Critical-current reduction in thin superconducting wires due to current crowding

If it is well-known that the Hall voltage measured in Hall bar devices is due to the electric charges accumulated at the edges in response to the magnetic field, the nature of

TCAD device modeling often describe the carrier distribution and transport inside a given device by solving the Poisson equation coupled to a Density-Gradient (DG)

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V. CRITICAL CURRENT HYSTERESIS DUE TO ELEC- TRON OVERHEAT IN NARROW SUPERCONDUCTING FILMS.. Musienko and I.M. Rdsumd.- On a dtudil l'hystlrdsis descaractdristiques courant-tension

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stance, all junctions at the boundary of a non- superconducting grain (a foreign phase) will be defective, and possess a vanishing critical current ;.. chemical

2014 From the nonlinear Ginzburg-Landau equations exact maximum supercurrent densi- ties of injected transport currents were calculated for a square microarray as a

Dans cet article seront présentées une méthode électrique, où l'échantillon est en contact avec le système de mesure on parle alors de méthode directe, et