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ENHANCEMENT OF CRITICAL CURRENTS IN MULTIFILAMENTARY V3Ga CONDUCTORS BY ADDITION OF INDIUM

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HAL Id: jpa-00223743

https://hal.archives-ouvertes.fr/jpa-00223743

Submitted on 1 Jan 1984

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ENHANCEMENT OF CRITICAL CURRENTS IN MULTIFILAMENTARY V3Ga CONDUCTORS BY

ADDITION OF INDIUM

C. Frenzel, G. Fuchs, K. Fischer, W. Holzhäuser, F. Lange

To cite this version:

C. Frenzel, G. Fuchs, K. Fischer, W. Holzhäuser, F. Lange. ENHANCEMENT OF CRITICAL CUR-

RENTS IN MULTIFILAMENTARY V3Ga CONDUCTORS BY ADDITION OF INDIUM. Journal

de Physique Colloques, 1984, 45 (C1), pp.C1-425-C1-428. �10.1051/jphyscol:1984187�. �jpa-00223743�

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JOURNAL DE PHYSIQUE

Colloque C l , supplément au n° 1, Tome 45, janvier 198* page Cl-425

ENHANCEMENT OF CRITICAL CURRENTS IN MULTIFILAMENTARY V

3

G a CONDUCTORS BY ADDITION OF INDIUM

C. F r e n z e l , G. F u c h s , K. F i s c h e r , W. H o l z h a u s e r and F . Lange

Zentralinstitut fiir Festkorperphysik und Wevkstofforsahung, 8027 Dresden, V.R.G.

Résumé - On présente des résultats montrant l'augmentation de la densité de courant dans des conducteurs techniques de V Ga par dépôt d'indium avant le recuit de diffusion. On discute l'influence de l'indium sur la structure du V

3

Ga.

Abstract - Results of enhancement of current density of technical V3Ga conductors by deposition of indium prior to diffusion annealing are presented. The influence of indium on the V,Ga structure is discussed.

Recently it has been demonstrated that for the construction of superconducting high-field magnets besides N b ^ n also bronze processed V3Ga multifilamentary conductors may be successfully used /1,2,3/. The highest fields which have been reached up to now by means of V^Ga-NbTi magnet systems are 12.4 Tesla in 80 mm / 2 / and 13 Tesla In 30 mm free bore /3/. Higher fields can be produced economically only by improving the overall critical current density (Jc) of the conductors. One possibility to achieve this aim are third elements, added to the CuGa matrix /4,5/. As was demonstrated in former investigations with single core wires the current carrying capacity was most effectively improved by indium /6/. The present paper deals with the enhancement of Jc of technical conductors by adding indium.

Experimental

The samples used throughout this investigation were either wires with 0.18 mm diameter containing 109 filaments or stranded cables consisting of six wires and a central tungsten wire with same diameter. Etching and electroplating of indium on to the sample surface was performed prior to thermal treatment essentially in the same way as described earlier /6/. The samples were annealed in vacuum or in helium atmosphere.

The field dependence of the critical current of cables was measured in a VoGa-UbTi magnet up to 10 Tesla at 4.2 K. For that purpose the annealed samples (length 18 cm) were wound on to a sample holder with 26 mm diameter. The critical current was defined according to 1 /uV per 10 cm length of sample. Additionally, measurements of critical currents of multifilament wires have been performed in Bitter magnets of ILMT Wroclaw up to Bo2. By using pole pieces the field range was extended to 22.5 Tesla. Samples for this measure- ment were annealed in a hair-pin like geometry according to the shape of pole pieces to avoid undue bending of the material.

Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphyscol:1984187

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Cl-426 JOURNAL DE PHYSIQUE

In some cases additionally to Ic further parameters have been measured as critical tempera:$ercf ayer thicknesra of V Ga using optical microscopy and concentration of indium and g a b ium by means of X-ray microanalyaie.

Results and discussion

In Fig. 1 the critical current of cables is represented as a function of thickness of deposited indium and of annealing conditions, where Ic values refer to a field of 10 Tesla. With rising thickness of indium layer the critical current increases up t8 60 per c ~ n t for annealing temperatures in the range from 555 C to 570 C.

For tem~eratures above about 600 OC and nom~arativels thick indium layers a decrease of Ic occurs. But it cannot be exciuded, that the bending diameter of 26 mm causes already a mechanical degradation of the samples considering the fact, that a combination of high annealing temperatures with large amounts of indium results in quite brittle material. Measurements are under way to clear this problem.

