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HAL Id: jpa-00223964

https://hal.archives-ouvertes.fr/jpa-00223964

Submitted on 1 Jan 1984

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EXTENDED SOFTWARE POSSIBILITIES IN X-RAY MICROANALYSIS

D. Grman, W. Muster

To cite this version:

D. Grman, W. Muster. EXTENDED SOFTWARE POSSIBILITIES IN X-RAY MICROANALYSIS.

Journal de Physique Colloques, 1984, 45 (C2), pp.C2-231-C2-234. �10.1051/jphyscol:1984251�. �jpa-

00223964�

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JOURNAL DE PHYSIQUE

Colloque C2, suppl6ment au n02, Tome 45, f6vrier 1984 page mC2-231

EXTENDED SOFTWARE POSSIBILITIES I N X-RAY MICROANALYSIS

D. G r m a n and W.J. Muster

Swiss Federal Laboratories for Materials Testing and Research, CH-Diibendorf, SwitzerZand

RGsume - En microanalyse par rayons X, de nouvelles possibi- litgs intsressantes d'application de l'informatique ont et6 d6veloppges au cours de ces dernisres annges. Quelques-unes d'entre elles,

2

savoir notarnment les programmes QLA, TRACE,

MAP

et CALIB, sont decrites ci-aprGs. Elles r e l h e n t de l'uti- lisation, dans le domaine de la mgtallurgie, d'une microson- de glectronique "JEOL Superprobe JXCA-733" pilotge par ordina- teur .

Abstract - In recent years further interesting computer appli- cation in X-ray microanalysis have been developed. Some of the- se (QLA-, TRACE-, MAP- and CALIB-program) will be presented us- ing a computer controlled electron microprobe "JEOL Superprobe JXCA-733" for metallurgical applications.

QLA-program

This program makes it possible to check within a few minutes for the presence of totally 71 elements ranging from fluorine to uranium, and to print out the results in a hardcopy. In QLA-program, three channels [CH(I) to

C H ( ~ )

] of spectrometers are scanned over their entire range and X-intensities of the mentioned elements are measured at the points corresponding to the caracteristics emission lines. An important ad- vantage of the energy dispersive method over wavelength dispersive systems has previously been the speed with which a general qualitative analysis could be obtained. This gap can now be closed for wavelength dispersive spectrometers by using the QLA-program, through which com- parable detection limits can be attained (see Table I). The substanti- ally higher energy resolution of the crystal spectrometer system also represents

a

great advantage, especially with a view to increasing analytical certainty. Rapid qualitative analyses with the aid of the QLA-program are to be recommended in the field of metallurgy above all for the investigation of slags (Fig. l), corrosion products, metal chips etc.

Table I - Detection limits in mass-% for selected steel elements by means of QLA-program for an accelerating voltage of 25 kV and a probe current of I O - ~ A . (The dectection limits may be improved by using higher probe currents.)

Element X-ray line mass-%

A1

K a

0.08

S i

K a

0.08

P K

a 0.3

S

K

a 0.3

T

i

K

a 0.4

V K

a 0.3

Element X-ray line mass-%

Cr

K a

0.2

Mn K

a

0.2

CO

K

a 0.2

N

i

K

a 0.1

MO La 0.6

W L a 0.4

I

Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphyscol:1984251

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JOURNAL

DE

PHYSIQUE

PfiOIct-CllRfFFK : ?+Q60F-08 < R ,

STOGF F O S . : X 13567 Y 2 2 7 0 4 7 1 1 4 0 7

X I 1 S i r n ' 0 F 1 8 . 3 2 0

UER 1.OG. AUSDRLICK U N T E R S C H E I D E T ZWISCHEN RESULTS:

THE FOLLOWING ELEMENTS ARE PRESENT MG, AL, 5 1 , K, CA, CR. MN, FE, N I

t H 7 2 ) PET

HG 5 . 6 5 0

N E b . 7 2 0 R U 5 . 8 4 1 X I f f 6 r b 7 ~3

P 6 . 1 6 0

UNTERGRUNIl UN18 ELEMENT ( t )

C H ( J ) L I F C O U N l I N T E N S I T Y ( L 0 G )

5 4 *********t 5 4 *********t 41 *******X*

4 0 *S*******

38 m********

3 6 ****L****

2 8 **%**%X*

2 6 Y Y I * * * * * 28 *X******

34 ******tt 16 ****X**

18 * * * * * W

2 8 4 3 *********tttttttttt 1 1

******

4 6 1 * * * * * * X * t t t t t t t 3 6 *****ttti

5 **tt 3

***

4 * * * t 4 ***t 4 ***t 3

***

1

*

1

*

Fig.

