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Solidification of polycrystalline silicon ingots : simulation and characterization of the microstructure
P. Lay, G. Nouet, M. Coster, L. Chermant, J.L. Chermant
To cite this version:
P. Lay, G. Nouet, M. Coster, L. Chermant, J.L. Chermant. Solidification of polycrystalline silicon
ingots : simulation and characterization of the microstructure. Revue de Physique Appliquée, Société
française de physique / EDP, 1987, 22 (7), pp.549-555. �10.1051/rphysap:01987002207054900�. �jpa-
00245574�
Solidification of polycrystalline silicon ingots :
simulation and characterization of the microstructure
P.
Lay (*),
G.Nouet,
M.Coster,
L. Chermant and J. L. ChermantLaboratoire d’Etudes et de Recherches sur les
Matériaux,
ISMRa,Université,
14032 CaenCedex,
France(*)
Photowatt Int. S.A.,6,
rue de laGirafe, BP 5117,
14043 Caen Cedex, France(Reçu
le 20 novembre1986, accepté
le 13 mars1987)
Résumé. 2014 La
morphologie
du siliciumpolycristallin
obtenu par solidificationdirigée
est trèshétérogène
et ne peut pas êtreanalysée
par les méthodesglobales d’analyse quantitative d’images.
Par contre il estpossible
d’utiliser la fonction
P(l) qui
donne accès aux distributions de tailles en nombre,F(l),
et en mesure,G(l).
Les résultats obtenus sur une simulationd’apparition
de nouveauxgrains
à un stade donné de lacroissance,
ontpermis
de montrer que la pente àl’origine
de la distribution en nombre, F(l),
est très sensible àune
germination
secondaire.Abstract. 2014
Polycrystalline
siliconprepared by
directional solidification exhibits a veryheterogeneous morphology. Consequently
theglobal
methods ofquantitative image analysis
are notapplicable.
On the contrary, theP(l)
functiongives
access to the size distribution in numberF(l)
and inweight G(l).
For agiven
stage of thegrowth,
the effect of newgrains
was simulated and was seen tomodify markedly
the
slope
of thesize
distributions at theorigin.
Classification
Physics
Abstracts81.30 - 81.90F - 81.90
1. Introduction.
The most
important development
in silicon solar cells is due to the substitution ofmonocrystalline by polycrystalline
silicon in order to reduce the cost.Polycrystalline
silicon isprepared by
various tech-niques :
sheet or ribbongrowth, casting
or direc-tional solidification. Ribbon
technologies
have beenstudied most
widely and,
as may beexpected,
further
development
of thesehighly sophisticated
methods is very slow. In addition
equipment
forcasting
and directional solidification issimpler
andconsequently ingots (HEM, SILSO, POLYX, ...)
can now be
prepared effectively.
In the last few years, Photowatt Int. S.A. and Laboratoires de Marcoussis-C.G.E. have
designed
and
developed
the directional solidification ofpoly- crystalline
silicon(POLYX).
Thecapacity
of theinitial furnace was
about
1kg
andtoday,
50 to 60kg
of silicon can be melted and
crystallized.
The process has beenoptimized
to maintain the constantquality
and the
good reproductibility
of the microstructure.In such
microstructures,
thegrain
size may varyconsiderably
and thus classical and localparameters
used inquantitative image analysis [1]
are nolonger applicable.
The aim of this paper is to relate the
crystallization
conditions and the resultant
morphology using
quan- titativeimage analysis
with theP (1 )
function and simulation of nucleation.2. Method of solidification.
The method
used
is based onBridgman
method. Itconsists in
melting
the silicon in agraphite
crucibleusing
inductionheating furnace.
The crucible is well insulated to reduce heat loss. The lowerpart
of the insulation can be retracted.Crystallization
is initiatedby displacing
the bottominsulation of the furnace. No seed
crystal
is used. In order to maintain aplane solid/liquid interface,
theheating
power is maintained constant.The removal of the latent heat of
melting
at thebase of the furnace is controlled
by
the shift of theinsulation.
By controlling
these variousparameters,
it ispossible
to obtain thecrystalline quality required
for this material
[2, 3].
3. Microstructure and sélection of the
morphological parameters.
The directional removal of latent heat results in
Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/rphysap:01987002207054900
550
unidirectional solidification with a
typical
columnarstructure
(Fig. 1).
Fig.
1. - Structure colonnairecaractéristique
d’une solidi-fication unidirectionnelle.
[Typical
columnar structure foran unidirectional
sol-idification.]
