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Exciton distribution function and secondary radiation in polar semiconductors

C. Trallero Giner, O. Sotolongo Costa

To cite this version:

C. Trallero Giner, O. Sotolongo Costa. Exciton distribution function and secondary ra- diation in polar semiconductors. Journal de Physique, 1987, 48 (9), pp.1505-1512.

�10.1051/jphys:019870048090150500�. �jpa-00210582�

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Exciton distribution function and secondary radiation in polar

semiconductors

C. Trallero Giner and O. Sotolongo Costa

Department of Theoretical Physics, Havana University, San Lázaro y L, Havana, Cuba (Reçu le 10 fgvrier 1986, révisé le 9 avril 1987, accept6 le 12 mai 1987)

Résumé.

2014

Nous calculons une fonction de distribution explicite hors d’équilibre pour des excitons dans l’état fondamental n = 1, dans des semi-conducteurs polaires, dans le cas on ne tient compte que de l’interaction

avec les phonons acoustiques. Nous l’utilisons pour obtenir une expression générale pour la section efficace de rayonnement secondaire (valable pour les processus Raman ainsi que pour la luminescence chaude et

thermalisée). Nous appliquons les résultats à l’explication de la dépendance en température des demi-largeurs

des raies de luminescence 1LO et 2LO dans des monocristaux de CdS. Nous étudions la valeur relative des contributions des intensités Raman 3LO et de luminescence et la variation du spectre d’émission secondaire en

fonction de la durée de vie des excitons. Nous obtenons un accord quantitatif avec des résultats

expérimentaux.

Abstract.

2014

An explicit non-equilibrium distribution function for excitons in the ground state n

=

1 in the case

when the fundamental interaction is with acoustical phonons is calculated for polar semiconductors. Using it, a general expression for the secondary radiation cross-section (valid for Raman, hot and thermalized luminescence processes), is obtained. The results are applied to explain the temperature dependence of the

1LO and 2LO luminescence lines half-width in CdS single crystals. The relative contributions of 3LO Raman and luminescence intensities and the variation of the secondary emission spectrum as a function of the exciton life-time are studied. Comparison with experimental results yields quantitative agreement.

Classification

Physics Abstracts

71.35

-

78.30

-

78.55

1. Introduction.

The study of secondary radiation of light by conden-

sed matter is a powerful method of investigating elementary excitations within matter. There is a

number of investigations dealing with this problem

in polar semiconductor (see [1]).

It has been shown [2-6] that the excitonic model is

a successful one to explain the process of secondary

radiation in many polar semiconductors such as CdS, ZnTe, CdSe, etc.

In CdS the excitonic spectrum of secondary radia-

tion [2] and the relative intensities of 3LO-Raman and luminescence [3, 4] were investigated. In general

these processes of light scattering with participation

of excitons as intermediate states of the crystal can

be viewed in the following way :

a) Indirect creation of an exciton with kinetic energy Eo in the energy state with principal quantum

number n

=

1.

b) Exciton relaxation.

c) Indirect exciton annihilation with the emission

of a photon líw

s

and at least one LO-photon with

energy líw Lo. On the other hand, it is known [7] that

the differential cross-section of the secondary emis-

sion radiated by an excited solid is given by the

formula :

where c is the velocity of light in vacuum, n ( w ) the frequency dependent refraction index, and W ( w S )

the emission probability of a quantum of secondary

radiation líw s by unit of time and of solid angle li,

when an incident light quantum hw 1 is in the volume

Vo with a refraction index equal to unity.

In terms of the exciton distribution function

(EDF), W(ws) is given by [8] :

where Wi(E, w,) is the annihilation probability per unit time and solid angle with photon emission of

Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphys:019870048090150500

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1506

energy hw,

$

and emission of LO-phonons by an

exciton having kinetic energy E, averaged through

the angle between the directions of the exciton and

photon momenta, and P(E)dE is the number of excitons within the energy interval (E, E + dE).

Although the EDF for polar semiconductors has been found when the exciton kinetic energy is greater than that of an optical phonon (i.e. E

>

hw LO) [8], this problem up to now has not been solved for E

-

líúJLO. This EDF, taking into account W, (E, co,), gives the possibility to investigate the light scattering processes by the above mentioned semiconductors when the incident photon has an

energy :

Here Eg is the gap and AE is the exciton binding

energy. In the following, this is the energy interval that will be considered.

