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HAL Id: jpa-00209566

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Submitted on 1 Jan 1983

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Positional order in the smectic-G, -F, and -C layers of HBHA

Satyendra Kumar

To cite this version:

Satyendra Kumar. Positional order in the smectic-G, -F, and -C layers of HBHA. Journal de Physique, 1983, 44 (1), pp.123-126. �10.1051/jphys:01983004401012300�. �jpa-00209566�

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Positional order in the smectic-G, -F, and -C layers of HBHA (*)

Satyendra Kumar (**)

Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign,

1110 West Green Street, Urbana, Illinois 61801, U.S.A.

(Reçu le 26 fevrier 1982, révisé le 24 septembre, accepté le 27 septembre 1982)

Résumé. 2014 La longueur de corrélation de l’ordre de position « 03BE ~ » parallèle aux couches smectiques (Sm) dans les phases G, F et C du HBHA (7O.6) a été mesurée par diffraction des rayons X. Dans la phase Sm-G, sa valeur est

limitée par la taille des cristallites et se situe entre 1200 et 1500 Å. Lors de la transition Sm-G, Sm-F, 03BE~ varie de

300 Å à 180 Å avec une dépendance en température correspondant à celle prédite par un modèle de fusion par l’intermédiaire des dislocations pour un réseau bidimensionnel 03BE~ varie de façon discontinue à la transition Sm-F, Sm-C. On trouve que la phase Sm-C a une longueur de corrélation inhabituellement grande (~ 50 Å), presque le double de celle de la phase Sm-A.

Abstract 2014The positional order correlation length « 03BE~ » parallel to the smectic (Sm) layers in the G, F and C phases of HBHA (7O.6) has been measured by X-ray diffraction. In the Sm-G phase its value is limited by crystallite

size and lies between 1200-1500 A. At the Sm-G to -F transition 03BE ~ changes from 300 to 180 A with a temperature dependence predicted by a dislocation mediated melting model of 2D lattice. At the Sm-F to -C transition 03BE~

changes discontinuously. The Sm-C phase is found to have an unusually large correlation length (~ 50 Å), almost

double of that in the Sm-A phase.

Classification

Physics Abstracts

61.30E - 64.70E - 61.70

In the phase diagrams of some thermotropic liquid crystals the smectic phases [1] G, F, and C occur in

that order with increasing temperature, with one

possible exception [2]. In these phases molecules have

a temperature dependent tilt with respect to the smec- tic layer normal. The smectic-G (Sm-G) phase is

characterized by long-range translational and bond- orientational order in the smectic layer while the

smectic-C (Sm-C) is believed to have 2D liquid-like layers. The smectic-F (Sm-F) phase was discovered

rather recently and is exhibited by only a handful of compounds. A limited number of structural studies

[3-5] of this phase indicates that it has some ordering

of molecules in the smectic layers.

According to Halperin and Nelson [6], melting of a

two dimensional solid occurs in two steps. As the temperature is increased, a transition to an interme- diate phase called « hexatic » takes place due to

(*) Research funded by the National Science Foundation under contract No. NSF-DMR-77-23999.

(**) Present Address : Department of Physics and

Center for Materials Science and Engineering, 13-2025,

Massachusetts Institute of Technology, Cambridge, Massa-

chusetts 02139, U.S.A.

the unbinding of dislocation pairs. The hexatic phase

transforms at a higher temperature into a 2D liquid by the unbinding of disclination pairs. On the basis of

this theory Birgeneau and Litster [7] suggested a

consistent picture of smectic phases. According to

them a system of stacked hexatic layers with infini- tesimal interaction between layers would have long-

range bond-orientational and positional order as

found in the Sm-B and -G phases. However, if the interaction between layers was sufficiently weak, the system would still have 3D long-range bond-orienta- tional order but exponential decay of the inplane posi-

tional order. Recently the Sm-B phase of 650BC has been shown [8] to be such a phase. It seems that the

Sm-F phase may also be a system of this type. The Sm-C and -A phases correspond to stacked layers with short-range bond-orientational and positional order in

the smectic layers. It is, therefore, important to study

the inplane structure of the Sm-C, -F, and -G phases

and the differences between them. In this paper the results of such a study of N-(4-heptyloxybenzylidene)- 4-n-hexylaniline (HBHA) are presented. HBHA was

selected due to its relatively high chemical stability

and continuous miscibility with TB5A [9], a homolog of TBBA, that has been a subject of some other investi-

Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphys:01983004401012300

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124

gations. The Sm-C to -F transition for this compound

is first order with a discontinuity in smectic layer

thickness [10]. During the present and previous high-

resolution X-ray work [10, 11] on the smectic phases,

coexistence of the Sm-F and -C phases was observed.

However, there was no indication of the coexistence of the Sm-F and -G phases. The smectic layer thickness

exhibited no discontinuity at the Sm-F to -G transi-

tion. The entropy of transition [10] was 0.01 R, which is comparable to the second order Sm-C to -A transi- tions [11] and about two orders of magnitude smaller

than typical first order liquid crystalline transitions.

