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Imaging optical thicknesses and separation distances of phospholipid vesicles at solid surfaces
Joachim Rädler, Erich Sackmann
To cite this version:
Joachim Rädler, Erich Sackmann. Imaging optical thicknesses and separation distances of phos- pholipid vesicles at solid surfaces. Journal de Physique II, EDP Sciences, 1993, 3 (5), pp.727-748.
�10.1051/jp2:1993163�. �jpa-00247867�
Classification
Physics
Abstracts87.20 42.30 06.30
Imaging optical thicknesses and separation distances of
phospholipid vesicles at solid surfaces
Joachim R§dler and Erich Sackmann
Physik Department, Biophysics Group,
Technische Universitfit Miinchen, Jarnes Franck Sk, 1, 8046Garching, Germany
(Received16 October 1992,
accepted
infinal form I8January
1993)Abstract. We present the
application
of reflection interference contrastmicroscopy
(RICM) (I)to map the
optical density
ofsupported bilayers
and vesicles and (2) toimage
the contactprofile
ofphospholipid
vesicles at surfaces. The resolution in the surfaceprofile
is 0.2 ~mlaterally
and I nm out ofplane.
Theoptical
thickness of the membrane can be determined with 0.2 nm accuracy. We outline the theoretical basis of RICM and derive the interference intensities ofadhering
vesicles from firstprinciples.
Ananalytical expression
for thedecaying
contrast of the interferencefringes
is
given.
The contact contour of vesicles is determined for various substrates. We further demonstrate thatdeposition
of amagnesium
fluoridelayer
on the glass substrate enhances thecontrast and allows the
optical density
of adsorbed membranes to beimaged. By
contrast variationof the buffer solution, the
layer
thicknesses and the indices of refraction can be measured. The novel method wasapplied
to imagelipid
domains of different chainlengths
in a substratesupported monolayer.
Introduction.
Reflection interference contrast
microscopy (RICM)
iswidely
used in cell science toinvestigate
cell adhesion.However,
so far thetechnique
has not beenrecognized
to be aquantitative technique
to determineoptical
thicknesses andseparation
distances of thin films.In his
pioneering
work Curtis[I]
introduced RICM as a tool for cell scientists toinvestigate
cell substrate interaction. The method was
greatly improved by
the invention of reflection contrastby
Ploem in 1975[2].
Considerable effort has been made toanalyze
RICMimages
in aquantitative
manner toyield
information about cell-substrateseparation distances,
membranethicknesses and structures.
Gingell,
Todd and Heavens[3, 4] developed
a method fornumerical
analysis
of RICMconsidering
the finite illumination aperture that resulted in a finite apertureinterferometry theory.
Due to thecomplexity
of the cell structure, aquantitative analysis
of RICM cellimages
is stilldisputed
and limitations must be made in theinterpretation
of the cell substrateseparation
distance. An extensive review of theseproblems
is
provided by
Verschueren[5].
To our
knowledge, however,
nosystematic study
of model membranesby
RICM has been made toinvestigate
thecapability
and limitations of RICM. Wereport
the firstexperiments
728 JOURNAL DE
PHYSIQUE
II N° 5using
RICM tostudy giant phospholipid
vesicles andsupported lipid monolayers
that allow arigorous quantitative interpretation.
The method was found to exhibithigh
accuracy indetermining layer
thickness and contact contours of membranes. Theimage
formation of RICM can be cast intoexplicit analytic expressions
of the interferenceintensity.
We have treated the finite aperture effectanalytically
and presentexpressions
for thedecaying
contrast andphase
shift of thefringe
pattem that are ingood agreement
withexperimental
results. Theinterference pattem of a
spherical phospholipid
vesicleadhering
to the substrate can be derived from firstprinciples
andyield
the membrane thickness as well as the contour and theseparation
distance of the vesicle.
It is further shown that
deposition
ofMgF~
on theglass
surfaces allows theinvestigation
ofmembrane- and
protein adsorption.
A A/8layer
ofMgF2
enhances thedependence
of thereflected
intensity
on the thickness of theadsorption layer
to 0.25 nm resolution. On the other hand RICMyields
ahigh
lateraloptical
resolution of 0.2 ~m. We demonstrate that in asupported monolayer
at theglass-air
interface the thickness difference of domains ofphospholipids
can be detected.The intention of this article is to demonstrate that RICM has an excellent
potential
for thestudy
of various structural anddynamical
features of model membranes. Thetechnique provides
animaging
interferometric tool withellipsometric
thickness resolution and microsco-pic
lateral resolution. It can beapplied
in combination with fluorescence andphase
contrastmicroscopy.
It isespecially applicable
fordynamical
studies, as was demonstratedby
a recentstudy
of the surface undulation of red blood cells[6]
and out ofplane
Brownian motion of latex beads[7].
The paper is divided into a theoretical and
experimental
section. In the first section we outline the basicprinciples
of the reflection interference contrastmicroscopy.
