~ SINGLE-CHIP 16-BITI Enlarged

(1)

MITSUBISHI ~mm~

~ SEMICONDUCTORS U(!J(!J U

~ SINGLE-CHIP 16-BITI ^Enlarged

o ~

- OJ J7

o o

A -

MICROCOMPUTERS edition

(2)

o ~ J7

o A

MITSUBISHI ^~.:.;'

ffi.·.\."'.'Ir.'·,·'.·.· ..•. •.

~.~.".!O.·.·:'.:;.·.',~.· ^'I.l

SEMICONDUCTORS B~i!J I

SINGLE-CHIP 16-BIT ^Enlarged

MICROCOMPUTERS ^edition

(3)

All values shown in this catalogue are subject to change for product improvement.

The information, diagrams and all other data included herein are, believed to be correct and reliable. However, no responsibil- ity is assumed by Mitsubishi Electric Corporation for their use, nor for any infringements of patents or other rights belonging to third parties which may result from their use.

'0

(4)

GUIDANCE

MELPS 7700 16-81T MICROCOMPUTERS

PROGRAMMABL E ROM MICROCOMPUTERS

APPENDICES

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(6)

MITSUBISHI MICROCOMPUTERS

INDEX

DGUIDANCE

PAGE

Index by Function ... '''1-3 Development Support Systems ... ·· .. · .. · .. · ... · ... · .... · ... · .... · .. · ... · ... 1 ~6

Ordering Information··· .... ··· .. ···· .. ··· .. ··· .. ··· .. ··· '1-8 Package Outlines· .. · .. ··· .. ·· .. ··· .. ··· .. ··· .. · ... ·· .. ··· .. ··· '1-9 letter Symbols for The Dynamic Parameters ... · .. · .. · ... ·1-12 Symbology .. ··· .. ··· .. ··· .. ··· .. ··· .. ··· .. ··· .. ··· .. ···· ... '1-15 Quality Assurance and Reliability Testing .... · .. · .. · ... · ... · ... · .. · .. · ... · ... · ... "1-18 Precaution in Handing MOS IC/lSls ... '1-24

UMELPS 7700 16-BIT MICROCOMPUTERS

M37702M2-XXXFP, M37702M2AXXXFP, M37702M2BXXXFP, M37702S1 FP, M37702S1AFP, M37702S1 BFP Single-Chip 16-8it CMOS Microcomputer .. · ... · .. ·2-3 M37702M4-XXXFP, M37702M4AXXXFP, M37702M4BXXXFP, M37702S4FP, M37702S4AFP, M37702S4BFP

Single-Chip 16-8it CMOS Microcomputer .. · ... · .. ·2-62 M37703M2-XXXSP, M37703M2AXXXSP, M37703M2BXXXSP, M37703S1SP, M37703S1ASP, M37703S1BSP

Single-Chip 16-8it CMOS Microcomputer' ... '2-65 M37703M4-XXXSP, M37703M4AXXXSP, M37703M4BXXXSP, M37703S4SP, M37703S4ASP, M37703S4BSP

Single-Chip 16-8it CMOS Microcomputer ... 2-84 M37720S1 FP, M37720S1AFP 16-8it CMOS Microcomputer··· .... ·· ... ··· .. ·· .. ··· .. ··2-86 M37730S2FP, M37730S2AFP, M37730S2BFP, M37730S2SP, M37730S2ASP, M37730S2BSP

16-8it CMOS Microcomputer· .... ···· .. · .. ··· .. · .. ··· .. ·· .. ··· .. ··· .. ·2-179 M37732S4FP, M37732S4AFP, M37732S4BFP

16-8it CMOS Microcomputer· .. ··· .. ··· .. ··· .. ··· .. ··· .. ·2-237 MElPS 7700 Addressing Modes ... ···· .. ··2-298 MElPS 7700 Instruction Code Table ... ···2-341 MElPS '7700 Machine Instructions··· .. ··· ... ···· .. ··2-344

II PROGRAMMABLE ROM MICROCOMPUTERS

M37702E2-XXXFP, M37702E2AXXXFP, M37702E2BXXXFP, M37702E2FS, M37702E2AFS, M37702E2BFS PROM Version of M37702M2-XXXFP, M37702M2AXXXFP, M37702M28XXXFP .... ·3-3 M37702E4-XXXFP, M37702E4AXXXFP, M37702E4BXXXFP, M37702E4FS, M37702E4AFS, M37702E4BFS

PROM Version of M37702M4-XXXFP. M37702M4AXXXFP, M37702M48XXXFP .... ·3-26 M37703E2-XXXSP, M37703E2AXXXSP, M37703E2BXXXSP

PROM Version of M37703M2-XXXSP, M37703M2AXXXSP, M37703M28XXXSp .... ·3-28 M37703E4-XXXSP, M37703E4AXXXSP, M37703E4BXXXSP

PROM Version of M37703M4-XXXSP, M37703M4AXXXSP, M37703M48XXXSp .... ·3-51

D APPENDICES

MELPS 7700 Mask ROM Ordering Method .. · .. · .. · .. · .. · ... · ... · ... · ... · .... -4-3 MELPS 7700 PROM Ordering Method ... , ... · .. · .... · .. · .. · .... · .. · ... 4-16 Mark Specification Form··· .. ·· .. ··· .. ·· .. · .. ··· .. ··· .. ··· .. ··· .. ··· ... ··· '4-29 Contact Addresses for Further Information

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GUIDANCE

(9)

(10)

MITSUBISHI MICROCOMPUTERS

INDEX BY FUNCTION

.MELPS 7700 16-BIT MICROCOMPUTERS

Type

M37702M2-XXXFP

M37702M2AXXXFP

M37702M2BXXXFP

M37702S1FP

M37702S1AFP

M37702S 1 BFP

M37702M4-XXX FP

M37702M4AXXXFP

M37702M4BXXXFP

M37702S4FP

M37702S4AFP

M37702S4BFP

M37703M2-XXXSP

M37703M2AXXXSP

M37703M2BXXXSP

M37703S1SP

M37703S1ASP

M37703S1 BSP

M37703M4-XXXSP

M37703M4AXXXSP

M37703M4BXXXSP

M37703S4SP

Circuit function and organization StructurE

16K-Byte Mask-Prog. ROM, 512-Byte RAM

16-Bit Timer, 8-Bit A-D Converter C, Si Two Serial I/O

External ROM, 512-Byte RAM

16-Bit Timer, B-Bit A-D Converter C, Si Two Serial I/O

32K-Byte Mask-Prog. ROM, 204B-Byte RAM

16-Bit Timer, 8-Bit A-D Converter C, Si

Two Serial I/O

. • MlTSUBlSHI . . . . ELECTRIC

Supply voltage (V)

