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Non-linear dynamics of charge-density-wave in orthorombic TaS3 at microwaves
I. Vendik, V. Pchelkin, A. Shchepak
To cite this version:
I. Vendik, V. Pchelkin, A. Shchepak. Non-linear dynamics of charge-density-wave in orthorombic TaS3 at microwaves. Journal de Physique I, EDP Sciences, 1992, 2 (7), pp.1497-1505. �10.1051/jp1:1992218�.
�jpa-00246635�
Classification
Physics
Abstracts72.15N 71.45L
Non-linear dynamics of charge-density-wave in orthorombic
TaS~ at microwaves
I. B.
Vendik,
V. M. Pchelkin and A. V.Shchepak
Electrical
Engineering
Institute, 5, Prof.Popov
street, St.Petersburg,
197376, Russia(Received 30 January 1992,
accepted
infinal form
9 March 1992)Abstract. Non-linear dc and microwave
conductivity
due to collective transport ofcharge- density-wave
inTaS3
wasexperimentally investigated
at T=
78-215 K. The non-linear dc field
dependence
of a differentialconductivity
dl/dV exhibits a threshold fieldE~j sharply
defined in the temperature range of 140-215 K. As the temperature decreasesbeyond
140K the fieldE~j disappears,
and the second threshold fieldE~»E~i originates.
The two fields are temperaturedependent
and showdecreasing
under a microwave radiation. A non-linear response V~t to the microwave radiation was observed at T= 78-215 K in a
mixing experiment
(detunedcase, D
= w1 w2 * 0). The dc field
dependencies
of the non-linear response V~t reveal nosigns
of the threshold field
singularities.
Theexperimental
results have beensatisfactorily
describedby
a classical model of an overdamped oscillator by
introducing
anempirical
distribution function for the threshold field andby averaging
V~t overE~.
I. Introduction.
The collective transport
phenomena
associated with thedynamics
ofcharge-density-wave (CDW)
inquasi-one-dimensional
conductors have been of great interest for many years. Thetransport phenomena
are well establishedby
variousexperimental
results. The field andfrequency dependencies
ofconductivity,
the coherent currentoscillations,
themodelocking phenomena, hysteresis
andmetastability
etc. are due to the collective transport of CDW. Asfollows from the
experimental frequency dependence
of CDWconductivity [1-3],
the CDWcan be considered as an oscillation system with characteristic
frequencies
in microwave and millimeter wave ranges. Ingeneral,
this system isnon-linear,
which arises from a modelocking experiment
at microwaves[4].
The non-linear response to the microwave radiation has been observed in a harmonicmixing experiment
where no dc biasvoltage
was used[5, 6].
The
experimental
results have been accounted forby
variousphenomenological
models. The mostpreferable
is theFukuyama-Lee-Rice (FLR) model,
which has been worked out forexplaining
thefrequency dependence
of CDWconductivity «(w ) [7, 8]
and the harmonicmixing experiments
as well[9, 10].
The novel information can be obtained fromexperimental investigations
of non-linear response of CDW to the microwave radiationsuperimposed
onthe
steady
electrical field. In this case the response involves both the field andfrequency
dependencies
ofconductivity.
1498 JOURNAL DE
PHYSIQUE
I N° 7In this paper we
report
theinvestigation
results of the non-linear response in orthorombicTaS3
in the CDW state to the weak microwaveradiation,
as a function of dc biasvoltage
under microwave
pumping.
Thisexperiment corresponds
to the directmixing
of twomicrowave
signals
withsufficiently
differentamplitudes
:Vi
m V~ and V
~ «
V~.
The detuned case, D= wj w~ #
0,
was used. Theoutput altemating voltage
withfrequency
D wasdetected as the non-linear bias
voltage dependencies
of non-linear response are observed and discussed.2.
Experiment.
2.I EXPERIMENTAL TECHNIQUE. -All measurements were
performed
on orthorombicTaS3 single crystals
in the two-portconfiguration
withtypical
distances between contacts 20-40~m
and cross-sections in the range of2-40~m2.