The crucialinfluence of the illumination and observation aperture of this
technique
is derived.Finally
a new method of contrast enhancementby deposition
of dielectriccoatings
is described. In theexperimental
section we describe a contrast variationexperiment
to determine the refractive index and thickness of lecithinbilayers
andpresent
first results on theinvestigation
ofgiant
vesicles
interacting
with anunderlying
substrate.Furthermore, examples
ofimaging
microsco-pically heterogeneous
film thicknesses aregiven.
1.
Theory
of RICMimage
formation.1. I REFLECTION INTERFERENCE. The basic
principle
of reflection interference isdepicted
infigure
I. Asample
is observed under monochromaticepi-illumination.
Theincoming
beam withintensity lo
ispartly
reflected at theglass/water
interface. We call the reflected beam reference beamIi.
The transmittedpart
is reflected from theobject
with anintensity I~.
The two beams interfere whenimaged by
themicroscope objective
onto theimage plane.
The observed total
intensity
I is describedby
thesuperposition
ofIi
andI~
I(d)=Ij +I~+2ficos [2kh(x)cosif
+3]. (I)
The argument of the cosine contains the difference in the
optical path length
of the two beams.Here h
(x)
denotes the verticalobject-substrate displacement
as a function of the lateralposition
x and k denotes the wave vector k
= 2 aTn/A with n
being
the index of refraction of the medium. The constantphase
3 takes into account that the beamI~ might
suffer an additionalphase
shift 8= aT at the
medium-object
interface if theobject
has ahigher
refractive index than the medium. The intensitiesIi
andI~
are related to the reflection coefficients of theinterfaces
by
II
"
r(I Io 12
~(l ~(l
)~ ~12~0 ~~~~~~~~~
,~
~l
~
~
Objective
image
~rocessing
Fig.
I. The basicprinciple
of RICM: theobject
is observed underepi-illumination using
monochromatic
light.
Interferencefringes
emerge from the difference in theoptical path
oflight
reflected from theobject
surface I~ and from the glass/buffer interfaceI~.
where the
amplitude
reflection coefficientsrq
aregiven by
the Fresnelequations
~
no cos
do
nj cosdj
~ n~ cos
do
no cosdj
~J
no cos
do
+ nj cosdj ~"
n~ cosdo
+ no cos dj
~~~
for s and p
polarization
with respect to thereflecting
surface. The essence ofequation ( I)
is that the observedimage
is a cosine transform of theobject-substrate
distanceh(x)
and therefore atransform of the lower side surface
profile
of theobject.
In this respect, RICMyields
aholographic picture
of the surfaceprofile
ofmicroscopic objects.
The three-dimensional reconstruction of the surfaces can be carried outby image processing. However,
as we show belowonly
surfaces close to the substrate can beinvestigated.
1.2 REFLECTION CONTRAST. The
intensity
of the reflected monochromaticlight
is very low(10~
~lo
andconsequently
the observation offringe pattem
isusually
obscuredby
straylight.
This
problem
is overcomeby
the reflection contrast, also often called antiflextechnique,
thatsufficiently
reducesstray light [2].
Theprinciple
of the reflection contrast is illustrated infigure
2. Apolarizer Pi produces
linearpolarized light
in the illuminationpathway.
Thelight
becomes circularpolarized
afterpassing
themicroscope objective
that is covered with a AMplate
at the top. Thelight
reflected from theobject
passes the AMplate
a second time and becomes linearpolarized again,
but is tumedby
90° withrespect
to theilluminating
beam.Therefore the
object
beam can pass the crossedanalyzer P~ placed
in the observationpath,
while stray
light
reflected from interfaces below the AMplate
will not.JOURNAL DE PHYSIQUE II T 3. N'S MAY 1991 29
730 JOURNAL DE
PHYSIQUE
fl N° 5,
,
,
1/4 plate
Objootlvo
, , ,
monochr.
boom
epllttor,
,
P
~~,,. j
, , , , , ,
p
,A ,
~
,
Y
,Fig.
2. The contrast in reflection interferencemicroscopy
is enhancedby suppressing
straylight
with the antiflextechnique. Light passing
the PolarizerPi
and the Amplate
on top of theobjective
becomescircular
polarized.
The reflectedlight
becomes again linearpolwized
with thepolwization
turned by 90°.Therefore
only
thelight
reflected from the object passes the crossedanalyzer P~
while straylight
arising from intermediate lenses does not.1.3 FINITE ILLUMINATION APERTURE EFFECT. While in
holographic microscopy
coherentillumination is
required,
RICM uses monochromatic but incoherent illumination focused withhigh
apertures. This leads to arapidly decaying visibility
of thehigher
orderfringes.
The effect has beennumerically
calculatedby Gingell
et al.[3, 4].
