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Angle-resolved photoemission of xenon adsorbed on Pt(111) : commensurate and incommensurate

monolayers

A. Cassuto, J.J. Ehrhardt

To cite this version:

A. Cassuto, J.J. Ehrhardt. Angle-resolved photoemission of xenon adsorbed on Pt(111) : com- mensurate and incommensurate monolayers. Journal de Physique, 1988, 49 (10), pp.1753-1759.

�10.1051/jphys:0198800490100175300�. �jpa-00210856�

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Angle-resolved photoemission of xenon adsorbed on Pt(111) :

commensurate and incommensurate monolayers

A. Cassuto and J. J. Ehrhardt

CNRS, Laboratoire Maurice Letort associé à l’Université de Nancy I, BP 104, 54600, Villers les Nancy, France (Requ le 12 avril 1988, révisé le 9 juin 1988, accepté le 13 juin 1988)

Résumé.

2014

Nous avons tracé les courbes de dispersion de la structure commensurable (~3 x ~3) R30° et

hexagonale compacte incommensurable tournée du xénon adsorbé sur Pt(111). Grâce à la comparaison avec

d’autres résultats de la littérature obtenus sur cuivre, palladium, aluminium, argent, platine et graphite, nous

avons pu montrer que le dédoublement des niveaux 5p3/2 était principalement au recouvrement des orbitales 5p au-dessous d’une distance minimale. 11 augmente faiblement lorsque la distance xénon-xénon décroît et ne dépend pas de la nature du substrat.

Abstract.

2014

The dispersion curves of the commensurate (~3 x ~3) R30° and the hexagonal compact incommensurate rotated xenon overlayers on Pt(111) are given. Comparison with other angle-resolved photoemission results on copper, palladium, aluminum, silver, platinum and graphite show that the splitting of

the 5p3/2 levels is mainly due to the overlap of the 5p orbitals from neighbouring Xe atoms below a minimum

distance. It increases only slightly with decreasing distances independently on the substrate nature.

Classification

Physics Abstracts

71.25T

-

73.90

I. Introduction.

Physisorbed layers of rare gases and particularly

xenon layers form a hexagonal (or nearly hexagonal)

compact structure on most single crystals [1-17]. In

some cases, e.g. on Cu(110) [10, 11], Cu(lll) [3, 12], Pd(lll) [15] and Pt(lll) [17], less dense solid

layers can also be formed at lower coverages. The

Xe/Pt(lll) system has been extensively studied in recent years on an almost defect free sample by Kern

et al. [18-21] using high resolution helium beam

scattering. It appears to be one of the most interest-

ing of quasi-2D systems obtained sofar by physisorp-

tion of rare gases on single crystal metal surfaces.

Indeed, depending on the coverage and temperature,

a variety of phases may be formed : a commensurate one (J3 x B/3) R300 (C) stable above 63 K ; a striped incommensurate one (SI) ; a hexagonal in-

commensurate one (HI) and, a hexagonal incom-

mensurate rotated phase (HIR).

The band structure of xenon layers has been scarcely studied. The 5p levels of the solid phases are

the 5pl/2 and two 5p3/2 levels (mj = ± 1/2,

mj = ± 3/2). It has been demonstrated that the 5p3/2 splitting is mainly due to lateral interactions and direct overlap of the 5p wave functions from

neighbouring xenon atoms when the adlayer is sufficiently close-packed in an ordered array [9, 22, 23]. The energy order of the 5p3/2 levels (identified by their angular dependence [9] and using polarized

electrons [24, 25]) is such that the lateral interaction model and the crystal field model [26, 27] can only explain the results. However, as pointed out by

