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Observation of diffraction radiation of oscillator on angular distribution measinrement
A. Grubich, O. Lugovskaya, S. Cherkas
To cite this version:
A. Grubich, O. Lugovskaya, S. Cherkas. Observation of diffraction radiation of oscillator on angu- lar distribution measinrement. Journal de Physique I, EDP Sciences, 1993, 3 (11), pp.2139-2149.
�10.1051/jp1:1993236�. �jpa-00246858�
Classification Physics Abstracts
07.85 29.90
Observation of diffraction radiation of oscillator
onangular
distribution measurement
A-O-
Grubich,
O-M-Lugovskaya
and S.L. CherkasInstitute of Nuclear Problems, Minsk 220050, Republic Belarus (Received 13 January 1993, accepted in final form 23 July
1993)
Abstract The expression for angular distribution of diffraction radiation of oscillator
(DRO
in single crystals is derived. The effect of the beam parameters on angular distribution density and oscillator kinetics are taken into account. The analysis of the conditions for DRO observation
on the parametric radiation and bremsstrahlung "background" is made. Some experimental procedures for detection DRO are suggested.
1 Introduction.
For a
charged particle
channeledalong
acrystal
axis orplane
theprojectile path
is a result of correlated collisions withcrystal
atoms. Theparticle
moves in an effectivepotential
obtainedby smehring
thecrystal potential along
the axis orplane iii.
This motion isaccompanied by
aspecial
type of radiation, so-calledchanneling
radiation [2,3].X-ray
radiation of a relativisticoscillator in a
crystal
isessentially
modified under diffraction conditions for emittedphotons.
Anew diffraction radiation is a result of coherent summation of two processes
photon
radiation andphoton
diffraction. It has been called diffraction radiation of oscillator(DRO)
[4].Though predicted
back in 1977 [5], DRO has not so far been observedexperimentally.
Itsstudy
is of considerableinterest,
since DRO may findapplication
intreating
different effects in theoptics
of a relativistic emittermoving
inrefracting
media [6].Besides,
DROangular
distribution is a strong function of thecharged particle
beamcharacteristics,
which may be used formonitoring high-quality
beam parameters.In this paper we
analyze
conditions of DRO observation inexperiments
on measurement ofangular
distribution of the radiation emitted towards the lateral diffraction maximumby
rel- ativistic electrons(positrons) passing through perfect single crystals
underplanar channeling.
DRO should be detected
against
a"background"
of parametric X-radiation(PXR) iii
andbremsstrahlung
diffractedby
thecrystalline planes.
2
Spectral-angular
distribution.Suppose
thatcharged particles
cross aplane-parallel single crystal plate along
a directionspecified by
the unit vector e3 which does not coincide in thegeneral
case with a unit vector of the normal to the surface N directed inwards. Let us further assume that the axisgiven by
the vector e3 crosses afamily
ofcrystallographic planes corresponding
to thereciprocal
lattice vector r((r(
=27r/d,
d is theinterplanar distance).
In this case the wavelength
ofphotons
with the wave vector kB =wBe3/c
andfrequency
wB> determined from theequality
[kB +r[
= [kB( and satisfies the
Bragg
condition AB " 2dsin@B, where sin @B=
-e~.r/[r[.