In Fig. 2 the critical current density of multifilamentary wires related to the overall cross ~lection of the samples is plotted against magnetic field up to Bc . It is obvious that the deposition of 2 urn indium prior to thermaf treatment leads to an increase of currehj densdty in the whole field range. The highest J 08

3.3910 A/om at 15 Tesla was found after annealing at 570 C.

Fig. 2 contains also the I (B) dependence of an indium-treated cable of 125 m length recatculated for one wire. A piece 1 m long was used for this measurement.

An essential cause for the improved critical current of samples containing indium ia an accelerated V3Ga layer growth rate, which was established for single core wires /6/ and also for multifila- mentary conductors, see Fig. 3. Details of the influence of indium on the V Ga growth rate will be discussed elsewhere.

Fig. 4 s2ows the relative enhancement of critical current via reduced field B/B 2. A greater content of V3Ga phase alone would only result in a Field-independent enhanced aIc/Ic. The rise of the curves in Fig. 4 towards higher fields therefore indicates a changed pinning in the V3Ga layer of indium-treated samples which is eepecially favourable in the high field range.

The influence of low concentrations of indium on the intrinsic superconducting parameters of V Ga is small as is to be concluded from the small increase of critlcal temperature ( S 0.2 K) and upper critical field (10.2 Tesla) of the investigated multifila- mentary conductors.

The experimental evidence obtained by ESMA, that only a small amount of indium is contained in the V Ga layer is in accordance to the before-mentioned finding. Therelore, the changed pinning in indium-treated samples may be referred to the fact, that besides growthrate also the grain structure of the V3Ga layer is influenced by indium. Investigations to settle this point are in progress .

Fig. 5 shows the compar&son between the Jc(B) dependence of s V Ga filamentary wires. It is obvious, that the Jc values of the sample annealed at 570 C and commercially processed Nb3Sn mult 2 -

indium-treated V Ga conductor in the high field range are

comparable with $hose of the best Nb3Sn conductors.

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References

/ I / ECKERT D., FISCHER K.

A

FRENZEL C . , GLADUN A., HoLZ~USER W.,

KNORN M., LANCE F., MOBIUS A . , VERGES P.

IEEE T r a m . Magn. MAG-1x (1981)632

/2/ ECKERT D., FKENZEL C., GLADUN A , , HOLZH&JSER W., VERGES P., ANASHKIN D.P. , KEILIN V.E. SURIN M . 1 .

Cryogenics 2? ( 1 982) 184 /3/ TACHIKAWA K.

i n "Filamentary A? 5 Superconductors", E d i t . : M. Suenaga, A.F. C l a r k , Plenum fieas, New York and London 1980, p.1 /4/ YOSHIDA Y e , TACHIKAWA K O , IWASA

Y e

Appl. Phys. L e t t e r s 3 (1975)632

/5/ TACH3KAWA K O , TANAKA Y o , YOSHIDA Y e , ASANO T., IWASA Y.

IEEE Trans. Magn. BbAG-15 (1979)391

/6/ FISCmR K., ROHR S., MUNCH J., HOLZH~~USER W., LANCE F.

IEEE Trane . Magn. MAG-1 7 ( 1981 ) 2032 /7/ SUENAGA M., SAMPSON W.B., LUIiMAN T.S.

IEEE T r a n s . Magn. MAG-17 (19811646

Fig. 1 - C r i t i c a l c u r r e n t of c a b l e a a t 10 T e s l a a s a f u n c t i o n

o f indium d e p o s i t i o n and a n n e a l i n g c o n d i t i o n s

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JOURNAL DE PHYSIQUE

Fig.2 - Influence of I n on c r i t i c a l c u r r e n t density.

f u l l symbols: 2 urn I n depos.

empty symbols : dQol)t I n A 540:~/425h '1 570 C/215h

570 C/215h Ic/6 of cable

m 630°c/ 70h

Pig.3 - Influence of I n on V Ga l a y e r growth r a t e

d 2-3 urn I n deposition

o with6ut I n

Fig.4 - Relative enhancement o f c r i t i c a l current vs.

reduced magnetic f i e l d

Fig.5 - Comparison of I n - t r e a t e d V Ga wire (curve) with

c~mmercial Nb3Sn wires /7/

A AERE V Airoo

0 Airco 0 Vac.

Airco + I G C % g%/Airco

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