The parameters ofTaS~ samples
measured,
are tabulated(Tab. I).
Thesample
was included in the microwaveintegrated
circuit. It was mounted on the
well-polished
alumina substrate in the gap of agold microstrip
line. A thin In film was
deposited
on thecrystal
and on themicrostrip
contact surfaces(Fig.
Iusing
anevaporating
and masktechnique.
Thehigh quality
electrical contactsyielded
the ohmic resistance of 1-2 fl. The samemicrostrip input
was used for two microwavesignals
offrequencies
wj and w~.Owing
to thehigh
value of thesefrequencies (w1/2
ar =
2
GHz)
the differencefrequency
of theoutput
responsesignal
n= wi- w~ was also
big enough
(n/2
ar =10MHz)
to indicate the short time response, while any slow processes wereeliminated. The
sample mounting
allowed us to use the same measurementstechnique
to indicate either the differentialconductivity
or the non-linear response to the microwave radiation as a function of the biasvoltage.
The biasvoltage
was sweptlinearly
with time. The outputsignal
was recorded on an X-Y-recorder. In the case of the differentialconductivity
measurements the
output voltage
of a selectiveamplifier
was recorded. The non-linearresponse to the microwaves was taken from a
spectrum analyzer
to the recorder. The dcmeasurements have been conducted
using
thepotential
source with a low intemal resistance.2,2 EXPERIMENTAL RESULTS.- The
experimental
fielddependencies
of the differentialconductivity
ofTaS~ sample (N24)
at various temperatures are shown infigure
2. The non- linear characteristics with a well defined threshold fieldE~i
have been observed below thePeierls transition
temperature (Tp=215 +220K),
to mI20K. As one can see in thefigure I,
the thresholdgradually
smoothes off as thetemperature
decreases, and at the T<110Kdisappears.
On the otherhand, beginning
with thetemperature Tm140K,
anTable I. -Parameters
of
theexperimental samples
:f,
t, S andRR~
are thelength,
thethickness,
the cross-section and the room temperaturerespectively.
N
f
t sRAT
~Lm ~Lm ~Lm2 fl
19 42 8 60
24 42 2 25 16
30 20 2 28 8.5
38 30 2 14 31
45 28 3 110
78 45 3 38 12
3 4 5
j
2 3 4 5
6
j ...
"
,, ,, ', ,' » ,,
" ,, ', " " " "
Fig.
1. Thesample mounting
scheme :TaS~ crystal
(1),organic compound
(2), thin In film (3),microstrip
(4), substrate (5),ground plate
ofmicrostrip configuration
(6).dt
W
T
= 170K
dt
W
itsorb. units
0 5 V~
(mV)
2
T
= 170
140
50 0 50 100 150
Eo
(V/cm)Fig.
2. The differentialconductivity
dl/dV of thesample
N38 versus electric field at various temperatures. The inset shows the initial part ofdiagram
in details.1500 JOURNAL DE PHYSIQUE I N° 7
En (V/cm)
iso
o
°
E~
100
(V/cm)
T= 78 K
o 400
~
~ /
° o
300 ~%
~~
° ~ ° °
° 200
~
%~
/~
~100 ~°
0
50 100 150 200 T(K) 0,1 0.2 0.3 0.4 1.0 t~ ' (~Lm)
a) b)
Fig.
3.- The temperaturedependence
(a) of the second threshold fieldEn (sample
N30) thedependence
of the fieldE~
on the inversesample
thickness (b).other field
E~ originates,
where theconductivity
increasessharply.
This field was called the second threshold field. The fieldE~~
is temperaturedependent (Fig. 3a)
and exhibits thedependence
on thesample
thickness(Fig. 3b).
Under the microwave radiation the fielddependence
of differentialconductivity changes,
and the threshold field decreases(Figs. 4a, 6a).