The choice of
morphological parameters depends
on the mean size of the
grains
and theshape.
As canbe seen in
figures
2a and3a,
the solar cells showsimultaneously
small and verylarge crystals
ofirregular shapes.
In order toprevent
a bias in thequantitative
measurements, it is necessary to elimin-ate those
particles
which intersect the frame of measurements[1].
If one works at lowmagnification,
it is not
possible
to detect the smallcrystals
and thusto carry out measurements on them. On the other hand at very
large magnification,
thelarge crystals
cut the frame of measurements and are then eliminated. To avoid this scale
problem,
it is necess-ary to use certain
parameters
of mathematical mor-phology,
such as the functionP (1), [1, 4].
This function P
(l ) corresponds
to theprobability
of a
segment
1being
included in thegrain.
Thevariation in
length
of thisstructuring
element 1enables the
change
in the different size ofcrystals
tobe followed. The size distribution functions of the chord
length, 1,
aregiven by
thefollowing equations [5] :
with
F(l) :
the size distribution function of the chordlengths,
innumber,
G(l) :
the size distribution function of the chordlengths,
inweight,
P
(0) :
the value of the function P(l )
at theorigin, P’(l) :
the derivative of the functionP (1 ).
As an
example,
the functionP (1 ),
the size dis-tributions in number
F (1 )
and inweight G (1 )
aregiven
infigures 2b,
c, d and3b,
c, d. It can be seenthat the curve
G (1 )
takes better intoaccount
the effect oflarge crystals
on the size distribution.4. Materials.
Two
polycrystalline
siliconingots (POLYX)
werechosen to
present
thefollowing
results. Two solar cells(n°
5 and50),
45.mmapart
in the direction ofsolidification,
were taken from theingot
2020-9 witha
homogeneous
structure andanalysed (Fig. 2).
Three solar cells were taken from an other
ingot (1118-1)
with a moreheterogeneous
structure : n° 29 and n° 49 were 20 mmapart,
and n° 118 70 mmapart
(Fig. 3) (the
solar cells are numberedsuccessively
from the
top
to the bottom of theingots,
and forparallel
sections from outside toinside).
The function P
(1 )
is the measure of the intersectedaera between the
original grain
and itsimage
trans-lated
by
thestructuring element
1.5. Results.
Both size distribution curves in number
F (1)
and inweight G(l),
for the different solarcells,
confirmwell the
high degree
ofhomogeneity
of theingot
2020-9
(Fig. 2)
and also the variation in the mor-phology
of theingot
1118-1(Fig. 3).
Themorpho- logical parameters
measured aregiven
in table I.The distribution curves,
F (1)
andG(l),
have ageneral shape
similar to that observedpreviously [6].
The
slope
of the curves variesstrongly
from thevarious solar cells
analysed
of theingot
1118. It hasbeen established that the
slope
at theorigin
is afunction of the
angularity
of thegrains
and thenumber of small
grains [4, 5]. Consequently
for thesame
ingot
andtaking
into account the columnar structure of thegrains,
which ensuresessentially
thesame
grain shape,
theslope
at theorigin
is aprecise
measure of the number of the small
grains.
Thisparameter
can be then used to detectpossible secondary
nucleation which may occurduring
sol-idification.
6. Simulation.
Using
an automaticimage analyser
such as the Leitz-TAS,
it ispossible
to store the initial structure inFig.
2. -Lingot
2020-9/50 :a) Micrographie optique
du quart d’une cellulesolaire ; b) La
fonctionP(l) ; c)
Distribution de la taille en nombreF (l ) ; d)
Distribu-tion de la taille en mesure
G (1 ).
[Ingot
2020-9/50 :a) Optical micrograph
of the quarter ofa solar
cell ; b)
Function P(l) ; c)
Size distribution in numberF (l ) ; d)
Size distribution inweight G(l).]
552
Fig.
3. -Lingot
1118-1/29 :a) Micrographie optique
du quart d’une cellule solaire ;b)
La fonctionP (1 ) ; c)
Distribution de la taille en nombreF (1 ) ; d)
Distribu-tion de la taille en mesure G
(1 ).
[Ingot
1118-1/29 :a) Optical micrograph
of the quarter ofa solar cell ;
b)
Function P(l) ; c)
Size distribution in numberF (l ) ; d)
Size distribution inweight G(l).]
Fig.
4. -a)
Structure initiale enmémoire ; b) Implanta-
tion de
vingt
germes ;c)
Erosion depetits grains
de tailleéquivalente.
