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To cite this version :
Philippe STEMPFLE, Aurélien BESNARD, Nicolas MARTIN, Anne DOMATTI, Jamal TAKADOUM
- Accurate control of friction with nanosculptured thin coatings: Application to gripping in
microscale assembly - Tribology International - Vol. 59, p.67–78 - 2013
gripping in mi ros ale assembly PhilippeStempé
a)
,AurélienBesnardb)
,Ni olasMartina)
,Anne Domattia)
,JamalTakadouma)
a)
InstitutFEMTO-ST(UMRCNRS6174-UniversitédeFran heComté-CNRS-ENSMM-UTBM),ENSMM26
Chemindel'Epitaphe,F-25030BesançonCedex,FRANCE
b)
LaBOMaP,ArtsetMétiersParisTe h deCluny,RuePortedeParis,F-71250 Cluny,FRANCE
Abstra t
ChromiumthinlmsweresputterdepositedimplementingtheGLan ingAngleDeposition(GLAD)method,
whi his athin lmdepositionte hniquewhere thein identvaporux - omposed ofatoms andmole ules
from gas phase- strikesonto thesubstrate at tilted angles
α
. Oriented hromium olumns were produ ed withvarious olumnanglesβ
(from0to60°) loselylinkedtothesputteringpressureandin iden eangleα
. Three sputteringpressuresof 0.11,0.40and0.53Pawereused. In iden eangleα
ofthesputteredparti les wassystemati ally hanged from 0to 80°. Tribologi al propertieswere investigated as afun tion of theseoperatingparameters. Resultsrevealthatthetribologi albehaviourisstrongly orrelatedwiththestru ture
and espe ially the growth me hanism of the lms, whi h are both linked with the operating sputtering
parameters. Thus,atthelowestsputteringpressure(0.11Pa),gradualvariationsofthetribologi alproperties
andwettabilityareobservedasafun tionofthein iden eangle
α
,whi hareinterrestingfortailoringsurfa es displayingagradientofwettability. In ontrast,athighersputteringpressures(>0.2Pa),lo alvariationsofstati fri tion oe ient, wettability andlateral onta tstiness are systemati allyobserved asafun tion
ofthe olumnangle
β
-andthenthein iden eangleα
. Basi ally,theseresultsenabletotailortribologi al properties by tuning the in iden e angleα
in order to ontrol the transition from sti king to sliding in mi ro-gripping.Keywords: MEMS,fri tion ontrol,nanos ulpturedthin oatings,mi ro-gripping,
1. Introdu tion
Inmi roassembly, two approa hes are urrently onsidered [1℄: (i) theself-assembly paradigm[2, 3, 4℄
in whi h surfa e ee ts are used to organize and assemble stru tures mainly up to a few mi rometers,
and (ii) the mi roroboti assembly [1, 5℄, based on the miniaturization of the a tuation, high resolution
mi romanipulatorsandgrippingdevi es(Fig. 1a),morededi atedtomesos opi sized omponents(between
a few mi rometers and a few millimeters). This one is well suitable for assembling MEMS omponents
where the main hallenging issues on ern the handling of small omponents (mainly down to about 10
µm). Currentresear h in this eld in ludes: (i) the development of new strategies to pi k up, to handle,
and to releasemi ro- omponentsasfor instan e mi roassembly in dry and liquid medium [6℄; and (ii) the
developmentof newtypesof surfa es [7,8,9,10, 11, 12,13℄, whi h would enableto ontrolseparately the
various omponentsoffri tiono urredin drymediummi roassembly. Inthisframework,whereasadhesive
omponents [14, 15, 16, 17℄ and apillary ee ts [1, 11, 13, 18℄ (see Fig. 1b) are generally ontrolled by
grafting self-assembly mole ules on grippers in order to redu e their surfa e tension [15, 19℄, me hani al
omponentsoffri tion-i.e stati anddynami fri tion oe ientsandespe iallystati todynani oe ient
ratio- ouldbe ontrolled bymeansofhighlyporousnanos ulpturedthinlms(Fig. 1 )purposelytailored
to a hievedesiredtribologi alproperties[9,13,20,21,22,23℄.
Emailaddress: philippe.stempfleens2m. fr(PhilippeStempé
a)
,AurélienBesnardb)
,Ni olasMartina)
,Anne Domattia)
,JamalTakadouma)
)(b) apillaryee tsinmi ro-assembly:thehandledobje tremainsstu konthebaremi rogripper;( )nanos ulpturedthinlm
thatis oatedonthegripper'sngers anpreventthese apillaryee ts,andmoreoveritenablesto ontrolthetransitionfrom
sti kingtoslidingbytailoringitsmi roar hite ture
GLan ingAngleDeposition (GLAD)method=rstreportedin 1959[24℄andlaterbyRobbieetal [25℄
= is an attra tive physi al vapour deposition method to fabri ate omplex1D, 2D or 3D nanostru tured
olumnarthin lms[26, 27, 28℄in luding nanopillars[23, 27, 28, 29, 30℄, zigzagnano olumns [20, 31℄, and
nanospirals[32℄. Thismethodisbasedonthe hangeoflo ationofthevapoursour erelativetothe olumns
duringgrowth. Basi ally,thesour eisnotmovedbutratherthesubstrate,whi h anbetiltedor/androtated
alongits entralaxis(Fig. 2). Thus,twodegreesoffreedom anbeadjusted: (i)arotationaxisatanangle
α
, whi h allows to vary the in iden e angle of the parti les ux, and (ii) a rotaryaxisat an angleφ
also alled azimuthalangle, whi h indire tlymodies theposition oftheparti lessour e. TheGLADte hniquetakesadvantageof the shadowingee t reated by atilted substraterelative to thenormal in iden e and
a hange ofthe material ux througharotationof thesame substrateduring thedeposition. As aresult,
byfavouringthedire tionalgrowthofthe olumns and ontrollingtheirstru ture,itis possibleto produ e
various kindsofnanoar hite ture(Fig. 3) displayingawideningspe trumofphysi o- hemi alpropertiesof
materials in ludingtheirstateofstress [29, 33,34℄, density[35℄, opti al[22℄, ele tri al [35℄and me hani al
behaviours[23,28,30,32℄. Besides,topography[22,27,36,37℄andwettabilityoflms analsobe ontrolled
bytheoperatingparameters-i.e sputteringpressure,in iden eangle
α
and olumnangleβ
.So, the aim of this work is to study how these operating parameters an inuen e the stru ture, the
density, theme hani al properties and nally thetribologi al propertiesof GLAD lmsunder low onta t
pressure(150 MPa) and low velo ity (0.1mm/s) asmetin lassi almi roassembly grippers[1, 5,38℄. For
this purpose, hromiumthin lms(thi knessabout850nmandRMS: 8.7
±
3.6nm)weresputterdeposited implementing the GLAD method on sili on wafers by varying boththe sputtering pressure (from 0.11to0.53 Pa) and the in iden e angle
α
of the sputtered parti les from 0 to 80°. Oriented hromium olumns were produ ed with various olumn anglesβ
(from 0to 60°) losely linked to the sputteringpressure and in iden eangleα
. Notethatthepanelofar hite turesprodu edbyGLADmethodisnotsolelyrestri tedto metalli ompounds,but erami s[39℄,andsemi ondu ting[40℄oralloyedmaterials[41℄ anbegrown. Thus,hromiumallowsthe synthesizeof attra tive ompounds forme hani alperforman es, espe ially metalloid