5±10%

5±1O%

5±10%

5±1O%

5±10%

Electrical characteristics Typ. Min. Max.

power cycle fre- Package Page dissipali time quency

(mW) (ns) (MHz)

30 500 8 80P6N

60 250 16 BOP6N

95 160 25 BOP6N

2-3

30 500 8 BOP6N

60 250 16 BOP6N

95 160 25 BOP6N

30 500 8 BOP6N

60 250 16 BOP6N

95 160 25 BOP6N

2-62

30 500 8 BOP6N

60 250 16 BOP6N

95 160 25 BOP6N

30 500 8 64P4B

60 250 16 64P4B

95 160 25 64P4B

2-65

30 500 B 64P4B

60 250 16 64P4B

95 160 25 64P4B

30 500 8 64P4B

60 250 16 64P4B

2-84

95 160 25 64P4B

30 500 8 64P4B

1-3

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.MELPS 7700 16-BIT MICROCOMPUTERS (Continue)

Type

M37703S4ASP

M37703S4BSP

M37720S1FP

M37720S1AFP M37730S2FP M37730S2AFP M37730S28FP M37730S2SP M37730S2ASP M37730S28SP M37732S4FP

M37732S4AFP

M37732S48FP

1-4

Circuit function.and organization Structute

16-Bit Timer, 8-Bit A-O Converter C, Si Two Serial 1/0

16-Bil Timer, 8-Bit A-O Converter C, Si Two Serial 1/0

Exlemal ROM, 512"Byte RAM

16-Bit Timer, 8-Bil A-O Converter C, SJ Two Serial 1/0, OMAlORAM Controller

16-Bit Timer, 8-Bil A-O Converter C,Si

Two SerJal 1/0, OMAlORAM Controller

External ROM, 1024-Byte RAM C,Si

16-Bit Timer, Serial 1/0

External ROM, 1024-Byte RAM C,Si

External ROM, 1024-Byle RAM C,Si

External ROM, 1024-Byte RAM C, Si

External ROM, 1024-Byle RAM C, Si

16-Bit Timer, Serial 110

External ROM, 1024-Byte RAM C, Si

16-Bil Timer, Serial 1/0 External ROM, 2048-Byte RAM

.•... ... MITSlBSH. I . . . . ELECTRIC

MITSUBISHI MICROCOMPUTERS

INDEX BY FUNCTION

Eleclncal characteristics Supply TYP· Min. Max.

voltage ppwer cycle Ire- Package _Pag~

(V) dissipatiar time quency (mW) (ns) (MHz)

5±10% 60 250 16 64P48

2'-'84

5±10% 95 160 25 64P48

5±10% 30 500 8 HioP6S

2--:-86

5±10% 60 250 16 100P6S

5±10% 30 500 8 64P6N

5±10% 60 250 16 64P6N

5±10% 95 160 25 64P6N

2--,179

5±10% 30 500 8 64P48

5±10% 60 250 16 64P48

5±10% 95 160 25 64P48

5±10% 30 500 8 80P6N

5±10% 60 250 16 80P6N 2-237

5±10% 95 160 25 80P6N

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MITSUBISHI MICROCOMPUTERS

INDEX BY FUNCTION

.PROGRAMMABLE ROM MICROCOMPUTERS

Electrical characteristics Supply Typ. Min. Max.

Type Circuit function and organization Structure voltage power cycle fre- Package Page (V) dissipalion time quency

