(2) -.031
Item Quantity.
CD
as required®
as required®
2@
1®
2®
as requiredCV
as required13250"~1
--I ~
.250+_:g~~
(2)CUT & STRIP DETAIL ®{J)
LIST OF MATERIALS
Description
Cable, SP Elect: 26 AWG (2.N & O-N) twisted pair, shielded and jacketed (or equivalent cable)
Wire, Elect: insulated, 26 AWG (2-N) stranded, tin top-coat, 800 PVC insulation (or equivalent wire).
Tip, Hook (black) pin 003-0625-00 (E-Z Hook X100-W) Tip, Hook (red) pin 003-0624-00 (E-Z Hook X100-W) Capacitor, 4.7 ,."f, Sprague Elect. Co_
5C37Z5U475M050B, or equivalent (SEE NOTE) Tubing, heatshrink, 0.093 in_ dia., (Insulectro Versafit or equivalent)
Wire, Elect: insulated, 26 AWG (O-N) 800 PVC insulation (or equivalent wire)
NOTE: Connect the second capacitor (not shown) across the current source binding posts in parallel with the cable connection.
4510-05
Figure 5·5 Current·source cable details. 5-21
Equipment Setup Procedure
~
Do not install or remove any electrical module or sUb-ssembly in a DAS mainframe while the power is on. Doing so can damage the module or subassembly.
The following steps describe the DAS configuration and test equipment setup required to begin the comparator offset adjustment procedure for 91 A04A and 91 AE04A Data Acquisition Modules. This procedure uses a Fluke 5101 B Multimeter Calibrator as a current source. Refer to the Reference Information section of this addendum for test point locations. Set up the equipment as follows:
1. Perform the DAC Adjustment procedure located earlier in this section. Leave the module under test on the extender when finished with the DAC adjustment.
2. Set up the oscilloscope as follows:
a. Set vertical sensitivity to 500 mV/div.
b. Connect the X10 probe to +5 V on the module under test.
c. Position the oscilloscope trace on the first major division line below the top of the graticule.
3. Connect the current source cable to the Fluke 5101 B: red twisted-pair to the red binding post, black twisted-pair to the black binding post.
4. Enter the 91 A04A Trigger Specification menu and select external clock, rising edge. Enter the Channel Specification menu and select a threshold value of 0.00 V. Press START ACQUISI-TION to set the threshold on the module under test then press STOP.
5. Disconnect the P6453 Data Acquisiton Probe from the module under test.
Comparator Offset Adjustment Procedure
1. Connect the black shield connector of the current-source cable (green wire) to the GND test point near U 115 on the module under test.
NOTE
Position the current-source cable as far as possible from the DAS rear cooling fan to obtain the best results from the following procedure.
2. Connect the remaining black connector of the current-source cable to +3 VL (top lead of C105).
3. Connect the oscilloscope ground also to the GND test point near U115 on the module under test.
4. Connect the red connector and the oscilloscope probe to the appropriate test points for the channel under test as listed in Table 5-6.
Verif. and Adjust. Procedures--DAS9100 Series 91A04A/91AE04A Service
CHANNEL Data 0 Data 1 Data 2 Data 3 Clock (91 A04A
only)
Table 5-6
CHANNELS, TEST POINTS, AND OFFSET ADJUSTMENTS FOR FLUKE 5101B METHOD
RED OSCILLOSCOPE ADJUSTMENT
CONNECTOR PROBE TIP (RXXX)
U218, pin 1 U218, pin 1 R201 (top of R203)
U311, pin 2 U418, pin 1 R301 (top of R303)
U411, pin 2 U518, pin 1 R401 (top of R403)
U511,pin2 U618, pin 1 R501
(top of R503)
U115, pin 2 U121, pin 13 R111 (top of R113)
5. Perform the following measurements for each channel listed in Table 5-6.
a. Program the Fluke 5101 B to output 15.080 mA, and adjust RXXX for a solid ECl high (approximately 4.1 V) on the oscilloscope with no noise present.
b. Program the Fluke 5101 B to output 14.020 mA, and adjust RXXX for a solid ECl low (approximately 3.3 V) on the oscilloscope with no noise present.
c. Program the Fluke 5101 B to output 15.060 mA, and adjust RXXX for a solid ECl high with very little noise present.
d. Program the Fluke 5101 B to output 14.040 mA, and adjust RXXX for a solid ECl low with very little noise present.
e. Program the Fluke 5101B to output 15,040 mA, and adjust RXXX for a solid ECl high;
some noise may be present.
f. Program the Fluke 5101 B to output 14.060 mA, and adjust RXXXfor a solid ECl low;
some noise may be present.
5-23
ADJUSTING COMPARATOR OFFSETS USING A TEKTRONIX PG502 250 MHz PULSE GENERATOR AS A SIGNAL SOURCE
This procedure describes an alternate method of adjusting comparator offset levels in a 91 A04A or 91 AE04A Data Acquisition Module using a Tektronix PG502 250 MHz Pulse Generator as a signal source. Performing this test requires that the P6453 Data Acquisition Probe be kept with the data acquisition module with which it was calibrated.