materials su h as some hromium nitride phases
CrN
orCr
2
N
. However, in this work, pure hromium lms was preferred to alloyed materials orother omplex ompounds be ause the sputtering me hanismsof parti les are largely simplied and easier to simulate in order to understand the possible relationships
vapour sour e ona substrateholder, whi h anbetilteda ordingtoan angle
α
ompared to the normaltothe substrate. Moreover,it anbeanimatedbyarotationφ
alonganaxis entredonthesubstrate.Figure3: ObservationbySEMofthe rossse tionof: a)in lined;b)zig-zag; )heli al olumnarstru tureof hromiumlms
2.1. Deposition ofthe nanos ulptured hromiumthinlms
Chromiumthinlmsweredepositedon(100)sili onsubstratesbyd magnetronsputteringfrom hromium
metalli target (purity 99.7 at.%). The metalli target was sputtered with a onstant urrent density
J
Cr
= 200 A.m
−2
in argon atmosphere. The substrates were grounded and kept at room temperature. Argonmassowratewasset onstantinordertorea hasputteringpressureof0.11,0.40or0.53Pa(pump-ingspeedwasmaintainedatS =10
L.s
−1
). Thedepositiontimewasajusted inordertodeposita onstant
thi kness loseto900nm. Thislatterwas he kedafterdeposition byprolometry. Thehome-madeGLAD
substrateholderallowedanorientation hangeofthein iden eangleoftheparti lesux
α
from 0to90°. 2.2. Thin lms hara terization2.2.1. Stru tureanddensity
The rystallographi stru turewasinvestigatedbyX-raydira tion(XRD)usingmono hromatized
CoK
α
radiationwith aBragg-Brentano ongurationθ/2θ
. TheDebye-S herrer methodwasusedto al ulatethe rystallitegrainsize. Columnangleβ
wasmeasuredfrom s anningele tronmi ros opy(SEM)observations onthefra tured ross-se tionofthelmsdepositedonsili onsubstrates. Densityofthelmswas al ulatedasafun tionof thein iden eangle
α
ofthesputteredparti ulesandforthethree dierentpressuresusing Paik'srelationships[44℄. Densityξ
oforientedthinlmsprodu edbyGLAD, anberelatedtothein iden e angleα
oftheparti lesuxby:ξ =
ξ
α=0
°1 + c tan (α)
(1)where
ξ
α=0
°isthedensityofthelm(
kg.m
−3
)
depositedatanin iden eangle
α = 0
°andc
isa onstant, whi hisproportionaltotheratiooftheshadowingstepheighttothe olumnthi kness. Atrst,wesupposethatthedensityofthebulkmaterial
ξ
0
isthesameasthedensityofthelmdepositedatanin iden eangleα = 0
° (i.eξ
0
= ξ
α=0
). Parameterc
depends on thenature of thesputtered materials andthe deposition onditions,espe iallythesputteringpressure. Films'densityvs. in iden eanglewas omputedforthethreeinvolvedpressure: 0.11,0.40and0.53Pa(Fig. 4).
An abruptdropofthe density anbenoti edfor in iden eangleshigherthan60°where theshadowing
ee tattheatomi s alebe omessigni ant. Forgrazingin iden eangles(
α > 80
°)
,ahighporousstru ture is obtainedsin ethe density ofthelmis fewtens% ofthe bulk. Consequently,to getsomeknowledge ofthe lm's density, evolution as afun tion of the in iden e angle
α
allows some lose orrelations between stru tural hara teristi s(e.g. thegrowthofaporousar hite ture)andtuneableme hani al[28℄orele tri alproperties[35℄.
2.2.2. Topographi al analysis
Thinlms exhibit self-ane properties in a ertain range of s ales[36, 37, 45℄. Self-anity is a
gener-alization of self-similarity, whi h is the basi property of mostof thedeterministi fra tals [46℄: apart of
self-ane obje tis similar to whole obje t after anisotropi s aling. Thus, manyrandomly rough surfa es
areassumedtobelong totherandomobje tsthatexhibittheself-aneproperties[47,48℄. Fra talanalyses
of the self-ane random surfa es using AFM or prolometer are often used to study and ompare these
surfa es,whi hhavethesamethi knessandroughness[37, 49, 50,51℄.
Dierentmethods offra talanalysis arereported in theliterature[16,18, 37,45, 46, 48,49, 50,51, 52,
53, 54℄. Ea h one displays its systemati error but results obtained by any method provide informations
aboutthedegree of omplexity orfragmentationof thesurfa es [45℄. However, themeasurementa ura y
anstronglybeae tedbythe hosenmethod[49℄. Thus,in thiswork,fra taldimension(
D
f
)is omputed by using a ube ounting method [37, 49℄ -implementedwithin theSPM data analysissoftware Gwyddion(http://gwyddion.net) - whi h is dire tly derived from the well-reliable box- ounting approa h [48℄. The
algorithm is based on the following steps: a ubi latti e with latti e onstant
l
is superimposed on the z-expandedsurfa e. Initiallyl
issetatX
2
(whereX
islengthofedgeofthesurfa e),resultinginalatti eof8 ubes. ThenS(l)
isthenumberofall ubesthat ontainatleastonepixeloftheimage. Thelatti e onstantPaik'smodelfordierentsputteringpressures[44℄
l
isthenredu edstepwisebyfa torof2andthepro essrepeateduntill
equalstothedistan ebetweentwo adja entpixels. Theslopeofaplotoflog(S(l))
versuslog(
1
/
l
)
givesthefra taldimension
D
f
dire tly(Fig. 5a).Sin e resultsof fra tal analysis an strongly beinuen ed by the tip onvolutionof the AFM analysis
(Digital Instruments Nanos ope III Dimension 3000), this one was he ked beforehand [49, 51℄. Besides,
fra tal's results were also ompared on largers ales by using a phaseshifting interferometri prolometer
ATOSMICROMAP570 (
λ
=520nm,spatialandverti alresolutionsare0.5µmand0.02nm,respe tively) in orderto omputethesystemati error: around3%. (Fig. 5b). FinallyaveragevalueofD
f
was omputed from data ompiledfromthewholeAFMandinterferometri pi tures.2.3. Nanotribologi al setup
Inthiswork,tribologi alexperimentsare arriedoutformodellingthetwo riti alstepsofmi rogripping
(i.e., pi k-upandrelease,respe tively)whensliding and/oradhesiono urbetweenthehandledobje tand
the gripper [1, 38 ℄. So, the experimental devi e is a ball-on-dis nanotribometer manufa tured by CSM
Instruments (Switzerland) [55℄. Fig. 6 displays the link between the mi rogripping (Fig. 6a) and the
tribologi al test (Fig. 6b): (i) the gripper is modelled by the atsample, whi h is oated by the various
GLAD lms; (ii) thehandled obje t is modelled bya
Si
3
N
4
ball whi h is gluedon the pin. Besides, the latteris mountedonasti lever(Fig. 6 ), designedasafri tionlessfor etransdu er(Kx =265.1Nm -1 ;K z =152.2 Nm -1
). During thetest, theballis loaded ontotheat samplewithapre isely known for e using
losed loop. Thefri tionfor e isdeterminedbymeasuringthedee tion oftheelasti arm(lowloadrange
downto50µN).Theloadandfri tionresolutionsareabout1µN.
