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Excitation dependence of photoluminescence transitions

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• defect- or band-occupation known by Fermi-function 𝑓(𝜙) 𝐼𝑃𝐿 ∝ 𝑓1(𝜙)𝑓2(𝜙)

• exponential term 𝑒𝑥𝑝(𝐸𝑖−𝐹𝑖(𝜙)

𝑘𝐵𝑇 ) replaced by power-law 𝑐𝑖𝜙𝑘𝑖

Recombination between two states:

1. No state gets fully occupied with excitation 𝐸1/2 − 𝐹1/2(𝜙) ≫ 𝑘𝐵𝑇

𝑰𝑷𝑳 ∝ 𝝓𝒌𝟏+𝒌𝟐 ∝ 𝝓𝒌

2. One state gets fully occupied with excitation 𝐸1 − 𝐹1(𝜙) ≈ 𝑘𝐵𝑇

𝑰𝑷𝑳 ∝ 𝝓

𝒌𝟏+𝒌𝟐

𝟏 + 𝒄𝟏𝝓𝒌𝟏

3. Both states get fully occupied with excitation 𝐸1/2 − 𝐹1/2(𝜙) ≈ 𝑘𝐵𝑇

𝑰𝑷𝑳 ∝ 𝝓

𝒌𝟏+𝒌𝟐

𝟏 + 𝒄𝟏𝝓𝒌𝟏 + 𝒄

𝟐𝝓𝒌𝟐 + 𝒄𝟏𝒄𝟐𝝓𝒌𝟏+𝒌𝟐

Excitation dependence of photoluminescence transitions

Conrad Spindler, Jan Sendler and Susanne Siebentritt

University of Luxembourg

Laboratory for Photovoltaics

Rate equations

Photoluminescence transitions

Model function

Summary

• excitation dependence more complicated than usually assumed • most curved Power-laws described by straightforward fit-function 1. Power-law exponent k consists of multiples of 1/2

2. curved Power-laws due to saturation of one involved defect or due to saturation of one capture-state in between

 resulting reduction of k by 1/2  curved excitation dependence 3. k-value increases if lower capture-state is present (empty)

 superlinear Power-law for donor-acceptor-pair transition

Motivation

1. excitation dependence often described with 𝐼𝑃𝐿 ∝ 𝜙𝑘  Power-law exponent k: slope of linear fit in log-log-plot  fitting models for curved dependence of 𝐼𝑃𝐿(𝜙) needed

2. excitation dependence often used to distinguish transitions [1] EXC: 1 ≤ 𝑘 FB/DAP: k ≤ 1

 deviations from this behaviour observed in experiments

 more models of k-values needed for further characterization

Limits

free exciton FX 1 ≤ 𝑘 ≤ 2 no saturation of the bands free-to-bound FB 12 ≤ 𝑘 ≤ 2 > 1: deeper capture levels donor-acceptor DAP 0 ≤ 𝑘 ≤ 2 > 1: deeper capture levels

Samples

• epitaxially grown Cu-rich chalcopyrites: CuInSe2 and CuGaSe2 • high PL-intensity occurs from deep defects in CuGaSe2

• observed free exciton emission in both samples

• no or negligible bound exciton emission (not discussed here)

• low temperatures  no thermal activation of defects • for simplification no bound excitons taken into account • one shallow donor 𝑁𝐷, shallow acceptor 𝑁𝐴, deep trap 𝑁𝑇

1. 𝑑𝑛𝑑𝑡 = 𝑐𝜙𝜙 − 𝑐𝑛𝐷𝑛 𝑁𝐷 − 𝑁𝐷0 − 𝑐𝑛𝑇𝑛 𝑁𝑇 − 𝑁𝑇0 − 𝑐𝑛𝐴𝑛𝑁𝐴0 − 𝑐𝑛𝑝𝑛𝑝 = 0 2. 𝑑𝑛𝐹𝑋 𝑑𝑡 = 𝑐𝑛𝑝𝑛𝑝 − 𝑐𝐹𝑋𝑛𝐹𝑋 = 0 3. 𝑑𝑁𝐷0 𝑑𝑡 = 𝑐𝑛𝐷𝑛 𝑁𝐷 − 𝑁𝐷 0 − 𝑐 𝐷𝑇𝑁𝐷0 𝑁𝑇 − 𝑁𝑇0 − 𝑐𝐷𝐴𝑁𝐷0𝑁𝐴0 − 𝑐𝐷𝑝𝑁𝐷0𝑝 = 0 4. 𝑑𝑁𝑇0 𝑑𝑡 = 𝑐𝑛𝑇𝑛 𝑁𝑇 − 𝑁𝑇0 + 𝑐𝐷𝑇𝑁𝐷0 𝑁𝑇 − 𝑁𝑇0 − 𝑐𝑇𝐴𝑁𝑇0𝑁𝐴 0 − 𝑐 𝑇𝑝𝑁𝑇0𝑝 = 0 5. 𝑑𝑁𝐴0 𝑑𝑡 = 𝑐𝐴𝑝 𝑁𝐴 − 𝑁𝐴 0 𝑝 − 𝑐 𝐷𝐴𝑁𝐷0𝑁𝐴0 − 𝑐𝑇𝐴𝑁𝑇0𝑁𝐴0 − 𝑐𝑛𝐴𝑛𝑁𝐴0 = 0 6. 𝑛 + 𝑁𝐴− = 𝑝 + 𝑁𝐷+ + 𝑁𝑇+ charge neutrality FX: 𝐼𝐹𝑋 ∝ 𝑛𝑝 FB-D: 𝐼𝐹𝐷 ∝ 𝑁𝐷0𝑝 FB-T: 𝐼𝐹𝑇 ∝ 𝑁𝐷0𝑝 FB-A: 𝐼𝐹𝐴 ∝ 𝑛𝑁𝐴0 DA-D: 𝐼𝐷𝐴 ∝ 𝑁𝐷0𝑁𝐴0 DA-T: 𝐼𝑇𝐴 ∝ 𝑁𝑇0𝑁𝐴0

Acknowledgements:

Thomas Schuler, Michele Melchiorre

• transitions eD+, eT+, D0T+, A0h mostly non-radiative (low E)

• nearly no free carriers e/h at lowest temperatures/excitations  shallow- and deep defect-pair transitions are likely dominant

[1] T. Schmidt et. al., Phys. Rev. B. 45(16), 8989 (1992)

[2] C. Spindler et. al., Appl. Phys. Lett. 109, 032105 (2016)

Power-law exponent ki is sum of k-values from involved states 1. two states with no capture-states in between:

increasing excitation: k=1 → k=1/2 → k=0

2. two states with capture-state e.g. for electrons in between: increasing excitation: k=3/2 → k=1 → k=1/2 → k=0

• excitation dependence can just be fitted with case 3

 two defect levels get saturated in the used excitation range • dominant DA2-transition shows Power-law close to 1 for

lowest used excitations

 no significant trapping of electrons from the donor-site by deep defects

Power-law exponents

• excitaion dependencies can be fitted with case 2 and fixed k-values [2]  just one defect gets saturated by excess carriers

• k-values of all transitions get reduced by 1/2 due to defect saturation • excitation dependence of deep TA-transitions is identically

 known shallow acceptor gets saturated and not the deep trap levels [2]

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