From all available data on the Sm-F to -G transition it is clear that this is a nearly (if not purely) second

order transition.

We utilized powder X-ray diffraction in parafocus- sing geometry, as shown in figure 1. The X-ray beam

is focussed by a bent graphite monochromator onto a

limiting slit S2 (0.05 mm). A divergent beam falls on

the sample surface at the centre of the diffractometer table. The reflected beam is focussed upon the analysing

slit (0.1 mm) in front of the scintillation counter, 12 cm away from the sample. Thus, while achieving

better resolution, intensity is also gained. The base of the resolution triangle of the experimental setup used is 0.005 A -1. The sample holder is shown as an inset in figure 1. The sample is held between two 6 Jl thick mylar sheets and is embedded in a copper block. Tem- perature is measured near the sample surface with

a relative precision of better than 0.1 OC. To increase the intensity of scattered radiation, the sample was aligned by cooling it from the isotropic to the Sm-C phase in a magnetic field of 4.5 kG. The magnetic

field was turned off after aligning the sample.

The profile of reflections was recorded at different temperatures while sweeping both up and down in temperature. Representative profiles of reflections are

Fig. 1. - Experimental setup for powder X-ray diffraction in the parafocussing geometry. M, H and C are the graphite monochromator, the hot stage, and the scintillation counter

respectively. The slits Si, S, and 83 are 0.4, 0.05 and 0.1 mm wide and 1 cm high. The inset shows the sample holder.

Fig. 2. - Outer reflections from the Sm-C, -F and -G phases.

The points are from digitization of the experimental curves.

The Sm-C peak has higher intensity on the right hand side

than on the left due to the presence of a mylar peak at

- 25°.

shown in figure 2 for the Sm-G, -F and -C phases. The intensity of the Sm-C reflection on the right side

appears higher than on the left due to the presence of a

mylar reflection at 2 0 - 270. In order to do a detailed line shape analysis, effects of molecular form factor, mosaicity of the sample and experimental resolution

function need to be taken into account. Without

significantly better resolution and temperature con- trol, and a more intense X-ray source, such an analysis

is not warranted. From the measured half-widths at half-maximum (HWHM) s of 2 0 peaks one can

calculate the correlation length j II using the relation

Çll I, = 2 £/(8 cos 0). This method, though not rigorous, gives an internally consistent measure of j j j and relative

changes in its value. The numerical value of ç II obtained

in this way is only an approximation to the actual value and should not be taken too seriously. The instrumen- tal resolution enables measurement of jjj II up to a maximum size of 2500 A. The calculated values of

ç II are plotted as a function of temperature in figure 3.

Fig. 3. - Correlation length II of positional order parallel

to the smectic plane in the Sm-G, -F and -C phases as a func-

tion of temperature. The solid line in the Sm-F region represents a fit to the function predicted by 2D melting model.

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Scattering from the Sm-G phase shows two peaks

which are not resolved. Since for a hexagonal structure

the multiplicity of 110 spots is twice as large as that

of 020 or 200 spots, we identify the peaks as 020 and

110 reflections. The reticular spacings suggest that the molecular tilt in the smectic layers is along a side (or towards an apex) of the hexagon. The hexagonal

structure in the Sm-G phase is not distorted drasti-

cally, as is evident from the small splitting « 0.5 %)

in the 110 and 020 peaks. Assuming an undistorted

(regular) hexagonal structure and taking the values

of layer thickness from an earlier high resolution

work [9], the cell parameters can be determined as

and

The direction of molecular tilt in the Sm-G phase of

TB5A is perpendicular [2] to a side of the hexagon. It

is interesting to note that in spite of a difference in the direction of molecular tilt, the Sm-G phases of these

two compounds are found to be continuously mis-

cible [9]. A transition in the direction of molecular tilt in the Sm-G phase should occur as the composition

of TB5A and HBHA mixture is varied. Such a change

may not be observed in a textural study. It should be possible to observe it with careful X-ray work.

The positional-order correlation length in the

Sm-G phase should be infinitely large because it is known to have 3-dimensional structure. We obtain a

value between 1200-1500 A. The reason for. this

finite value (less than the resolution limit 2500 A)

is that it is limited by the crystallite size in the powder sample. The correlation length drops abruptly to

280 A within 250 mdeg. at the Sm-G to -F transition.

This is accompanied by a 50 % drop in the scattered

intensity.

The correlation length in the Sm-F phase shows

a pretransitional rise above the Sm-G to -F transition.

A power law fit of the type

gives j = 125.5 A and v = 0.12. This value of v does not correspond to the prediction of any model.