(mW) (ns) (MHz) M37702E2-XXXFP One time PROM Version of M37702M2-XXXFP

C, Si 5±10% 30 500 8 80P6N

16K-Byte PROM, 512-Byte RAM

M37702E2AXXXFP One time PROM Version of M37702M2AXXXFP

C, Si 5±10% 60 250 16 80P6N 16K-Byte PROM, 512-Byte RAM

M37702E2BXXXFP One time PROM Version of M37702M2BXXXFP

EPROM Version of M37702M2-XXXFP 3-3

M37702E2FS

16K-Byte EPROM, 512-Byte RAM C, Si 5±1O% 30 500 8 8000

M37702E2AFS EPROM Version of M37702M2AXXXFP

C, Si 5±10% 60 250 16 8000

16K-Byte EPROM, 512-Byte RAM M37702E2BFS EPROM Version of M37702M2BXXXFP

C, Si 5±10% 95 160

I

²⁵ ⁸⁰⁰⁰

16K-Byte EPROM, 512-Byte RAM

M37702E4-XXX FP One time PROM Version of M37702M4-XXXFP

C, Si 5±10% 30 500 8 80P6N

M37702E4AXXX FP One time PROM Version of M37702M4AXXXFP

C, Si 5±1O% 60 250 16 80P6N 32K-Byte PROM, 2048-Byte RAM

M37702E4BXXXFP One time PROM Version of M37702M4BXXXFP

3-26 M37702E4FS EPROM Version of M37702M4-XXXFP

C, Si 5±1O% 30 500 8 8000

32K-Byte EPROM, 2048-Byte RAM M37702E4AFS EPROM Version of M37702M4AXXXFP

C, Si 5±10% 60 250 16 8000

32K-Byte EPROM, 2048-Byte RAM M37702E4BFS EPROM Version of M37702M4BXXXFP

C, Si 5±10% 95 160 25 8000

32K-Byte EPROM, 2048-Byte RAM

M37703E2-XXXSP One time PROM Version of M37703M2-XXXSP

C, Si 5±10% 30 500 8 64P4B

M37703E.2AXXXSP One time PROM Version of M37703M2AXXXSP

C, Si 5±10% 60 250 16 64P4B 3-28

M37703E2BXXXSP One time PROM Version of M37703M2BXXXSP

C, Si 5±10% 95 160 25 64P4B 16K-Byte PROM, 512-Byte RAM

M37703E4-XXXSP One time PROM Version of M37703M4-XXXSP

C, Si 5±10% 30 500 8 64P4B

M37703E4AXXXSP One time PROM Version of M37703M4AXXXSP

C, Si 5±10% 60 250 16 64P4B 3-51

M37703E4BXXXSP One time PROM Version of M37703M4BXXXSP

C, Si 5±10% 95 160 25 64P4B 32K-Byte PROM, 2048-Byte RAM

1-5

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MITSUBISHI MICROCOMPUTERS

DEVELOPMENT SUPPORT SYSTEMS

Development support systems for MELPS 7700

MELPS 7700

Assembler Emulation pod For evaluate

type name M37702M2-XXXFP M37702M2AXXXFP M37702S1FP M37702S1AFP

M37702T-HPO M37702E2-XXXFP

M37702E2AXXXFP M37702E2FS M37702E2AFS M37702M4-XXXFP

M37702M4AXXXFP M37702E2FS

M37702S4FP M37702E2AFS

M37702S4AFP M37702T -HPO M37702E2BFS

M37702E4-XXXFP (Exchange MCU for M37702S4AFP) M37702E4FS

M37702E4AXXXFP M37702E4AFS

M37702E4FS M37702E4BFS

M37702E4AFS M37702M2BXXXFP M37702S1 BFP

M37702TB-HPO**

M37702E2BXXXFP M37702E2BFS M37702M4BXXXFP

M37702S4BFP M37702TB-HPO**

M37702E4BXXXFP (Exchange MCU for M37702S4BFP)

M37702E4BFS M37703M2-XXXSP

M37703M2AXXXSP RASM77

M37703S1SP

M37702T-HPO M37703S1 ASP

M37703E2-XXXSP

I

M37703E2AXXXSP

M37703M4-XXXSP M37703E2-XXXSP

M37703M4AXXXSP M37703E2AXXXSP

M37703S4SP M37702T-HPO M37703E2BXXXSP

M37703S4ASP (Exchange MCU for M37702S4AFP) M37703E4-XXXSP

M37703E4-XXXSP M37703E4AXXXSP

M37703E4AXXXSP M37703E4BXXXSP

M37703M2BXXXSP

M37703S1 BSP M37702TB-HPO**

M37703E2BXXXSP M37703M4BXXXSP

M37702TB-HPO**

M37703S4BSP

(Exchange MCU for M37702S4BFP) M37703E4BXXXSP

M37720S1FP

M37720T -H PO** -

M37720S1AFP M37730S2FP M37730S2AFP

M37730T-HPO**

M37730S2SP M37730S2ASP

-

M37730S2BFP

M37730TB-HPO**

M37730S2BSP M37732S4FP

M37732T-HPO**

M37732S4AFP -

M37732S4BFP M37732TB-HPO**

**

Under development

1-6

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MITSUBISHI MICROCOMPUTERS

DEVELOPMENT SUPPORT SYSTEMS

Program writing adapter for built-in PROM type microcomputers of MELPS 7700 Built-in PROM type

microcomputers type name M37702E2-XXXFP

M37702E2AXXXFP M37702E2BXXXFP M37702E2FS M37702E2AFS M37702E2BFS M37702E4-XXXFP M37702E4AXXXFP M37702E4BXXXFP M37702E4FS M37702E4AFS M37702E4BFS M37703E2-XXXSP M37703E2AXXXSP M37703E2BXXXSP M37703E4-XXXSP M37703E4AXXXSP M37703E4BXXXSP

Program writing adapter

PCA4774

PCA4708

PCA4774

PCA4708

PCA4709

• MITSUBISHI

... ELECTRIC

^1-7

(15)

MITSUBISHI MICROCOMPUTERS

ORDERING INFORMATION

FUNCTION CODE

Mitsubishi integrated circuit may be ordered using the following simplified' alphanumeric type-codes which define the function of the IC/lSls and the package style.

For Mitsubishi

Example:

M 3

T

Original Products

77 02 E 4 001 FP

-, T

^~^- ^{- , -} M : Mitsubishi integrated prefix

3 : Represent an original singlecchip microcomputer Series designation using 2 digits

Circuit function identification code using 2 digits Memory identification code using a digit

[

E : PROM P : Piggyback

M : Mask ROM 5 : External ROM N : Mask ROM+EEPROM

Memory size identification code using a digit Normally, using hyphen.

J

When electrical characteristic, or division of quality identification code using alphanumeric character.

T : For automobile, industrial equipment Mask ROM number

Package style

[ .

J : PlCC, or SOJ package FP : Molded plastic flat package F5 : Ceramic flat package 5P : Molded plastic shrink package 55 : Ceramic shrink package

PACKAGE CODE

Package style may be specified by using the following simplified alphanumeric code.

1-8

Example:

64 P 4 B

' - - - j - - + - - j - -Number of pins ' - - j - . - - t -Package structure

[

K: Glass-sealed ceramic ] P : Molded plastic

5 : Metal-sealed ceramic Package outline

[

0 : PlCC, SOJ 1 : DIP 2 : SOP

Secondary outline code

4 : DIP

l

6 :QFP

J

Special-purpose secondary codes describing outline are' included as necessary. For details, contact your sales representative.

• MITSUBISHI

. . . . ELECTRIC

(16)

MITSUBISHI MICROCOMPUTERS

PACKAGE OUTLINES

64P4B Plastic 64pin 750mil SDIP

eJl

1. 778 TO. 25

56 4 +0.5 . -0.2

64P6N Plastic 64pin QFP

"'Nt

0 0

00 +1

'"

a

® _®

®

·31

O.6±O.2

., MITSUBISH

~ELECTRIC'

Dimension in mm

_ _ _ 19_--=:2~

Dimension in mm

1-9

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MITSUBISHI MICROCOMPUTERS

PACKAGE OUTLINES

8000 Ceramic 80pin LCC

Dimension in mm 21.0±0.2

<1>68.8

18. 40±0. 15

aOP6N Plastic 80pin QFP

Dimension in .mm

IQl) @)

!f= ~t

^o ^®I @

CD @ x « _:::;:

~ 0-;

UUL ^[lUll[

.6±0.2

.l

^14+0.2

J ~ -

^,

o

.~ .llill nO[ Dl 1'\\ '

I

^20±0.2

0.6±0.2

f*

22.8+0.3

I

^16.8+0.3 ^d

1-10

(18)

