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A thin absorbing layer at the center of a Fabry-Pérot interferometer
P. Mächtle, C. Müller, C. Helm
To cite this version:
P. Mächtle, C. Müller, C. Helm. A thin absorbing layer at the center of a Fabry-Pérot interferometer.
Journal de Physique II, EDP Sciences, 1994, 4 (3), pp.481-500. �10.1051/jp2:1994139�. �jpa-00247974�
Classification Phj,.vie.,v Ah,vtiac.t.v
33.20K 42.60D 82.65D
A thin absorbing layer at the center of
aFabry-Pdrot
interferometer
P. Michtle, C. MUller and C. A. Helm
(*)
Institut for Physikalische Chemie, Johannes Gutenberg-Universitht, Jakob-Welder Weg II. D-
55099 Mainz,
Germany
(Rec.eiied 7 September f993, ac.cepted in
final
foim 9 Decemher 1993)Abstract. The influence of a dye (Rhodamin B) dissolved in solution or adsorbed at an interface
at the center of
a Fabry-Pdrot interferometer on the transmission was investigated both experimentally and theoretically. We show that (ii ~pectra of extremely thin films are measurable at sub-monolayer concentration lone monolayer reduces the transmission
by
= 50 %), (iij thetransmis~ion is sensitive to the location of an extremely thin film within nm range and (iii) the
absorption
coefficient is determinedquantitatively
bycomparison
between theory and e~periment thus permitting one to estimate the local concentration. The results are relevant for the use of dye probes to monitor changes of organic interfaces in the Surface Forces Apparatu~ as well as generally to detect changes of interfaces between adjacent surfaces.1, Introduction,
The Surface Forces
Apparatus
has become an established method foraccurately measuring
the total interaction force between surfaces immersed in solution[1, 2]. Very often,
these forcesare due to osmotic pressure
gradients.
Such an osmotic pressuregradient
occurs, if thedensity
and/orcomposition
at thesolid/liquid
interface deviates from the bulkliquid.
Osmotic pressuregradients
contribute to very different forces, such as the electrostatic, the solvation andstructural and the steric and
hydration
forces[3].
Until now, there was no direct way to monitor the interface while the interaction between the surfaces is measured as a function of theirseparation.
This isespecially
inconvenient, if the interfaceschange
due to molecular rearrangements[4, 5].
To eliminate this latter drawback, we
developed
a more direct method to determine solute concentrations. We measure theabsorption
ofdye
molecules between theinteracting
surfaces and thus determine theoptical density.
This is a convenientmethod,
sinceoptically
the Surface(*) To whom
co«espondence
should be sent.Forces
Apparatus
is aFabry-Pdrot
interferometer which wasoriginally designed
to determinethe distances between the surfaces. The measurement of enhanced and
position
sensitiveabsorption requires
aquantitative knowledge
of local fields and the relation betweenoptical density
and local concentration. In thiswork,
we calculated and measured the effect of an absorber in the center of such acavity.
There, thespatially oscillating intensity
waves exhibit either crests(even-order fringes)
ortroughs (odd-order fringes).
Therefore anextremely
thin film(down
to 0, I fb of awavelength)
attenuates and shiftsonly
evenfringes
withoutaffecting
odd
fringes. Actually,
a thindye layer
(about twomonolayers) trapped
between the surfaces exhibits an extinction coel'ficient which exceeds the one in the bulkby
about two orders ofmagnitude indicating
asubstantially
increaseddye
concentration at the interface. If the film thickness is increased toextremely large
distances(~Lm)
we observe the Rhodamin B spectrumas measured in
solution,
yet we still find an increaseddye
concentration at the interface.The paper is
organized
as follows. The next section describes theoptics
of aFabry-Pdrot
interferometer with a thin
absorbing layer
at the center. Since thistechnique
has not been described before, our account isfairly
detailed. Section 3gives
theexperimental procedures.
In section 4 we show our
optical
results and in section 5 we discuss them in terms of thedensity
distribution of thedye
at the interface.2,
Theory.
First, we shall describe a
simple Fabry-Pdrot
interferometer with onehomogeneous layer
between the mirrors
(following [6]),
then asymmetric three-layer
interferometer as it is used in the Surface ForcesApparatus.
Next we consider aone-layer
interferometer with a loss, andeventually
we discuss the mostinteresting
case, anabsorbing layer
in the Surface ForcesApparatus.
For the whole section, we assume that no
dispersion
occurs, I-e- that all reflection and transmission coefficients are constant for the resonancewavelength
of agiven
order even whenthe resonance conditions are affected
by changes
of the centerlayer.
