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EXTENDED SOFTWARE POSSIBILITIES IN X-RAY MICROANALYSIS
D. Grman, W. Muster
To cite this version:
D. Grman, W. Muster. EXTENDED SOFTWARE POSSIBILITIES IN X-RAY MICROANALYSIS.
Journal de Physique Colloques, 1984, 45 (C2), pp.C2-231-C2-234. �10.1051/jphyscol:1984251�. �jpa-
00223964�
JOURNAL DE PHYSIQUE
Colloque C2, suppl6ment au n02, Tome 45, f6vrier 1984 page mC2-231
EXTENDED SOFTWARE POSSIBILITIES I N X-RAY MICROANALYSIS
D. G r m a n and W.J. Muster
Swiss Federal Laboratories for Materials Testing and Research, CH-Diibendorf, SwitzerZand
RGsume - En microanalyse par rayons X, de nouvelles possibi- litgs intsressantes d'application de l'informatique ont et6 d6veloppges au cours de ces dernisres annges. Quelques-unes d'entre elles,
2savoir notarnment les programmes QLA, TRACE,
MAPet CALIB, sont decrites ci-aprGs. Elles r e l h e n t de l'uti- lisation, dans le domaine de la mgtallurgie, d'une microson- de glectronique "JEOL Superprobe JXCA-733" pilotge par ordina- teur .
Abstract - In recent years further interesting computer appli- cation in X-ray microanalysis have been developed. Some of the- se (QLA-, TRACE-, MAP- and CALIB-program) will be presented us- ing a computer controlled electron microprobe "JEOL Superprobe JXCA-733" for metallurgical applications.
QLA-program
This program makes it possible to check within a few minutes for the presence of totally 71 elements ranging from fluorine to uranium, and to print out the results in a hardcopy. In QLA-program, three channels [CH(I) to
C H ( ~ )] of spectrometers are scanned over their entire range and X-intensities of the mentioned elements are measured at the points corresponding to the caracteristics emission lines. An important ad- vantage of the energy dispersive method over wavelength dispersive systems has previously been the speed with which a general qualitative analysis could be obtained. This gap can now be closed for wavelength dispersive spectrometers by using the QLA-program, through which com- parable detection limits can be attained (see Table I). The substanti- ally higher energy resolution of the crystal spectrometer system also represents
agreat advantage, especially with a view to increasing analytical certainty. Rapid qualitative analyses with the aid of the QLA-program are to be recommended in the field of metallurgy above all for the investigation of slags (Fig. l), corrosion products, metal chips etc.
Table I - Detection limits in mass-% for selected steel elements by means of QLA-program for an accelerating voltage of 25 kV and a probe current of I O - ~ A . (The dectection limits may be improved by using higher probe currents.)
Element X-ray line mass-%
A1
K a0.08
S i
K a0.08
P K
a 0.3
S
Ka 0.3
T
i
Ka 0.4
V K
a 0.3
Element X-ray line mass-%
Cr
K a0.2
Mn K
a0.2
CO
Ka 0.2
N
i
Ka 0.1
MO La 0.6
W L a 0.4
I
Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphyscol:1984251
JOURNAL
DE
PHYSIQUEPfiOIct-CllRfFFK : ?+Q60F-08 < R ,
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X I 1 S i r n ' 0 F 1 8 . 3 2 0
UER 1.OG. AUSDRLICK U N T E R S C H E I D E T ZWISCHEN RESULTS:
THE FOLLOWING ELEMENTS ARE PRESENT MG, AL, 5 1 , K, CA, CR. MN, FE, N I
t H 7 2 ) PET
HG 5 . 6 5 0
N E b . 7 2 0 R U 5 . 8 4 1 X I f f 6 r b 7 ~3
P 6 . 1 6 0
UNTERGRUNIl UN18 ELEMENT ( t )
C H ( J ) L I F C O U N l I N T E N S I T Y ( L 0 G )
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Fig.
1- QLA-analysis of slag in steel. Accelerating voltage 25 kV, probe current
1O - ~ A .
For high-speed quantitative analysis recently a new semi-quantitative analysis program was developed which is aimed at performing qualita- tive analysis and obtaining the approximate results of quantitative analysis at high speed without requiring measurement of the specific standard specimen for the elements detected [
11.
TRACE-program
This computer controlled measuring process samples automatically with- in
acertain wavelength range of the X-ray spectrum using a spectro- meter at high precision and with a minimum step of
1micron. By this means even very low concentration (down to the ppm range) can be clearly established statistically. A typical, relevant practical exam- ple of this process is the detection of nitrogen when investigating stress corrosion cracking on brass. As Fig. 2 shows, the corrosion products on an opened fracture surface with small amounts of nitrogen (approx.
0.2mass-%) reveal with the aid of the TRACE-program clearly the presence of the
NK-emission band, whereas this element could not be detected at any of the points investigated when the process was not controlled by a computer.
Furthermore this program also represents a useful procedure for exam- ing the influence of chemical bonding on the X-ray emission spectra.
Fig. 3 shows a representation of the measured data for the investiga-
tion of the S Kp-emission bands emitted by FeS2 and FeS04. The clear
band separation makes it possible for corrosion investigations to de-
termine within a short time (approx. 5 min) the degree of oxidation of
the elements S or Fe contained in the corrosion products' and thus to
draw more precise conclusions concerning the corrosion mechanism. This
applies especially in the case of corrosion phenomena at locally li-
mited areas where other methods (X-ray fluorescence analysis, X-ray
diffraction, wet chemical methods) cannot be used.
Fig.
2- Microanalytic evidence of bound nitrogen (nitrogen concentra- tion approx. 0.2 mass-%) in the corrosion products [ C U ( N H ~ )
I + ( O H ) 2]on the opened fracture surface, determined by means of
NK-emission band Analyser crystal STE, accelerating voltage 10 kV, probe current 3.10-g A, spectrometer step
185p.m(approx. 0.0658), meas. time/per step 10
S.5,030 5,035 5,040 X [l]
Fig. 3 - The
SK@-emission band emitted by FeSos(a) and FeS2(b). Ana-
lyser crystal PET, accelerating voltage 15 kV, probe current 4.10'~~,
spectrometer step 10 gm (approx. 0.0003 A), meas. time/per step
2 S.C2-234 JOURNAL