If the scattering processes are described by the

relaxation time r, and the exciton annihilation by T,

the stationary population in the band is conditioned

by both life-time and relaxation. If -r > TS, a thermal

quasi-equilibrium of excitons takes place leading to

the formation of thermalized luminescence. If this condition is not fulfilled, the emission line tends to become a Raman line with the participation of real

intermediate states.

In the case of thermalized luminescence, it is logical to expect the EDF to be a Maxwell-Bol- tzmann one, whereas for the Raman line, the corresponding EDF must be a strong non-equili-

brium one.

In section 2 we deal with the balance equation, obtaining an approximate expression for the EDF valid for both cases.

In section 3 an application of our results to experimental observations is made.

2. Exciton distribution function.

The determination of the EDF is a complex problem, governed by the specific physical conditions of the system. Let us neglect exciton-exciton interaction and consider that the exciton relaxation is con-

ditioned only by the interaction with acoustical

phonons (this is the case in clean enough polar

semiconductors when the exciton kinetic energy E .-- h(o Lo at low temperatures). In the case of an isotropic EDF the balance equation is :

where W;n represents all the contributions per unit time to the excitonic state with energy E, and conversely for Wout. So, for the processes contained in Wout we have : 1) exciton scattering w (E, E’)

from energy E to energy E’ in the quantum state

n = 1 performed by acoustical phonons ;

2) phonon-assisted transitions to states with n > 1

(Wn); 3) exciton decay (Wd ) ; 4) LO-phonon as-

sisted exciton annihilation with the emission of a

light quantum líúJ = hw 1- Khw LO (K ::. 1 ) (1/’rR) ; and 5) processes of non-radiative annihila- tion (11’rNR). For the case of exciton-LA phonon

interaction when the deformation potential model is used, it was shown [9] that processes 2 and 3 for E H(OLO are negligible. Similarly, this can be proved by taking the piezoelectric model into ac- count. Then we can write :

In the (5) the total lifetime of excitons 1 / T

=

1/TR + I/TNR is governed by radiative and non-

radiative annihilation processes.

In the same way we may represent :

where W, ,,, is the rate of indirect creation of a

Wannier-Mott exciton with energy Eo. This energy is

strongly determinated by the energy of the exciting light líúJ 1. If we suppose, for example, that exciton creation is performed by LO-phonon emission (indirect exciton creation by light, see [10]), then Eo is the exciton kinetic energy in the n = 1 state

equal to fiw -Eg+AE- HCOLO -

In the appendix a calculation of w (E, E’) is performed for piezoelectric and deformation poten- tial interaction Hamiltonians.

Using relations (4)-(6) and (A. 14) from the appen-

dix, the balance equation is transformed to :

where

Noting that the exciton energy is varied in a quite

small amount after acoustical phonon absorption or emission, we may expand f (E’, t ) as :

In the stationary case, and retaining terms up to

second order in (10), from (7) it follows that :

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being :

From inspection of (12), (A.9) and (A.13) it can be

shown that for exciton kinetic energies E > mu 2

al is negative. Although the coefficients a,,(E) can

be calculated by direct integration supposing

N [ (E’ - E)IKB T] = kB TI (E’ - E) leading to complex expressions for these coefficients, it can be

seen that a direct solution of (11) is impossible.

Nevertheless, it is possible to evaluate al and a2 by the following reasoning : owing to the fact that, according to (A.9) and (A. 13), w (E, E’ ) is different

from zero in a narrow interval, we evaluate the

energy multiplicator (E’ - E ) in (12) as As, a

characteristic energy of the order of 2 mu2 and remains in (12) the integral of the scattering proba- bility which may be identified with the inverse of the relaxation time (l/Ts(E». So, al and a2 may be expressed approximately as :

and for simplicity we consider that T s (E) is a

constant independent of the energy.

Imposing that P (E) -+ 0 for E oo and that the total number of particles in the stationary state is

we obtain for the EDF the expression :

where :

-0 (x) is the error function and B (x ) the Heaviside unit step function defined as :

If T is great enough, EDF (14) reduces to a Maxwell-

Boltzmann one :

3. Comparison with experimental results.

In this section we will apply our theoretical results to the experimental observations reported in [2-4].

3.1 HALF-WIDTH OF 1LO AND 2LO LUMINESCENCE LINES.

-

In [2] the half-width of 1LO and 2LO

luminescence lines in CdS was measured as a func- tion of temperature using an exciting radiation of

wavelength A

=

485.3 nm creating excitons with a

kinetic energy E -- ftw LO.