The
Fabry-Pdrot
interferometer, named after its inventors, can be considered as thesimplest
type ofoptical
resonator.Normally,
such an instrument consists of twoparallel
dielectricmirrors.
To
begin with,
we consider asimpler
structure, that consists of aplane-parallel plate
of thickness D and refractive index n immersed in a medium of a different index. The reflection and transmission coefficients R and T are,according
to standardoptics [6], given by
(I e~~'~),j
R
= ~
(l)
I p e~ '~
~
~-,~
T
= ~
(2)
p e~ '~
where we used the
symmetry
of the system(I.e. r(
=
r,)
as well as the definitions(cf. Fig.
I, without the centerlayer)
where p and T are,
respectively,
the fraction of theintensity
reflected and transmitted at each interface and will be referred to in thefollowing
discussion as the mirror's reflectance and transmittance,following
convention. If the incidentintensity (watts
per unitarea)
is taken asunity,
we obtain thefollowing expression
for the fraction of the incidentintensity
that isreflected :
j~j2 ~
~ P SIn~ ~b
~~
(l
p )~ + 4 psin~
~b
Moreover,
fromequation (2)
~~
~(l p
~
+
~sin~
~b
~~~
for the transmitted fraction. This basic model contains no loss
mechanism,
so conservation of energyrequires (R
(~ +(T(~
= l, as is indeed the case.Let us consider the transmission characteristics of the interferometer.
According
toequation (5)
the transmission isunity
wheneverBy using
A= c/v, condition
(6)
for maximum transmission can be written aswhere c is the
velocity
oflight
in a vacuum and v is theoptical frequency.
In the literature, thesharp
transmissionpeaks
are also known asFringes
ofEqual
Chromatic Order(FECO).
Anyhow,
for a fixed thicknessD, equation (7)
defines theunity
transmission(resonance) frequencies
of theFabry-Pdrot
interferometer. On the otherhand,
the minimum transmissionapproaches
zero as papproaches unity.
In the
preceding paragraphs,
we used aplane-parallel plate
of dielectric medium as thesimplest
type ofFabry-Pdrot
etalon. In the case of the Surface ForcesApparatus
the transparentthin film of thickness D is sandwiched between two
(mica)
sheets each of thicknessD~,
and refractive index n~,. The outer surfaces of the sheets are silvered andprovide high-
reflectance mirrors (cf.
Fig, I).
Now,
the « mirror's »reflectivity
coefficient,,'p
is a function of r, and i~, the Fresnelreflectivity
coefficients of the silveredmica/support
and the mica/medium interfaces,respectively
-?>~~j -2,~~j
'~ ~ ~~e~
~'~~'
~ '
~
~~~
mica
dye
micasilver silver
~ D~~, n~~ D, D~~,
n~~J~
n~-iK
ri -ri r~ -r~ -r~ r~ ri
ti t'i t2 t'2 t'2 t2 t'l tl
Fig. I. An interferometer made up of three layers of thickness D~~, D. DGI and refractive index
n~j, n n, ix, n~j with the outer faces ~ilvered. The reflection and tran,mission coefficients as u~ed in
the text are indicated. A ray of light incident on the left face emerges from the right after multiple reflection~.
where we used the definitions
2<~Gl
~~~
2 grn~j
~/
= r, "2 e
~~
~jj
~ , ~$~j = ~~~~
'Obviously, ,,~
iscomplex.
Wemay define
,,~
=
,~
e'Y and thusp may be written as
P =
(P( e~'Y
The « mirror's
» transmittance
(r( depends additionally
on t, and t~, the Fresneltransmission coefficients of the
support/silvered
mica and the mica/medium interfaces,respectively
t, t~ e
'~~'
t( ti
e'~~'
(t, t( )(tl
t~)~, ~
~
l r, r~
e~~'~~'~
I r, r~
e~~'~~' N~
~ ~~ ~~~~Note, that
sandwiching
the thin film of interest between two sheets did not introduce any lossmechanism,
I-e- we still have[p
+jr
= I.
The reflected fraction of the incident
light
is~j~
~
41pi sin2
(~by) (i lpi)2+41pi sin2
i~b yi ~~~~and the transmitted fraction is
~ ii
jp
)~'~" j12)
~
(i
lpi
)~ +4jp sin~
(~b Y)To find the resonance condition of this
Fabry-Pdrot,
we have to consider the additionalpha~e
shift y due to the insertion of the
(mica)
sheets into theFabry-Pdrot
interferometer. The transmittance isunity~
whenever ~b yequals
zero or some multitudes of gr, I-e-tan ~b
~~~'' ~
Re,~ (13)
This resonance condition is
unambiguous.