No evidence ofmodelocking
was observed up to theamplitude
of microwave pumpsignal Vi
=
(10-20) V~.
The non-linear response in themixing experiment (Fig. 4b)
reveals no distinctivesigns
of threshold field. The response Vn
depends
on the biasvoltage exhibiting
abroad maximum. One can see a strong
dependence
of theamplitude
on the small microwavesignal V~
«V~.
The non-linear responsedisappears
atVo
m 0.3
V,
wherepeculiarities
on thedI/dV
characteristics become remarkable(Fig. 4a).
Infigure
5 the samedependencies
as in thefigure
4b are shown for anothersample (N19)
at alightly
lowertemperature.
The characteristics of the
TaS3 sample (N78)
at the T= 78 K are shown in
figure
6. If the second threshold fieldE~
isexceeded,
the differentialconductivity
increasessharply.
The value ofE~
isstrongly dependent
on the microwave pumpamplitude.
The relativechange
of the threshold fieldAE~/E~~
=(E~(O ) E~~(Vi ))/E~(O
isproportional
to theamplitude Vi squared (the
inset inFig. 6a).
The non-linear response of thesample
N78 in themixing
experiment
is shown infigure
5b. There is no maximum on the curves in contrast to the results athigher
temperature(Figs. 4b, 5).
The responseVn
increasesnon-linearly
as the biasvoltage
rises. Thedependence
exhibits asporadic
nature when the biasvoltage
reaches the valueVo
m 0.8 V. This
voltage sufficiently
exceeds the second thresholdvoltage V~
for thissample
in the presence of the microwave radiation.3. Discussion.
As follows from the
experimental results,
the ID-conductor in the CDW state,being
under extemaldriving forces,
exhibitsvarying
behaviour as the temperature decreases. Two different threshold fields have been observed in contrast to theprevious
results[I1, 12].
Theresults obtained arise from the
experiment
conditions. Thesamples
ofTaS~
in theseexperiments
were rather short and thin(see
Tab.I),
so that size effects should be taken intodI
W
d/~ = 128 K
$
~ ~ 14 v
~b units
4 ~ _~
Vi
=0.14" °
o 5 lo
Vo
(mV)0.1 0 0.1 0.2 0.3 0.4 Vo (V)
a)
Vn
(~V) ~"
0 ~
; 2
m
4.8
mV
2 3.2
~ . l.0
1.0 5
- 0 0,1 0.2 0.3
b)
Fig.
4. The differentialconductivity
dI/dV (a) and non-linear response to the microwave radiation(b) versus the bias
voltage (sample
N24). The microwave pumpamplitude Vi
= 0.14 V. Solid lines
correspond
to theexperiment,
dashed linescorrespond
to the calculationby
fomlula (7) withfitting
parameters tabulated (Tab. II). The insets show the initial part ofdiagram
in details.account
[13, 14].
On the other hand the CDW inTaS~
isnearly
commensurate and can bedeformed in a
high
electricfield,
so thepinning
on the initial lattice should be considered. Itwas assumed that the first threshold field was caused
by
theimpurity pinning,
and the secondone was determined
by
thepredominant pinning
of the commensurate CDW on the lattice.The
competition
between the two kinds of the CDWpinning produces
thesmearing
on the threshold field(T
=
115-140 K in
Fig. 2).
The contribution of the surfacepinning
of CDW is alsoappreciable.
This is demonstratedby
thefigure 3a,
where the size effect of the secondthreshold field is
presented.
Thedependence
ofE~~
on thesample
thickness issatisfactorily approximated
asE~~
~ t~ , that is in agreement with the results observed inNbse~ [13].
It is
yet impossible
tosuggest,
with any assurance that the dc characteristics observed are dueonly
to collective transport of CDW. One can assume the Jouleheating
isresponsible
for theconductivity increasing
as well. On the other hand the observation of thehigh-frequency
(D/2
ar=
10 MHz
)
non-linear response Va to the microwave radiation is unaffected
by
Joule1502 JOURNAL DE PHYSIQUE I N° 7
V~
(~V) T = 134 K
80
,
V2
" 17 mV
,
' 13
- ,
'
8.5
/"
~~
'
~ .2
Fig.