AsshowninFig. 7,thenanotribometerissetwithinagloveboxinorderto ontrolboththetemperature
(22°C) andtherelativehumidity(RH35%) andso,anyadditional apillary ee tsthat ouldo urduring
thetests. Thenormalload(10mN)andtheball'sdiameter(
φ 4 mm
)area urately hosenforlimitingthe onta tpressureat 150MPa,whi hisusuallymetinmi rogripping[e.g.,1℄.Alltestsare arriedoutinlinearre ipro atingmodebothin thedire tionparallel andperpendi ular
to the orientation of the olumns, with and against the tiltaxis of the olumns, in orderto noti eany
ee tofthe olumnangleonthefri tionbehaviour. AsreportedinFig. 8,twokindsoftestsare arriedout
Figure5: Examplesofthefra taldimensionassessmentsfor hromiumlmsdepositedwith
α
=
80°andsputteringpressureof 0.11Pa arriedouton(a)anAFMmap(1µm):D
f
=2.21and(b)aninterferometri prolometermap(320µm):D
f
=2.28Figure6: Linkbetweenthemi rogrippinggeometry(a)andthenanotribologi altest(b): Thegripperismodelledbytheat
sample oatedbytheGLADlm;thehandledobje tismodelledbytheballgluedonthe antilever( )
Figure8:Tribologi altests: a)ingrossslipregimeformeasuring
µ
s
andµ
d
onthewholeof y lesb)inabsen eofsliding,the assessmentoftheslopeofF
T
= f (δ)
whenδ < a
(witha
,thehertz onta tradius)givestheaveragelateral onta tstinessk
L
(i)Whentheos illationamplitudeis greatlyhigherthanthe onta tradius(i.e
δ
±0.5 mm),agross slipregimeisobserved(Fig. 8a)leadingtoassessboththeaveragestati (µ
s
)anddynami (µ
d
)
fri tion oe ient,andalsotheratioµ
s
µ
d
parti ularlyinterestingto ontrolthetransitionfromsti kingtosliding
inmi roassembly. Theaveragevalueoffri tion oe ientsare omputedby onsideringallthe y les
ofthetribologi altests. Besides, possiblewear analsobeassessed. Forthiskindoftest, thesliding
velo ityandthenumberof y lesare: 0.1mm.s -1
and10 y les,respe tively.
(ii)Whentheos illationamplitudeislowerthanthe onta tradius(
δ
±10µm),noslidingiso urred (Fig. 8b). So, the oatingis just submittedto ashear test, that enablestoassess thelateral onta tstiness asreportedbyMindlinetal [56℄. Thevariationsofthelatterwiththesputteringparameters
(in iden eangle
α,
sputteringpressure)provideinformationsabouttheme hani alpropertiesoflms. Thelateral onta tstiness istheslopefromthefri tionfor evs. displa ement(Fig. 8b). Inthis asethevelo ityandthenumberof y lesare5
µm.s
−1
and10 y les,respe tively.
3. Resultsand dis ussion
3.1. Morphology andstru tureofGLAD thinlms
As expe ted by thestru tural zone model proposedby Thornton[57℄, lmsdeposited a ordingto our
deposition onditions and with a perpendi ular in iden e of the parti les ux (
α = 0
°)
exhibit a typi al olumnar mi rostru ture. This kind of morphology orresponds to the transition zone of the Thornton'smodelsin ethesputteringpressurewas0.11,0.40and0.53Paandthesubstratetemperaturewasafewtens
ofthe hromiummeltingpoint(2173K).Columns onsistofinverted one-likeunits appedbydomes. Films
produ edwiththeseoperating onditionsappearasaquitedensestru turewith olumnswidth loseto100
nm. Theyaremoreorlessseparatedbyvoidedboundariesthatarefewnanometreswide. Asimilar olumnar
stru ture wasprodu ed forlms preparedat sputteringpressureof 0.11, 0.40and 0.53Pa. In reasing the
in iden e angle
α
of the parti les ux, in lined olumns be ome separated and a mu h moreporous and brousstru tureisprodu edasthein iden eangleα
in reasesandthesputteringpressureredu esdownto 0.11Pa. Itisalsoworthofnoti ingthatthe olumn angleβ
isinuen edbythesputteringpressure(Fig. 9 ).Asthein iden eangle
α
tendsto90°,the olumnangleβ
asymptoti allyrea hes24°for0.53Pawhereasβ
tendsto35° for0.40Paandβ
rea hes60°for0.11Pa. Thus,forthethree sputteringpressures,β
versusα
well follows the empiri al tangent rule (tanα = 2 tan β
) up to an in iden e angleα
lose to 60°, as ommonlyobservedforseveral ompounds[58℄. Afterwards,asaturationofthe olumnangleβ
o urs. Itis mainly attributedto themeanfreepathofthesputteredparti lesand thesputteringemission(the angularFigure 9: Evolutionof the olumn angle
β
vs. in iden eangleα
in hromium thinlms deposited by sputtering for three dierentargonpressures. Columnangleβ
saturates loseto24and35°forsputteringpressureof0.53and0.40Pa,respe tivelyFigure10: Typi alSEMviewsofthe fri tiontra kafterslidingforthreesputteringpressures: (a)0.11 Pa,(b)0.40Paand
( )0.53Paandforthesamein iden eangle
α
= 75
°(horizontalslidingdire tion)to the target material. Due to enhan ed ollisions between sputtered parti les and argon atoms, ux of
hromiumatoms impinging on the growing lm be omes less dire tional[60℄. Theangular distribution of
sputtered hromium in oming from the target surfa e is spreadleading to a more randomizedux rather
thanpureballisti and onsequently,asaturationofthe olumnangle
β
( f. 3.6). 3.2. Tribologi al propertiesof GLAD thinlmsin grossslip regime3.2.1. Evolutionof theaverage dynami fri tion oe ientwith the sputteringparameters
In ontrast to what waspreviously observedby Abreu et al [21℄ and Lintymer et al [34℄ on hromium
GLADlmsinmi ro-andma rotribologi altests,respe tively,theinitial olumnarstru tureisnotdamaged
after sliding using amulti-asperity nanotribometer (Fig. 10). So, theadhesion and the ohesion of these
lmsarestrongenoughto sustainthe onta tsoli itations-150MPa-whateverthe oating onditions.