Their finiteaperture theory
simulates theaperture
effectby
incoherent summation off(d)
over allangles
of illumination.Applying equations (1-3)
theintegration
can be written as follows2w
wI
=
w(d))rot(d)
+(I r(~(d))r~~(d)e~~~~~~~~~°~°+~~)~sin
d dodp (4)
o
o
where w
(d
denotes the distribution function of theilluminating light
withrespect
to theangle
of incidence d. For the discussion of the numerical solution of this
integral
we refer to the work ofGingell
et al.[3]. However,
with thefollowing approximations
ananalytical
solutioncan be achieved.
Firstly
theintensity
distribution functionw(d)
isapproximated by
arectangular profile
function for small aperturesIo
d w aw
(d )
=(5)
0 d
~ a
where a
=
d~~~
denotes the maximum illuminationangle
in the medium of refractive index ni, which is related to the numerical illuminationaperture
INAby
a = sin~JNA/ni].
Secondly,
theangular dependence
of the reflection coefficientsr~~ is
neglected.
The laterapproximation
isjustified
as follows. Anexpansion
of the Fresnelequations (3)
in powers of dyields
to second order theapproximation
:n~
nj
ni~ ~
r)j
P = ± 1Y +O(1Y ) (6)
n~ + n~ n~
Equation (6)
shows that thereflectivity
r~ increases with second order in 1Y andr~
decreases. Since the antiflextechnique,
as describedabove, requires
circularpolarized light
the
integration
has to be carried out over 1/2(I~
(1Y +I~(1Y ))
to account forequal intensity
of s and ppolarization. Applying
theexpansion
ofequation (6)
andcollecting
all terms in powers of d one finds that all thequadratic
terms in 1Y cancel.Therefore,
thereflectivity
of circularpolarized light
has an apparent weakdependence
on theangle
of incidence.Assuming
constantreflectivity
coefficientsr~~(9)
=r~j(0)
theintegration
ofequation (4)
can be carried outla
~I
=
2
«lo )rot
+(I r(i)
ri~ e~~~~~~" * + ~) sin 1Y d1Y(7)
o
which results in
1
=
4 aT
sin~
a/2(Ij
+I~
+ 2fi
~~~ ~~~~~~~ "~~~
cos
[2 kh(I sin~ a/2)
+ 3j
(8)
2 kh sin a/2where
Ii
andI~
are defined inequation (2). Equation (8)
shows twoimportant
features of thefinite aperture effect. The contrast or the
visibility
v of the interferencefringes usually
definedas
~max ~ ~mln
decays
withincreasing
distance and aperture like sin~y)/y.
v =
~~fi
~~~~Y~,
y=
2 kh
sin~
a/2(10)
+ 2 Y
Secondly,
thephase
is stretchedby
a factor of Isin~
a. Both results are in agreement with
experimental
observations. Infigure
3 we show thefringes
of a waterwedge
between twoglass plates
for two different illumination apertures. It isclearly
seen that thedecay
of theexperimental fringe amplitudes
followsequation (8).
The fitted lines infigures
3a and 3b differ inonly
one parameter, which is the apertureangle
a. There is however one curiousphenomenon
infigure
3b. The function sin~y)/y
becomesnegative
for a certain range of y. Hence a suddenphase
shiftaT is
expected,
when sin~y)/y equals
zero, Thisphenomenon
is known as contrast reversal. However the data seem to avoid an obviousjump
inphase
and exhibit asignificant
deviation fromequation (8)
in this criticalregion.
1.4 WAVE-OPTICAL DESCRIPTION oF THE FINITE ILLUMINATION APERTURE EFFECT. The
theoretical result described above can also be derived in a wave
optical picture
from the classicaltheory
of coherence. Let us assume aquasi-monochromatic
and incoherentlight
source and consider the situation
depicted
infigure
4a. Twopinholes
in theobject plane
O are732 JOURNAL DE PHYSIQUE II N° 5
aW.37
o-1
0 lo 20 30 40
a) position / pm
w4.52
0 lo 20 30 40
b) position / pm
Fig.
3. Interference pattern of a waterwedge
between twoglass
plates measured for two different apertures. The full lines represent the theoreticalexpression
for the finite illumination aperture effect given byequation
(8). The theoretical functions in a) and b) differ in only one parameter, the maximumillumination
angle
a.illuminated
by
the incoherentlight through
the lens L with aperture A. The outcoming
beamsIi
andI~
interfere in theimage plane
S. Since the illumination is assumed to beperfectly
incoherent there will be no interference visible unless the
pinholes
are veryclosely adjacent.
The
light
then becomespartial
coherent and thedegree
of interference is describedby
the mutual coherence functionri~
definedthrough
1=Ii +I~+2firj~cos [2kh(x)+ &] (11)
ri~
=
0
corresponds
to total incoherence, whileri~
= I
equals
thefully
coherent case.According
to the Van Citter-Zemike theorem the mutual coherence function isequal
to the Fourier transform of theintensity
distribution of the incoherent source in the apertureplane A,
whichagain
isgiven by
theamplitude spread
function of the illuminationoptics [8].
