Recent research activities at NRC in Photometry and Radiometry

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Access and use of this website and the material on it are subject to the Terms and Conditions set forth at Recent research activities at NRC in Photometry and Radiometry Rowell, Nelson

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Ove r vie w of N RC Phot om e t r y a nd

Ra diom e t r y M e a sure m e nt

Se r vic e s

Nelson Rowell

Measurement Science and Standards

National Research Council of Canada

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Phot om e t r y a nd Ra diom e t r y w it hin t he M e a sure m e nt

Sc ie nc e a nd St a nda rds Por t folio at t he N at iona l Re se a rch

Counc il

Programs

• Measurement Science

for Emerging

Technologies

• Metrology for Industry

and Society

• Scientific Support for

the National

Measurement System

Groups

• Biotoxins Metrology

• Chemical Metrology

• Electrical Power Measurements

• Electrical Standards

• Frequency and Time

• Ionizing Radiation Standards

• Mechanical Metrology

• Photometry, Radiometry &

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Phot om e t r y a nd Ra diom e t r y M e a sure m e nt

Se r vic e s

Se r vic e Are a s

 Radiometry

 Spectroradiometry/Photometry

 Radiation Thermometry

 Spectrophotometry

 Emerging Areas

_{If you'd like more:}

PR Measurement

Course 24-26 Oct.

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Ra diom e t r y m e a sure m e nt se r vic e s

Team: Charlie Bamber, Rick Gerson and TeamCryorad

(Jeff, Éric, Andrew)

Detector/Photometer Calibrations

Properties

Responsivity, temperature coefficients, linearity,

uniformity, angular dependence, UV meters

Range 200 - 3000 nm

Types of detectors - CW mode

Traceability - cryorad link

Quality system

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SPECT RAL M EASU REM EN T S :

BROADBAN D SOU RCES & M ON OCH ROM ATORS

ADVANTAGES :

• WIDE SPECTRAL COVERAGE , ANY STEP SIZE , FULLY AUTOMATED

DISADVANTAGE :

• NOT AS ACCURATE AS LASER-BASED SYSTEMS

MONOCHROMATOR-BASED CALIBRATIONS AT

• PRIMARY LEVEL ( CRYOGENIC RADIOMETER )

• SECONDARY LEVEL ( ESR , TRANSFER STANDARDS , INTERCOMPARISONS )

• MONOCHROMATOR FILTER WHEEL SHUTTER SOURCE MIRRORS A B DETECTORS

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N RC CRYORADI OM ET ER SYST EM

CRYO-

RAD

Sources

Monochromators

Secondary

Radiometer

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SPECT RAL RESPON SI V I T Y APPARAT U S ( 2 0 0 nm - 3 0 0 0 nm )

HOLOGRAPHIC GRATINGS ELLIPSOIDAL REFLECTOR TURNTABLE WORKING STANDARD TEST DETECTORS ORDER SORTING FILTERS XENON ARC LAMP TUNGSTEN HALOGEN LAMP F/9 beam MONOCHROMATOR

S

(λ) = S

(λ) I

/ I

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Wavelength / nm

200 400 600 800 1000 1200 1400 1600 1800 2000 2200 2400 2600 2800 3000

Re

sp

on

si

vi

ty

/

am

ps

p

er

wa

tt

0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 1.3 SILICON PHOTODIODES GERMANIUM PHOTODIODES INDIUM ANTIMONIDE PHOTODIODES PtSi

SPECT RAL RESPON SI V I T Y M EASU REM EN T S :

REFEREN CE DET ECTORS & SPECT RAL RAN GES

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Team: Arnold Gaertner, Jeff Lundeen, Éric Côté

Facilities

Traceability - world-mean scale

High temperature black body

Quality system

Properties

Types of sources - Incandescent, LED

Applications/clients

Spectroradiometry

Spectral irradiance lamp standards

350 - 1600 nm

Spectral radiance source standards

380 - 1060 nm

- spectroradiometers

- irradiance

- radiance

Spe c t rora diom e t r y m e a sure m e nt se r vic e s

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Phot om e t r y m e a sure m e nt se r vic e s

Phot om e t r y of I nc a nde sc e nt La m ps

t ot a l lum inous flux (lum e n st a nda rds)

lum inous int e nsit y st a nda rds

illum ina nc e st a nda rds

c olour t e m pe ra t ure

la m p a ging

Ca libra t ion of Phot om e t ric I nst rum e nt s

a nd Sourc e s

- illum ina nc e m e t e rs

- lum ina nc e m e t e rs

- lum ina nc e sourc e s

Team: Arnold Gaertner, Jeff Lundeen,

Éric Côté

Traceability - NRC absolute radiometer

Quality system

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Team: Jeff Lundeen, Charlie Bamber, Rick Gerson