This is nottrivial,
since both p s absolute value,p
[,
and itsphase,
2 y, dodepend
on thewavelength.
Yet, onconsidering
p[,
one findsOnly [N
~depends
on thewavelength.
Onevaluating equation (12), [N
[~ cancels. Since we have for allwavelengths
pN~
~ 0,
equation (13)
is theunambiguous
resonance condition.It may be rewritten as
tan ~b =
"~ '
~l
~'~(2 lbGi)
'2('
+ '~)
(i +I'()
COS(2 ~b~,) (15)
Assuming
furthermore the reflectance at the silveredmica/support
interface to beunity ii-e-
r, = I, this condition
implies [p
= I,
too),
one finds(I 11)
~'~ ~~~Gl)
~~~ ~
(16)
21'2
(1 +1'()
COS(2
~bGl~the standard
equation
to calculate the distance between the(mica)
surfaces in the Surface ForcesApparatus [2].
Note,
that weapproximated
ideal reflectance of the silveredmica/support
interfaceby
theapproximation
tj- 0. Thus in the limit of t, = 0 we see from
equations (2, 12)
that thetransmission remains finite
only
if[p
= I, as is indeed the case.
In an
experiment,
aslightly
different form ofequation (16)
is used to minimize errorsarising
from some little known
quantities,
such asdispersion
andphase
shifts due to the silver. We focus our attention on the m th order resonancewavelength,
A~,. If the sheets are in contact(I,e.
D=
0) we know the resonance
wavelength
fromequation (6)
'~l~ ~
~ ~ ~Gl
~Gl (17)
On
separating
the sheetsby
a distance D, the m th orderfringe
is shiftedby AA,,,
to alonger wavelength
A. Therefore, ~b~, may be rewritten as~bGi =
j'n"
'j (18)
Using equation (16)
and sometrigonometric
relations likecos(gr-6)=-cos6~
cos
(2
gr 6= cos 6~ sin (gr 6)
=
sin 6 and sin (? gr 6
=
sin 6 we can write
equation (16)
in the more convenient form(1 1-j sin (m gr AA~,/A
tan ~b =
~
(19)
± ? r~ + + i-i cos (mar AA~,/A
where the +
~ign
refers to m odd, and thesign
to m even.Finally,
for small gaps between the sheets, one mayapproximate
sin (mgr AA ~,/A ) = mar AA~,/A,
cos (mgrAA,,,/A
)=
and tan ~b = 2 grn DIA. Thus, one obtains
D
= m
AA,,,/2
n~,, m odd(20)
and
Dn~
= m AA
~,
n~,/2,
m even(21)
The shift of the even
fringes
isstrongly
influencedby
the medium between the sheets, whereas the oddfringes
do not « see » the medium. For an intuitiveunderstanding
ofwhy
the odd and evenfringes
shiftby
different amounts we follow[2]
and refer to theanalogous
case ofan elastic string stretched between two walls. The normal modes of transverse vibrations are
considered. The first
(fundamental)
mode has atrough
at the center of thecavity
; the secondmode has a crest at the center the third mode has
again
atrough
at the center, and so on. At thecenter, the
standing
waves have either a crest (the evenfringes)
or atrough (the
oddfringes) (cf. Fig.
2a). At the center, where the medium is situated, the electrical field of the oddfringes
is zero.
Consequently,
the medium and the odd waves do not interact with each other. For theeven
fringes,
theopposite
situation occurs, the electrical field is at a maximumjust
at theposition
of the medium andthus,
the interaction isextremely
strong.If we allow for existence of losses in the medium of a
simple Fabry-Pdrot
interferometer, we find that thepeak
transmission is les~ thanunity.
The refractive index of the medium become~complex,
I,e, n= n, ix. x is known a~ the extinction coefficient.
During
the passage oflight through
the medium notonly
aphase
~hift occurs, but alsoabsorption.
Thenequation (2)
becomes
~
~-'~ ~~'kIJ
T
~ ~ ~ ~
(22)
1-pe~-"
e~-'with the abbreviations
2 grn~ 2 ~r~
~b =
D and a
=
(23)
(For
visiblelight,
I.e. A=
550 nm we have K
> 100
a).
