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Ex t e nsion of N RC Fluore sc e nc e
M e a sure m e nt Ca pa bilit ie s
CORM 2012, Session I, 30 May 2012
NRC Sussex, Ottawa, Canada
Joanne Zwinkels, Mario Noel and Bill Neil
Out line
• Background of NRC Fluorescence Project
- Instrumentation & services: surface fluorescence
• Extension to Volume Fluorescence
- Results of international comparison
• Extension to NIR Fluorescence
- Impact on use of colour standard tiles
• Extension to Other Measurement Geometries
- 3M Goniospectrofluorimeter Facility
- Preliminary characterization results
N RC Re fe re nc e Spe c t rofluorim e t e r
• Based on two-monochromator method • Measurement geometry: 45°a/0°
J. Zwinkels et al., Applied Optics, 36, 892-902 (1997)
370 400 430 460 490 520 550 580 610 640 250 290 330 370 410 450 0.0E+00 1.0E-03 2.0E-03 3.0E-03 4.0E-03 5.0E-03 6.0E-03 7.0E-03 8.0E-03 L um in an ce r ad ian ce f act or Emission (nm) Excitation (nm) 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 300 400 500 600 700 800 Wavelength (nm) R adi anc e f ac tor s Total D65 Reflected Luminescent
Why Ca librat e ?
500 560 620 680 740 800 370 420 470 520 570 620 0.0E+00 2.0E-03 4.0E-03 6.0E-03 8.0E-03 L u m in an ce r ad ian ce fact o r Em ission (nm ) Excitation (nm ) Raw Bispectral Lum inescent Radiance Factor500 560 620 680 740 800 370 420 470 520 570 620 0.0E+00 2.0E-03 4.0E-03 6.0E-03 8.0E-03 1.0E-02 L u m in an ce r ad ian ce fact o r Em ission (nm ) Excitation (nm ) Norm alized Bispectral Lum inescent Radiance Factor
0.0 0.5 1.0 1.5
300 400 500 600 700 800
Raw “Measured” After Calibration
Total (D65)
True result
“after calibration” Erroneous result “raw” data
Surfa c e Fluore sc e nc e
N RC Ca librat ion Se r vic e s
Total Spectral Radiance Factors
βT (45ºa/0º); βT = βR + βF 300 – 850 nm, 5 nm bandpass • Selected illuminants (CIE D65, C,A, D50, custom)
• In accordance with ASTM and CIE
colorimetry standards
Solid Samples:
Paper, textile, paint, plastics, pressed powdersSpectral Quantum Yields
Fluorescent Quantum Yield
0% 10% 20% 30% 40% 50% 60% 70% 250 300 350 400 450 Excitation Wavelength (nm)
Ex t e nsion t o Volum e Fluore sc e nc e
Background:
•
Increasing use of fluorescence techniques as a quantitative
analytical tool
•
Increase in biological and medical applications of fluorescence,
e.g. probes and labels
•
Increasing diversity of fluorescence instrumentation
•
Fluorescence measurements are very dependent on
instrument-specific effects (wavelength, polarization, aging)
Ex t e nsion t o Volum e Fluore sc e nc e
Specifications for Intercomparison:
SAMPLES: fluorescent dyes
• Transparent
• Side-viewing
• 0°/90° geometry
• High resolution (1 or 2 nm)
• Low concentration (weak
fluorescence)
•
LI QU I DS
Specifications of NRC Spectrofluorimeter:
IDEAL: fluorescent surface colours
• Opaque
• Front-surface viewing
• 45°/0° geometry
• Medium resolution (5 nm)
• Moderate to strong fluorescence
•
SOLI DS
NRC – invited to participate in an International Comparison of Correction of Emission Spectra
Pre lim ina r y N RC Re sult s
Spectrum of Quinine Sulfate Dihydrate, First look !