Fig. 11 shows the evolutionof the average dynami fri tion oe ient (
µ
d
) vs. the in iden e angleα
for thedierent argonsputteringpressures. Forthe lowestpressure(0.11Pa),µ
d
abruptly in reaseswhen the in iden eangle ishigher than50°. In onstrastfor thehighestargon pressure(0.53Pa),µ
d
displaysa minimum for in iden e anglesin-between 20and 40° revealing a bowl shapearound these values. Forthemediumsputteringpressure(0.40Pa),
µ
d
showstwomaxima(about0.32)for20°and55°respe tively,whi h reveal some kind of lo al ee ts probably indu ed by ne variations of the stru ture. As an unexpe tedFigure11:Variationsoftheaveragedynami fri tion oe ientvs. in iden eangle
α
forthethreeargonsputteringpressuresresult, no dieren e is observed in the tribologi al behaviours arried out in the dire tion parallel and
perpendi ular totheorientation ofthe olumnsasreportedby[23, 61℄. However,theseauthors useda17
µm radius diamondindenter tip asa slider - ommonly used in nanoindentation test - whi h is probably
more sensitivebut also more destru tive than ours (2 mm radius
Si
3
N
4
ball). In the sameway, there is no real dieren e between tribologi al tests arried out with and against the tilt axis of the olumns.This isprobablydue tothesize ofthe onta tarea,whi h ismu h moreimportantthanboththe olumns
size and the distan e between the olumns. Hen e, the onta t in multi-asperity nanotribology appears
quiteinsensitivetotheindividual orientationofthe olumns. Indeed,asreportedbymanyauthorsworking
on GLADmethod [62, 63, 64℄, obtainingsurfa etopographieswithoutsto hasti and non-separatesurfa e
features isthe main hallengeof thiste hnique. However,arouteto bypassthisissue ouldbeto reatea
seeded layerof known density and heightprior to the GLADdeposition [27℄. So, in our ase, the olumn
orientation
β
doesnotappearas thedriving for e that ontrols the hange in thefri tion behaviour. But, referringtomanyauthors[eg. 7℄,thelms'density-andmoreparti ularlythelms'porosity-areprobablythemainones.
Whentheerrorbarsappearto belowenough-asobservedin Fig. 11-apseudo3D-map-asshownin
Fig. 12-willbeusedinsteadofthe lassi al2Dviewinorderto onsiderboththesputteringpressureand
thein iden eangle
α
(Fig. 12a)orthe olumnangleβ
(Fig. 12b). Thusthe omparisionofFig. 12andFig. 4revealsthat thein rease ofµ
d
startingfrom 45° and55° (for0.11Paand 0.53Pa,respe tively) strongly orrespondsto thedropof thelms' density down to 93%. Inthe sametime, theminimunofµ
d
observed in-between20° and50° (Fig. 11at 0.53Pa) greatly orrespondsto the zonewhere the lm'sdensitystaysonstant(Fig. 4). Thus,
µ
d
appearsasaparameterthatisverysensitivetoany hangeinthelms'density asabulkparameter.However,inmi ro-grippingthestati fri tion oe ientandmoreparti ularlythetransitionbetweenthe
stati anddynami fri tion oe ienthasprobablyagreaterimportan ethanthedynami oneonly.
3.2.2. Evolutionof theaverage stati fri tion oe ientwiththe sputteringparameters
Fig. 13showsthepseudo3D-maps oftheaveragestati fri tion oe ient
µ
s
omputedfromthewhole of y les (10 y les ba k and forward). Overall,µ
s
has the same global behaviour thanµ
d
with respe t to the operating parameters. Neverthelessit denitely appears moresensitive than thelatter to anylo alFigure12:Pseudo3D-mapsdisplayingtheevolutionoftheaveragedynami fri tion oe ient
µ
d
asafun tionofthesputtering argonpressureand(a)thein iden eangleα
and(b)the olumnangleβ
tribologi alvariationslinkedto lowvariationsin thesputteringparameters. Thus,
forthelowestpressure(0.11Pa),
µ
s
is rather onstantuntilα = 50
°and stronglyin reaseswhenthe lm'sdensitydropsasreportedforµ
d
; whentheargonsputteringpressurein reasesfrom0.11to0.53Pa,thereare olumnangles
β
(Fig. 13b) whereµ
s
displays amaximum(µ
s
≃
0.5 at0.40 Pa) oraminimum (µ
s
≃
0.17 at 0.53Pa). Besides, aroundthese latter,µ
s
an bestrongly modied- i.e multiplied ordividedbyafa tor 2-whenβ
is shiftedto±
5
°( orrespondingtoashiftofα
around10
°asshownin Fig. 13a).Thus, for thelowest sputtering pressure, the behaviour of the stati fri tion oe ient is the sameas the
dynami one-i.e ontrolled bythelms'sdensityasabulkproperty. But, foragivensputteringpressure
higherthan0.11Pa- orrespondingtoa hangeinthesputteringme hanismfromapureballisti toamore
randomisedone( f. 3.1)-thestati fri tion oe ient ana uratelybe ontrolledbyadjustementofthe
in iden eangle
α
. Sin ethedynami fri tion oe ientislesssensitivethanthestati one,itisalsopossible to adjust theratioµ
s
µ
d
bytuning
µ
s
that allowsto a urately ontrol thetransition fromsti king tosliding byavoidingthesti k-slip o urren e[65℄and its onsequen es onthefri tion[66℄ andwearbehaviours[67℄.Forexample, Fig. 14 showstwo dierent aseswhere the sti k-slip o uren e is ompletely avoided when
µ
s
= µ
d
(at0.40Paandα = 5
°orα = 35
°)orwhenthesti kingisfavouredovertheslippingwhenµ
s
≫
µ
d
(e.g.µ
s
> 2.µ
d
at 0.40Paandα = 45
° orα = 75
°). Hen e,tuneabletribologi alproperties aneasilybe obtainedinmi ro-grippingbyusing suitablesputteringoperatingparameters.However,in onstrasttowhat isobservedfor
µ
d
(Fig. 4and 12),theevolutionofµ
s
withtheoperating parameters an not be dire tly explained by onsidering the lms' density only. Indeed, Fig. 13a is notdire tly omparablewithFig. 4asreportedfor
µ
d
. So,it isne essaryto remindthephysi aloriginsofthe stati oe ienta ordingtotheliterature:µ
s
originatesfromthestati real onta tarea ontrolledbythe physi o- hemi alpropertiesof thesurfa es, in ontrasttoµ
d
, whi h is mainly governedby theme hani al propertiesat thes aleofthemi ro-asperitiesin ludingelasti ity,stinessandinertiaofthe onta t[18℄. Inorderto understandtherelationshipbetweenthestati oe ientbehaviourandtheoperatingparameters,
thephysi o- hemi alandme hani alpropertiesofGLADlmswillbestudiedsu essivelyusing(i)wettability
[15,18, 38℄andfra taldimension assessment[36,37,45,47,48,68,69,70℄ontheonehand,and (ii)lateral
onta tstiness measurementontheotherhand[56℄.