100P6S Plastic 100pin QFP

~~~fn-uruuuuu.~-=~j ci I.

20±O.2 O.6±O.2

• 22.8

MITSUBISHI MICROCOMPUTERS

PACKAGE OUTLINES

Dimension in mm

k - - - ' 2 . : = ' - - - . . I 6 +1

16.8

1-11

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MITSUBISHI MICROCQMPUTERS

LETTER SYMBOLS FOR· THE··DYNAMIC ·PARAMETERS"

"1. INTRODUCTION

A system 'of letter symbols to be used to represent the dynamic parameters of intergrated circuit memories and other 'sequential circuits especially fQr single-chip microcomputers, microprocessors and LSls for peripheral circuits has been discussed internationally in the TC47 of the International Electrotechnical Committee (lEC).

Finally the IEC has decided on the meeting of TC47 in February 1980 that this system of letter symbols will be a Central Office document and circulated to all countries to vote which means this system of letter symbols will be a international standard.

The system is applied in this LSI data book for the new products only. Future editions of this data book will be applied this system. The IEC document which describes "Letter symbols for dynamic parameters of sequential integrated circuits, including memories" is introduced below. In this data book, the dynamic parameters in the IEC document are applied to timing reCluirements and switching characteristics.

2 .. LETTER SYMBOLS

The system of letter symbols outlined in this document enables symbols to be generated for the dynamic parameters of complex sequential circuits, including memories, and also allows these symbols to be abbreviated to simple mnemonic symbols when no ambiguity is likely to arise.

2.1. General Form

The dynamic parameters are represented by the general symbol of the form:-

tA(BC-DC)F ... (1) where:

Subscript A indicates the type of dynamic parameter being represented, for example; cycle time, setup time, enable time; etc.

Subscript B indicates the name of the signal or terminal for which a change of state or level (or establishment of a state or level) con- stilutes a signal event assumed to occur first, that is, at the beginning of the time interval. If this event actually occurs last, that is, at the end of the time interval, the value of the time interval is negative.

Subscript C indicates .the direction of the transition and/or the final state or level of the signal represented by B. When two letters are used, the initial state or level is also indicated.

1-12

Subscript 0 indicates the name of the signal or terminal for which a change of state or level (or establishment of a state or, ,level) consti- tutes a signal· event ass'u'med to occur, last, that is, at the end of the time interval. If this event actually occurs first, that is, at the beginning of the time interval, the value of the time interval is negative.

Subscript E indicates the direction of the transition and/or the final state or level of the signal represented by D. When two letters are used, the initial state or level is also indi- ca.ted.

Subscript F indicates additional information such as mode of operation, test conditions, etc.

Note 1: Subscripts A to F may each consists of one or more letters.

2" Subscripts 0 and E are not used for transition times.

3: The "-" in the symbol (1) above is used to indicate "to"; hence the symbol represents the time interval from signal event B occuring to signal event 0 occuring. and it is important to note ,that this convention is used for all ',dynamic parameters including hold times. Where no misunderstanding can occur the hyphen may be omitted.

2.2. Abbreviated Form

The general symbol given above may be abbreviated whim no misunderstanding is lil<ely to arise. For example to:

or ^tA(B)

or ^tA(D) often used for hold times or tAF no brackets are used in th is case or tA

or tBe-DE often used for unclassified time intervals

2.3. Allocation of Subscripts

In allocating letter symbols for the subscripts, the most commonly used subscripts are given single letters where practicable and those less commonly used are designated by up to three letters. As far as possible, some form of mnemonic representation is used. Longer letter symbols maybe, used for specialised signals or terminals if this aids understanding.

3. SUBSCRIPT A

(For Type of Dynamic Parameter)

The subscript A represents the type of dynamic parameter to be designated by the symbol and', for memories, the parameters may be divided into two classes:

a) those that are timing requirements for the memory and

(20)

MITSUBISHI MICROCOMPUTERS

LETTER SYMBOLS FOR THE DYNAMIC PARAMETERS

b) those that are characteristics of the memory.

The letter symbols so far proposed for memory circuits are listed in sub·clauses 3.1 and 3.2 below.

All subscripts A should be in lower-case.

3.1. Timing Requirements

The letter symbols for the timing requirements of semiconductor memories are as follows·:

Term Cycle time

Time interval between two signal events Fall time

Hold time Precharging time Rise time Recovery time Refresh time interval Setup time

Transition time Pulse duration (width)

3.2. Characteristics

Subscript c d f h pc rec rf su w

The letter symbols for the dymmic characteristics of semiconductor memories are as follows:

Characteristic Subscript

Access time a

Disable time dis

Enable time en

Propagation time p

Recovery time rec

Transition time T

Valid time v

Note: Recovery time for use as a characteristic is limited to sense recovery time

4. SUBSCRIPTS BAND D

(For Signal Name or Terminal Name)

The letter symbols for the signal name or the name of the terminal are as given below.

All subscripts Band D should be in upper-case.

Signal or terminal Subscript

Address A

Clock C

Column address CA

Column address strobe CAS

Data input D

Data input/output DO

Chip enable E

Erasure ER

Output enable G

Program PR

Data output 0

Read R

Row address RA

Row address strobe RAS

Refresh RF

Read/Write RW

Chip select S

Write (write enable) W

Note 1 In the letter symbols for time intervals. bars over the subscripts. for ex ample CAS, should not be used

2 It should be noted, when further letter symbols are chosen, that the sub·

script should not end with H, K, V. X, or Z, (See clause 5)

3 If the same terminal, or signal, can be used for two functions {for example Data Input/output, ReadNVritel the waveform should be labelled With the dual function, if appropriate, but the symbols for the dynamic parameters should include only that part of the subscript relevant to the parameter

5. SUBSCRIPTS C AND E (For Transition of Signal)

The following symbols are used to represent the level or state of a signal:

Transition of signal High logic level

Low logic level

