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IEEE TRANSACTIONS ON

RELIABILITY IEEE RELIABILITY SOCIETY

published by the

and Journal of the ASQ- ELECTRONICS & COMMUNICATIONS Division

MARCH 2006 VOLUME 55 NUMBER 1 IERQAD (ISSN 0018-9529)

EDITORIAL

AssessmentforU.S.EngineeringPrograms WKuo 1

PAPERS

Statistics and Estimation

Some Properties of Confidence Bounds on Reliability Estimation for Parts Under Varying Stresses. . . .

... WZhao,R.Pan,AAron,andAMettas

Estimation of Gpmmon Cause Factors From Systems Witt Different Numbers of Channels . . . . P'Hokstad,A.Maria,andP'Tomis On Improved Confidence Bounds for System Reliability. . . . J. E. Ram[rez~Marquez and W Jiang

Design

Multi-Path Heuristic for Redundancy Allocation: The Tree Heuristic. . . . C Ha and W Kuo A Generalized Framework for Probabilistic Design Witt Application to Rotors. . . . J. F. Shortle and M. B. Mendel

Testing .

Variables Sampling Plans for Weibull Distributed Lifetimes Under Sudden Death Testing. . . . c.-HJun,S.Balamurali,andS.-HLee

Optimal Design for Step-Stress Accelerated Degradation Tests. . . C-M. Liao and S.-T. Tseng Analysis of a Simple Step-Stress Life Test Witt a Random Stress-Change Time. . . C Xiong, K. Zhu, and M. Ji A Methodology for Predicting Service Life and Design of Reliability Experiments. . . .

P.Sadegh,A.Thompson,X.Luo,Y.Park,andT.Sienel Systems and Networks

A Continuous-Time Bayesian Network Reliability Modeling, and Analysis Framework . . . . H Boudali and 1. B. Dugan Recursive Formulas for the Reliability of Multi-State Consecutive-k-out-of-n:G Systems. . . .

:...HYamamoto,M.J.Zuo,T.Akiba,andz.Tian

A Genetic Aigorithm for Reliability-Oriented Task Assignment Witt k Duplications in Distributed Systems. . . . C-CChiu,c.-HHsu,andY.-S.Yeh

Maintenance

Optimal Periodic Preventive Repair and Replacement Policy Assuming Geometrie Process Repair . . . . G.J.WangandY.L.Zhang Quality-Oriented-Maintenance for Multiple Interactive Tooling Components in Discrete Manufacturing Processes. . . . .

Y.ChenandJ.Jin Lifetime Data Analysis

Lognormal Selection With Applications to Lifetime Data. . . .T. T. John and P. Chen Reliability Improvement Experiments Witt Degradation Data. . . .. V.R. Joseph and 1.-T. Yu

7 18 26 37 44

53 59 67 75 86 98 105

118 123 135 149

+.IEEE

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