3.3. Wettability - Evolutionof the onta tangle of awaterdrop withthe sputteringparameters
Fig. 15 showsthevariationsof the onta tangle
θ
ofawaterdropasafun tion ofthein iden e angleFigure13: Pseudo3D-mapsdisplayingtheevolutionoftheaveragestati fri tion oe ient
µ
s
asafun tionofthesputtering argonpressureand(a)thein iden eangleα
and(b)the olumnangleβ
Figure14: 3D-mapdisplayingtheevolutionoftheratio
µ
s
µ
d
asafun tionofthesputteringargonpressureandthein iden eangle
α
. Thismapisveryusefultopredi ttheoperatingparameters(i)toavoidanysti k-slipphenomenon-e.g. whenµ
s
= µ
d
for 0.40Pa,α
= 35
°-oronthe ontrary,(ii)tofavoursti kingoverslippingwhenµ
s
≫
µ
d
(e.g.0.40Pa,α
= 75
°whenµ
s
>
2.µ
d
)Figure15: Variationofthe onta tangle
θ
ofawaterdropvs. in iden eangleα
forthethreesputteringpressures(
θ > 90
°)
in ontrasttotheinitial hromiumtarget,whi hishydrophili (θ = 49.1
°±
0.6
). Thus,the onta t angleθ
ofawaterdrop-and onsequentlytheunderlyingadhesive ontributionoffri tionduetothe apillary ee ts -seemsto be ontrolled bythenanostru turationofthesurfa es[7,71,72℄. Inour ase,the onta tangleofthewaterdrop learlydependsonthesputteringpressure:
forthehighestpressures(0.53Pa)the onta tangleisrather onstant(about117°);
in ontrastforthelowestpressure(0.11Pa),the onta tangle ontinuouslyin reasesfromahydrophili
behaviour to ahydrophobi one. A lineartrend is evennoti ed with agood orrelation oe ient (r
=0.99)revealinganenhan ementofthehydrophobi behaviourwiththein iden eangle
α
. However, the onta t angle does not evolve anymore for the highest in iden e angles. This result is in goodagreementwiththetheoriesproposedsu essivelybyWenzel(1936)andCassie-Baxter(1944)in order
to explain thewettabilityof heterogeneous surfa es [7, 9,10, 71, 72℄. This saturation value(around
125°)isprobablyduetotheshadowingee t attheatomi s aleasmentionedin2.2.1.
As reported in Fig. 16, the evolution of the water drop onta t angle
θ
as a fun tion of the operating parametersrevealsthatthewettabilityvariesaswellasthelms'density(Fig. 4)leadingto the on lusionthatthevariationsofthe onta tangle
θ
isdire tly ontrolledbythelms'porosity-des ribedasairpo kets, whi hareableto ontrolthewaterdropletspreadingout[7℄.However,thesize ofthewaterdropbeinggreatlylargerthanthestati real onta tarea,thevariations
of the onta tangle
θ
asa fun tion of thelm's density arenot really a urateenough to explainthat ofµ
s
. Hen e,ana urateexperimental assessementofthe oatings'densityisneeded. Thefra tal dimension isoneofthembe auseitprovidesa urateinformationsaboutthedegreeoffragmentationofthesurfa es.3.4. Evolution ofthe fra taldimension with the sputteringparameters
For thin oatings, the fragmentation of the surfa es is strongly onne ted to the degree of porosity of
these ones: themore thesurfa e is fragmented, the higheris the fra tal dimension (
D
f
in-between2 and 3). Thus,aswettability,fra taldimension shouldberepresentativeofthelm'sporositybutwithagreatersharpness due to thetopographi assessment te hnique -i.e AFM and interferometri prolometry -more
Figure16: Pseudo3D-mapsdisplayingtheevolutionoftheaverage onta tangle
θ
ofawaterdrop(in°)asafun tionofthe sputteringargonpressureand(a)thein iden eangleα
and(b)the olumnangleβ
Figure17: Pseudo3D-mapsdisplayingtheevolutionoftheaveragefra taldimension
D
f
asafun tionofthesputteringargon pressureand(a)thein iden eangleα
and(b)the olumnangleβ
Figure18: a)Pseudo3D-map displayingthe evolution ofthe average lateral onta t stiness (
N m
−1
)
as a fun tion ofthe sputteringargonpressureandforvarious olumnanglesβ
andb)X-raydira tionpatternsof hromiumthinlmsdeposited at0.40Paandforvariousin iden eanglesα
(thesharp entralpeakisthe hromiumone orrespondingtotheinitialtarget)As expe ted, in rst approximation and in great agreement with the literature [68, 69, 70℄, Fig. 17
revealsthat
D
f
varies asthewettabilityresults. Inthe sameway, there isno obvious orrelation betweenµ
d
(Fig. 12)andD
f
in agreementwithGantietal [47℄. However,asanunexpe tedresult, itappearsthatD
f
has the same variations asµ
s
(Fig. 13): espe ially the positions of their maximum (at 0.40 Pa andα = 20
°)andminimum(at0.53Paandα = 20
°)arequitesimilar. Thus,thevariationsofµ
s
seemstrongly orrelatedwiththatofD
f
,whi happearsasthelo al variationsofthelms'porosity-shownasairpo kets. Besides,thefra taldimension'smap(Fig. 17)givesmorea urateinformationsaboutthesurfa ethanthoseomputedfromatheoreti almodel(Fig. 4),whi h annottakeinto a ountthelo al variationsofthereal
nanostru tures. It iswellknown[71℄, that thelatter-bymeansofse ondarygraingrowthforinstan e- is
ableto reatesomekindofinstabilitiesatthes aleofthemi ro-nano onta tdueto apillaryee ts. Thus,
thelo al variationsof
µ
s
ouldbeexplainedby onsideringthelo al variationsofthelms'porosity-i.e at thes aleofthe olumns-revealedbythelo al variationsofthefra taldimensionD
f
. However,theseones ould alsolo ally hange theme hani alpropertiesof thesurfa es and onsequently thefri tionbehaviourtoo. Theseevolutions anbeassessedbymeansofthelateral onta tstiness (
k
L
)
. 3.5. Evolution ofthe lateral onta tstinesswith the sputteringparametersAsmentionedbefore(2.3),thelateral onta tstiness (
k
L
)istheslopefromthefri tionfor evs. lateral displa ementwhentheos illationamplitudeislowerthanthe onta tradius(±10µm) -i.e whenthethinlm is submittedto analternativeshear testing whereno sliding o urs. Referringto Mindlin et al. [56℄,
thislateral onta tstiness
k
L
(N m
−1
)
is onne tedto theelasti propertiesofsamplesasfollow:
k
L
= 8a
1
2−ν
1
G
1
+
2−ν
2
G
2
(2)where
a
isthe onta tradius(m),G
i
andν
i
aretheshearmodulus(N m
−2
)andthePoisson'ratioofea h
sample,respe tively.
Fig. 18arevealsthatthevariationsoftheaveragelateral onta tstiness
k
L
arequitelow(from95to109N m
−1
)be ausethesurfa eisratherhomogeneousanddenseenoughinthethi knesstoinsuretheme hani al
ohesionofthelms(the averagevalueisabout103
N m
−1
). Theseresultsareingoodagreementwiththe
XRD ones, whi h reveal similar dira tion patterns with respe t to the operating parameters. Hen e,
k
L
- and onsequentlythe elasti properties of thelms - is notreally ontrolled by the sputteringoperatingparameters.