Facilities

Correlated photon measurements

Traceability

Applications/clients

Qua nt um ra diom e t r y m e a sure m e nt se r vic e s

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Team: Joanne Zwinkels, Mario Noël, Éric Côté, Réjean Baribeau,

Bill Neil, Nelson Rowell

Facilities

Traceability / mutual recognition arrangement

Quality system

Properties measured

Types of samples

Applications/clients

Spe c t rophot om e t r y m e a sure m e nt se r vic e s

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Spe c t rophot om e t r y

Re fe re nc e Spe c t rophot om e t e r

U nc e r t a int y: 2 .5 pa r t s in 1 0

4

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Spe c t rophot om e t r y

Ca libra t ion Se r vic e s 2 5 0 - 2 5 0 0 nm , 5 0 0 0 - 5 0 0 c m

-1

M. Noël

Regular Reflectance and Transmittance

Best meas. capability 0.2%

T(Φ, Φ); Φ = 0º, ± 60º

R(Φ, Φ); Φ = 7.5º

15º–75º (s- and p-polarized)

Calibrated reflectance standards

Colorimetric calculations

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Spe c t rophot om e t r y:

Diffuse Re fle c t a nc e a nd Tra nsm it t a nc e

M. Noël

Diffuse Reflectance and Transmittance

UV-VIS-NIR

_:

_{250 - 2500 nm}

MIR

_{: 5000 - 600 cm}

-1

T(0º/ d): UV-VIS-NIR and MIR

R(8º/d), R(8º/t): UV-VIS-NIR

R(0º/d), R(15º/t): MIR

R(0º/45º): 380 - 1100 nm

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Goniom e t ric M e a sure m e nt s

Gloss:

20°, 60°, 85° (ISO 2813,

ASTM D523)

- Paints, ceramics, textiles

75° (ISO 8254-2, DIN

method)

75° (ISO 8254-1, TAPPI

method)

BRDF:

Metallic, diffuse, thin films

Robot

Source

Spectro-

radiometer

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N RC Fluore sc e nc e Fa c ilit ie s & Ac t ivit ie s

Facilities:

Research:

NIST-BAM-PTB-NRC comparison of spectral emission (8 dyes)

Reference

Spectrofluorimeter

45

o

_:0

Goniospectrofluorimeter

Intercomparisons:

Weak NIR fluorescence of ceramic color

standards Impact on

spectrophotometric calibrations

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N RC Fluore sc e nc e

Calibration Services

Total Spectral Radiance

Factors

R

_T

(45ºa:0º); R

_T

= R

_R

+ R

_F

• Emission: 300 to 850 nm

(250 to 1050 nm )

• Selected illuminants (D65,

C,A, D50,custom)

• Comply with ASTM, CIE and

ISO Standards

Photoluminescence

Quantum Yield

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Fluore sc e nc e Re se a rch

I m pa c t on St a nda rdiza t ion

300 340 380 420 ₄₆₀ 500 540 580 620 250 260 270 280 290300 310320 330340 350 0.0E+00 5.0E-05 1.0E-04 1.5E-04 2.0E-04 2.5E-04 Emission λ (nm) Excitation λ (nm)

Normalized Bispectral Luminescent Radiance Factor

Japanese Opal Glass – Reflectance Standard

Impact:

Canadian industry

discontinued use

of this opal glass

as transfer

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I nfra re d Tra nsm it t a nc e St a nda rds

NG11 glass 1mm thick

2000 to 4000 cm

-1

_{(5000 to}

2500 nm)

1000 2000 3000 4000 5000 0.0 0.2 0.4 0.6 0.8 2010 2473 2598 2739 3031 ₃₅₁₂ 3990 R eg ul ar T rans m itt anc e Wavenumber Values (cm-1₎ Wavenumber

cm-1 Transmittance Uncertainty(95% Confidence

Level) 3990 73.04% ±0.18% 3512 14.86% ±0.08% 3031 36.26% ±0.12% 2739 6.59% ±0.06% 2598 17.27% ±0.08% 2473 10.32% ±0.07% 2010 0.01% ±0.01%

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I R Re fle c t a nc e - Va ria ble Angle

Reflectometer -

near-retro-reflection

Sample & mirror

tandem rotated - 10

o

to 80

o

Relative to Au coated

mirrors calibrated

with VW

Polarization effects >

10

o

M1

M2

M3

M4

Sample

Input

Beam

Exit

Beam

~105o

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I I I -V M at e ria l St ruc t ure