Antoniewicz [28], the latter requires unreasonably large positive charges on surface atoms to produce

the observed splitting. Moreover, there is no splitting

for a 2D gas on W(100) [29], Ag(lll), Cu(lll), Ru(001) [30, 31] and at large distances between

xenon atoms in the repulsive Xe/Pd(100) system [22]. The dispersion curves of the xenon incommen-

surate hcp layer have been determined on Pd(100) [9], on Al(lll) [16], on the c(2 x 2) phase and on

the almost hexagonal phase on Cu(110) [11] and on

the (J3 x J3) R300 phase on Pt(lll) [32]. The general trend of all these results, compared in the

last reference, is in agreement with theoretical calculations [33, 34]. One observes an increase in the

dispersion for all bands and in the 5p3/2 splitting

with decreasing interatomic distances in the xenon

layer. At normal emission (T point), the 5pl/2 binding energy referenced to the vacuum level is almost independent on the substrate nature (for Cu,

Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphys:0198800490100175300

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1754

Pd, Al and Pt) and equals 11.85 eV, supporting a major effect of the initial state in the photoemission

process as demonstrated by Wandelt for several Xe/metal surfaces [35]. As a consequence, for vari-

ous metal surfaces, photoemission of adsorbed xenon

(PAX) in one particular direction of detection and

preferably near the normal [32], has been used as a

« local work function probe » in order to sample

structural defects [36-38], adsorbed species [39-41],

and alloys [42-43]. However, it must be mentioned that on Pb, Ga and Ba overlayers [44], distance- dependent shifts are not due to work-function

changes induced by the Xe adatom itself but to

changes in the final state screening [45].

In this paper, a comparison will be made between the dispersion curves of the commensurate (C) and hexagonal incommensurate rotated (HIR) layer (new results) in the context of the previous angle-

resolved photoemission data on other substrates.

We will demonstrate that the splitting of the 5p3/2

levels is moderately sensitive to the interatomic distance and relatively insensitive to the nature of the substrate.

2. Experimental.

Most of the experiments were made in an apparatus

(Atomic Energy Commission

-

Service de Physique Atomique des Surfaces, Saclay, France) consisting

of a home made ultrahigh-vacuum moveable electron spectrometer (hemispherical, radius

=

30 mm)

mounted in a two-level chamber equipped with a

rare-gas discharge lamp (Leybold), a low-energy

diffraction (LEED) optics (Riber), an ion gun

(Riber) and electron bombardment for crystal prep- aration. Pumping is ensured through a cryopump

(Air Liquide), an ion pump and/or a trapped oil

diffusion pump (Edwards). Base pressures below

10- g Pa are obtained after bakeout. Additional results at normal emission were obtained at LURE

(Laboratoire d’Utilisation du Rayonnement Electro- magn6tique, Orsay, France) using synchrotron radi-

ation light between 19.5 and 30 eV and in Nancy

with our ESCA equipment (Leybold-Heraeus) and a

rare-gas discharge lamp.

The Pt crystal was cut from a single crystal rod of

5N purity (Materials Research) after orientation to within 0.5° and mechanically polished. The Pt sample

was preoriented under X-ray back reflection before

mounting with the light incidence plane along the

rM orientation of the Pt(lll) crystal. It is clamped

onto a tantalum reservoir containing circulating liquid nitrogen. The minimum temperature obtain- able on the sample was estimated to 80-85 K (see later). After ion bombardment and annealing

around 1 000 K, Auger electron spectroscopy (AES)

revealed no impurity (C, Si, Ca, Al) at the detection limit [46, 47] and a sharp diffraction pattern of the

clean (1 x 1) surface was observed. The LEED pattern showed a slight misalignment (3-4°) with

respect to the FM orientation.

Photoelectron spectra were taken with unpolarized

He I radiation at an incidence angle equal to 45° with

15 meV steps for the electron kinetic energy. Absol- ute work function was determined as well as the instrumental resolution (150 meV) at the Fermi edge. At LURE, the resolution was only 220 meV

and in Nancy around 300 meV.