The maximum transmissiondrops
from
unity
toT ~
=
~~ ~~~
~j~ (24)
(1
P e~ ~Yet, the condition for maximum transmission as stated in
equation (6)
remains valid.However,
the situation gets morecomplicated
and moreinformative,
if we introduce anabsorbing
medium between the(mica)
sheets in the SFA. Thenequation (2)
reads~
~-,~
~- aD~
l
[p e~'~Y~~~ e~~~~
~~~~and for the
reflectivity
coefficient r~ at the mica/medium interface and thecorresponding
transmission coefficients t~ and
t(
we findn~, n~ + I K
~ 2 n~, 2(n~ I K
r~ = =
(r~
e',
t~ = and
t(
=
(26)
n~, + n~ i K n~, + n~ i K ncj + n~ i K
However,
the definition of the « mirror's » transmission coefficients asgiven
inequation (12)
still holds.Thus,
the transmitted fraction of the incidentlight
is~
~j2 ~-2aD
~~~
ii (p e~~~~)~
+4(p e~~~~ sin~
(~by)
~~~~
with the abbreviations
[p
= (
[r~
[~ +r( 21-j [r~(
cos(2
~b~j + 6)) (28a)
(N~(
and
(N~
= r~ ~r(
+ 2 rj r~ cos(2
~b~, 6(28b)
It is very inconvenient to find that
(N (~(l
pe~~ "~)
doesdepend
on the
wavelength
A.Therefore, no
simple
way exists to find a resonance condition similar toequation (13).
Since the
equations
do not have obvious solutions, we will describe first the results from calculations on the base of the matrix formulation[6] together
with our intuitivepicture.
Thesecalculations were
performed assuming
alayered
system as shown infigure
I. LetI~ be the incident
intensity
andlo
the transmittedintensity.
Inside theFabry-Pdrot
interferome- ter, we maysplit
the electric field as the sum of aright-traveling
wave and aleft-traveling
wave. Let
Ii
_,
and
I~_,
be the intensities of these waves,respectively.
These intensities are relatedby
lo
=
(T(
2 I~(29)
lo
= t,,
t(.I,_,
=
(I r().1,_~ (30)
'<-1
"
~~'ii
<
(31)
According
to theseequations,
theintracavity
intensities aregiven by
1,
_, =
~~~
I~
(32)
rj
r([T[2
1,_j
= /~
(33)
r(
rj is assumed to be close to
unity.
If maximum transmission occurs, theintracavity intensity
in such aFabry-Pdrot
interferometer is muchlarger
than the incidentintensity (cf. Fig. 2).
Now, let us
again
consider anextremely
thinlayer
ofabsorbing
material between the(mica)
sheets and its effect on both the resonancewavelength
and the transmittance. It was shownbefore,
that the oddfringes
do not interact with a thinlayer
at the center of thecavity,
since there, their electrical field is zero and theirintensity
waves havetroughs (cf. Fig. 2). Thus,
we may expect the shift of thewavelength
AA to beindependent
of the index of refraction of the thin film andequation (20)
to be valid. Also, as can be seen infigure
2a(or
rather, cannot beseen, the waves with and without a thin film are
indistinguishable
within the resolution of thefigure),
theintracavity intensity
is the same. Therefore theintensity
of the oddfringes
asobserved after
leaving
theFabry-Pdrot
interferometer isexpected
to be the same.To understand the behaviour of the even
fringes,
let us first consider the electrical fieldwaves within the
cavity.
Here, a thinabsorbing
film ispositioned exactly
at an extremum ofthe electrical field
(in Fig.
2b the thin film ispositioned
at a minimum of the electrical field.The
intensity depends
on the square of the electrical field, therefore both minima and maxima of the electric field wavecorrespond
to maxima of theintensity wave).
Aright-traveling
wavewill
undergo
aphase
shiftentering
the film(due
to thecomplex
transmission coefficient t~. Note that theimaginary parts
oft(
and t~ areequal).
In theabsorbing film,
the electrical fieldwill decrease
exponentially,
then, onleaving
the film the waveexperiences
the reversephase
shift. Due to the
absorption
at the crest, the wave lost its symmetry, the maximum of the electric field isslightly
shifted to the left where the wave comes from.Similar,
a wave,moving
in the
opposite
direction(from right
toleft) experiences absorption
at the center crest and theopposite
symmetry break. The electrical field in a normalFabry-Pdrot
at agiven wavelength
is the sum of the electrical fieldsgenerated by
the wavestraveling
in both directions. It issymmetric. However,
in case of very strong absorbers(large
K), the symmetry break of the center crest may bequite pronounced.
This leads to abroadening
of the center node, in extreme cases the« crest » even exhibits two extrema
(minimia
in the case ofFig. 2b).
Thebroadening
of the crest in one
period
of the wave can be seen as an effective decrease of theoptical path,
therefore the resonance
wavelength
is decreased. Also, as is demonstrated infigure
2a, theintracavity intensity
is much lower than without an absorber.To find some
approximate
formulas for the resonancecondition,
thefollowing approach
waschosen: to allow an
unambiguous
power seriesexpansion
to the denominator of thetransmittance,
equation (27j,
thecomplex
numbers have to be broken intoexplicit
real andimaginary
parts instead of absolute values and theirphase.