1

- QLA-analysis of slag in steel. Accelerating voltage 25 kV, probe current

1

O - ~ A .

For high-speed quantitative analysis recently a new semi-quantitative analysis program was developed which is aimed at performing qualita- tive analysis and obtaining the approximate results of quantitative analysis at high speed without requiring measurement of the specific standard specimen for the elements detected [

1

1.

TRACE-program

This computer controlled measuring process samples automatically with- in

a

certain wavelength range of the X-ray spectrum using a spectro- meter at high precision and with a minimum step of

1

micron. By this means even very low concentration (down to the ppm range) can be clearly established statistically. A typical, relevant practical exam- ple of this process is the detection of nitrogen when investigating stress corrosion cracking on brass. As Fig. 2 shows, the corrosion products on an opened fracture surface with small amounts of nitrogen (approx.

0.2

mass-%) reveal with the aid of the TRACE-program clearly the presence of the

N

K-emission band, whereas this element could not be detected at any of the points investigated when the process was not controlled by a computer.

Furthermore this program also represents a useful procedure for exam- ing the influence of chemical bonding on the X-ray emission spectra.

Fig. 3 shows a representation of the measured data for the investiga-

tion of the S Kp-emission bands emitted by FeS2 and FeS04. The clear

band separation makes it possible for corrosion investigations to de-

termine within a short time (approx. 5 min) the degree of oxidation of

the elements S or Fe contained in the corrosion products' and thus to

draw more precise conclusions concerning the corrosion mechanism. This

applies especially in the case of corrosion phenomena at locally li-

mited areas where other methods (X-ray fluorescence analysis, X-ray

diffraction, wet chemical methods) cannot be used.

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Fig.

2

- Microanalytic evidence of bound nitrogen (nitrogen concentra- tion approx. 0.2 mass-%) in the corrosion products [ C U ( N H ~ )

I + ( O H ) 2]

on the opened fracture surface, determined by means of

N

K-emission band Analyser crystal STE, accelerating voltage 10 kV, probe current 3.10-g A, spectrometer step

185p.m

(approx. 0.0658), meas. time/per step 10

S.

5,030 5,035 5,040 X [l]

Fig. 3 - The

S

K@-emission band emitted by FeSos(a) and FeS2(b). Ana-

lyser crystal PET, accelerating voltage 15 kV, probe current 4.10'~~,

spectrometer step 10 gm (approx. 0.0003 A), meas. time/per step

2 S.

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C2-234 JOURNAL

DE

PHYSIQUE

MAP-program

The program produces at various magnifications highly accurate two di- mensional X-ray contour maps, with the additional possibility of eva- luating ti~ese digital element maps semi-quantitatively over the entire concentration range. This allows interesting metallurgical investiga- tions, such as of segregation phenomena respectively diffusion zones.

CALIB-program

In special cases, the CALIB-computer-program enables the user to ob- tain more precise analytical results through the use of calibration curves than would be possible with the usual ZAF programs and the ap- plication of pure standards. One of its most important applications in the field of metallurgy is the analysis

of

the carbon content in steels, for example, when investigating case-hardened layers. The con- centrations which appear in this context (for the most part, between 0.1 and 1.0 mass-%) cause substantial difficulties with the usual ZAF corrections. By using the CALIB-program and special standard steel specimens, the carbon analysis is simplified considerably and its ac- curacy improved.

References

[ l ] ONO

Y.,

JEOL

NEWS

E , nO1

(1983) 9.

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