The situation in reflection interference
corresponds exactly
to the situation described above.It is shown in
figure
4b that thelight
reflected from theglass/buffer
interface can beregarded
aspinhole
I and thelight
reflected from theobject
ascoming
from a virtualpinhole
2 at a distance 2 h(x).
The mutual coherenceri~
isagain given by
theamplitude spread
function. But in thiscase the
amplitude spread
function has to be takenalong
the axis out of focus. The three- dimensionalintensity
of theAiry
pattem near the focus was calculatedby Debye [8].
Theamplitude spread
function u~ isgiven by
Up " 1~12 ~
~~y~~
~~~
'
~ ~ ~~ ~~~~ ~~~ ~~~~
A , L
______
~ ~
incoh.
illumination
a)
o
A L
incoh, i
illumination
b)
Fig.
4. Waveoptical description
of the finite illumination aperture effect. a)Light
emitted from twopinholes
Pi and P~ becomespartial
coherent, if the distance of thepinholes
iscomparable
to the half width of theAiry
pattern of the incoherent illumination. b)Correspondingly
in RICMlight
reflected from theglass
interface and reflected from theobject
ispartial
coherent for small h(x). If theobject
is removed from theobject
plane O the coherence and therefore the interference pattern iseventually
lost.Substituting
thisexpression
intoequation (11) yields directly
theprevious
result ofequation (8).
The above calculation shows that the finite aperture effect can be considered as aproblem
ofpartial
coherence between the tworeflecting
interfaces. The reflectedlight
loses coherence as theobject
moves out of focus of the illumination.1.5 SPATIAL RESOLUTION. Most
objects
of interest that areinvestigated by
RICM willexhibit curved surfaces in contact with a flat substrate. This also
implies
that thefringes
narrowas the
gradient, ahlax,
of the contour at theedge
increases. For smallobjects
and steepgradients
thefringe
pattem willconsequently
reach the limit ofspatial
resolution of themicroscope.
In otherwords, fringes
ofhigh
lateralspatial frequency
will beadditionally damped
beside the effect causedby
the finite illuminationaperture
described above. The totaldamping
isreadily
describedby
the normalizedoptical
transfer functionv(k~)
f;mg(kx)
= fo~j(kx)
v(kx) (13)
where
I~~~
(k~)
denotes theobject
spectrum and I~~~(k~)
theimage
spectrum as a function of thespatial frequency
variable k~. Thespatial frequency
k~ is determinedby
theslope
of the contour734 JOURNAL DE
PHYSIQUE
II N° 5h(x) according
tok~ =
2 k ah/3x.
(14)
Following
theoptical
transfer function of ourimaging system
has to be determined. It tums out that theoptical
transfer function of amicroscope
becomes rathercomplicated
in the case ofpartial
coherent illumination and exhibits nonlinearity. However,
for thefollowing
discussion it will be sufficient to consider the so-called apparent transfer function of the fundamentalspatial frequency
component. Anexplicit expression
has been calculatedby
Becherer and Parrent[9]
0~k~~b-a b+a-k~
v(k~)=
3b-a~k~~b+a (15)
b+5a-kx
0
b+a~k~
with a
=
2 aTn/A INA and b
=
2 aTn/A NA where INA denotes the numerical illumination aperture and NA the numerical aperture of the
objective.
The transfer function varies as afunction of the ratio bla between a step function for bla - oJ
(coherent case)
and alinearly decaying
function for bla- 0
(incoherent case).
We are now able toexplicitly
include thespatial
resolution inequation (8).
The observedintensity
becomesfinally
I
=
Ii
+I~
+ 2fi rj~(h)~ v(k~)~
~ cos [~P
(h)~] (16)
here
4(h)
describes in short thephase
of the interference as above4(h)=
2
kh(I sin~ a/2)
+ 3 and the indicesa and p indicate
dependence
on the illumination and observation aperturerespectively.
We conclude that contours with
gradients steeper
than alimiting slope
exhibit interferencepattem damped by
theoptical
resolution of themicroscope.
Thelimiting slope
isgiven by ahlax(~~~
=n/n~j~~~(NA -INA)
as derived fromequations (14)
and(15).
We obtain 34°degrees
as thelimiting slope
for INA=
0.48 and NA
=
1.25. For
gradients larger
than 57° thefringes
willeventually vanish,
since theoptical
transfer functionequals
zero.RICM can also be used to
image
differentoptical
densities rather than contours. In this case the lateral resolution ofheterogeneity
in aplanar layer
can also be derived from theoptical
transfer function
equation (15). Applying
the classicalRayleigh
criterion the resolution is about 0.2 ~m for anobjective
with NA=
1.25.
1.6 IMAGING MEMBRANES AND MULTILAYERS. So far we have
analyzed
the interference oftwo
reflecting
interfaces toexplain
theprinciples
of RICM. Yet ingeneral
theobject
as well as the substratemight
becomposed
oflayers
with many interfaces. We will reduce the latter case to the case of two interfacesby calculating
the effectivecomplex
reflectionamplitudes
for both thelayered object
and the substrate and insert these intoequation (8)
as derived above.Let us consider the reflected
light
from asingle
membrane of thickness d. The membrane hastwo surfaces and the
complex
reflection coefficient isgiven by
Drudes Formula[10].