The power seriesapproximation
was calculated for AA~ and D, up to terms of order AA ~ and D. Then, to find the maximum of the transmission, the derivative with respect to AA was put to zero furthermore ri was taken to be
unity.
As
expected,
we find the resonance condition for the oddfringes unchanged (cf. Eq. (20))
D= m AA
~/2
n~, m odd(34)
However, for even
fringes
we obtain(n)
K ~) D = m AA~,
n~j/2
,
m even
(35)
even, D
= 0
20 odd, D=)D=2nm
even,D=2nm
15
j
[:_ ,I "; ;' [ ."_ / '.
-
I I
I
I I/
f
l I ; I I- I II j I i ;I
2~ 10 I; il ;÷ 1. .~
i
~) l II ).Ii
I
Iit
/; I( II
~ii
5
jl );
l Ii ; Iiij j Ii j II
0
~'~
«300 «200 «100 0 100 200 300
Distance from Center [nm]
a)
E, 1~ r Thickness: 2 nm
E~r~l n=1.33-5i
Z E
_
1.5
$
1.0il
0.5 ~"'[. ,,
~
o-o
,
.."'
' "., ,'
;""
',.._
.(
«0.5"ji--I)
I
-1.0 LU-1.5
-300 -200 -100 0 100 200 300
Distance from Center
[nm]
b)
Fig. 2. a) The ~patial
inten~ity
di~tribution at the center of the cavity without and with an ab;orber atthe center, as obtained from calculations using the matrix formalism. Without an ab,orber, at the center
of a simple cavity the
intensity
of the odd iringe, i; zero, while the inten;ity of the even fringe, i, at amaximum, about fifteen times the incident inten,ity i,. With and without a 2 nm thick ab;orber at the
center of the cavity, the odd
fringes
coincide within the re,olution oi the figure. However, on in,ertion ofthe dye, the
intensity
of the even fringe isprofoundly
attenuated, al;o asplitting
oi the cre~t al the position of the dye can be detected. b) was designed, to explain the ,plitting of the cre,t, Here, the electrical field of the evenfringe
aiter the in~ertion of the dye i~ shown. The electrical field (3E is the sum of the fields of the wave traveling from left- right and of the one
traveling
from right-
left. On
pa~sing
the ab,orber, both wave~ experience a ~ymmetry break a~ well a~ abroadening
oi thecrest. In the matrix calculation~, the following constants were u~ed the ~ilver layer wi 40 nm thick with
an index of refraction of 0.05 2.87 I, the mica was ?.754515 ~m thick with iicj 1.58 and the dye- layer wa~ 2 nm thick with n, ix 1.~3 5 1, Without an absorber, the wavelength of [he odd fringe
was 550.018 nm, the one of )he even
fringe
586.02 nm. With the dye, the re~onance wa~elength~ ~.ere~hifted by 0,19~ nm and 1.967 nm, re~pectively.
As mentioned above, for
large
K, the resonancewavelength
decreases withincreasing
film thickness. This is due to the symmetry break the wave suffers whentraveling through
a thin film. If n, exceeds K, the resonancewavelength
increases withincreasing
film thickness. In the limit of K- 0 we have the same
equation
as for anon-absorbing
thin film,equation (21).
Now, let us consider the maximum transmittance, I,e, the
intensity
losses due to the thin film. It was calculatedby replacing
the shift of the resonancewavelength by
the distance D(I.e. Eqs.(34, 35))
in theequation
for the transmittanceequation (27) (the
latter broken intoexplicit
real andimaginary parts).
We find for the oddfringes
T(D)[
)~~=
l D ~ " ~r' K
(I
1",
~~
~G'(I
+"1) (36)
The transmittance is almost
unity,
since bothD/A°
and r, are very small. However, foreven
fringes
we have~
12
~r n~. K (I + rj ) 2T(D
j= I + D
(37)
~~~~ A~ ~Gl I 1',
Now, the small D/A ° is to be divided
by
thesimilarly
small r,. Therefore, theintensity
starts to decrease even if D amounts to 0.I fb of A. The effect is more
pronounced
the more thereflectivity
coefficient of the silveredmica/support
interfaceapproaches unity.