Superlattice

Very thin (< 1 nm) InGaAs layers spaced with InP

f/4

E

_s

E

_p

Wafer with Epilayers

Incident

Beam

Reflected Beam

Reflectance - Phonons

(24)

T H z Re fle c t a nc e - M onola ye r T hick La ye rs

Thickness = 0.25

nm

150 200 250 300 350 0.0 0.2 0.4 0.6 0.8 1.0 0.0 0.2 0.4 0.6 0.8 1.0 InGaAs Modes p-polarized InAs LO GaAs TO InAs TO InP undoped TO InP undoped LO Interface - LO MQW In_0.53Ga_0.47As/InP InGaAs Thick = 0.25 nm Period Thick = 22 nm Number Periods = 40 Angle 60o _{Substrate LO} Phonon/Plasmon R ef lec tanc e R at io Wavenumber Value - cm-1 s-polarized

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I R Re fle c t a nc e - Diffuse & Tot a l

Sphere reflectometer - Diffuse Reflectance

Complete hemispherical integration

Edward's configuration

Sample mounted at sphere center

Regular component included or not

Reference

Tilt 15o - axis through

entrance port center

First reflection from sphere wall

Diffuse gold coating R > 90 %

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I nt e rc om pa rison: I R Tot a l Re fle c t a nc e

Original NPL data and later data from NIST and NRC. NPL - hemiellipsoidal reflectometer in dispersive spectrophotometer

NIST & NRC used integrating spheres with FT-IR

Agreement between NPL, NIST and NRC within combined uncertainty

Angles of incidence: 15o, 12o, and 10o for NRC, NIST, and

NPL

NIST : wall mounted sample NRC: center mount 1000 2000 3000 4000 0.00 0.04 0.08 0.12 0.16 0.20 NPLNPLLo NRCNPLLo NISTNPLLo npllor2.spc

Total Reflectance - NPL SRM's

NPL 034/97 Nextel Black Velvet Paint (3M)

Wavenumber cm-1 1000 2000 3000 4000 0.72 0.76 0.80 0.84 0.88 0.92 nplhir2.spc

NPL 032/97 Flame Sprayed Aluminum

1000 2000 3000 4000 0.32 0.36 0.40 0.44 0.48 nplmer2.spc

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Team: Don Woods, Andrew Todd

Facilities

Services

Temperatures measured

Research

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La rge Ape r t ure Bla ck body Sourc e s

Fixed Point

Indium 156.5985 °C

Tin 231.928 °C

Zinc 419.527 °C

Aluminum 660.323 °C

Silver 961.78 ° C

Variable Temperature

Alcohol Bath –40 to 10 °C

Water Bath 5 to 90 °C

Water Heat Pipe 50 to 250 °C

Cesium Heat Pipe 300 to 660 °C

Sodium Heat Pipe 660 to 1000 °C

Graphite Furnace 800 to 2500 °C

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H igh Te m pe rat ure Fa c ilit y

LP3 Pyrometer

(30)

M id a nd Low -Te m pe rat ure Fa c ilit y

(31)

Se r vic e s - Ra diat ion T he r m om e t r y

Calibrations

• Industries

Cal Service

Medical

High Temperature Manufacturing

Precision Thermometry Equipment Manufacturing

• Improve the capability for radiation thermometers

• Calculate blackbody effective emissivity

(32)

Ra diat ion T he r m om e t r y Re se a rch Ac t ivit ie s

Develop high temperature fixed points (HTFPs) (1324

°C to 2474 ° C and higher)

Measure thermodynamic melting temperature of HTFPs

(33)

Future P&R services

• Surface enhanced spectrophotometry

• Quantum optical metrology

• IR chemical imaging

• High temperature eutectics

(34)

SERS, SEIRA - Plasmonics

Metal nano particles and quantum dots

Applications on the rise: 40,636 publications and more to come

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200 nm 200 nm 1 2 3 4 1 2 3 4 500 550 600 650 700 750 800 S cat ter ing ( ar b. uni ts ) Wavelength (nm) 1 2 3 4

(36)

SERS for Biose nsing a nd Bioim a ging

(a) (b) (c)

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Coincidence Rate i s R_∩ s R i R AND i s P_∩ Pair Production Rate Rate of clicks Rate of clicks i η s η Coincidence Rate i s R_∩ s R i R AND i s P_∩ Pair Production Rate Rate of clicks Rate of clicks i η s η