Subscript H L Valid steady-state level (either low or high) V Unknown, changing, or 'don't care' level X High-impedance state of three·state output Z The direction of transition is expressed by two letters, the direction being from the state represented by the first letter to that represented by the second letter, with the letters being as given above.

When no misunderstanding can occur, the first letter may be omitted to give an abbreviated symbol for subscripts C and E as indicated below.

All subscripts C and E should be in upper-case.

Subscript

Examples Full Abbreviated

Transition from high level to

low level HL L

Transition from low level to

high level LH H

Transition from unknown or

changi ng state to val id state XV V Transition from valid state to

unknown or changing state VX X

Transition from high-impedance

state to valid state ZV V

Note Since subscripts C and E may be abbreviated, and since subscripts Band D may contain an indeterminate number of letters, it is necessary to put.the restriction on the subscripts Band 0 that they should not end with H, L, V, X, or Z, so as to avoid possible confusion

• MITSUBISHI

. . . . ELECTRIC

^1-13

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MITSUBISHI MICROCOMPUTERS

LETTER SYMBOLS FOR THE DYNAMIC PARAMETERS

6. SUBSCRIPT F (For Additional Information)

If necessary, subscript F is used to represent any additional qualification of the parameter such as mode of operation, test conditions, etc_ The letter symbols for subscript F are given below_

Subscript P sh.ould be in upper-case_

Modes of operation Power-down

Page-mode read Page-mode write Read

Refresh

Read-modify-write Read-write Write

1-14

Subscript PO PGR PGW R RF RMW RW W

'.. . MITSUBISHI

. . . . ELECTRIC

(22)

MITSUBISHI MICROCOMPUTERS

SYMBOLOGY

FOR DIGITAL INTEGRATED CIRCUITS

New symbol. Former symbol Parameter-definition

C, Input capacitance

Co Output capacitance

C,o Input/output tanninal capacitance

C'(~I Input capacitance of clock input

I Frequency

I(~I Clock frequency

I Current-the current into an integrated circuit terminal is defined as a positive value and the current out of a terminal is defined as a negative value

IBB Supply current from Vee

IBB(AV) Average supply current from Vae

lee Supply current from Vee

ICC(AV) Average supply current from Vee

Icc{po) Power-down supply current from Vee

100 Supply current from Voo

IOO(AV) Average supply current from Voo

laa Supply current from VaG

IGG(AV) Average supply current from VGG

I, Input current

I'H High-level input current-the value of the input current when VOH is applied to the input considered I'L Low-level input current-the value of the input current when VOL is applied to the input considered 10H High-level output current-the value at the output current when VOH is applied to the output considered 10L Low-level output current-the value of the output current when VOL is applied to the output considered

loz Otf-state(high-impedance state)output currerit-Itle current Into an output having a three-state capability with input condition so applied that it will establish according to the product specification, the off(high-impedance)state at the output

IOZH Otf-state(high-impedance state) output current, with high-level voltage applied to the output IOZL Otf-state(high-impedance state) output current, with low-level voltage applied to the output

los Short-circuit output current

Iss Supply current from Vss

Pd Power dissipation

NEW Number of erase/write cycles

NRA Number of read access unrefreshed

R, Input resistance

RL External load resistance

ROFF Off-state output resistance

RON On-state output resistance

la Access time-the time interval between the application of a specified input pulse during a read cycle and the availability of valid data signal at an output la(AI la(ADI Address access time-the tJme interval between the application of an address input pulse and the availability of valid data'signals at an output

ta{cAs) Column address strobe access time

la(EI la(eEI Chip enable access time la(al la(oEI Output enable access time

ta(PR) Data access time after program

la(RASI Row address strobe access time la(sl la(esl Chip select access time

Ie Cycle time

IeR Ie(RDI Read cycle time-the time interval between the start of a read cylce and the start of the next cycle

tCRF le(REFI Refresh cycle time-the time Interval between successive signals that are intended to restore the level in a dynamic memory cell to its original level

t CPG le(pal Page-mode cycle time

tCRMW tC{RMW) Read-modify-write cycle time-the time interval between the start of a cycle in which the memory is read and new data is entered, and the start of the next cycle

lew tC(WR) Write- cycle time-the time interval between the start of a write cycle ,and the start of the next cycle

1-15

(23)

New symbol Former symbol

td(CAS~RAS)

td(CAS-W) td(RAS-CAS) td(RAS-W) tdiS(R-O) tdis(s) tdis(w) tOHL tOLH len(A-O) teneR-oj tents-oj tf th theA) theA-E) theA-PRJ th(CAS-CA) th(CAS-D) th(CAS_Q)

th(CAS-RAS) th(cAs-w) th(D) th(D-PR) theE) theE-D) theE-G) th(R) th(RAS-CA)

the RAS-CAS) th(RAS-O) th(RAS-W) th(s) thew) th(W-CAS) th(W-D) thew-RAS) tpHt.:.

tpLH

tr

trec(w) trec(po) tsu

tSU(A) ISU(A-E) tSU(A-W) tSU(CA-RAS)

1...,16

td(RAS-WR) tdis(R-DA) tp~z(CS) tPXZ(WR)

tpzv(A-OQl tPZV(R-OQ) tpzx( cs-co)

thlAD) th(AD-CE) th{AD-PRO)

th(CAS-DA) th(CAS-OUT)

th(CAS-WR) th(DA) theDA-PRO) thlCE) th(CE-DA) th(CE-OE) th(RD)

th(RAS-DA) th(RAS-WR) th(cs) th(WR) th(WR-CAS) th(WR-DA) th(WR-RAS)

twr

tSU(AO) tSU(AD-CE) tSU(AD-WR)

MITSUBISHI MICROCOMPUTERS

Parameter-definition

Delay time-the time between the specified reference pOints on two pulses

Delay time between clock pulses-a:g., symbology,. delay time, .clock 1 to clock 2 or clock 2 to clock 1 Delay time, column address strobe to row address strobe

Delay time, column address strobe to write Delay time, row address strobe to column address strobe Delay tim.e, row address strobe to write

Output disable time after read Output disable time after chip select.

Output disable time after write

SYMBOLOGY

High-level to low-level delay ti.me ) the time interval between specified reference points on the input and on the output pulses when the output is Low-level to high-level delay time going to the low (high)level and when the device is driven with a specified loading networks

Output enable time after address Output enable time after read Output enable time after chip select Fall time

Hold time-the interval 01 time during which a signal at a specified input terminal appears after an active transition occurs at another specified input tenninal Address hold time

Chip enable hold time after address Program hold time after address