For the 1LO luminescence line the annihilation

probability W,(E,co ) is given by :

where q is the phonon wavevector and M is the transition matrix element given by :

The sum in (19) runs for all virtual excitonic states.

H,, - 1 (H,, - p) is the exciton-light (exciton-LO phonon) interaction Hamiltonian. In [10] this matrix element was calculated. For the energy range we deal with, the influence of the continuous spectrum

can be proved to be negligible. Then we have :

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1508

where :

ml (m2) is the effective electron (hole) mass, and

where M = M 1 + M2, EO (EOO) is the static (high frequency) dielectric constant, A is the exciton’s reduced mass, Pcv the momentum matrix element

connecting the K

=

0 valence and conduction band Bloch functions and e the polarization vector of the

incident light. Using (1), (2), and (18) we obtain :

Formula (23) permits us to obtain the thermal in-

crease of 1LO luminescence line half-width. A detailed analysis of the experimental results leads us

to conclude that in the sample used in the experiment

T is a big one, so we may use the Maxwell-Boltzmann EDF (17) in (23).

Concerning 2LO luminescence line, it can be seen

that two-phonon exciton annihilation probability is independent of energy as was shown in [2]. By this

reason the differential cross-section can be written

as :

where for this case the matrix element M is indepen-

dent of energy.

Using the matrix element calculated in [10] and P (E) from equation (17), equation (23) can be

calculated in arbitrary units for any energy. The

same applies to equation (24) taking into account

that M in that case is a constant. The half-widths of the curves given by (17) are independent of the employed units, and the comparison with exper- imental results obtained in [2] can be performed

without any adjustment.

Fig. 1.

-

Broadening of exciton emission lines in units of

hw Lo in CdS with temperature. Lines 1 and 2 were

obtained using formulae (21) and (22) respectively. The

half-widths are those at lle of the maximum intensity

value.

In figure 1 the comparison of theoretical (using

formulae (23) and (24)) and experimental results is

shown. The half-widths are given in units of

hW LO (for CdS !iw LO is equal to 0.038 eV).

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3.2 TEMPORAL EVOLUTION OF EXCITON SECOND- ARY EMISSION SPECTRUM. - In [3] the experimental study of the secondary emission in CdS single crystals, using samples with different free exciton lifetimes was reported. It was seen that the relation of 3LO luminescence integral intensity with 3LO

Raman emission line is highly dependent on the

relation between exciton lifetime and acoustical relaxation time Tg. The crystals were excited at 2K by a laser line A

=

476.5 nm. In this case 1LO

assisted exciton creation with kinetic energy E

:

/iw LO is performed. This means that 3LO emission

line is obtained by 2LO assisted exciton annihilation,

whose probability, as we already know, is indepen-

dent of energy. Then, 3LO Raman intensity (l3LO )

is due to the two-phonon exciton annihilation from the energy Eo, and we can use equation (24). This

3LO Raman intensity is proportional to equation (24) multiplied by a narrow frequency interval Aw,, which is the frequency interval used in the experiment. The intensity is proportional to the jump of the EDF P (E > Eo ) - P (E EO) = AP.

Then, from (14) it can be seen that:

The integral intensity Iz can be obtained by inte- gration of (24) in WS. This leads to the result that

I_v will be proportional to We., T, the whole number of excitons in the band. So, we may obtain :

Ií dúJ s

where A = h Aw, is a constant to adjust with

AE

experimental data. In table I a comparison of exper-

imental values with those obtained from (24) is presented for different samples.

In figure 2 secondary emission spectra of CdS samples with different lifetimes of excitons, reported

in [3] are presented and compared with results obtained from (24) with EDF given by (14). As can

be seen the EDF given by (14) satisfactorily reflects

the temporal evolution of secondary emission spec- trum as a function of exciton lifetime.

Fig. 2.

-

Exciton secondary emission spectra for CdS samples with different lifetimes. Dotted curves are theoret-

ically predicted with formula (22). The samples are those corresponding to table I.

The observed emission spectrum in the region

near 499 nm is due to the contribution of bound excitons which are not taken into account in our

model.

In [4] a comparison of the integral luminescence

intensity IA with I3LO as a function of ’r/T, was presented. This luminescence IA reveals itself as a

band of hot luminescence in the long wavelength part of the 3LO line. Its integral intensity is equal

to :

Table I.

-

Comparison of ILO obtained rom 24 with experimental . data i i I3LO and II are reported in [3] for

different samples. The proportionality constant A was adjusted to sample N 1.