5. Theexperimental
non-linear response to the microwave radiation of thesample
N19 (solid lines). The microwave pumpamplitude
Vi = 0.2 V. Dashed linescorrespond
to the calculationby
thefomlula (7) with
fitting
parameters tabulated (Tab. II).heating.
It seems safe toidentify
the biasvoltage dependence
of Va as a manifestation of
only
the CDW
dynamics.
Let us discuss the characteristics
Va(Vo) (Figs. 4b, 5, 6b).
The main feature of thedependence
of non-linear responseVn
on the biasvoltage
is the absence of a threshold field.It is worth
noting
that thesharply
defined threshold field on dc characteristics does not eliminate under the microwaveradiation,
butchanges
its value(Figs. 4a, 6a).
In order to account for theexperimental
data atmicrowaves,
thefollowing
model can be devised the CDW is considered as a manypanicle
classical system with the statistical nature[10].
It is believed that the ID-conductor consists of a number ofweakly-connected non-interacting
chains with CDW, which are
distinguished by
threshold field[15].
If the chain consists ofphase
coherentsegments separated
from each otherby impurities
orincommensuarities,
eachsegment
on every chain in thecrystal
cannot bedepinned individually.
But forweakly
connected chains a
percolation
process couldprovide
the CDW movement at the effective fieldE~.
So one can observe the threshold field on the dc characteristics. At the same time thenon-linear response to the microwave radiation
involving
thedisplacement
current, features the average reaction to the extemal fields of all pans of different chains in thesample.
In thiscase the threshold field is smeared out and can not be revealed.
4. Model
approach.
Let us consider the CDW as a
single overdamped
oscillator and use theequation
of CDWmotion in the
simplest
classical form[16].
Theexpression
for the threshold fieldE~(V)
in the presence of the microwave radiation wasgiven
in[17]
:E~(V~)
=
E~/(I
+ a), (1)
d/
Mm
$ E~ sample
arb. units
~ ~~
~
l.0 u 45 T=78K
~/
/
~/~
~ -. »-
2 0 1.0 Vi (V)
Vi = 0.67 V 0.46 0.2 0.
0 0.25 0.50 0.75 1.00 Vo (V)
a)
Vn V~ = o.047 V
(mV)
0.2
0.1
_ /
-- 0.020
0 _--
b)
Fig.
6. The differentialconductivity
dI/dV(a)
under the microwave pump radiation and non-linear response to the microwave radiation (b) versus the biasvoltage
at the T= 78 K
(sample N78).
The microwave pumpamplitude (Fig.
5b)Vi
= 0.9 V. Solid linescorrespond
to theexperiment,
dashed linescorrespond
to the calculationby
the fomlula(7)
withfitting
parameters tabulated (Tab. U). The inset offigure
6a shows thedependence
of relativechange
of the second threshold fieldAE~/E~
on themicrowave pump
amplitude squared
the dashed lines areguides
to the eye.where
v 2
a "
(~)
(~) f(W),
2
V~
f(W )
=
((W/Wo)~ li
+(wT)-2j)~ ~, (3)
V~
is the thresholdvoltage.
wo and Tare the
pinning frequency
anddamping
parameter of CDW modelrespectively.
1504 JOURNAL DE PHYSIQUE I N° 7
In the case of a «
I, AE~
V), what is in accordance with thedependences
in the inset offigure
6a.The
explicit expression
for a current response in themixing experiment
under conditionsVi
<V~
andV~
«V~
was derived in[17].
Let us introduce the distribution function of the threshold field in the form[15]
:P
(ET )
=
(E
*)~
x~ exp(-
x)
,
(4)
where E* and n are distribution
parameters,
x =E~/E*.