3. Results.

3.1 LEED. - At the lowest temperature of the sample, adsorption of xenon at 10- 6 Pa pressure

(gauge reading uncorrected) produces the

(J3 x B/3) R300 pattern (C phase). This structure is easily observed and stable under vacuum. When the pressure is increased up to 10- 4 Pa, an intermediate incommensurate hcp phase (HI) (which like the C

phase is rotated with respect to the substrate by 30°)

appears transiently and converts readily into an

incommensurate rotated phase (HIR) consisting of

domains rotated from the common orientation of the C and HI phase by ± 3°. Under vacuum, the reverse

sequence of patterns is observed and the C phase is

recovered. From the heats of adsorption of the

various phases [17], the minimum temperature of the sample can be estimated to be 80-85 K. At this temperature, the phase diagram given by Kern et al.

is not clear [18, 21]. However, at 88 K, it was shown in a preceeding paper [17] that the HIR phase

existed at saturation of the xenon overlayer.

3.2 ARUPS. - We will consider here the C and the HIR overlayers. Dispersion curves were made along

the rKMK direction of the C phase. The LEED pattern of the C layer and the Surface Brillouin Zone (SBZ) are schematically shown in figure 1.

The Xe-Xe distances were estimated to be respect- ively around 4.8 A and 4.4 A for the C and HIR

phase. Along the rKMK direction, the kll values for

the C phase are 0.878 A-1 1 at the K point and

1.317 A-1 at the M point. Due to the slight misorien-

Fig. 1.

-

Low electron energy diffraction pattern of the

(J3 x B/3) R30° xenon overlayer. Surface Brillouin zone

(SBZ) of xenon.

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tation of the crystal, we note also kp at the H point,

viz 0.814 A-1. The corresponding values for the

HIR phase are 0.9558 A-1 1 and 1.4378 Å - 1. Two domains in the HIR phase coexist in such a way that

one domain is almost strictly in the TKMK direction while the other one is misoriented by about 6°-7°. As

a consequence, dispersion curves of the HIR layer

are expected to be less accurate than for the C

phase.

The direction of the normal was determined

precisely using various methods [32], including the

symmetry of the dispersion curve itself. Photoelec- tron spectra were taken every 4 degrees in order to

obtain roughly 0.1 A-1 variation in kll , according to

where E is the kinetic energy (eV) of the electrons

leaving the crystal, and 0 the angle of analysis with respect to the surface normal. Knowing the work

function 4>, E is given by

The experimental work function of the clean metal was found to be 5.85 eV. A 0.60 eV decrease

was obtained with the C overlayer and slightly more (0.65 eV) with the HIR layer. Values of kll were computed taking into account the account the work

function of the covered surface.

Figure 2 gives the photoelectron spectra of the C and HIR phases at the T point. Several features should be noted.

(a) The three 5p levels of adsorbed xenon are

clearly seen. Their positions are almost the same for

the two phases. A similar ksylt was obtained at

LURE in the 19.5-20 eV photon energy range and in

Nancy using He I radiation (21.21 eV).

Fig. 2.

-

Photoemission spectra at normal emission of the C and HIR overlayers of xenon on Pt(lll) starting from

the Fermi edge (h v

=

21.21 eV).

(b) On the high binding energy side of the 5p1/2

and 5p3/2 (mj = ± 1/2) levels extra transitions exist.

They do not disperse and were attributed to indirect transitions due to defects in the crystal [32].

(c) After removal of the base line the spectra

were decomposed using an optimization routine into five peaks (Gaussian-Lorentzian) [48] to account for the extra transitions. Allowing for an experimental

resolution of 150 meV deduced from the Fermi cut-

off, the natural width of the lines is around 200 meV at the r point for the C layer. The 5p3/2, mj = ± 3/2

level is broader (600 meV) because of the remaining

influence of a Pt 5d induced transition. This influence

disappears upon analysis away from the surface normal because of a different dispersion behaviour.

An example of decomposition of spectra of the C and HIR layers at the r point is given in figure 3.

Fig. 3.

-

Deconvolution into sublevels at normal emis- sion : (a) the commensurate layer (C) ; (b) the hexagonal

incommensurate rotated layer (HIR). Binding energies

are referenced to the Fermi level.