~ ~WM ~
~2kd
~~~~~~
where rwm denotes the Fresnel coefficient of the water/membrane interface. The interference function of the membrane at a distance
h(x)
above a substrate can be calculatedby equation (8)
replacing I~
=(R
(~lo
and 3= arctan
(Im (R)/Re (R)).
This theoretical function is shown infigure
5(full line).
Note thatmultiple
reflectance between the membrane and the substrate isneglected
in this case.There are two
noteworthy properties
in the interference function(Fig. 5).
Both arise from the fact that a membrane is very thin and the reflectedlight
of the two interfaces interferes almostentirely
destructive due to thephase
difference of aT.6xlO~
~ ~~~*membrane
~(~) H~o
~o '
membmne
~
O 50 lOO 150 200
"~ ~°
h(x)
/nm '""" "'Fig.
5. Theoretical interferenceintensity
normalized with respect tolo
of aphospholipid
membrane asa function of the membrane-substrate
(glass)
distance h(x). Theamplitude
of theoscillating intensity
isproportional
to the thickness of the membrane (here 43A).
AnMgF~
antireflectioncoating
of 60 nmdeposited
on theglass
surfaces shifts thephase
of the interference [dashed line] and enhances the contrast between the interference and thebackground
intensity.Firstly,
for small membrane thicknesses theintensity
differenceI~~~ I~~~
isproportional
to the membrane thickness d. This can be seenby approximating I~
fromequation (17).
I~
=
R~ Io
m 4r(w sin~ (kd) lo (18)
Applying equation (I)
we obtain anexpression
for the contrast of the interferencefringes
~~~~ ~~'~
=
~~~~
sin
(kd) (19)
j ~jw
I~~~, I~;~
andIi
can be measured from themaximum,
the minimum and thebackground intensity
of the membrane interference pattem. Thereforeequation (19) provides
a tool formeasuring
the membrane thickness with greatprecision,
since the difference in intensities dividedby
thebackground intensity
is not sensitive to fluctuations of theincoming light lo,
which are themajor impairment
forquantitative
measurements. We discuss theresulting
membrane thicknesses in the
experimental
section.Secondly,
the effectivephase
of thelight
reflected from a membrane isapproximately
8
m aT/2 + 2kd. This
implies
that theintensity
as a function of the membrane-substrate distance varies sinusoidal rather thanfollowing
a cosine function. A membrane in contact with736 JOURNAL DE
PHYSIQUE
II N° 5the
glass
surfaceyields
anintensity
that isnearly indistinguishable
from thebackground intensity.
Therefore adsorbed films and membranes arehardly
visible at a pureglass
interface.As will be shown below, the situation is different if a dielectric
layer
isdeposited
on theglass
surface.1.7 CONTRAST ENHANCEMENT BY
MgF~
DEPOSITION. Theoptical
effect of a dielectriccoating
on the interference function is also shown infigure
5. Alayer
of 60 nmmagnesium
fluoride(MgF~)
decreases thebackground intensity
and at the same time shifts the interferencephase
such, that a membrane in contact with the substrate isclearly distinguishable
from thebackground.
The dielectriclayer
can be considered as a spaceradjusting
thereflectivity
of theglass/buffer
interface to thereflectivity
of the membrane as well asshifting
thephase
of the interference. Note thatthereby
the contrast as defined inequation (9)
increasesby
a factor of 1.5.Let us now consider the
sensitivity
inoptical density
detection achievedby
thedeposition
ofMgF~.
Let the thickness of the dielectriclayer
be L. Afteradsorption
of anarbitrary layer
of thickness Ad onto the dielectric theintensity changes by
AI.Neglecting multiple
reflection the relativechange
inintensity
isgiven by
:"
=
~ ~~~~~~ ~~~ ~ ~~
2 k Ad
(20)
~ d °
41
~ ~(3 ~ ~ ~ol ~13 ~°S ~ ~~where the indices
0, 1, 2,
3 indicateglass, MgF~, adsorband,
buffer.Equation (20)
states that maximumsensitivity
is achieved for a A/8coating,
if the denominator isonly weakly varying (rot
»ri~).
We obtain a thickness resolution for adsorbedlayers
of Adm 0.25 nm at the
Mgf~lair
interface and Ad m0.snm at theMgF~/water
interfaceassuming
anintensity
resolution of I ffi and a
MgF~ coating
thickness of L= 50 nm.
Beside the fact that adsorbed membranes become
visible,
thedeposition
of aMgF~ layer
solves a more
general problem
in RICM that is theunique
reconstruction of a surface orheight profile.
