Toward a reliability analysis method of wide band gap power electronic components and modules

HAL Id: hal-00952709

https://hal.archives-ouvertes.fr/hal-00952709

Submitted on 27 Feb 2014

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Toward a reliability analysis method of wide band gap power electronic components and modules

Guillaume Parent, Gregor Massiot, Vincent Rouet, Catherine Munier, Paul-Etienne Vidal, Francisco Carrillo

To cite this version:

Guillaume Parent, Gregor Massiot, Vincent Rouet, Catherine Munier, Paul-Etienne Vidal, et al..

Toward a reliability analysis method of wide band gap power electronic components and modules.

IMAPS-Europe European Microelectronics and Packaging Conference EMPC, Sep 2013, Grenoble,

France. �hal-00952709�

This is an author-deposited version published in: http://oatao.univ-toulouse.fr/

Eprints ID: 10734

To cite this version:

Parent, Guillaume and Massiot, Gregor and Rouet, Vincent and Munier, Catherine and Vidal, Paul-Etienne and Carrillo, Francisco Toward a reliability analysis method of wide band gap power electronic components and modules. (2013) In: IMAPS-Europe European Microelectronics and Packaging Conference EMPC, 09 September 2013 - 12 September 2013 (Grenoble, France).

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Toward a Reliability Analysis Method of Wide Band Gap Power Electronic Components and Modules

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