The same decomposition procedure was followed

to determine the dispersion curves. Note that off

normal direction, the 5p levels of the HIR phase

were broader than for the C phase, a fact which is not surprising because of the coexistence, of two

rotated domains. As expected, the dispersion curves

show more scatter for the HIR phase than for the C

phase ; they are given in figure 4.

4. Discussion.

Qualitative agreement exists between the dispersion

curves of figure 4 and other experimental results on

different substrates and layers [9, 11, 16, 32].

Despite different accuracies for the two layers exami-

ned here, we note the following points :

(a) at the r point, the binding energy of all levels

are only slightly different for the C and HIR layers in

the three apparatus that we have used (see also Fig. 2). This result is at variance with those obtained

by Schonhense [24, 25] for the 5p3/2 levels using a

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1756

Fig. 4.

-

Dispersion curves of the 5p xenon levels along

rKMK direction ; binding energies are referenced to the Fermi level ; incidence angle

=

45° : (o, 0) C layer ; (A, A) HIR layer.

photon energy of about 11 eV. This author found a shift of 0.5 eV towards lower binding energies be-

tween the C and the HIR layer. Kern et al. [21]

attributed such a large shift to a change in the

distance between the layer and the substrate of

about 0.3 A. They used the theoretical work of Lang [49] to support this hypothesis. However, Lang

derived a shift of 0.2 eV only for the 4d levels of

xenon adsorbed on Al(lll) for a one Bohr radius

(0.52 A) variation in vertical distance. The rs par- ameter equal to 2 chosen in this case (which express-

es the density of the positive background) is reason-

able for Pt [50]. Moreover, the experimental results

of Mariani et al. [11] did not show any difference in

binding energy of the xenon 5p levels between the

c(2 x 2) layer and the uniaxially compressed phase

where such a change in vertical distances is expected.

We do not see any clear explanation for the discrep-

ancy between the results of Schonhense et al. and

ours apart from the possibility of strong final state effects due to the low photon energy used in their case ;

(b) a maximum binding energy is observed for all bands near point K and the band structure is nearly

flat for the mjl ± 1/2 levels between points K and M ;

,

(c) the 5p3/2, ml/ ± 3/2 level passes through a

maximum in binding energy near point K and through a minimum near point M ;

(d) apart from small variations in the width of the bands, of the spin-orbit splitting and the 5p3/2 levels,

the qualitative behaviour is the same for the C layer

and the HIR layer.

In order to assess more clearly the influence of the Xe-Xe lateral interactions on dispersion and split- ting, we have recalled in table I all the photoemission

results that we know along with the xenon-xenon

distance in the layer. Some of the results have been determined after enlargement of the original figures

and may be relatively inaccurate. For Cu(110), the

two structures are not strictly hexagonal but unia- xially compressed (along the {110} direction). Con-

trary to table II in reference [32] and following a suggestion of Mandel [51]

«

effective

»

Xe-Xe dis-

tances calculated from the values of the areas for adatom under the assumption of a hexagonal close- packed Xe structure have been used. Some very

recent results for xenon monolayers and bilayers on graphite (001) [52] are also included. The corre-

sponding values obtained from differences in threshold positions in the work of Schonhense [24]

are such that the separation of the 5p3/2 bands at

T point is smaller for the first layer than for the

bilayer. On graphite, depending on temperature

(below and above 63 K) the first layer is commensur-

ate or incommensurate with the substrate [53]. In

the second case, the xenon-xenon distance varies

continuously between 4.51 A and 4.44 A. It explains

the question mark.