The strong influence of the
reflectivity
coefficient of the silveredmica/support
interface will be discussedbriefly,
first for asimple Fabry-Pdrot
interferometerconsisting only
of micawithout any film in the center. The
reflectivity
of the mirrors does not influence thetransmittance at resonance. Also, the resonance conditions
quoted
inequation (7)
areindependent
of r,, and so are the resonancefrequencies,
which areseparated by
the freespectral
range, Av cl (2 n~, D). However, thereflectivity
isimportant
for transmittance atfrequencies
whichslightly
deviate from resonance, I.e, the width of the transmissionpeaks
is finite. This effect isusually quantified by considering
the Full Width of thesepeaks
at theirHalf-Maximum values
(FWHM). According
toequation (5),
half-maximum transmission(I.e., (T(
~ =0.5)
occurs at~
(l
r))~
sin- ~b~, =
(38)
4
r(
For most
high
resolutionFabry-Pdrot
interferometers,r(
is very close to I. Thus, the solutions ofequation (38)
aregiven approximately
as1_,-(
~b~, = mm =
139)
~,.,
The FWHM in terms of the
frequency dv,/~
is thusgiven by
I
r(
dv
~~ = Av
=
Av IF
(40)
grr,
The finesse F is the ratio of the
separation
betweenpeaks
to the width of a transmissionpeak.
Here, it is
given
as a function of the reflectance of the silveredmica/support
interface. If a thinabsorbing
film is now situated at the crest of a resonance wave, the symmetry breaks shown infigure
2 lead to shifts in thewavelength,
away from the almostsymmetric right
and lefttraveling
waves in a usualcavity.
Thesharper
the transmissionpeaks,
the more decreased is theintensity
of the thus shifted wave.If one wants to compare the
absorption
spectra of a very thinlayer
to those from the bulkmedium,
it is convenient togive
theabsorption
in a form similar to the Lambert-Beer law.Usually
theabsorptance
A isgiven,
which isproportional
to thelogarithm
of the transmittedintensity
I dividedby
the incidentintensity
I~A cc 2 grKD/A
=
Injo (I/I~).
Cte.(41)
Here, we find with
equation (37)
T(0
) )~~~ n~,(I rj2 grKD/A
=
C
~
l with C
=
(42)
T(D
~~~~
n~(
I + r,)
Let us
briefly
mention the case oflarge separations,
I,e,large
~ "~ D. For a veryrough
estimate of the transmittance, we may put p ~ l and obtain T(D
)[
2 = r [2 e~ ~ ~~,
D
large (43)
At
large separations
of the micasheets,
the transmittancedecays roughly exponentially
with distance.To conclude the
theory
section, we would like toemphasize
that we discussedonly
theprinciples
of anhomogeneous
thinabsorbing
film at the center of aFabry-Pdrot
interferometer.We also
neglected dispersion,
which is noproblem
aslong
as the shifts of thewavelength
arevery small. If we intend to simulate an
experiment
which involveslarge
distances and thuslarge wavelength shifts,
we would have to take into account both thedispersion
of the thin filmat the center of the
cavity (that
isr~)
as well as thepronounced dispersion
of the silver(that
isr,).
However, in this case we expect aninhomogeneous
concentrationprofile
at the interface,and the whole
three-layer picture
appears to begrossly inappropriate. Then,
one wouldpresumably
use a matrix formalisminvolving
as manylayers
as necessary, or may be onelayer
with acontinuously varying
index of refraction.Anyway,
in this case one would have to do numerical calculations. And the aim of this section was togive
aphysical understanding
for enhancedabsorption.
3. Materials and Methods,
MATERIALS. -Rhodamin B was from Merck,
Darmstadt, Germany
and used as received.The water was filtered in a
Milli-Q
unit. Thedye
concentration was in allexperiments
0.01 M.SURFACE FoRcEs APPARAI'US. In these
experiments
theFabry-Pdrot
interferometer consistsof two mica sheets of
equal
thickness, which are silvered on their backside (about5001
silver).
The sheets wereglued
on crossedcylindrical
disks(radius
~ 2 cm), a geometry which
corresponds
to asphere
on a flat. The sheets werequite large
and covered theglass
diskscompletely.
Then, the disks were mounted in the apparatus (Mark IV, Anutech,Australia).
One of the
mountings
is movable, the other isrigid.
The former issupported by
a stiffspring.
At the
beginning
of eachexperiment,
the mica surfaces werebrought
into contact indry
air and theiroptical properties
were studied. Then, the surfaces were moved far apart and adroplet
of Rhodamin B solution (~ 60 ~Ll) wasinjected
with asyringe
between the disks. Next, a waterdish was
placed
at the bottom of the apparatus, and theatmosphere
was allowed toequilibrate
for about two hours.
