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Resistive Non-Volatile Memories Characteri-zation by Conductive Atomic Force Micros-copy (C-AFM) in Ultra-High Vacuum Environment

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Figure 2.11a shows a typical resonance curve of a diamond tip and PtSi tip. The quality factor Q in vacuum for PtSi tip (Q UHV = 30000) is much larger than full diamond tip (Q UHV = 1500)
Figure 2.15 shows an example of AFM topography obtained for a 1x1µm 2 scan in contact mode with a full diamond tip on H f O 2 ( 5nm ) sample.

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