As can be seen fromfigure
5 the interferenceintensity
of a membrane does not relateuniquely
to a membrane-substrateseparation
distance. Forinvestigations
of membranes close to a substrate it is anadvantage
that theintensity
relatesuniquely
to theseparation
distance inthe range of 0 to 100nm as in the case of a
MgF~-coated
surface. In thisregime
thereconstruction of the contour is
independent
of additionaltopological assumptions
and can be carried outby
a directmapping
of theintensity
field onto aheight profile.
This isespecially important
fordynamical investigations
of contour fluctuations close to the surface.2.
Experimental
section.2.I MIcRoscoPE SETUP. A Zeiss Axiomat
microscope
was modified for reflectioninterference contrast observation as follows.
Epi-illumination
wasprovided by
a loo Whigh
pressure mercury
lamp.
A heatabsorption
filter and abandpass
filter(dv
= 5 nm, 85 ffi
peak transmission)
was used to select the green 546, I nmHg
line. The illumination numerical aperture wasadjustable
and was measuredby
the illumination cone in a I cm thickglass
block.The smallest value available for the INA was 0.48. The
microscope
wasequipped
with a Zeiss Neofluar63/1.25
Antiflexobjective.
For properworking
of the antiflex contrast enhancement twopolarizers
were situated in the illumination and observationpathway respectively,
asdescribed above. Fluorescence
microscopy
could beperformed by switching
to a dichroic mirror barrier filter set. Phase contrastmicroscopy
could be usedsimultaneously
with RICMby using additionally
dia-illumination andplacing
aphase ring
in the Fourierplane.
The RICimages
were recordedby
a CCD camera(HR480, Aqua TV, Germany)
at a rate of 25frames per second. A frame
comprised
604 x 588pixels.
Themagnification
of theimage
could be varied
by
a set of intermediateoptical
lenses.Image processing
was carried out on aDatacube
image processing
system(Datacube Peabody, Boston, USA).
Theimages
weredigitized
into 256 gray levels. For staticimage analysis
the data wereaveraged
over 8 frames to reduce camera noise. To account for the nonlinearities of the camera, anintensity
gaugecurve was recorded
by placing
a set of six different transmission filters in theoptical path.
Thegauge curve was fitted
by
apolynomial
function and the measured intensities correctedaccordingly.
2.2 SAMPLE PREPARATION.
Synthetic
lecithins werepurchased
from Avanti PolarLipids
(Birmingham, AL).
Within this article we use the conventional short notation as denoted inbrackets:
L-a-dimyristoyl-1,2-diacyl-sn-glycero-3-phosphocholine (DMPC), L-a-dipal-
mitoyl-1, 2-diacyl-sn-glycero-3-phosphocholine (DPPC)
andI-stearoyl-2-oleoyl-sn-glycero-3- phosphocholine (SOPC).
Giant vesicles
consisting
ofDMPC,
DPPC and SOPC wereprepared
as follows.Lipid
wasdissolved in a stock solution of lo
mg/ml
chloroform/methanol(2
:1).
40 ml of the solutionwas dried on a teflon disk and desiccated under vacuum for 2 hours.
Subsequently
loo mMsucrose solution was added to the teflon disk
placed
at the bottom of theglass
beaker and leftfor 24 hours at 40 °C. The
lipid
swells on top of the teflon and forms closed vesicles. Some mlof the vesicle
suspension
was transferred into ameasuring
chamber filled with loo mMinositol solution. The vesicles sediment
slowly
to the bottom of the chamber due to the difference indensity
of sucrose inside the vesicle and inositol outside. Themeasuring
chamberwas made out of a teflon frame
(20
x 20 x 4 mm)
embedded in a temperature controlledcopper block. The teflon frame was closed at the bottom
by
acoverslip
andpositioned
on themicroscope
stage. The refractive indices of the buffer solutions were measuredindependently
with an Abbe refractometer.
Thin films of
magnesium
fluoride onglass coverslips
wereprepared by
vacuumdeposition.
The
glass
waspreviously
cleaned in 2 ffi Hellmanex solution.MgF~ deposition
tookplace
at apressure of
10~~
atm witha
deposition
rate of about Inm/s
at a substratetemperature
of 380 °C. The film thickness was measuredby
a quartz thickness monitor. Thelayer
thicknesswas also cross-checked
by
the transmission spectrum of thesample using
anabsorption
spectrometer.
2.3 MEASUREMENT OF THE REFRACTIVE INDICES AND MEMBRANE THICKNESSES BY CONTRAST
VARIATION. Lecithin vesicles
strongly
adsorb ontofreshly deposited magnesium
fluoride.Most vesicles rupture when
touching
theMgF~
surface andspread
out to asingle
flatbilayer patch.
The membrane is seen as a darkpatch
in RICM due to the interference effect described in section 1.7. Anexample
is shown infigure
6a. The rupture andspreading
of the vesicles takesplace
within milliseconds. In thisarticle, however,
we want to focus on theoptical properties
of an adsorbed membrane. With RICM we measure one gray level associated with theoptical
thickness of apatch
of lecithin. To measure both the index of refraction and the absolute thickness of the adsorbedbilayer patch,
a classical contrastexperiment
can be carried outby varying
the refractive index of the aqueous bufferby adding glycerol.
