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Test and Reliability of Electronic Circuits in Natural and Radiative Environment

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HAL Id: tel-01259002

https://hal-lirmm.ccsd.cnrs.fr/tel-01259002

Submitted on 19 Jan 2016

HAL is a multi-disciplinary open access

archive for the deposit and dissemination of sci-entific research documents, whether they are pub-lished or not. The documents may come from teaching and research institutions in France or

L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d’enseignement et de recherche français ou étrangers, des laboratoires

Test and Reliability of Electronic Circuits in Natural

and Radiative Environment

Luigi Dilillo

To cite this version:

Luigi Dilillo. Test and Reliability of Electronic Circuits in Natural and Radiative Environment. Electronics. Université de Montpellier, 2015. �tel-01259002�

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UMR 5506 Université de Montpellier / CNRS

161 rue Ada, 34095 Montpellier cedex 05

H A B I L I T A T I O N À D I R I G E R D E S

R E C H E R C H E S

Test and Reliability of Electronic Circuits in

Natural and Radiative Environment

Rapport de

Luigi DILILLO

Chargé de Recherche au C.N.R.S.

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Preamble

The researches presented in this manuscript were performed between 2002 and 2015 at the laboratory LIRMM of Montpellier (France), the University of Southampton (ECS department) and the laboratory CEA LFSE of Saclay (France). This document consists of two main parts:

- The first part is an extended Curriculum Vitae, which includes details like collaborations, supervision, teaching activities, contracts, etc.

- The second part is a summary of my research activities and perspectives ending with bibliography references and the list of my publications.

The references of which I am not the author are indicated with a number that follows the order of appearance in the test. For example, [1] and [7] denote the first and the seventh publications that are referred in the document.

A different numbering was adopted to distinguish the work to which I contributed: publications in international journals are referenced by [JO#]; publications in international conferences, symposia and workshops are

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Members of the jury.

FIGUERAS Joan, professor, Universitat Politècnica de Catalunya. BarcelonaTech; Department of Electronic Engineering. Barcelona - Spain

PRINETTO Paolo, professor, Politecnico di Torino Dip. di Automatica e Informatica. Torino - Italy

ANGHEL Lorena, professor, Laboratoire TIMA, Grenoble – France

PORTAL Jean Michel, professor, Université Aix-Marseille. Marseille – France

SAIGNE Frédéric, professor, IES-RADIAC Université de Montpellier UMR5214, CNRS/UM. Montpellier France

PRAVOSSOUDOVITCH Serge, professor, Laboratoire LIRMM - UMR 5506 CNRS/UM. Montpellier – France

RENOVELL Michel, DR CNRS, Laboratoire LIRMM - UMR 5506 CNRS/UM. Montpellier – France

Invited Member: GIRARD Patrick, DR CNRS, Laboratoire LIRMM - UMR 5506 CNRS/UM. Montpellier – France

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