Vous avez des questions? Nous pouvons vous aider. Pour communiquer directement avec un auteur, consultez la
première page de la revue dans laquelle son article a été publié afin de trouver ses coordonnées. Si vous n’arrivez pas à les repérer, communiquez avec nous à PublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca.
Questions? Contact the NRC Publications Archive team at
PublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca. If you wish to email the authors directly, please see the first page of the publication for their contact information.
https://publications-cnrc.canada.ca/fra/droits
L’accès à ce site Web et l’utilisation de son contenu sont assujettis aux conditions présentées dans le site LISEZ CES CONDITIONS ATTENTIVEMENT AVANT D’UTILISER CE SITE WEB.
READ THESE TERMS AND CONDITIONS CAREFULLY BEFORE USING THIS WEBSITE.
https://nrc-publications.canada.ca/eng/copyright
NRC Publications Archive Record / Notice des Archives des publications du CNRC :
https://nrc-publications.canada.ca/eng/view/object/?id=729c303e-a65f-47cf-afa8-00b55279adb1 https://publications-cnrc.canada.ca/fra/voir/objet/?id=729c303e-a65f-47cf-afa8-00b55279adb1
NRC Publications Archive
Archives des publications du CNRC
Access and use of this website and the material on it are subject to the Terms and Conditions set forth at Transmission electron microscopy imaging and spectroscopy of nanomaterials
Transmission electron microscopy imaging
and spectroscopy of nanomaterials
Marek Malac
Seminář odd. 26
Tenkých vrstev a nanostruktur
datum:
čas:
místnost:
27. 6. 2016 pondělí
10:30
knihovna, budova A, 1.p.
TÉMA
Fyzikální ústav AVČR, Cukrovarnická 10, Praha 6
National Institute for Nanotechnology, (NINT)
and Department of Physics, University of Alberta,Edmonton, Canada
Transmission electron microscope (TEM) has been used for materials characterizations for decades. With the interest in nanoscience and nanotechnology the possibility to reveal morphology, structure and physical properties at nearly atomic resolution led to vigorous development of TEM methods. Here we will discuss two methods in particular: the momentum resolved electron energy loss spectroscopy (qEELS) and hole free phase plate imaging in TEM. Both methods can be combined with all analytical capabilities of a modern TEM providing insights into material structure relation to its properties.
The qEELS allows to study electronic excitations of nanoscale objects and their dispersion relations. As a result it is possible to identify the origin of spectral features such as bandgap transitions and Cerenkov radiation. Furthermore, qEELS is needed to investigate non-dipole regime of excitations in plasmonic devices.
Phase plate imaging in a TEM uses a concept analogous to Zernike imaging in light optics. An unscattered electron wave is phase shifted relative to the scattered beam improving the efficiency and low dose imaging of many radiation sensitive objects. A particular set up, referred to as hole free phase plate, uses an uniform thin film and the incident electron beam itself to set up a phase plate in-situ.
The principle, practical implementation and example applications of the above methods will be illustrated.