OPTICS. The
experimental
set-up is shown infigure 3,
theprinciple
of theoptics
infigure
4.Briefly, light
from a 100Whalogen lamp (MUller Instruments, Grasbrunn, Germany)
is focused on theFabry-Pdrot
interferometer. Behind the interferometer amicroscope objective (magnification lo,
effective focallength
13.9mm)
focuses the transmittedlight
on theentrance slit of a
spectrograph (HR
3205f/4.2,
Instruments S. A. Riber-Jobin-Yvon, Gras-brunn, Germany),
which is >500 mm away from theinterferometer,
thusleading
to amagnification
factor of >50. Behind thespectrograph
a camera(Proxitronic, HLS,
Bensheim,Germany)
and a video-recorder allowrecording
and observation of thefringe
pattern. Thespectrograph
is alsoequipped
with aneye-piece,
which contains a small moveable scale. With theeye-piece
shifts of thewavelength
down to 0.02 nm can be resolved in intensefringes.
ID M2 S
Prism Spektrograph
CL Video
Microscope
System
Objective
LGCrossed Mica spektrograph
Cylinders
HM
OSMA
~
Lamp
Fig.
3. The experimental set-up. HM : heat reflecting filter (hot mirror), Ml mi«or, ID irisdiaphragm,
M2 : moveable mirror, S slit, CLcollimating
lens system, LGlight guide.
The
intensity
of thefringes
was determined with an OSMA(Optical
Simultaneous MultichannelAnalyzer)
system. A movable mirror is used to deflect thelight
at theposition
indicated in
figure
3. A lens system collimates the beam on alight guide (OFC200,
Spectroscopy Instruments, Gilching, Germany)
with an actuallight transmitting
area of~0.3mm2. Then, the
light
travelsthrough
a monochromator(HR320, Spectroscopy
Instruments)
to a MultichannelAnalyzer (IRY-700G, Spectroscopy Instruments).
Thespectral
resolution is determinedby
thegrating (3001/mm
and12001/mm),
~160 nm andm40nm can be observed
simultaneously
with a resolution of0.23nm/pixel
and0.057
nm/pixel, respectively.
The twogratings
have different reflectivities. Thesensitivity
of the diodes of the MultichannelAnalyzer
variesby
up to 10 fb.Therefore,
whenever intensitiesof different spectra were
compared, only
measurementsperformed
at identicalgrating
positions
were used. Between Is and I min are necessary to measure a spectrum withsatisfactory
statistics.Since mica is
birefringent,
and the orientation of the sheetsagainst
each other is random, sometimespeak
doublets were observed. In this case, apolarizer
was used.To select the center spot in the interference pattern (cf.
Fig. 4),
an irisdiaphragm
is situated in thepath
oflight
before the mirror. Forspectral calibration,
a mercury pen raylamp
wasemployed.
lo Xi
e
m
~
QJ
b
g
O~ u
tll QJ
B
I
QJ
j~
~~ tll
~
X
Real
Space Wavelength ~
lo xi
Wavelength ~
Fig.
4. Cartoon of theAlignment.
Top leit it the cros~ed cylinder~ are irradiated by monochromatic light. Newton'~ rings are ob~erved, Top right : the pattern as observed in the ~pectrograph, if the centralarea of Newton's rings is focused on the entrance flit. Bottom left when the surfaces are irradiated by white light, the FECO fringe~ are observed. Their shape reflects the deformation~ of the surfaces. Bottom right : at the smallest wavelength of a given fringe the suriaces are close~t together. This area i~ ~elected
by
an iri~ diaphragm, and there, the intensity of theiringe
is measured.CALCULATIONS. To simulate the
optical
set-up, numerical calculationsrelying
on thematrix formali~m were used
[6].
This was executed with a Mathematica (Version2.04)
program on a Macintosh llvx. The sequence of
layers
was as follows silver, mica, medium, mica, silver. Mathematica was also used to find theapproximate
formulas for thewavelength
shift and the intensities
(I,e. Eqs.(34-37))
in cases where theabsorbing layer
is very thin.Furthermore, all
analytical
formulas were cross-checked with the matrix formalism for sometypical
numericalexamples.
4. Results.
This section is
organized
as follows first we will describe how wedistinguish
odd and evenfringes
in air, and how a very thin film ofdye trapped
between the mica sheets affects the transmission of theFabry-Pdrot
interferometer. Next, toquantify
the effect, we have to know theproperties
of theFabry-Pdrot
interferometer such a~ itsspectral
resolution, its finesse andthe transmission of the
contacting
mica sheets withoutdye.
Then we can determine thethickness of the thin
dye layer
and itscomplex
index of refraction. If the distance between the mica surfaces is increased, the spectrum resembles more and more that of the bulk solution.Yet, even if the surfaces are ~Lm apart, we still see the concentration increase of the
dye
closeto the mica surfaces.