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1510

Then from (26) we have :

In figure 3 the comparison with experimental

results is shown. The theoretical curve reveals that,

as in the experiment, the increase of T leads to a more effective exciton thermalization.

Fig. 3. - I AI 13LO vs. s = T . The dots represent exper-

Ts

.

imental observations for different samples. The curve was

obtained with formula (28).

Finally, from the obtained results it is important to

note that formula (1) derived from the general theory of secondary radiation [7] and the EDF given by (14) may be used to investigate Raman scattering

processes as well as hot and equilibrium lumi-

nescence for exciton kinetic energy E -- H(OLO. The

obtained EDF, expressed as a function of T, TS, and temperature reflects the above showed

experimental facts that the concurrence of acoustic

relaxation and exciton lifetime determines the exci- ton population in the band.

Acknowledgments.

We are gratefully indebted to Drs I. G. Lang,

S. T. Pavlov and S. Permogorov for their helpful

discussions and comments to our work.

Appendix.

THE SCATTERING PROBABILITY w(E, E’).

-

The exciton-piezoelectric phonon Hamiltonian is :

where j = 1, 2 corresponds to electron and hole, respectively, r is the radius vector, bq are the

annihilation (creation) operators of the acoustic

phonon with wavevector q, and

e is the electron charge, 13,,,,, ,, the tensor of

piezoelectric moduli, Emn the dielectric tensor,

Vo the normalization volume, p o the crystal density ;

w

=

uq and e the frequency and the polarization

vector. Considering the exciton wavefunctions for the initial and final states as being of the type :

where R is the radius vector of the centre-of-mass of the exciton, and a its Bohr radius, and

P = Irl-r2l-

.

The calculation of w(E, E’ ) can be performed through Fermi’s Golden Rule, according to which

the transition probability is :

Using (A.1)-(A.4) we obtain :

where :

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y is defined in [11] like the mean value of:

with respect to the angles formed between the direction of q relative to the crystals axes. In [11,12] this value

was found to be y

=

( 4£: ) 2. 2.68 x 10 for CdS. The scattering probability by unit of time and energy is :

where :

In the same way w (E, E’) may be calculated using the deformation potential model, where the exciton-

phonon interaction Hamiltonian is :

where :

and Ei is the deformation potential for electrons or holes. In this cases :

In both models (piezoelectric and deformation potential) it can be seen that:

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1512

References

[1] CARDONA, M., Light Scattering in Solids (Springer- Verlag) 1975.

[2] GROSS, E., PERMOGOROV, S., RAZBIRIN, B., J.

Phys. Chem. Solids 27 (1960) 1647.

[3] PERMOGOROV, S., TRAVNIKOV, V., Solid State Com-

mun. 29 (1979) 615.

[4] PERMOGOROV, S., TRAVNIKOV, V., Fiz. Tverd. Tela.

22 (1980) 2651 (Sov. Phys. Solid State 22 (1980))

1547.

[5] TRALLERO GINER, C., SOTOLONGO COSTA, O., PAVLOV, S. T., Fiz. Tverd. Tela. 26 (1984) 241 (Sov. Phys. Solid State 26 (1984)) 1.

[6] TRALLERO GINER, C., LANG, I. G., PAVLOV, S. T., Fiz. Tverd. Tela. 23 (1981) 1265 (Sov. Phys.

Solid State 23 (1981)) 743.

[7] GOLTSEV, A. V., LANG, I. G., PAVLOV, S. T., BRYZHINA, M. F., J. Phys. C. 16 (1983) 4221.

[8] TRALLERO GINER, C., LANG, I. G., PAVLOV, S. T., Phys. Status Solidi B 106 (1981) 349.

[9] TRALLERO GINER, C., LANG, I. G., PAVLOV, S. T., Fiz. Tej. Poluprov 14 (1980) 235 (Sov. Phys.-

Semicond. 14 (1980)) 138.

[10] TRALLERO GINER, C., SOTOLONGO COSTA, O., Phys. Status Solidi B 127 (1985) 121.

[11] ZINOVIEV, H.-H., IVANOV, L. P., LANG, I. G., PAV-

LOV, S. T., PROKAZNIKOV, A. V., YARO-

SHETSKY, I. D., Zh. Eksp. Teor. Fiz. 84 (1983)

2153 (Sov. Phys.-JETP 57 (1983)) 1254.

[12] HUTSON, A.-P., Conference on Semiconducting

Compounds Suppl. to the J. Appl. Phys. 32

(1961) 2287.

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