Within the samesample
we observed theintensity
at differentpositions
on the uncoated(glass/buffer)
and the coated interface(glass/MgF~/buffer
andglass/MgF~/lipid/buffer). Figure
6b shows the reflectedintensities as a function of the refractive index of the
glycerol/water
solution. The intensitiesare normalized to the percentage of
light
reflected at theglass/water
interface. The fitted linesare calculated
by using
theappropriate expression
for thereflectivity
of stratifiedlayers taking
multiple
reflection into account[10].
The firstgraph yields
the refractive index ofglass,
the second and thirdsuccessively
the refractive index andlayer
thickness of themagnesium
738 JOURNAL DE PHYSIQUE II N° 5
fluoride and the
lipid bilayer.
We measured in severalexperiments patches
ofDMPC,
DPPCand SOPC. The
averaged
refractive index found forMgF~ (1.386
±0.002)
is in verygood
agreement with
published
data. For theaveraged
refractive index of the lecithins a value of 1.49 ± o-o I wasspecified
which is ingood
agreement with the value measuredby Chapman
et al.[I
I]. Fitting
the intensities for the differentlipid patches
with the constantaveraged
value of the refractive index forlecithins,
we obtain differentlipid bilayer
thicknesses as listed infigure
6. Published data on lecithin membrane thicknesses vary to some extenddepending
on@@
a)
~
~~ ~~
a G~WMgF~
£ X Glmwmg§JIIMPC
$
1.34 1.36 1.33 1.40 1.42 1.44 1.46
refracthte index of
water/g~cerol
b)Fig.
6. a) RICM micrograph of a lecithin (DMPC) vesicle that isnlptured
and spread out to a flata
patch
ofsupported bilayer
onMgF~.
b) Contrast variationexperiment
the refractive index of the buffer is changed by addition ofglycerol.
The intensity at three spots of different interfacecomposition
is measured. The indices of refraction and thelayer
thicknesses are obtained from the fit to the theoreticalreflectivity
of stratifiedlayers.
The intensities are normalized with respect to thereflectivity
of theglass/water
interface.water/glycerbl:=
_
lipid
=_,.._
~il_:
.j;.I"I:;.;: ,I;__. _,:. .:.
.. _)_.~.__ .[..)
Mg§
llllllllllll'[
/, I,~.
n~~~~
=1.532
+0.004 ~~p~
=
3.4
±O.6
nmn~ ~= l.386
±0.002 d~p~ =4.7 +O.5nm
~~~ =1.486 +O.01 dsopc, =4.O ±0.5nm
~Mgl§
"~~°~
~°°~
~'~~C)
Fig. 6. c) Indices of refraction and layer thicknesses as obtained from
figure
6b.the
experimental
method[11-13].
Our results agree best withX-ray scattering
data[13].
TheexpeRmental
error in ouroptical
method does not allow a detailedcompaRson
between the differentscattering techniques.
The thickness of the adsorbedlayer
may be determined with an accuracy of about 0.5 nm in a contrast variationexperiment.
The membrane thicknesses aredetermined more
precisely
from the interferencefringes
ofgiant
vesicles as described in the nextchapter. However,
we are able todistinguish
the relative thickness increase of thebilayer
with
increasing length
of thefatty
acid chains. It should also be noted that at the observation temperature of 30 °C the DMPCbilayer
is in the fluid(L~ phase,
while the DPPCbilayer
is in the solid(L~ phase.
Thisexplains
thelarge
difference in thebilayer
thicknesses of DMPC andDPPC,
since theL~ phase
is known to be thicker than theL~ phase.
For the same reason the thickness of DPPC was found to belarger
than that of SOPC which is in theL~ phase
due to theunsaturated chain.
2.4 VESICLE MEMBRANE THICKNESS> CONTACT SHAPES AND SEPARATION DISTANCE. We
applied
RICM tostudy
theshape
ofphospholipid
vesiclesadhering
to different substrates. In thischapter
weinterpret
fourexamples
of RICMmicrographs
of vesicles that aregiven
infigures
7-10. Eachfigure
contains aphotographic presentation
of the RICMimage,
anintensity plot,
a schematicdrawing
of the vesicleshape
andfinally
theexperimentally
determined contour function. The evaluation of the contour is based on
equation (8)
of section1.3. We describe the contour functionh(x)
in terms of several parameters and determine theseparameters by fitting
theanalytic
interference function(Eq. (8))
to theexperimental fringe
pattem. A differentapproach
is demonstrated in the lastexample.
Therewe
directly
relateintensity
values toseparation
distances in aregime
where aunique mapping
is
possible.