Odd and even
fringes
canalready
bedistinguished
with mica in air. This is due to thelarge
adhesion of clean mica surfaces indry
air[3].
If the surfaces arebrought
into contact~ thecontact zone flattens because of the
large
adhesion. This is shownby
theshape
of theinterference
fringes,
which have a flat center and are nolonger
rounded as sketched infigure
4.The diameter of the contact zone is 10-50 ~Lm~
depending
on the mechanicalproperties
of the whole system[7].
Thelarge
adhesion induces the surfaces tobulge
forward the bifurcation at theedges
of the contact zone is verypronounced.
This bifurcation is detecteddifferently by
even and odd
fringes.
At theedges
of the contact zone, the distances between the surfaces arestill small and
equations (20, 21) apply.
The shift of the oddfringes
isproportional
ton~, = 1.58, whereas the shift of the even
fringes
isproportional
ton~/ii~j
= 0.63(assuming
n~, =
1.58 and n
= n~,, ). Therefore~ above and below the flat zone, the odd
fringes
appearto have
sharp edges,
while the evenfringes
seem to be more rounded.Figure
5~ top, shows the spectrum of the resonancewavelengths
ofcontacting
mica surfacesin air as measured with the OSMA and the 3001/mm
grating. Sharp
resonancepeaks
areobserved, whose
positions
are determinedby
the thickness of the mica sheets(Eq. (17)
). The maximumintensity
follows anenvelope
which is determinedby
thelamp
spectrum, but also influencedby
thespectral
resolution of thegrating
and the detector. The width of thepeaks
isresolution-limited.
However, if one intends to
quantify
theabsorption
coefficient of a thinlayer,
it is essential to determine the fines~e and thus thereflectivity
of the silvered mica/substrate interface. Toachieve this end, the 12001/mm
grating
was used, but still thepeaks
wereonly slightly
broader than the resolution. Therefore, we used mica with about half the thickness of the one whose transmission spectrum is shown in
figure
5.Keeping
the finesse more or less constant(I,e, using alsways
the same amount of silver to achieve the same i-j) anddividing
the thicknessby
a factor of two increases both the freespectral
range and the distance resolutionby
thatfactor of two. (Of course~ any measured
absorption
spectrum of a very thinlayer
has now fewerpoints
that is thepay-offj.
One transmi~sion
peak
of aFabry-Pdrot
interferometerconsisting
of very thin mica sheets is shown infigure
6. To obtainquantitative
information one mustla)
assess and subtract thebackground
from the totalintensity
to obtain thesignal intensity,
and(b)
model thesignal intensity by
a convolution of an assumed, intrinsic lineshape
with theexperimental
resolution.The latter is determined
empirically
with the 1?001/mmgrating
and theyellow
lines of amercury pen ray
lamp.
The theoretical
shape
of a transmissionpeak
isgiven
inequation (5).
Thi~shape
may be well described as a Lorentzian, after converting thewavelengths
to wave numbers. The convolution450 500 550 600 650
Wavelength [nm]
Fig. 5. The transmission pattern as observed with the OSMA,
using
the 3001/mmgrating.
Thediffraction peaks measured at two different
angles
of thegrating
aresuperimposed,
they overlap between 540 nm and 550 nm. The mica is rather thick (D~j = 7.52 ~m ), therefore the distance between the peaks (I,e. the freespectral
range) isquite
small. Top : the mica surfaces in air arebrought
into contact.Bottom a droplet of 0.01 M Rhodamin B solution is placed between the mica surfaces, then the surfaces
are
brought
into contactagain.
It isimpossible
to remove the lastremaining layer
of Rhodamin B, eventhough large compressive pressures are applied. The thickness of the remaining layer is 1.2 = 0.6 nm.
Only
the electric field of the evenfringes
does interact with the Rhodamin B, thereforepronounced absorption
of every second fringe is observed.559.32nm 557.67nm
8000
~i
60002000
17700 17800 17900 18000 18100
Wave Number
[cm
~]Fig. 6. The transmission peak of an even fringe (m 32) measured with mica in air. Shown is a
spectrum as observed with the OSMA,
using
the 2001/mmgrating.
The two maxima are due to the pronounced birefringence of the mica. The straight line gives the resolution as determined from a mercury pen raylamp.
The mica is on the thin side(D~j
= 2.83 ~m, A(
= 575.95 nm and (j = 577.71 nm),
therefore both the distance between the peaks and their width are quite large. The finesse of this Fabry- Pdrot interferometer was 20.5 = 0.5. In this