Experimental results [5] suggest that the Sm-F phase of TBPA is a hexatic phase. On the basis of the model of Birgeneau and Litster, the Sm-F to -G transition shquld be analogous to dislocation mediated melting

in two dimensions. The theory of 2D melting developed by Halperin and Nelson [6] predicts an unusual tem-

perature dependence of j jj ;

with v lying between 0.37 and 0.40 for a triangular

lattice. Such a temperature dependence of jjj II has

been observed for the freezing transition of physisorbed

xenon on graphite [12]. A reasonable fit of this form to our data, with v fixed at 0.40, is obtained with

0 = 166.7 A, B = 0.387 and is shown by the solid line in the Sm-F region in figure 3. The Sm-F to -G tran-

sition, therefore, seems to be a dislocation mediated

melting transition, and the Sm-F phase a stacked

hexatic phase.

The correlation length attains a value of about

180 A just before a jump to - 53 A in the Sm-C phase.

The value of ç II in the Sm-C phase corresponds to

more than 12 molecular thicknesses and is rather large

for a phase that is believed to have liquid-like structure

within the layers. No measurements on the Sm-A

phase were made during this investigation.

It is important to note that the value of 3°, for the width of the outer ring of the Sm-C reflections reported by Benattar et al. [4] for TB5A agrees well with our measurements (t-...; 3.5°). For comparison, a value of

6.2° for the Sm-A phase of 70.5 can be estimated from reference [13]. Also, for a mixture of 60CB and 80CB,

the outer ring of the Sm-A phase has a width of about 6.7° as measured by Kortan et al. [ 14]. These values give jjj - 25 A or 5-6 molecules. A comparable value (t-...; 20 A) of jjj II is obtained by X-ray diffraction [15]

from free standing Sm-A films of 40.8. Evidently the

Sm-C layers are more structured than the Sm-A

layers.

To summarize, in the Sm-G phase the value of

limited by crystallite size, lies between 1200-1500 A.

It changes rather abruptly at the Sm-G to -F transi-

tion. The correlation length near the Sm-F to -G tran-

sition agrees with the prediction of the dislocation mediated melting model of a 2D triangular lattice. This.

indicates that the Sm-F phase may be a stacked hexatic phase. In the Sm-C phase j I has an unusually large value, more than double of that in the Sm-A

phase. The Sm-C phase, therefore, has more order

than the Sm-A, contrary to popular belief. Measure- ments of jjj II and the bond-orientational order in monodomain samples and free standing thin films of different smectic materials with higher resolution

are essential to further clarify differences between the various smectic phases.

Acknowledgments. - The author wishes to thank W. L. McMillan, J. D. Litster, Tom Polgreen, and

A. J. Berlinsky for their help and useful discussions.

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126

References

[1] This nomenclature was suggested by GRAY and SACKMANN. For example, see :

DEMUS, D., GOODBY, J. W., GRAY, G. W. and SACK-

MANN, H., Proceedings of the conference of Liquid Crystals of one and two dimensional order and their

applications, Garmisch-Partenkirchen, F. R. G.

(Springer-Verlag) 1980, p. 31.

[2] GOODBY, J. W., GRAY, G. W., LEADBETTER, A. J. and MAZID, M. A., J. Physique 41 (1980) 591.

[3] LEADBETTER, A. J., GAUGHAN, J. P., KELLY, B., GRAY, G. W. and GOODBY, J. W., J. Physique Colloq. 40 (1979) C3-178.

[4] BENATTAR, J. J., DOUCET, J., LAMBERT, M. and LEVELUT, A. M., Phys. Rev. 20A (1979) 2505.

[5] BENATTAR, J. J., MOUSSA, F. and LAMBERT, M., J.

Physique-Lett. 42 (1981) L-67.

[6] HALPERIN, B. I. and NELSON, D. R., Phys. Rev. Lett.

41 (1978) 121, 519.

[7] BIRGENEAU, R. J. and LITSTER, J. D., J. Physique-Lett.

39 (1978) L-399.

[8] PINDAK, R. and MONCTON, D. E., Phys. Rev. Lett.

46 (1981) 1135.

[9] SAKAGMI, S., TASAKE, A. and NAKAMIZO, M., Mol.

Cryst. Liq. Cryst. 36 (1976) 261.

[10] KUMAR, Satyendra, LEGRANGE, J. D., McMiLLAN, W.

L. and MOCHEL, J. M., Phys. Rev. 25A (1982)

2258.

[11] KUMAR, Satyendra, Phys. Rev. A 23 (1981) 3207.

[12] HEINEY, P. A., BIRGENEAU, R. J., BROWN, G. S., HORN, P. M., MONCTON, D. E. and STEPHENS,

P. W., Phys. Rev. Lett. 48 (1982) 104.

[13] DEJEU, W. H. and DEPOORTER, J. A., Phys. Lett. 61A (1977) 114.

[14] KORTAN, A. R., unpublished work.

[15] MONCTON, D. E. and PINDAK, R., Phys. Rev. Lett.

43 ( 1979) 701.

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