[a)
Initial structure in memory ;b) Implantation
of 20nuclei ; c)
Erosion of the smallgrains
withequivalent
size.]
554
Table 1. - Values
of the morphological parameters :
mean chord
length
inweight, mean
chordlength
innumber,
initial valueof
theslope
b at theorigin of
theG(l) function
and initial valueof
theslope
b at theorigin of the F(1) function for
thedifferent
solarcells analysed.
memory
(Fig. 4a)
and toimplant
in the structure anincreasing
number of nuclei of agiven
size. In orderto test the effect of
secondary nucleation
we haveonly implanted
a small number ofgrains.
Thus 20nuclei
implanted
in a field of measurement of2 300 mm2 correspond
to aconcentration
1.12 %(Fig. 4b).
It ispossible
to obtain new size distribution curves,G (1 )
andF (1 )
based on the modifiedstructure and also to
study
thechange
in the variousmorphological parameters, and,
inparticular,
theslope
at theorigin, b, using
theapproximation
y
= ax2 + bx + c.
The obtained values for the two
ingots
with nuclei added- 10,
20 and 40 - aregiven
in table II. It canbe seen that a reduction in the mean chord
length
Table II. : Values
of
the samemorphological
para- meters than in table Iafter implanting
several nuclei n.takes
place
withincreasing
the number of nuclei.The
slope, b,
increasesmarkedly
withincreasing
thenumber of additional nuclei. This was observed for the different solar cells studied. It is therefore
a parameter
very sensitive to the presence of new smallcrystals.
Since these
experiments
were carried out on realsolar
cells,
we have made the reverseoperation,
i.e.eliminating (by erosion)
thegrains
ofequivalent
sizeto those
implanted, taking
care to reconstruct the zone eroded toprevent
the formation offictitious
pores. This
is
shown infigure
4c and the results aregiven
in table III. Arelationship
between thechange
in the
slope at
theorigin
and theproportion
of smallgrains
eliminated can then be determined.Table III. - Values
of
themorphological
parametersafter
an erosionof
size 3(the grains
with a size smaller than 3 areeliminated) for
thedifferent
solar cells ana-lysed. In
our case size 3 isequivalent
to 1.2 mm.7. Discussion and conclusion.
Based on the results
presented
it can be seen thatcertain
parameters
of mathematicalmorphology
well describe the
morphology
ofpolycrystalline silicon, despite
the effect of scale which isalways present. The slope
at theorigin
of the distributioncurve in
number, F (1 ),
is aparameter
verysensitive
to the presence of small
grains, providing
that thegrains
have more or less the sameshape
from onesolar cell to the other. The measurement of the
slope
at the
origin
can therefore be used to detect second-ary nucleation
during
solidification ofpolycrystalline
silicon
ingot.
Thus in the case of theingot
2020-9with
homogeneous microstructure,
the results pre- sented show the presence of thebeginning
of asecondary nucleation,
theslope changing
very little between solar cells n° 5 and 50. On the other hand in the case ofingot
1118-1 with a veryheterogeneous microstructure,
thestrong
decrease inslope
at theorigin
for solar cells n°29,
n° 49 and then n° 118 shows that there wasappreciable secondary
nu-cleation.
The
slope
at theorigin
of the size distributioncurves in number is therefore a
parameter
which takes into accountchanges
insecondary
nucleationand which is very sensitive to the presence of small
crystals.
It is aparameter
which can therefore be used in studies of nucleation and solidification ofmetallurgical
or ceramicstructures,
to better under- stand the mechanisms of solidification.References
[1] COSTER, M., CHERMANT,
J. L., Précisd’Analyse d’Images (Ed. CNRS)
1985.[2] FALLY,
J.,GUIGNOT,
D.,Symposium
onPoly-micro- crystalline
andamorphous semiconductors,
E-MRS,
June1984, Strasbourg (France),
ed.by
P.Pinard,
S. Kalbitzer(Ed.
dePhysique,
lesUlis) 1984, p. 199.
[3] LAUVRAY,
H.,LAY,
P.,NOUET, G., DONON,
J., Proc. ofthe
VIthEuropean
Photovoltaic SolarEnergy Conference, April 1985, London
(England) (Ed. by
D.Reidel,
Publ.Company) 1985,
p. 901.[4] SERRA,
J.,Image Analysis
and Mathematical Mor-phology (Academic Press)
1982.[5] MATHERON, G.,
Eléments pour une Théorie des Milieux Poreux(Ed. Masson)
1967.[6] CHERMANT,
J. L.,COSTER,
M.,LAY,
P.,NOUET, G.,
IVth