370 390 410 430 450 470 490 510 530 550 570 590 610 630 650 670 Wavelength (nm) R el at ive F lu o rescen ce I n ten si ty Expected value at HV= 1100 V
S/N ~ 5:1
=> Need to
Increase
S
and
Decrease
N
Increase S:- Optimize sample presentation - Optimize system throughput
Decrease N:
Ex t e nsion t o Volum e Fluore sc e nc e
Re-optimization of instrument parameters
- No ground loops - No cooler switching noise - Choice of cuvette - Cuvette positioning - PMT high voltage
S/N ~ 100:1
(20x
improvement
)
0 0.2 0.4 0.6 0.8 1 1.2 375 400 425 450 475 500 525 550 575 600 625 650 675 R el at iv e F lu o rescen ce I n ten si ty Wavelength (nm)Quinine sulphate dihydrate (0.08A) Raw
N RC Fina l Com pa rison Re sult s
0.0E+00 1.0E-04 2.0E-04 3.0E-04 4.0E-04 300 350 400 450 500 550 600 650 700 750 A B C D E Y SRM936a-0,08 SRM936a-0,04 X Wavelength (nm)U nc e r t a int y Ana lysis – Volum e
Fluore sc e nc e M e a sure m e nt s
Uncertainty Component Type Standard
Uncertainty (k=1) Relative Uncertainty Measurement repeatability A 1.0% 1.0% Wavelength B 0.10 nm 0.2% Detector linearity B <0.20% <0.20%
Radiometric calibration of emission unit
Spectral irradiance standard B 3.0 – 0.5% 3.0 – 0.5% Spectral radiance factor
standard
B 0.2% 0.2%
Transfer of relative spectral emission calibration
B 0.4% 0.4%
Total expanded (k=2) uncertainty
Spe c t ra l Em ission Cor re c t ion
Com pa rison Re sult s
Participants:
• NIST BAM
• PTB • NRC
U. Resch-Genger et al. Anal. Chem., 84, 3889-3898 (2012)
State-of-the-art
comparability of
corrected
emission spectra
~4.2%
Fluore sc e nc e Re se a rch
400 500 600 700 800 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 Samples Gray Green Red Cyan R ef lec tanc e Fac tor (R ) Wavelength [nm] Colour standards: Requirement: reflectance is independent of mode of measurementKoo, A . et. al, Appll. Opt., 49, 2375-2381(2010)
Nadal, M., Miller, C., and Zarobila, C., Color Res. Appl., (2010) Monoch. Illumination/ polych. detection
Tra c e a bilit y of N RC Fluore sc e nc e
M e a sure m e nt s
Standard Detector 0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45 250 350 450 550 650 750 850 950 1050 1150 Wavelength (nm) R e sp o n si v it y s-polarized p-polarized Standard Lamp 0.0 1.0 2.0 3.0 4.0 5.0 300 350 400 450 500 550 600 650 700 750 800 Wavelength (nm) Irra d ia n ce Standard Reflector 0.99 1 1.01 1.02 1.03 350 400 450 500 550 600 650 700 750 800 850 45/ 0 R ad ian ce F ac torCD = calibrated detector
CS = calibrated light source
CR = calibrated reflector
CD: 1. Calibrate monitor detector CD-CR: 2. Calibrate excitation unit CS-CR: 3. Calibrate emission unitSpe c t ra l Em ission Ca librat ion
Three Methods:
- Physical Transfer Standards
: CS
-
CR
-
Physical Transfer Standards
: CD-
CR
- Certified Reference Material: RM
0.00 0.01 0.02 0.03 0.04 0.05 0.06 0.07 350 400 450 500 550 600 650 700 750 800 Wavelength (nm) Grating B Grating A
Ex t e nsion t o N I R:
CD
-
CR
M e t hod
)
(
)
(
)
(
)
(
2λ
β
λ
λ
λ
std ref sw sysE
k
i
R
=
0.00 0.20 0.40 0.60 300 500 700 900 1100I
sw(λ)
0.0 1.0 2.0 3.0 300 500 700 900 1100 Wavelength (nm)E
ref(
λ)
Emission Unit Spectral
Responsivity, R
sys(
λ)
CD
Excitation Unit Spectral
Ex t e nsion t o N I R
0.00 0.10 0.20 0.30 0.40 0.50 300 400 500 600 700 800 900 1000 1100Responsivity Emission Unit, Grating B
R emission (Vertical) R emission (Horizontal) Wavelength (nm) 0.00 0.10 0.20 0.30 0.40 0.50 300 400 500 600 700 800 900 1000 1100
Responsivity Emission Unit Unpolarized, Xe 2011 Responsivity with Tungsten lamp (ISWB2012)
CS-CR
Ex t e nsion t o N I R
350 440 530 0.00E+00 1.00E-05 2.00E-05 3.00E-05 4.00E-05 5.00E-05 700 750 800 850 900 950 1000 Excitation (nm) R aw B is p ec tr a l F a ct o r Emission (nm) 350 480 0 0.0001 0.0002 0.0003 0.0004 0.0005 700 750 800 850 900 950 1000 Excitation (nm) B is p ec tr a l F a ct o r Emission (nm) 360 460 560 0.00E+00 1.00E-05 2.00E-05 3.00E-05 4.00E-05 5.00E-05 Excitation (nm) Ra w B is p ec tr a l F a ct o r CCS Yellow CCS OrangeCorrected
Raw
Raw
I m pa c t of N I R Fluore sc e nc e
0.0 0.2 0.4 0.6 0.8 1.0 1.2 300 400 500 600 700 800 900 1000 R a d ia n t P o w e r ( a .u .) Wavelength( (nm) A Equi-energy Xe sourcePolychromatic illumination mode
0.0 0.2 0.4 0.6 0.8 1.0 1.2 300 400 500 600 700 800 900 1000 Radiance factor ß 45:0 Wavelength (nm)
CCS Orange
0.0 0.2 0.4 0.6 0.8 1.0 300 400 500 600 700 800 900 1000 Wavelength (nm)CCS Yellow
Ex t e nsion t o Ot he r Ge om e t rie s:
Gonio- a nd Sphe re
Motivation:
Research Optical Properties of Materials
Gonio-characteristics of fluorescent white standards
New Calibration Services
Gonio-apparent fluorescent materials(security, decorative materials)
Standardization Procedures
Study geometric dependence: primary c.f. transfer calibrations
- Reference measurements: bidirectional geometry (45:0) c.f.
