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BAND GAP VARIATION OF GALLIUM SELENIDE UNDER HIGH PRESSURE
Michel Gauthier, A. Polian, J Besson
To cite this version:
Michel Gauthier, A. Polian, J Besson. BAND GAP VARIATION OF GALLIUM SELENIDE UNDER
HIGH PRESSURE. Le Journal de Physique Colloques, 1984, 45, �10.1051/jphyscol:1984813�. �hal-
03059390�
JOURNAL D E PHYSIQUE
Colloque C8, suppldment au nO1 1, T o m e 45, novembre 1984 page C8-65
BAND GAP V A R I A T I O N OF G A L L I U M S E L E N I D E UNDER H I G H PRESSURE
M. Gauthier,
A .Polian and J . M . Besson
Physique des Milieux h 8 s Condensls, U n i v e r s i t l P . e t M . Curie, 7 5 2 3 0 Paris Cedex 0 5 , France
Resume - Af in de rendre compte de l a variation sous pression de l a b a n d e i n t e r d i t e de GaSe, nous proposons u n modele dans lequel l a nature lamellaire de ce compose e s t explicitement u t i l i s e e . Ce mo- dele complete par l e s r e s u l t a t s de calcul de s t r u c t u r e de bandes e s t en t r e s bon accord avec l e s r e s u l t a t s experimentaux.
Abstract - Taking into account the lamellar s t r u c t u r e of GaSe, we reproduce i t s complex band gap variation under pressure. The model j o i n t with recent band s t r u c t u r e calculation f i t s very well with experimental data.
Ga Se is layered 1 1 1 - V I semiconductor. The variation of its absorption coefficient under pressure is complex : Although the indirect absorption edge monotonicaly decreases with pressure, the direct gap first decreases up to 1.3 GPa and then increases at higher pressure. We can account for these variations with a simple model in which we assume that :
i) the interlayer and interlayer regions are completely independant.
ii) the deformation potentials depend only upon the nature of the electronic levels.
In order to compare this model with experimental data, we have determined the variation under pressure of the intra-and interlayer distances.
COMPRESSIBILITY
The disconnection of the intra and interlayer regions is the key to our description of the evolution of the cristallographic parameter C under pressure. We write :
dc = dci + dc P a n d : x C = $ x . + - P
c X~
with xi - 1 = Bi = C (n)pn
;- dP
n Boi i ' Xi
X-l= B
.:c B(n)Pn
=- a d~
P P n o p p XF P
where
c : cristallographic parameter
c : thickness of one layer of compressibility x in the c direcsion
P P
c
= G- c interlayer distance in the c direction (compressibility x.) P
Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphyscol:1984813
C8-66 JOURNAL DE PHYSIQUE
Experimental data were obtained by using a microphotographic method in the diamond anvil cell (D.A.C.). Figure 1 shows the fit between experimental data and this
.
EXPERIENCE- THEORlE
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5 10 15
EXPERIENCE