After
averaging
overE~
with the distribution function(4)
the current response looks asla ~lii~f~")l'~ ll~i~ xl
,
~5)
where V*
=
E*
f,
f is thesample length,
a=
V~V*, R~
is the dc resistance of thesample
caused
by depinned CDW,
N~
=
j~ x~exp(- x)
dx.(6)
o
If a load resistance
R~
is connected to the output terminals of theID-samples,
thevoltage
response can be found as
~~ ~~~~~~~~l~n~~a~~~~~~
~~~Here a~
=
R[/R~
;R[
= R
~
R~/(R~
+R~ ),
andR~
is the resistance due to normal carriers.The calculation results are shown in
figures 4b,
5 and 6b with dashed lines. Thefitting
model parameters are n, V* and
f(w). According
to theexperimental
conditionwT
ml,
and instead of(3), f(w)
=
(w/w~~)
with w~~=
w(T.
The non-lineardynamic
response in
figure
4 is well describedby
formula(7)
with the distributionparameter
n = 2. But for the
sample
N24(Fig. 3b)
thegood
coincidence with the same n= 2 takes
place only
forVow
0.2 V. Thediscrepancy
atVo~0.2
V issuggested being
due to thesample heating.
One can assume that the CDW in thissample disappears owing
to temperatureincreasing,
when the biasvoltage
reaches the valueVo
m 0.3 V(Fig. 4).
Theoverheating
is believed to appear as a consequence of thesample imperfections.
In the case of thepotential
source used in the
experiment,
theavalanchi-type
temperatureincreasing
can takeplace,
theimperfections being staning points
of the process.The non-linear
dynamic
response to the microwave radiation at T= 78 K
(Fig. 6b)
can be describedby
the sameexpression (7).
But the distribution parameter n = 3 was used. Thechange
of parameter n andrespectively
thechange
of distribution function with the temperaturedecreasing
wasthought
to result from thechange
of the dominant kind of the CDWpinning. Taking
into account the coexistence of differenttypes
ofpinning,
we assumed that theimpurity pinning
of CDW wasreplaced by
thecommensurability pinning
as thepredominant
one. At the same time thepinning
on the surface and the contactpinning
of CDW remain invariable.The model parameters of the
samples investigated
are collected in table II. It isnotewonhy
that the
high
value offitting parameter
w~~ for allexperimental
data is in agood
agreementwith the two-mode model of CDW
dynamics [19],
Table II. The model parameters
of
thesamples
: V * and n are the distribution parameters, a~ is the dimensionless loadresistance,
w~~ is the crossoverJkequency
; T is thesample
temperature,
V~
is the threshold biasvoltage
in the absenceof
the microwave radiation(Vi
=0).
N T
V~ (Vi
= ~l) V* n a~
w~~/2
arK V V GHz
19 134 0.018 0.1 15 2 0.25 0.41
24 128 0.003 0.07 2 0.5 0.82
78 78 0.76 0.88 3 1.0 1.63
5. Conclusion.
We have
presented
the results of theexperimental investigation
of the CDW non-linear response to the microwave radiation versus the biasvoltage
under the microwave pump. The stochastic nature of the non-linear response wasemphasized.
The classical model of CDW motion was used.Taking
into consideration the distribution of thresholdfield,
the non-linearresponse was described
by
theexpression (7) using
the distribution function(4).
Thechange
of the distribution
parameter,
n, atcooling
thesample,
was attributed to the redistribution of the different kinds of contribution of the CDWpinning
:impurity pinning, pinning
of thecommensurate CDW on the
pristine lattice, pinning
on the surface andpinning
on thecontacts.
Acknowledgements.
This work has been
performed
on theTaS3 samples prepared by
the Yu. I.Latyshev
group(Moscow).
We would like to thank Yu. I.Latyshev,
I. F.Shchegolev,
Yu. A. Firsov for useful discussions and W.Wonneberger
for their interest in theproblem.
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