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HAL Id: jpa-00225910

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Submitted on 1 Jan 1986

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STUDY OF LANTHANUM ON TUNGSTEN FIELD EMITTER

G. Kozlowski, W. Swiech, S. Surma

To cite this version:

G. Kozlowski, W. Swiech, S. Surma. STUDY OF LANTHANUM ON TUNGSTEN FIELD EMIT- TER. Journal de Physique Colloques, 1986, 47 (C7), pp.C7-101-C7-103. �10.1051/jphyscol:1986718�.

�jpa-00225910�

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JOURNAL DE PHYSIQUE

Colloque C7, supplement au n o 11, Tome 47, Novembre 1986

STUDY OF LANTHANUM ON TUNGSTEN F I E L D EMITTER

G.

KOZLOWSKI, W. SWIECH and S. SURMA

Institute of Experimental Physics, University of Wroclaw, Ul. Cybulskiego 36, PL 50-205 Wroclaw, Poland

ABSTRACT - Activation energy for surface self-diffusion of lant- hanum was measured on La epitaxial crystal grown on a surface

of tungsten field emitter. A possible influence of an electric field during the course of the diffusion as well as in the case of the zero-field activation energy was investigated.

Epitaxial single crystals grown from vapour in a field emission mic- roscope

/ F E M /

under ultra-high vacuum conditions show an extremely

high level of purity and appear to be a suitable object in investiga- tion of surface processes. Epitaxy and surface self-diffusion of a se- ries of rare-earth elements, such as Y [I], Dy

1 2 1 ,

Gd

1 3 3

and Er [4,5J was in the past investigated using the FEM technique. This paper presents preliminary results of measurement of the surface self- -diffusion activation energy of lanthanum which was carried out on an epitaxial La crystal grown from vapour on a surface of the field emitter of tungsten. Fig. la shows an FEM pattern of the tungsten substrate surface, obtained at liquid nitrogen temperature.

The lanthanum source was a piece of lanthanum placed in a conical coil basket of a tungsten wire which could be resistively heated. The ambient pressure during the deposition of lanthanum was lower than 3 x 1 0 - ~ Pa. The temperature of the substrate field emitter was control- led by means of an electronic temperature controller and determined with an accuracy of + 5 K by using the resistance thermometry method

[ 6 ] .

A lanthanum epiyaxial single crystal 'obtained at a temperature

of 780-790

K

after a 3 hr evaporation of lanthanum is shown in fig.

lb. Similarly as in the case of Gd 3 and Er 4 the nucleation of lanthanum started on the terraces of a 110 plane of tungsten and required a precoverage. The growth of La crystals was made in a few stages of evaporation involving quenching to liquid nitrogen tempera- ture after stage.

The activation energies for surface self-diffusion of La were computed from Arrhenius-type dependences of In t vs 1/T obtained from measurements using the method described by Melmed 171. A small reproducible deforma- tion /build-up/ of the crystal shape was first made at a temperature of 640 K with an electric field /of straight or reverse polarity/ applied to the tungsten substrate, see fig. lc. Then the time, t, required to smooth the surface of the crystal was measured at various temperatures, T /in the range 550

K

to 620

K /

with no applied electric field. The initial and final states of the shape of the deformed and smoothed cry- stal were characterized by the relevant values of the field emission current at a fixed voltage. Then zero-field activation energies were

Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphyscol:1986718

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C7-102

JOURNAL

DE

PHYSIQUE

computed from such two sets of data. To examine the effect of electric field on the activation energy this procedure was repeated measuring the time of deforming in the same temperature range but with an applied electric field, for both polarities. In this way another two sets of data for the activation energy were measured. The result is shown in fig. 2. The values of the activation energy, Q3=1.45 eV/atom and Q4=1.52 eV/atom, for the surface self-diffusion of lanthanum with an applied electric field are close to that, Q2=1.43 eV/atom, for the dif- fusion with no applied field after the straight build-up /i.e. when it was made with a negative potential applied to the substrate tip/. The case of the zero-field activation energy, Q 1.24

+

0.10 eV/atom, for the build-up produced with a reverse field );ith a-positive potential to the substrate/ p obably reflects a "field memory" effect similar to the case of erbium 151. It was supposed for erbium that the field-indu- ced build-up process changes the binding energy of topmost atoms of the crystal and that these changes are conserved after removal of the elec- tric field, which affects the value of the activation energy for the surface self-diffusion with no applied field. It should be noted, howe- ver, that in the present case the "field memory" effect of lanthanum caused a decrease of activation energy rather than increase as in the erbium case.

It was mentioned above that the build-up was induced both in a straight and reverse field at 640 K which i s some 55 K higher than the tempera- ture of the phase transition from -La/hcp/ to -La/fcc/. Though, observation of field emission patterns made in the temperature range 550

K

to 630 K during the course of measurement of the diffusion times with an applied straight electric field /which was sufficiently high for FEM imaging/ - gave no evidence for a change in the symmetry of the lanthanum crystal across the transition temperature.

In conclusion, we have found the nucleation and crystal growth of lan- thanum to be similar as for other rare-earth metals. Evaporation was made at a high temperature of 780 K by stages followed by equenching to 7 8

K

resulting with an La crystal. Over the phase-transition tempe- rature of lanthanum the field emission pattern revealed no change of symmetry of the crystal. The zero-field activation energy for surface self-diffusion of lanthanum shows a "field memory" effect after defor- mation induced by the "reverse" field at 640 K whereas no influence of an electric field applied during the diffusion on the activation energies was found within the accuracy of the measurement.

ACKNOWLEDGEMENTS

This work has been supported by the Polish Ministry for Science and Higher Education within the Central Research Project on Surface Science 01.08.Al.

REFERENCES

Melmed, A.J., J.Less-Common Metals, 8 /1965/ 320.

Ciszewski, A., Melmed, A.J., Surface-Sci., 145 /I9841 L509.

13 Ciszewski, A., Melmed, A. J., Surf ace Sci., 145 /1984/ L471.

14 1 Ciszewski, A., Kozlowski, G., Swigch,

W . ,

A= Universitatis Wrati- slav., 847 /1985/ 33.

15) K O Z ~ O W S ~ G., Ciszewski, A., Swiech,

W . ,

J. Physique, 47 /I9861

C2-337.

63 Workowski, C.J., J.Phys. E 10 /1977/ 538.

'73 Melmed, A.J., J . A p p l . P h y s . , T ~ /1967/ 1885.

t

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Fig. 1 - Field emission pat- terns at 78 K of a/

W

sub- strate, b/ epitaxial La cry- stal,

c /

slightly deformed

Fig. 2 - Arrhenius plots for surface self-diffusion of La at 550-620

K .

Curves: 1 - diffusion with no applied field, after reverse build-up,

2 - no field, after straight build-up, 3 - diffusion with applied re-

verse field, 4

-

diffusion with applied straight field.

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