Howeversome variations of
k
L
- similar to that ofD
f
andµ
s
- are lo ally observed: thus, as shown in Fig. 18a,the maximum of thelateral onta tstiness learly orresponds to the maximumofµ
s
(Fig. 13b) butelsewherethevariationsofk
L
annotbedire tly onne tedtothevariationsofµ
s
. Theseresults are alsoin goodagreementwiththeXRD ones (Fig. 18b), whi hreveal bothawidening andashiftoftheFigure19: Angulardistributionof hromiumsputtered parti lesobtainedfromSIMTRA[73℄foranin iden eangle
α
=80° andforanargonsputteringpressureofa)0.11Pa;b)0.40Pa; )0.53Pa.some hanges ofthe rystallitessize or(ii) thepresen eof potentialtensionmi ro-stresseswithin thelms
fabri ated at 0.40Pawith these in iden eangles. Thus, the global variationsof the lms'porosity donot
really hangetheme hani alpropertiesofthelms: thelatterarequitehomogeneousand ontrolledbythe
densersubsurfa e. However,thelo al variationsofthelateral onta tstiness -whi harethesameasthose
of
D
f
andµ
s
- ould be orrelated with either (i) thepresen e of internal stressesor(ii) some hanges of the rystallitessizeasreportedbeforebythese ondarygraingrowth. So,thereis learlyarelationbetweengrowth,stru tureandtribologi alproperties.
3.6. Relationbetweengrowth,stru tureandtribologi al properties
Forthelowest sputteringpressure(0.11Pa), hromiumthin lms exhibitaregular olumnarstru ture.
As previously observedin Fig. 9,growingof the highest olumn angle
β
is produ ed fora systemati rise of the in iden e angleα
. Inaddition, the olumnarstru ture is kept forhigh sputteringpressures but,β
anglesaturates at35and 22°forthe orrespondingpressureof0.40and 0.53Pa,respe tively. Su hregularolumnargrowthobservedat0.11Pais mainlyattributed to thedire tionalux ofthesputteredparti les,
whi hisespe iallyfavouredatlowsputteringpressure(Fig. 19).
Simulation of the parti les ux from SIMTRA software [73℄ allows thedetermination of the sputtered
parti les traje toriestaking intoa ountthe geometryof thesputtering hamberand operating onditions
(e.g. pressure, ion urrent density on the target, ...). It is worthof notingthat this spatial distribution
exhibit a strong dire tional ux at 0.11 Pa and for an in iden eangle
α
= 80°(Fig. 19a). An in reasing sputtering pressureup to 0.40 Paleads to a spreadingof the distribution (Fig. 19b), whi h is even moreemphasizedat0.53Pa(Fig. 19 ). Asaresult,su halossofthedire tionalparti lesuxwiththesputtering
pressurehasto be orrelatedwithsomefeatures ofthe olumnargrowthaswellassomesingularitiesofthe
stati fri tion oe ient,thefra taldimension andtosomeextentsthelateral onta tstiness.
On the one hand, for sputtering pressure of 0.11 Pa, the evolution of the olumnar orientation vs.
in iden eangle
α
issmooth. A regulargrowthisprodu eddue toanarrowspatialdistribution ofthe parti lesux(Fig. 19a). So,mostofthesputteredatomsimpingeonthegrowinglma ordingtothegivenin iden eangle
α
. Thus,agradualvariationofthetribologi alproperties(Fig. 11), waterdrop onta tangleθ
(Fig. 15),fra taldimension(Fig. 17)aremeasuredasafun tionofthein iden eangleα
. Asaresult,variationsofµ
s
arequitesimilartotheµ
d
ones. Ontheotherhand,anin reasingsputteringpressuredoesnotsolelyredu e themeanfreepathofthe
sputteredatomsand so,the s atteringofthe ux. It alsofavoursthese ondarygrain growthin thin
lms,asillustrated in Fig. 20for hromium thin lmsexhibiting aspiral olumnarstru ture. Thus,
amulti-dire tional hara teroftheparti les ux prevailsagainstasingleorienteduxfor the hosen
in iden e angle
α
= 80°. Thermalization ee t of the sputtered parti les o urs and gives rise to a morerandomizedgrowthofthe olumnarstru tureleadingtolo al variationsofsurfa espropertiesasporosityasre entlyreported[31℄. Tribologi albehavioursof thelms preparedathigh pressure an
usinga onstantin iden eangle
α
=80°andasubstraterotationφ
=0.5revolutionperhour. Ase ondarygraingrowth an be learlyobserved.sputteredparti les. Typi allo al variationsofstati fri tion oe ient,thehighestfra taldimension
orthestrongest lateral onta tstiness aresystemati allyobservedforin iden eangles
α
=0to 30° ( orrespondingβ
anglesare0to20°)andforpressuresin-between0.30to0.50Pa. Therefore,thisrange ofin iden eanglesandpressureswell orrelatewith hangesofthenanostru tureduetose ondarygraingrowth,andfri tionbehaviours. Hen e,thisrangeofsputteringpressuresenablestotailortribologi al
propertiesfavouringsti kingoversliding or,in ontrast,avoidinganysti k-slip o urren e.
4. Con lusion
Inthiswork, hromium thinlms weresputterdepositedimplementingtheGLan ingAngleDeposition
(GLAD)method(i.e thein identvapouruxstrikesontothesubstrateattiltedangles
α
)inorderto reate in linednanos ulpturedthinlmsfor ontrollingtribologi albehaviourinmi ro-grippingappli ations. Threesputtering pressures0.11,0.40 and 0.53Pa were used and thein iden e angle
α
of thesputtered parti les wassystemati ally hangedfrom0to80°. Firstly,resultsrevealthattheme hani alpropertiesofthelms-asabulkparameters-donotreally hangewiththesputteringparameters. Se ondly,tribologi albehaviour
- in luding surfa eproperties - is strongly orrelatedwith the growth me hanism andthe stru ture of the
lms,whi harebothlinkedwiththeoperatingsputteringparameters. Thus,
forthelowestsputteringpressures,aregulargrowthisprodu edduetoanarrowspatialdistributionof
theparti lesux. So, hromiumlmsexhibitaregular olumnarstru ture. Thevariationofthe olumn
orientationisverysmoothwiththein iden eangle
α
. Agradualvariationofthetribologi alproperties, andespe ially thewettabilityisnoti ed asafun tion of thein iden eangleα
. In pra ti e,this level ofsputteringpressureisquiteinterestingfortailoringsurfa es displayingagradientofwettability; in ontrast,when thesputteringpressuresare in reasedbeyondthepure balisti sputteringarea,the
meanfreepathofthesputteredatomsisstronglyredu ed,andsothes atteringoftheuxprevails. In
the olumnarstru ture. Lo al variationsofstati fri tion oe ient, wettability,surfa eporosityand
lateral onta tstinessaretypi allyobservedinthisrangeofsputteringpressures. Thislatterenables
totailorsuitablesurfa espropertiesbytuningthein iden eangle
α
favouringsti kingoverslidingor, in ontrast,avoidinganysti k-slip o urren e. Indeed,thestati fri tion- andmoreparti ularly theratio
µ
s
µ
d
- an easilybeadjusted to ontrolthetransitionfromsti kingtosliding inmi ro-gripping.
A knowledgments
TheauthorsaregratefultotheRégionFran heComté (Fran e)foritsnan ialsupportundertheawards
FIMICAP :Reliability ofmi ros ale assemblyanddesign of smartsensorsusingsurfa eengineering.
Referen es
[1℄ P.Lambert,CapillaryFor esin Mi roassembly,Springer,ISBN978-0-387-71088-4,2007.
[2℄ K.Goser, P. Glösekötter,J. Dienstuhl,Nanoele troni s andNanosystems, Springer BerlinHeidelberg,
ISBN3-540-40443-0,2004.
