Scanning electron microscope (SEM)
Quantitative Stereovision in a Scanning Electron Microscope
... scales, Scanning Electron Microscope (SEM) images have been combined with modern non contacting measure ment methods such as Digital Image Correlation (DIC) to make accurate 2D measurements on ...
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Scanning Electron Microscope Calibration Using a Multi-Image Non-Linear Minimization Process
... Introduction Scanning electron microscope (SEM) is an electron microscope where a fo- cused beam of electrons is used to scan the surface of a ...
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Accurate 3D Shape and Displacement Measurement using a Scanning Electron Microscope
... a Scanning Electron Microscope Electron Microscopy Introduction The concept of electron microscopy is born in the 1930’s because scientific research required to pass over a limitation ...
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Combining gradient ascent search and support vector machines for effective autofocus of a field emission–scanning electron microscope
... The scanning electron microscope (SEM) and the transmission electron microscope (TEM) are reference instruments for the microanalysis of materials: they are widely used in material and ...
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Inter- and Intragranular Stress Determination with Kossel Microdiffraction in a Scanning Electron Microscope
... a Scanning Electron Microscope (SEM) in order to determine the crystallographic orientation as well as the inter and intragranular strains and stresses on the micron scale, using a one cubic ...
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Fast Image Drift Compensation in Scanning Electron Microscope using Image Registration.
... in Scanning Electron Microscope Using Image Registration Naresh Marturi, Sounkalo Demb´el´e and Nadine Piat Abstract— Scanning Electron Microscope (SEM) image ac- quisition is ...
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Calibration of Scanning Electron Microscope using a multi-images non-linear minimization process.
... a scanning electron microscope is very different from the structure of an optical microscope, it became apparent that novel image analysis, geometrical projection models and calibration ...
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Crystallography of Stress corrosion cracking of austenitic stainless steel by scanning electron microscope and electron backscatter diffraction
... *MSMP Lab., Arts et Métiers ParisTech, Aix-en-Provence/France **Chimie ParisTech, Paris/France Summary In this study, Stress Corrosion Cracking (SCC) produced for 304L austenitic stainless steel in different ...
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In Situ Characterization of Inconel 718 Post-Dynamic Recrystallization within a Scanning Electron Microscope
... a Scanning Electron Microscope (SEM) is performed on partially dynamically recrystallized samples which were quenched after hot-deformation, in order to provide a direct observation of the active ...
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Estimation of the electron beam-induced specimen heating and the emitted X-rays spatial resolution by Kossel microdiffraction in a scanning electron microscope
... an electron beam is focused on a material, various elastic and inelastic interactions can occur between electrons and the ...considering scanning electron microscopy, a conductive bulk specimen is ...
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Building a near-field scanning millimeter-wave microscope integrated in a scanning electron microscope
... capabilities up to 110 GHz. Consequently, the new instrumentation offers the possibilities to adapt the lateral and depth resolutions by proper choice of the frequency of interest in the range 1-110 GHz. In addition, the ...
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Magnification-continuous static calibration model of a scanning-electron microscope.
... 24 rue Alain Savary 25000 Besançon, France Abstract. We present a new calibration model of both static distortion and projection for a scanning-electron microscope (SEM). The pro- posed calibration ...
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Visual Servoing-Based approach for efficient autofocusing in Scanning Electron Microscope.
... in Scanning Electron Microscope Naresh Marturi, Brahim Tamadazte, Sounkalo Demb´el´e, and Nadine Piat Abstract— Fast and reliable autofocusing methods are essen- tial for performing automatic ...
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A crystallographic approach of brittle fracture in the 16MND5 bainitic steel. In-situ X-ray diffraction and scanning electron microscope measurements at low temperatures
... a Scanning Electron Microscope (SEM), in order to characterize the behavior and the damaging processes (nucleation/crack-growth, but also appearance of slip lines) of the 16MND5 bainitic pressure ...
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Examination of rock surfaces with the scanning electron microscope
... Examination of rock surfaces with the scanning electron microscope Gillott, J. E. https://publications-cnrc.canada.ca/fra/droits L’accès à ce site Web et l’utilisation de son contenu sont assujettis ...
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Closed-Loop Autofocus Scheme for Scanning Electron Microscope
... 1 Introduction For high accuracy during manipulation tasks or micro-nanoscale measurements under a scanning elec- tron microscope (SEM), high quality and sharp im- ages are always required. For this ...
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Dislocation analysis of a complex sub-grain boundary using accurate electron channeling contrast imaging in a scanning electron microscope
... 4. Conclusion In summary, a complex low angle sub-grain boundary in a creep deformed polycrystalline UO 2 was characterized using an innovative procedure combining HR-SACPs and A-ECCI. TEM style dislocations contrast ...
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Depth and Shape Estimation from Focus in Scanning Electron Microscope for Micromanipulation.
... Under Focused Fig. 2. (a) Focusing geometry in SEM (b) various focusing scenarios. the aperture, converge the beam once again and focus it on to the sample surface. The focusing process is shown in the Fig. 2(a). Coarse ...
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Metrology in a scanning electron microscope: theoretical developments and experimental validation
... on electron microscopy (such as SEM and TEM) are ...of electron microscopy [ 20 , 21 ] is quite different from optical microscopy, a new model and a calibration process are necessary compared to a classical ...
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Depletion layer imaging using a gaseous secondary electron detector in an environmental scanning electron microscope
... secondary electron ~SE! images obtained using a field emission gun SEM operated at a beam energy of ap- proximately 1 keV, where the SE yield ...secondary electron detector ...permits electron ...
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