Column address hold time after column address strobe Data-in hold time after column address strobe Data-out hOld time after column address strobe Row address strobe hold time after column address strobe Write hold time after column address strobe Data-in hold time

Program hold time after data-in Chip enable hold time Data-in hold time after chip enable Output enable hold ti~e after chip enable·

Read hold time

Column address hold time after row address strobe Column address strobe hold time after row address strobe Data-in hold time after rOw address strobe

Write hold time after row address strobe Chip select hold time

Write hold time

Column .address strobe hold time after write Data-in hold time after write

Row address ·hold time after write High-level to low-level propagation time ) Low-level to high-level propagation time Rise time

the time interval between specified reference points on the input and on the output pulses when the output is going to the low (high)level and when the device is driven and loaded by typical devices of state~ type

Write recovery time-the time interval between the termination of a write pulse and the initiation of a new cycle Power-down recovery time

. Setup time-the time interval between the application of a Signal ~hiCh is maintained at a speciifed input, terminal a!:ld a cOflsecutive active tarnsltion at another specified input terminal

Address setup time

Chip enable setup time before address Write setup time before address

Row address strobe setup time belore column addr'ess.

(24)

New symbol Former symbol

t5U (D) tSU(DA)

tSU(D-E} tSU(DA-GEl

tsu(o-w) tSU(DA-WR) tSU(E) tsuCCE )

tSU(E-P) tsuCCE-p)

tSU(G-E) tSU(OE-GEl

tSU(P-E} tSU(P-CE}

tSU(PD)

tSUCR) tSU(RD)

tSUCR-CAS) tSU(RA-CAS) tSU(RA-CAS)

tsu(s) tsu(cs}

tSU(S-w) tSU(CS-WR)

tsu(w) tSU(WR)

hHL tTlH

tV(AJ tdV(AOJ

tV(EJ tdv(eEi

tV(EJPR tvCCEJPR

tV(G) tV(OE)

tV(PR)

tv(s) tv(cs)

tw

tW(E) tW(CE)

tWCEH) tW(CEH)

tW(ELJ tW(ELJ

tW(PRJ

tW(R) tW(RD)

tw(S) twCCs)

tw(w) tWCWR)

tw(.p) Ta Topr Tstg VBB

Vee VDD

VGG V, V'H V'L Vo V OH VOL Vss

MITSUBISHI MICROCOMPUTERS

SYMBOLOGY

Parameter-definition Data-in setup time

Chip enable setup time before data-in Write setup time before data-in Chip enable setup time

Precharge setup time before chip enable Chip enable setup time before output enable Chip enable setup time before precharge Power-down setup time

Read setup time

Column address strobe setup time before read Cloumn address strobe setup time before row address Chip select setup time

Write setup time before chip select Write setup time

High-level to low-level transition time

I

the time interval between specified reference points on the edge of the output pulse when the output is going to the 10w(high)level and when a specified input signal is applied through a specified network and Low-level to high-level transition time the output is loaded by another specified network

Data valid time after address Data valid time after chip enable

Data valid time after chip enable in program mode Data valid time after output enable

Data valid time after program Data valid time after chip select

Pulse width (pulse duration)the time interval between specified reference points on the leading and training edges of the waveforms Chip enable pulse width

Chip enable high pulse width Chip enable low pulse width Program pulse wiqth Read pulse width Chip select pulse width Write pulse width Clock pulse width Ambient temperature Operating temperature Storage temperature VBB supply voltage Vee supply voltage Voo supply voltage VGG supply voltage Input voltage

High-level input voltage-the value of the permitted high-state voltage at the input Low-level input voltage--=-the value of the permitted low-state voltage at the input Output voltage

High-level output voltage-the value of the guaranteed high-state voltage range at the output Low-level output voltage,.-the value of the guaranteed low-state voltage range at the output

V ss supply voltage

• MITSUBISHI

"'ELECTRIC

^1-17

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MITSUBISHI MICROCOMPUTERS

···QUALITY ASSURANCE AND RELIABILITY TESTING

1 INTRODUCTION

IC & LSI have made rapid technical progress in electrical performances of high integration, high speed, and sophisti- cated functionality. And now they have got boundless wider applications in electronic systems and electrical ap- pliances.

To meet the above trend of expanding utilization of IC &

LSI, Mitsubishi considers that it is extremely important to supply stable quality and high reliable products to customers.

Mitsubishi Electric places great emphasis on quality as a basic policy "Quality First", and has striven always to improve quality and reliability.

Mitsubishi has already developed the Quality Assurance System covering design, manufacturing, inventory and delivery for IC & LSI, and has supplied highly reliable products to customers for many years. The following articles describe the Quality Assurance System and examples of reliability control for Mitsubishi Single-chip 16-bit Micro- computer.

2. QUALITY ASSURANCE SYSTEM

The Quality Assurance System places emphasis on built-in reliability in designing and built-in quality in manufacturing.

The System from development to delivery is summarized in Figure 1.

2.1 Quality Assurance in Designing

The following steps are applied in the designing stage for a new product.

(1) Setting of perfomance, quality and reliability target for new product.

(2) Discussion of performance and quality for circuit de"

sign, device structure, process, material and package.

(3) Verification of design by CAD system to meet standar- dized design rule:

(4) Functional evaluation for bread-board device to confirm electrical performance.

(5) Reliability evaluation for TEG (Test Element Group) chip to detect !>asic failure mode and investigate failure mechanism.

(6) Reliability test (In-house qualification) for new product to confirm quality and reliability target.

(7) Decision of pre-production from the standpoint of performance, reliability, production flow/conditions, production capability, delivery etc.

2.2 Quality Assurance in Manufacturing

Quality assurance in manufacturing is performed as follows.

(1) Environment control such as temperature, humidity and dust as well as deionized water and utility gases.

(2) Maintenance and calibration control for automatized manufacturing equipments, automatic testing equipments, and measuring instruments.

1-18

(3) Material control such as silicon wafer, lead frame, packaging material, mask and chemicals.

(4) In-process inspections in wafer-fabrication, assembly and testing.

