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Strongly Correlated Charge Transport in Silicon Metal-Oxide-Semiconductor Field-Effect Transistor Quantum Dots

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FIG. 2. Description of the experiment. The charge carriers in the silicon-on-insulator (SOI) channel are symbolized by the red clouds, showing the drain and source reservoirs on either side of the quantum dot
FIG. 3. (a) Differential conductance dI=dV DS measured as a function of gate voltage V g and drain-source voltage V DS
Figure 4 shows that, unexpectedly, F takes super- super-Poissonian values even for V DS below the inelastic  cotun-neling onset, close to the edges of the diamonds

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