Table I deserves more comments :

(a) the general trend is in agreement with theoreti- cal calculations [33, 34]. With decreasing Xe-Xe

distances one observes an increase in the dispersion

for all bands and in the 5p3/2 splitting. The variation of the spin-orbit splitting is less obvious. For com-

parison, the theoretical values of Hermann et al. [33]

for an hcp layer (4.48 A) are 0.38, 0.48 and 0.6 eV for the maximum dispersion of the three bands, 0.43

and 1.32 eV for the 5p3/2 splitting and the spin-orbit splitting. If the interatomic spacings in the adsorbed Xe monolayer are taken into account [51], a rela- tively good agreement is found for the dispersion of

the Sp112 level ;

(b) a parameter, quite sensitive to the distance, is

the 5p3/2 splitting at the r point. In the case of the repulsive Xe/Pd(100) system, Bradshaw et al. [22]

have observed a splitting of these levels at coverages

as low as 0.30. This corresponds to a Xe-Xe distance of around 5.4 A. This system presents the advantage

of a continuous variation of the Xe-Xe distance.

Unfortunately, the variation of this splitting versus

coverage was not recorded in this last work. Results show nevertheless that the 5p orbitals start to overlap when the Xe-Xe distance is close to 5.4 A ; (c) between the Xe (B/3 x /3-) R30’/Pt(lll) layer and the hcp layer this splitting varies only

between 0.4 and 0.65 eV. For the hcp Xe/Cu(lll) layer and the hcp Xe/Ru(001) layer Eder et al. [30, 31] have found splittings respectively equal to 0.3

and 0.2 eV, values much lower than for the hcp

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Table I.

-

Dispersion results.

[TW1] : This work - Apparatus in Saclay.

[TW2] : This work - Leybold apparatus in Nancy.

(*) : at M or K point.

(**) : bilayer.

Fig. 5.

-

Separation of the 5p3/2 levels at the r point

versus the xenon-xenon distance.

Xe/Ag(lll) layer (0.5 eV). Accordingly they pro-

posed that the splitting was « mainly caused by

lateral interactions and 2D band structure formation and that the size of the splitting could be regarded as

a measure of the lateral Xe-Xe attraction ». They

added that

«

this is compatible with the sequence of

dipole moments

».

However, this attractive expla-

nation is contradicted by the data of table I.

It must be noticed that in Eder’s experiments [54]

the photoemission spectra are recorded at an angle

of about 45° and not in the normal direction.

Therefore the emission point in the SBZ depends

therefore on the azimuthal orientation of the sub- strate. Indeed, as it can be seen in figure 6 of

reference [11], for Cu(110) the splitting of the 5p3/2

levels depends on the azimuthal angle for a given

detection angle. For instance at 45°, it is smaller in the rKMK direction than in the TMT direction

(0.25 eV compared to 0.5 eV). A similar result is found for Xe/graphite (001) [52]. The splitting of the 5p3/2 levels at 45° is 0.34 in the FKMK direction and 0.65 in the FMF direction. The Ag and Cu films

used by Eder et al. were epitaxially grown on

Ru(001) [54]. On bulk Cu(lll) [12] and Ru(001) [55] the xenon saturated layer is rotated with respect

to the substrate ; it is aligned to the substrate on

Ag(lll) [5,6]. The 30° difference in angle of the overlayer corresponds exactly to a change from the

FKMK direction (Cu(lll) and Ru(001)) to the

FMF direction (Ag(lll)). As a consequence, the results of Eder et al., when interpreted self-consist-

ently, do not contadict those presented in table I and do not require a special interpretation.

Therefore it must be concluded that despite differ-

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1758

ent adsorption energies and dipole moments for

xenon adsorbed on Cu, Al, Pd, Pt, Ag and graphite

there is no significant change of the xenon 5p3/2 splitting on different substrates, apart from small variations due to the different xenon-xenon dis- tances.

5. Conclusion.

Like on other metals xenon adsorbed on Pt(lll) in

2D dense phases shows marked dispersion effects on

its 5p levels. Due to lateral interactions and to the

overlap of orbitals, the 5p3/2 levels are split. This splitting appears to be mainly characteristic of the

xenon-xenon distance. It varies between approxi- mately 0.45 eV and 0.65 eV for distances between, roughly, 4.8 and 4.3 A.

Acknowledgements.

The authors would like to thank J. Cousty and R.

Riwan (SPAS-Saclay) for fruitful discussions and

appreciate the opportunity to have used their angle-

resolved equipment.

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18, 1988).

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