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Submitted on 1 Jan 1989
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IN SITU OBSERVATION OF DISLOCATION MOTION IN CdTe USING EBIC
J. Kronewitz, W. Schröter
To cite this version:
J. Kronewitz, W. Schröter. IN SITU OBSERVATION OF DISLOCATION MOTION IN CdTe USING EBIC. Journal de Physique Colloques, 1989, 50 (C6), pp.C6-166-C6-166. �10.1051/jphyscol:1989623�.
�jpa-00229654�
R E W E DE PHYSIQUE A P P L I Q U ~ E
Colloque C6, Suppl6ment au n06, Tome 24, Juin 1989
IN SITU OBSERVATION OF DISLOCATION MOTION IN CdTe USING EBIC
J. KRONEWITZ and W. SCHROTER
4 . Physikalisches Institut and Sonderforschungsbereich 126, University
of Gtittingen, 0-3400 Gtittingen, Bunsenstrasse 11-15, F.R.G.
Abstract
Dislocations in compound semiconductors are thought to be decorated with point defect clouds that may dominate the observed electrical activity. We were able to separate the point defect cloud from the dislocation by i n aitu observation of dis- location motion using a deformation apparatus installed in the scanning electron microscope. CdTe crystals were deformed by compression a t room temperature.
Concerning the EBIC-contrasts associated with moving dislocations we have dis- tinguished two cases:
1) Some dislocations showed almost no EBIC-contrast between their initial and their final position. Dislocation motion was only detectable by the occurence and growth of a new contrast while the contrast a t the initial position slowly d i s a p peared. We have concluded that in this case the EBIC-contrasts were mainly due to point defect clouds which were left behind when the dislocations moved and had t o be re-established a t the final position.
2) Other dislocations in the same specimen moving in the same direction showed EBIC-contrasts of constant intensity during motion, even a t a velocity of up to 10 microns per second. No contrasts remained a t the initial positions of these dislocations. In this case the origin of the EBIC-contrast seemed t o be fixed to the dislocation line also during fast motion.
Different dislocation types or different types of decorating point defects may be responsible for the different EBIC-contrasts during dislocation motion.
Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphyscol:1989623