740 JOURNAL DE PHYSIQUE II N° 5
~
~
C w
2
~
° ~ralal distan~e
/~m
~ ~°
a) b)
'
8
©~m1
B
J
~ ~
~m~
~ ~~c) d)
Fig. 7. a) RICM
image
of aspherical giant phospholipid
(DMPC) vesicle with radius 16 ~m.c) Schematic view of
spherical
vesicle close to the substrate. b) (m) Angularlyaveraged intensity
plot offigure
7a. The dashed curve indicates the theoretical interference function of asphere
obtained byequation
(8)> thefully
drawn curve includes the finitespatial
resolution effectaccording
toequation
(16).The
discrepancy
between the curves for thehigher
orderfringes
isexplained
in the text. d) Calculated spherical contour corresponding to the fit in b).Firstly
we studied the RICpattem
of aspherical vesicle,
in which case the contour isgiven by
h(x)=ho+R- $fi.
(21) Figure
7adepicts
thecorresponding
RICMimage,
which exhibits the well known Newtonianrings.
Theshape
isperfectly spherical,
since the vesicle is under weak osmotic pressure. The vesicle is filled with loo mM sucrose inside and floats in a loo mM inositol solution above a pureglass
surface. Thegravitational
force determinedby
theslight
difference indensity
of the sugar solutions and the van der Waals forcepush
the vesicle towards the substrate. On the other side the electrostaticforce,
due to thehigh
surfacepotential
ofglass
and someimpurity charges
on the
vesicle, prevents
the vesicle fromtouching
theglass
surface[7].
Theangularly averaged
intensity
of the pattem infigure
7a isplotted
infigure
7b. The datapoints
arecompared
withthe
theoreticalintensity
functiongiven by equation (8) (dashed)
andby equation (16) (full line)
thatadditionally
includes theoptical
transfer function.The
experiment
shows that as thegradient
of the contour increases thefringes
are morestrongly damped
aspredicted.
In fact neither the effect of the finite illumination aperture nor of the finiteoptical
resolutionfully
describes thedecay
of thefringes.
Thediscrepancy
can be understood as an effect due to the curvature of the vesicle surface. Forparallel
surfacesequation (8) predicts
anintensity Ii +I~
in the limit where coherence between the two interfaces is lost. Theexperimental intensity,
however,approaches
thebackground intensity I~
forlarge
radial distances, asexpected,
since the vesicle has a finite diameter. The differencebetween the theoretical and the
experimental
curve shown infigure
7bequals
in factIi.
Therefore the theoreticaldescription
of thedamping
of thefringes
ofstrongly
curved surfaces remainsunsatisfactory.
However, the interferenceintensity
of thequasi
flatpart
of the vesicle that is closest to the substrate is well describedby
the theoretical function derived in section I.The
spherical
contour assumed in the fit is confirmedby
the data. Note that the informationon the
shape
of theobject
iscomprised only
in thephase
of the interference pattem and not affectedby
thedamping
due to curvature and finite aperture effects. The fityields
the same vesicle radius as determined inphase
contrastmicroscopy.
As described in the above discussion of
equation (19)
in section1.7 the thickness of the membrane can be obtained from the differenceI~~~
I~~~ of the firstfringes.
Here we obtain 3.8 ± 0.2 nm for the membrane thickness of the DMPC vesicle. This value is reasonable for asingle bilayer
and withinth/
standard deviation of the thickness obtained for the adsorbedDMPC membrane in 2.3.
We now consider vesicles
adhering
to the substrate. Two cases are studied : strong and weak adhesion. Adhesion of vesicles to surfaces has been studiedexperimentally
andtheoretically [14-16].
In the case of strong adhesion the vesicle takes theshape
of aspherical
cap. In thecontact
region, however,
the membrane is bentsmoothly
rather thanforming
asharp
contactangle
with theunderlying
substrate. On the other handweakly
bound vesicles maydisplay
avariety
ofshapes
determinedby
thebending
stiffness andexhibiting thermally
excited surfaceundulations.
We induced adhesion of DMPC vesicles to a
glass
surfaceby adding Cacl~
to the sugarbuffer.
Figure
8apresents
anexample
of a multilamellar vesicleadhering
toglass
in a buffercontaining
90 mM inositol and lo mMCacl~.
We expect the vesicle to be flat in the
adhering part
andquasi-spherical
otherwise. We therefore fitted the interference function of asphere
to thehigher
orderfringes
of the data(dashed curve).
There isgood
agreement in thephase
from the firstfringe
on. Asexpected
the fityields
anegative sphere
substrate distance and the data do not fit the intensities for theadhering
middleregion.
We describe the contact contour of the
adhering
middleregion by
thefollowing polynomial
function
h
(x)
=
~°
~ ~
~°~ ~
~ ~°
(22) ho
+ a(x xo)
+b(x xo)
+ c(x xo)
elseThe contour is flat in the
adhering
part(x
~xo)
and deviates for x~ xo. The fit is
represented by
the full line infigure
8b. The coefficients were xo = 2.2 ~m, a=
0.0001,
b= 0.04 and
c = 0.001. Therefore the vesicle
shape
near the contact zone isclearly
second and forth order.As
figure
8dshows,
the fitted contour functions(full
line anddashed) smoothly
merge into each other.The