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Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

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doi:10.1017/S1431927612009488 © Microscopy Society of America 2012Microsc. Microanal. 18 (Suppl 2), 2012

https://doi.org/10.1017/S1431927612009488

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Microsc. Microanal. 18 (Suppl 2), 2012 1527

https://doi.org/10.1017/S1431927612009488

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