(5) 100% final inspection of electrical characteristics, visual inspection and burn-in, ii necessary.

(6) Quality assurance test

-Electrical characteristics and visual inspection, lot by lot sampling

-Environment and endurance test, periodical sampling.

(7) Inventory and shipping control, such as storage environment, date code identification, handling and ESD (Electro Static Discharge) preventive procedure.

2.3 Reliability Test

To verify the reliability of a product as described in the Mit- subishi Quality Assurance System, reliability tests are performed at three different stages in new product development, pre-production and mass-production.

At the development of a new product the reliabi.lity test plan is fixed corresponding to the quality and reliability target of each product, respectively. The test plan includes in-house qualification test and TEG evaluation, if necessary.

TEG chips are designed and prepared for new device structure, new process and new material.

After the proto-type product has passed the in-house qualification test, the product advances to the pre-production. In the pre-production stage, the specific reliability tests are programmed and performed again to verify the quality of pre-production product.

In the mass production, the reliability tests are performed periodically to confirm the quality of the mass production product according to the quality assurance test program.

Table 1 shows an example of reliability test program for plastiC encapsulated IC & LSI.

Table 1 TYPICAL RELIABILITY TEST PROGRAM FOR PLASTIC ENCAPSULATED IC & LSI

Group Test Test condition

1 Solderability 230'C, 5sec. Rosin flux Soldering heat 260'C, lOsec.

2 Thermal shock -55'C, 125'C, 15cycles Temperature cycling -65'C, 150'C, 100cycles

3 Lead fatigue 250gr, 90', 2arcs

Shock 1500G, O. 5msec.

20G, 100-2000Hz

4 Vibration X, Y,.Z direction

4min.lcycle, 4cycles/direction Constant acceleration 20000G, Y direction, 1 min.

5 Operation life T a= 125'C, Vccmax

1000hours 6 High temperature

T a= 150'C, 1000hours storage life

High temperature and

85'C ,85%, 1000hours 7 high humidity

Pressure cooker 121'C, 100%, 100hours

(26)

MITSUBISHI MICROCOMPUTERS

QUALITY ASSURANCE AND RELIABILITY TESTING

DESIGNI QUALITY

STAGE MARKET SALES PRODUCTION MANUFACTURING ASSURANCE

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• MlTSUBlSHI

"ELECTRIC

PRODUCTION CONTROL

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1-19

I

(27)

MITSUBISHI MICROCOMPUTERS

QUALITY ASSURANCE AND RELIABILITY TESTING

2.4 Returned Product Control

When failure analysis is requested by a customer, the failed devices are returned to MitsubishiElectric via the sales office of Mitsubishi using the form of "Analysis Re- quest of Returned Product"

Mitsubishi provides various failure analysis equipments to analyze the returned product. A failure analysis report is

FAILURE ANALYSIS

generated to the customer upon completion of the analysis.

The failure analysis result enforces taking corrective action for the design, fabrication, assembly or testing of the product to improve reliability and realize lower failure rate.

Figure 2 shows the procedure of returned product control from customer.

r - - - ,

CLASSIFICATION OF FAILURE MODES ACCEPTANCE

is

;::

() L1J

...,

...---;--I~

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Fig;2 PROCEDURE OF RETURNED PRODUCT CONTROL

1-20

~M~I

SURVEY OF PROCESS RECORD

(28)

MITSUBISHI MICROCOMPUTERS

QUALITY ASSURANCE AND RELIABILlry TESTING

3 RELIABILITY TEST RESULTS

The reliability test results for Mitsubishi Single-chip l6-bit Microcomputers are shown in Table 2.

Table 2 shows the result of endurance tests of high temper-

ature operation life and high temperature storage. life test and the results of the environment tests of thermal stress, high temperature/high humidity and pressure cooker test for the single-chip l6-bit Microcomputer.

Table 2 ENDURANCE and ENVIRONMENTAL TEST RESULTS

Test . Series Type Number Test Condition Number of Device Hours Number of

Samples (Hours) Failures M37702M2BXXXFP

M37702M4BXXXFP M37703M4BXXXSP

High Temperature M37720S1 AFP

MELPS 7700 M37730S2BFP 125t 7V 198 200000 0

Operation Life

M37730S2BSP M37732S4BFP M37702E2AXXXFP M37703E4AXXXSP High Temperature

MELPS 7700 ditto 150°C 198 200000 0

Storage Life Low Temperature

MELPS 7700 M37702M2BXXXFP

-55t 44 88000 0

Storage Life M37702E4AXXXFP

M37702M2BXXXFP M37702M4BXXXFP M37703M4BXXXSP

High Temperature M37720S1AFP

85°C85%RH

MELPS 7700 M37730S2BFP 198 200000 0

High Humidity Life

M37730S2BSP 5.5V

M37732S4BFP M37702E2AXXXFP M37703E4AXXXSP

Test Series Type Number

I

Test Condition

r

Number ofT Number of Failures

1

Samples f 96Hours

I

^240Hours

I

Pressure Cooker MELPS 7700 ditto

I

121tl00%RH

I

¹⁹⁸

I

⁰

I

⁰

I

Test Series Type Number Test Condition Number of Number of Failures

Samples 10Cycles

I

100Cycles Temperature

MELPS 7700 ditto -65°C 30min

198 0

I

⁰

Cycling 150t 30min

1-21

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MITSUBISHI MICROCOMPUTERS

'QUALITY ASSURANCE AND RELIABILITY TESTING

4 FAILURE ANALYSIS

Accelerated reliability tests are applied to observe failures casued by temperature, . voltage, humidity, current, mechanical stress and those combined stresses on chips and packages.

Examples of typical failure modes are shown below.

{1) Wire Bonding Failure by Thermal Stress

Figure 3, Figure 4 and Figure 5 are examples of a failure occured by high temperature storage test of 225°C, 1000hours.

Au-AI intermetallic formation, so-called "Purple plague" by thermal overstress makes Au wire lift off from aluminum metallization. The activation energy of this failure mode is estimated at approximately 1.0eV and no failure has been observed so far in practical uses.

Flg.3

Micrograph of lifted Au ball trace on AI bonding pad

Flg.4 Flg.S

Au-AI plague formation on bonding pad

Lifted Au wire ball base

(2) Aluminum Corrosion Failure by Temperature/Humidity Stress.

Figure 6, Figure ? and Figure 8 are examples of corroded failure of aluminum metallization of plastiC encapsulated IC after accelerated temperature/humidity storage test (pressure cooker test) of 121°C, 100%RH, 1000hours duration.

Aluminum bonding pad is dissolved by penetrated water from plastic package, and chlorine concentration is observed on corroded aluminum bonding pad as shown in Figure 8.

1-22

• ·MITSUBISHI

"'ELECTRIC

Fig.6

Micrograph of corroded Aluminum metallization

Fig.? Enlarged micrograph of c<;lrroded Aluminum bonding pad

Fig.8 CI distribution on corroded Aluminum bonding pad

(30)

MITSUBISHI MICROCOMPUTERS

QUALITY ASSURANCE AND RELIABILITY.TESTING