[3℄ E. Gne o,E. Meyer,Fundamentalsof fri tionandwearonthenanos ale,SpringerBerlinHeidelberg,
ISBN978-3-540-36806-9,2007.
[4℄ T. Pradeep, NANO: The Essentials - Understanding Nanos ien e & Nanote hnology, M Graw Hill,
ISBN978-0-07-154829-8,2008.
[5℄ T.-R.Hsu,MEMS&Mi rosystems,Wiley,2nd edn.,ISBN978-0-470-08301-7,2008.
[6℄ M. Gauthier, S. Regnier, P. Rougeot, N. Chaillet, For es analysis for mi romanipulation in dry and
liquidenvironments,J.Mi rome hatroni s3(2006)389413;.
[7℄ M. Nosonovsky, B. Bhushan, Multis ale Dissipative Me hanisms and Hierar hi al Surfa es, Springer
BerlinHeidelbergNewYork,ISBN 978-3-540-78424-1,2008.
[8℄ M. Nosonovsky, B. Bhushan, Multis ale fri tion me hanisms and hierar hi al surfa es in nano- and
bio-tribology,MaterialsS ien eandEngineeringR58(2007)162193.
[9℄ M.Nosonovsky,B.Bhushan,Hierar hi alroughnessoptimizationforbiomimeti superhydrophobi
sur-fa es,Ultrami ros opy107(2007)969979.
[10℄ B.Bhushan,Y. Jung,Natural andbiomimeti arti ial surfa esfor superhydrophobi ity,self- leaning,
lowadhesion,anddragredu tion,ProgressinMaterialsS ien e (56)(2011)1108.
[11℄ D. Mar hetto, A. Rota, L.Calabri, G. Gazzadi, C. Menozzi, S. Valeri, Hydrophobi ee t of surfa e
patterningonSisurfa e,Wear268(2010)488492.
[12℄ D.Mar hetto,A.Rota,L.Calabri,G.Gazzadi,C.Menozzi,S.Valeri,AFMinvestigationoftribologi al
propertiesofnano-patternedsili onsurfa e,Wear265(2008)577582.
[13℄ C.Yang,U. Tartaglino,B.Persson, Inuen eofsurfa eroughnessonsuperhydrophobi ity,Phys.Rev.
Letters97(2006)116103.
[14℄ F.Borodi h,B.Galanov,S.Grob,Y. Prostov,Adhesive onta tproblemsatma roandnanos ales,in:
F.Franek, W.Bartz(Eds.), Pro eedingsofthe3rdEuropeanConferen eonTribology,June7-9,2011,
Vienna,Austria,1520,2011.
[15℄ C.Mate,Tribologyonthesmalls ale,NY:OxfordUniversityPress,ISBN978-0-19-852678-0,2008.
[16℄ B.Persson,O.Albohr,U. Tartaglino,A.Volokitin,E.Tosatti,Onthenatureofsurfa eroughnesswith
appli ation to onta tme hani s, sealing, rubberfri tion andadhesion, J.Phys.: Condens. Matter 17
3540661139,2000.
[18℄ B.Persson,SlidingFri tion-Physi alprin iplesandappli ation,SpringerBerlinHeidelbergNewYork,
2ndedn.,ISBN 3-540-67192-7,2000.
[19℄ A. Casoli,M.Brendlé,J.S hultz,P. Auroy,G. Reiter,Fri tionIndu ed byGraftedPolymeri Chains,
Langmuir17(2001)388398.
[20℄ J.Takadoum,MaterialsS ien e&EngineeringinTribology,Wiley,ISTELtd,ISBN978-1-84821-067-7,
2008.
[21℄ C.Abreu, N.Martin,J.Gomes,Chromiums ulpturedthin lms: tribologi alevaluationunder
ma ro-andmi ro-testing onditions,in: Pro eedingsoftheNordTrib2010,paper35,2010.
[22℄ A.Lakhtakia,R.Messier,S ulpturedThinFilms,NanoengineerredMorphologyandOpti s,SPIEPress,
Bellingham,WashingtonUSA,ISBN081945606-3,2005.
[23℄ E. So, M. Demirel, K. Wahl, Me hani al anisotropy of nanostru tured parylene lms during sliding
onta t,J.Phys.D:Appl.Phys.43(2010)045403.
[24℄ N.Young,J.Koval,Opti allya tiveuoritelms,Nature183(1959)104.
[25℄ K. Robbie, J. Sit, M.Brett, Advan ed te hniques for glan ing angle deposition, J.Va . S i. Te hnol.
B16(1998)1115.
[26℄ K.Robbie,M.Brett,A. Lakhtakia,Chirals ulpturedthin lms,Nature 384(1999)384.
[27℄ A. Dolatshahi-Pirouz, D. Sutherland, M. Foss, F. Besenba her, Growth hara teristi s of in lined
olumns produ ed bt Glan ing Angle Deposition (GLAD) and olloidal lithography, Appl. Surf. S i.
257(2011)2226.
[28℄ J.Lintymer, J. Gavoille, N.Martin, J.Takadoum, Mi rostru ture and properties of sputterdeposited
hromiumthin lms,Surfa e&CoatingsTe hnology174-175(2003)316.
[29℄ C.Zhou,D.Gall,Thestru tureofTananopillarsgrownbyglan ingangledeposition,ThinSolidFilms
515(2006)12231227.
[30℄ C.Gaire,D.-X.Ye,F.Tang,R.Pi u,G.-C.Wang.,T.-M.Lu,Me hani alTestingofIsolatedAmorphous
Sili onSlantedNanorods,JournalofNanos ien eandNanote hnology5(2005)18931897.
[31℄ Y. Yang,D. Hass,H. Wadley, Porosity ontrol in zig-zagvapor-deposited lms, Thin Solid Films 471
(2005)111.
[32℄ D.-L. Liu, D.-X. Ye, F. Khan, F. Tang, B.-K. Lim, R. Pi u, G.-C. Wang., T.-M. Lu, Me hani s of
PatternedHeli al SiSprings onSiSubstrate,JournalofNanos ien eandNanote hnology3(6)(2003)
492495.
[33℄ A. Besnard, Relation stru ture- ondu tivité éle trique dans les lms de hrome ar hite turés, Ph.D.
thesis,UniversitédeFran heComté,2010.
[34℄ J. Lintymer, Etude de l'inuen e de la mi rostru turesur les propriétés mé aniques et éle triques de
ou hesde hromeenzigzagélaboréesparpulvérisation athodique,Ph.D.thesis,Universitéde
Fran he-Comté,2003.
[35℄ A. Besnard, N. Martin, L. Carpentier, B. Gallas, A theoreti al model for the ele tri al properties of
hromiumthin lmssputterdepositedatobliquein iden e,J.Phys.D:Appl.Phys.44(2011)215031.
[36℄ M. Khadar, N. Shanid, Nanos ale ne-stru ture evaluation of RF magnetron sputtered anatase lms
using HRTEM, AFM,mi ro-Ramanspe tros opyandfra tal analysis,Surfa e& CoatingsTe hnology
minedbylow-temperatures anningtunneling mi ros opy,Phys.Rev.B51(16)(1995)51.
[38℄ B. Bhushan, Nanotribology and Nanome hani s, an introdu tion, Springer Berlin Heidelberg, ISBN
3-540-24267-8,2005.