Test Equipment Required
Table 5-7 lists test equipment required for comparator offset adjustment using a Tektronix PG502 250 MHz Pulse Generator as a signal source. Unless otherwise specified, equivalent test equipment may be used.
QTY 1 1
1
1 1 1
Table 5-7
EQUIPMENT REQUIRED FOR THE COMPARATOR OFFSET ADJUSTMENT USING THE TEKTRONIX PG502
FUNCTION logic analyzer mainframe module extender
~400 MHz oscilloscope
250 MHz pulse generator
high-speed acquisition test fixture 5-114 inch probe ground cable
RECOMMENDED TYPE DAS 9100 Series (no substitute)
DAS Main Extender Board,
pin
670-6748-00 (no substitute)Tektronix 7904 mainframe with a 7 A 19 ver-tical amplifier, a 7B10 timebase, and Tek-tronix P6201 X10 FET probe
Tektronix PG502 250 MHz Pulse Generator Tektronix
pin
067-1139-00 (no substitute) Tektronix pin 175-0848-01Equipment Setup Procedure
~
Do not install or remove any electrical module or sub-ssembly in a DAS mainframe while the power is on. Doing so can cause damage to the module or subassembly.
Verif. and Adjust. Procedures--DAS9100 Series 91A04A/91AE04A Service
The following steps describe the DAS configuration and test equipment setup required to begin the comparator offset adjustment procedure for 91 A04A and 91 AE04A Data Acquisition Modules. This procedure uses a Tektronix PG502 250 MHz Pulse Gen~rator as a signal source. Refer to the Reference Information section of this addendum for test pOint locations. Set up the equipment as follows:
1. Perform the DAC Adjustment procedure located earlier in this section. Leave the module under test on the extender when finished with the DAC adjustment.
2. Connect the output of the 250 MHz pulse generator to data input connector J350 on the High-Speed Acquisition Test Fixture using cable 012-0057-02. (Do not apply power to the test fixture.)
3. Connect the data outputs of the test fixture through the P6453 Probe to data channels 0-3 of the module under test.
4. Set the pulse generator as follows:
a. Set the pulse generator to the <4 ns scale. Monitor the data output at J355 of the test fix-ture with the oscilloscope P6201 FET probe and 7A19 vertical amplifier.
b. Adjust the pulse generator for an output of 600 mV Pop centered around ground, and for a 5 ns high period and a 5 ns low period (± 5%). (Note any asymmetry for future use in the Comparator Offset Adjustment Procedure.)
5. Enter the 91 A04 Trigger Specification menu and select external clock, rising edge. Enter the DAS Channel Specification menu and select 0.00 V threshold. Press START ACQUISITION to set the threshold of the module under test.
6. Adjust and connect the oscilloscope as follows:
a. Set sensitivity to 200 mV /div.
b. Set the FET probe to
+
dc offset.c. Connect the probe tip to pin 1 of J125 (Vbb) on the module under test.
d. Connect the 5 1/4 inch probe ground cable to TP116 (GND) on the module under test.
(Probe ground will remain at this position for all comparator offset test and adjustment steps.)
e. Position the oscilloscope trace at the center graticule line.
Comparator Offset Adjustment Procedure
Perform the following steps to adjust comparator offset for data channels 0-3 and the clock channel. (Clock channel adjustment applies to the 91A04A only.)
1. Connect the oscilloscope probe tip to data channel 0 (pin 1 of deskew register U218) on the module under test.
2. Adjust R201 for symmetry identical to that previously noted at the pulse generator output. The signal at this test point should be centered on the graticule center line ± 10%, and have a duty cycle of about 5 ns high and 5 ns low.
3. Move the oscilloscope probe tip to data channel 1 (pin 1 of deskew register U418).
4. Adjust R301 for symmetry identical to that previously noted at the pulse generator output. The signal at this test point should be centered on the graticule center line ± 10%, and have a duty cycle of about 5 ns high and 5 ns low.
5-25
5. Move the oscilloscope probe tip to data channel 2 (pin 1 of deskew register U518).
6. Adjust R401 for symmetry identical to that previously noted at the pulse generator output. The signal at this test point should be centered on the graticule center line ± 10%, and have a duty cycle of about 5 ns high and 5 ns low.
7. Move the oscilloscope probe tip to data channel 3 (pin 1 of deskew register U618).
8. Adjust R501 for symmetry identical to that previously noted at the pulse generator output. The signal at this test point should be centered on the graticule center line ± 1 0%, and have a duty cycle of about 5 ns high and 5 ns low.
NOTE
If the module under test is a 91AEOA, this procedure is completed. If the module under test is a 91A04A, perform the remaining steps to adjust the clock channel.
9. 91A04A only: Disconnect data channel 0 of the data acquisition probe from the test fixture's data output connector, and connect the data acquisition probe's clock channel to the vacated data output connector.
10. 91A04A only: Move the oscilloscope probe tip to the clock channel (pin 13 of U121). (Pin 13 of U121 connects to pin 7 of U115.)
11. 91A04A only: Adjust R111 for symmetry identical to that previously noted at the pulse generator output. The signal at this test point should be centered on the graticule center line
± 10%, and have a duty cycle of 5 ns high and 5 ns low.