(3) Destructive Failure by Electrical Overstress

Surge voltage marginal tests have been performed to reproduce the electrical overstress failure in field uses.

Figure 9 and Figure 10 are examples of failure observed by surge voltage test. The trace of destruction is verified as the aluminum bridge by X-ray micro analysis.

Fig.9 Micrograph of surge

(4) Aluminum Electromigration

Figure 11 shows an open circuit of aluminum metallization in high current density region caused by accelerated operation life test. This failure is due to aluminum electromigration. Voids and hillock have been formed in aluminum metallization by high current density operation.

Fig.11 Voids and hillocks formation by Aluminum electromigration

5 SUMMARY

The Mitsubishi quality assurance system and examples of reliability control have been discussed. The customer's in- terests and requirements for high reliability IC & LSI are in- creasing significantly. To satisfy customer's expectancy.

Mitsubishi as an IC vendor, would like to make perpetual efforts in the following areas.

(1) Emphasis on built-in reliability at design stage and reliability evaluation to investigate latent failure modes and acceleration factors.

(2) Execution of periodical endurance, environment and mechanical test to verify reliability target and realize higher reliability.

(3) Focus on development of advanced failure analysis techniques. Detail failure analysis, intensive corrective action and quick response to customer's analysis re- quest.

(4) Collection of customer's quality data in q,ualification, incoming inspection, production and field use to improve PPM, fraction defective and FIT, failure rate.

Mitsubishi would highly appreciate if the customer would provide quality and reliability data of incoming inspection or field failure rate essential to verify and improve the quality/

reliability of IC & LSI.

• . MITSUBISHI

. . . . ELECTRIC

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MITSUBISHI MICROCOMPUTERS

PRECAUTIONS IN HANDLING MOS IC/LSls

A MaS transistor has a very thin oxide insulator under the gate electrode on the silicon substrate. It is operated by altering the conductance (gm) between source and drain to control mobile charges in the channel formed by the applied gate voltage.

If a high voltage were applied to a gate terminal, the insulator·film under the gate electrode could be destroyed, and all Mitsubishi MaS IC/lSls contain internal protection circuits at each input terminal to prevent this. It is inherent·

Iy necessary to apply reverse bias to the P·N junctions of a MaS IC/lSI.

Under certain conditions, however, it may be impossible to completely avoid destruction of the thin insulator-film due to the application of unexpectedly high voltage or thermal destruction due to excessive current from a forward biased P-N junction. Therefore the following recommendations should be followed in handling MaS devices.

1. KEEPING VOLTAGE AND CURRENT TO EACH TERMINAL BELOW MAXIMUM

RATINGS

1. The recommended ranges of operating conditions provide adequate safety margins. Operating within these limits will assure maximum equipment performance and quality.

2. Forward bias should not be applied to any terminal since excessive current may cause thermal destruction.

3. Output terminals should not be connected directly to the power supply. Short·circuiting of a terminal to a power supply having low impedance may cause burn·out of the internal leads or thermal destruction due to excessive current.

2. KEEPING ALL TERMINALS AT THE SAME POTENTIAL DURING TRANSPORT AND STORAGE

When MaS IC/lSls are not in use, both input and output terminals can be in a very high impedance state so that they are easily subjected to electrostatic induction from AC fields of the surrounding space or from charged objects in their vicinity. For this reason, MaS IC/lSls should be protected from electrostatic charges while being transported and stored by conductive rubber foam, aluminum foil, shielded boxes or other protective precautions.

3. KEEPING ELECTRICAL EQUIPMENT, WORK TABLES AND OPERATING

PERSONNEL AT THE SAME POTENTIAL

1. All electric equipment, work table surfaces and operat·

ing personnel should be grounded. Work tables should be covered with copper or aluminum plates of good conductivity, and ground~d. One method of grounding personnel, after making sure that there is no potential difference with electrical equipment, is by the use of a wristwatch metallic ring, etc. attached around the wrist and grounded in series with a 1M

n

resistor. Be sure that the grounding meets national. regulations on personnel safety.

2. Current leakage from electric equipment must be prevented not only for personnel safety, but also to avert the destruction of MaS IC/lSls, as described above. Items such as testers, curve·tracers and synchro·

scopes must be checked for current leakage before being grounded.

4. PRECAUTIONS FOR MOUNTING OF MOS IC/LSls

1. The printed wiring lines between input and output terminals of MaS le/lSls should not be close to or parallel to high-voltage or high-power signal lines. Turning power on while the device is short-circuited, either by a sol- der bridge made during assembly or by a probe during adjusting and testing, may cause maximum ratings to be exceeded, which can result in the destruction of the device.

2. When inputloutput, or input andlor output, terminals of MaS IC/lSls (now open·circuits) are connected, we must consider the possibility of current leakage and take precautions similar to §2 above. To reduce such undesirable trouble, it is recommended that an interface circuit be inserted at the input or output terminal, or a resistor with a resistance that does. not exceed the output driving capability of the MaS IC/lSI be inserted between the power supply and the ground.

3. A filter circuit should be inserted in the AC power supply line to absorb surges which can frequently be strong enough to destroy a MaS IC/lSI.

4. Terminal connections should be made as described in the catalog while being careful to meet specifications.

5. Ungrounded metal plates should not be placed near input or output terminals of any MaS IC/lSls, since destruction of the insulation may result if they become electrostatically charged.

6. Equipment cases should provide shielding from electro·

static charges for more reliable operation. When a plastic case is used, it. is desirable to coat the inside of the case with conductive paint and to ground it. This is considered necessary even for battery·operated equipment.

1-24

• MrTSUBISHl

"-ELECTRIC

(32)

MELPS 7700 16-BIT MICROCOMPUTERS

(33)

~ SINGLE-CHIP 16-BITI Enlarged

MITSUBISHI ~mm~

~ SEMICONDUCTORS U(!J(!J U