Electronics Letters, vol. 50, n° 15, 1063-1065, 2014, IET (ex. IEE).
Robustness of Radon transform to white additive noise:
General case study
N. Nacereddine, S. Tabbone, D. Ziou
Abstract:
A detailed study is presented on the robustness of the Radon transform to additive white noise for the general case of a rectangular grey-level image.
Keywords: Radon transform, white additive noise.