- Commercial instruments & Standard Test Methods (ISO, ASTM, AATCC) : sphere geometry (d:0, d:8).
Goniospe c t rofluorim e t e r Fa c ilit y
Gonio – variable angles of incidence and detection
Donated to NRC in 2009 by 3M Co.
Complements the NRC Reference Spectrofluorimeter
Gonio- spectral fluorescence: Spectral range: 300- 850 nm Spectral bandpass: 5 nm Incidence: 0° to 90°
Viewing: 22° to 180°
Seve ra l M e a sure m e nt Ge om e t rie s
Bidirectional reflectance (45a:0)
Hemispherical reflectance (sphere method)
Goniospe c t rofluorim e t e r
Xe source + excitation mono Sample compartment Emission mono + PMT detectorPre lim ina r y N RC Re sult s
S/N ~ 5:1
=> Need to
Increase
S
and
Decrease
N
Increase S: - Re-coat mirrors - Refurbish predisperser - Re-optimize optical design - Improve optical alignmentDecrease N:
-Optimize lock-in operation: phase
-Optimize software :data -4E-05 0 4E-05 8E-05 0.00012 0.00016 0.0002 500 550 600 650 700
Sample: SFS-336 , 0/45, raw data
Cur re nt N RC Re sult s
Increase S:
- Change to AR-coated quartz beamsplitter
Decrease N:
-Add order-sorting filters -Improve stability of lock-in & chopper method -2E-05 3E-05 8E-05 0.00013 0.00018 0.00023 500 550 600 650 700
Sample: SFS-336 , 0/45, EX=350 nm, raw data
Sep2010 Apr2012
Ca librat ion of Em ission U nit –
Ca librat e d Sourc e M e t hod
Spectral radiance
Spectral reflectance standard
M e a sure d Em ission U nit Dat a (ra w )
0 0.002 0.004 0.006 0.008 0.01 0.012 0.014 0.016 330 430 530 630 730 830 0/25 0/30 0/35 0/40 0/45 0/50 0/55 0/60 0/65 0/70 0/75 0/80 Wavelength (nm)Tra c e a bilit y: Spe c t ra l Em ission Dat a
Calibrated spectral reflectance standard (pressed PTFE) BRDF data: 0/25 to 0/80 degrees
Calibrated spectral radiance sphere source 0.8 0.85 0.9 0.95 1 1.05 1.1 400 500 … 600 700 Wavelength (nm) 0 100 200 300 400 500 600 700 800 900 380 580 780 980 Wavelength (nm)
Em ission U nit Spe c t ra l
Cor re c t ion
0 1 2 3 4 5 350 450 550 650 750 25 30 35 40 45 50 55 60 65 70 75 80 Corrected for: • Gonio/spectral of PTFE reflectance standard • Spectral transmittance of ND filter (0.7) • Standard spectral radiance source Spectral Correction – NOT GEOMETRY-DEPENDENT Wavelength (nm) (R e spo ns iv it y )-1Cur re nt N RC Goniofluore sc e nc e
M e a sure m e nt Re sult s
0 0.00005 0.0001 0.00015 0.0002 0.00025 0.0003 500 550 600 650 700 SFS-336 , 0/45, EX=350 nm - CorrectedComparison with NRC Reference Spectrofluorimeter
corrected reference
2nd order SRE (EX= 350 nm)