[39℄ K. Harris, D. Vi k, E. Gonzalez, T. Smy, K.Robbie, M. Brett, Porous thin lms for thermal barrier
oatings,Surfa e&CoatingsTe hnology138(2001)185.
[40℄ M.Colgan,M.Brett,Fieldemissionfrom arbonandsili onlmswithpillarmi rostru ture,ThinSolid
Films389(2001)1.
[41℄ B.Di k, M.Brett, T.Smy, M.Freeman,M.Mala ,R. Egerton, Periodi magneti mi rostru turesby
glan ingangledeposition,J.Va .S i.Te hnol.A18(2000)1838.
[42℄ M.Gauthier,S.Regnier,(Editors), Roboti Mi ro-Assembly,Wiley-IEEEPress,2010, ISBN:
978-0-470-48417-3.
[43℄ N. Chaillet, S.Regnier, Mi roroboti s for Mi romanipulation, STE Ltd and John Wiley & Sons In ,
2010,ISBN-10: 1848211864,ISBN-13: 978-1848211865.
[44℄ S. Paik,S. Kim, I.S huller, R.Ramirez,Surfa e kine ti sand roughness onmi rostru tureformation
inthin lms,Phys.Rev.B43(2)(1991)1843.
[45℄ D. Raou,Fra talanalysesof ITOthinlms: A studybasedonpowerspe traldensity,Physi a B405
(2010)451455.
[46℄ B.Mandelbrot,Fra tals: form, han eanddimension,Freeman,SanFran is o,ISBN978-2-0812-4617-1,
1984.
[47℄ S. Ganti, B. Bhushan, Generalizedfra tal analysis and its appli ations to engineering surfa es, Wear
180(1995)1734.
[48℄ J.-J.Gagnepain,C.Roques-Carmes,Fra talapproa htotwo-dimensionalandthree-dimensionalsurfa e
roughness,Wear109(1986)119126.
[49℄ W. Zahn, A. Zös h, The dependan e of fra tal dimension on measuring onditions of s anning probe
mi ros opy,FreseniusJAnalenChem365(1999)168172.
[50℄ A. van Put, A. Vertes, D. Wegrzynek, B. Treiger, R. van Grieken, Quantitative hara terization of
individualparti lesurfa esbyfra talanalysisofs anningele tronmi ros opeimages,FreseniusJAnalen
Chem350(1994)440447.
[51℄ A. Mannelquist, N. Almquist, S. Fredriksson, Inuen e of tip geometry on fra tal analysis of atomi
for emi ros opyimages,Appl.Phys.A66(1998)891895.
[52℄ A.Czifra,I.Baranyi,G.Kala ska,Fra talanalysisofmi rotopographiesinwear,in:F.Franek,W.Bartz
(Eds.),Pro eedingsofthe3rdEuropeanConferen eonTribology,June7-9,2011,Vienna,Austria,593
596,2011.
[53℄ W.Zahn,Chara terizationofthinlmsurfa esbyfra talgeometry,FreseniusJAnalenChem358(1997)
119121.
[54℄ T.Thomas,RoughSurfa es,Imperial CollegePress,2nd ed.edn., ISBN 978-1860941009,1999.
[55℄ P. Stempé, J. Takadoum, Multi-asperity nanotribologi al behavior of single- rystal sili on:
Crystallography-indu edanisotropyin fri tionand wear,TribologyInternational48(2012)3543.
[56℄ R.Mindlin,W.Mason,J.Osmer,H.Deresiewi z,Ee tsofanos illatingtangentialfor eonthe onta t
surfa es of elasti spheres, Pro . 1st US National Congressof Applied Me hani s ASME [227℄(1952)
ofthi ksputtered oatings,J.Va .S i. Te hnol.11(1974)666.
[58℄ J.Nieuwenhuizen,H.Haanstra,Mi rofra tographyofthin lms,PhilipsTe h.Rev.27(1966)87.
[59℄ Y. Yamamura, K. Muraoka, Over osineangular distribution of sputtered atoms at normal in iden e,
Nu l.Instrum. MethodsB42(1989)175.
[60℄ H. Fujiwara, K. Hara, M. Kamiya, T. Hashimoto, K. Okamoto, Comment on the tangentrule, Thin
SolidFilms 163(1998)387.
[61℄ H.Hirakata,T.Nishihira,A.Yonezu,K.K.Minoshima,Fri tionalAnisotropyofOblique Nano olumn
ArraysGrownbyGlan ingAngleDeposition,TribologyLetters44(2011)259268.
[62℄ K. Robbie, M. Brett, S ulptured thin lms and glan ing angle deposition: Growth me hani s and
appli ations,J.Va .S i.Te hnol.A15(1997)1460.
[63℄ A.Dolatshahi-Pirouz,C.Pennisi,S.Skeldal,M.Foss,J.Chevallier,V.Za her,P.Andreasen,K.Yoshida,
F.Besenba her,Theinuen eofglan ingangledepositednano-roughplatinumsurfa esonthe
adsorp-tionofbrinogenandtheproliferationofprimaryhumanbroblasts,Nanote hnology20(2009)095101.
[64℄ A. Dolatshahi-Pirouz, M. Hovgaard, K. Re hendor, J. Chevallier, M. Foss, F. Besenba her, S aling
behaviorofthesurfa eroughnessofplatinumlmsgrownbyobliqueangledeposition,Phys.Rev.B77
(2008)115427.
[65℄ F.Heslot, T. Baumberger,B.Perrin,B.Caroli, C.Caroli, reep,sti k-slip,anddry-fri tiondynami s:
experimentsand aheuristi model,Phys.Rev.E49(1994)49734988.
[66℄ M.S herge,J.S haefer,Mi rotribologi alinvestigationsofsti k/slipphenomenausinganovelos illatory
fri tionandadhesiontester,TribologyLetters4(1998)3742.
[67℄ M.Brendlé,P.Diss,P.Stempé,Nanoparti ledeta hment: apossiblelinkbetweenma roand
nanotri-bology?,TribologyLetters9(2000)97104.
[68℄ F. Bottiglione, G. Carbone,Super-hydrophobi ityof fra tal surfa es,in: F. Franek, W. Bartz(Eds.),
Pro eedings of the3rd European Conferen eon Tribology, June 7-9, 2011, Vienna, Austria, 267271,
2011.
[69℄ T. Onda, S. Shibui hi, N. Satoh, K. Tsujii, Super-water-Repellent fra tal surfa es, Langmuir 12 (9)
(1996)21252127.
[70℄ S. Sarkar,S. Patra, N. Gayathri,S. Banerjee, Ee t of self-ane fra tal hara teristi sof surfa es on
wetting, Appl.Phys.Letters96(2010)063112.
[71℄ M. Nosonovsky, B. Bhushan, Capillary ee ts and instabilities in nano onta ts, Ultrami ros opy 108
(2008)11811185.
[72℄ S. Cai, B. Bhushan, Menis us and vis ous for es during separation of hydrophili and hydrophobi
surfa eswithliquid-mediated onta ts,MaterialsS ien eandEngineeringR61(2008)78106.
[73℄ K. van Aeken, S. Mahieu, D. Depla, The metal ux from arotating ylindri al magnetron: aMonte