The
spectral-angular
distribution of the number ofphotons
with the wave vectork([k[
=
w/c)
and
polarization s(a,
7r) emitted from thecrystal
towards the lateral maximumgiven by
thevector kBr = kB + r can be found
by
thegeneral
method described in reference [8].where a
=
1/137,
fl is the oscillation
frequency
in thelaboratory
coordinate system,Lo
=L/~to,
Lbeing
theplate thickness,
~to= e3N,
rot
(rot> ro2)
is the transverse radius vector ofparticle
at the moment it enters thecrystal (ri (t
=
o)
=roil,
era ii
[k, r],
e~~ii
[k
r,e~~] polarization
unit vectors,Rj~~~
is the coefficientdefining
theefficiency
of emittedphoton
diffraction incrystal
for the Laue (~ti =kBrN/ [kBr(
>o)
andBragg
(~ti <o)
diffractiongeometry
~ ~ ~~ 2
~~ ~
2
(n2s nis)
' ~~~(for
anexplicit
form of the coefficientR[
the reader should refer to(8]), Ca
= I, C«= cos 2@B> n~~ = I + dps + al
/2
is the index of X-radiation refraction in acrystalline plate
in the case of two-wave diffraction ofphotons by
the atomiclattice,
p = 1, 2di(2)s
=k
-ai~ti + xo (~to +~ti)
+I(ai~ti
+ xo (~to ~ti))~
+~to~tir~1 (3)
al "
((k r[~
[k[~)/[k[2
is the deviation from the exactBragg condition,
rs=
r[
+irl'
XrX-rC),
=Xo =
Xi
+iXi>
XT, X-r are thecrystal complex susceptibilities, k~s
= k r +"~"~~
is the
photon
wave vectorpropagating
in acrystal
at a smallangle
with the vectorkBr,
c~tofl xIQ
~"~ "
$ /
d~~(l)
-«IQ
exp
ikpseiu / dt'@i (t')
inflt+
ikpse3.u/2. / dt'@~(t') Hit
,
~ ~ (4)
is the coefficient of Fourier
expansion
of the functionperiodic
in t withperiod
27rIn,
v(t)
=ucos(@(t))e3
+u@(t)
is theparticle velocity,
= [@(@1, @2)( « 1, @1(t +
27r/fl)
=@i(t),
@i(o) = Hoi, @2 = @02, Ho = (Hoi> @02) is theparticle
entranceangle
with respect to the axisgiven by
vector e3(we
assume theparticle
goesthrough
thecrystal along
theperiodic trajectory
in theplane specified by
the vectors ei and (@o2e2 + cos (Ho)e3)
ei, e2, e3 stand for the basis vectors of the Cartesian coordinate systemoriginating
at thecrystal
surface irradiated withcharged particles),
lpn =
~~
~t~~
+
d~
+ 2dpsal +
Hi ~~°~~e2(k r)
~~~~
(5)
w w w
is the
complex
coherentlength
ofradiation,
n 2«/n
~~
27r ~~~~~~~' ~~~
In
equation (ii [(k- r)rot(
£wdroi/c, Hi
is of the same order ofmagnitude
as the maximum value of the square of theangle
Ho at which theparticle
penetrates thecrystal,
the modulus~~°~~e2(k r)
£ 2@o2d, where d is theangle
between the wave vector of the emittedw
photon
k and the vector kBr(the polar angle
ofradiation).
For thefollowing
considerationwe suppose that
wdroi/c
« I,Hi
« ~tQ~, 2@o2d « ~tQ~, where ~ttr =w/wL,
wLbeing
theLangmure frequency
of thecrystal,
are fulfilled.3.
Angular
distribution.The scalar
product
ens.an(the
index p isdropped
here due to anegligible dependence
of the Fourier component on thedispersion
branchnumber)
will further be written as a sum ensat
+ ensal,
the first term of which describes theoscillatory
motion of theparticle
(at
= ant
ei)
and the second its linear motion in thecrystal (al
=(ant, an2))
In this case~
the part of
equation ii, proportional
to the modulussquared ens al
,
should be
interpreted
as a
spectral-angular
distribution of PXR emittedby
the oscillator andcorresponding
to the constant component of itsvelocity.
Let us use the harmonic oscillator with the transverse
velocity
vi
=u.@oi
.ei.cos(fl.t+~2o)+u.@o2e2 (7)
as a model of a relativistic oscillator. We choose @02
= o, ~2o " o as initial conditions. It is
further assumed that the transverse
velocity
perturbatior~,
determinedby particle
transverse oscillations in the channel, issmall,
I,e, the condition ~ ~~°~< l is met.
Therefore,
expansion 8flcan be carried out in this small parameter. Then for the
Fourier-components
an we obtaina~
"
(~01e3 ~n+I (ill
~~n-I(il) )~) i~n-i(il)
~~n-3(il) ~n+i(il)
~~n+3(il)j
,
~~
~~~ ~~
~"~~~
~~ ~
~
~~ ~"~~~~~ ~~ ~ ~~ "+~~~~)
' ~~~
where Jn(1~) is the n-th order Bessel
function,
1~ =
kei ~(~
Considerdipole approximation.
In this case the condition
1~ < should be
fulfilled,
thenat
= Hoi ei
~
al
= e3
~
2 c c
It follows from
(I)
that themagnitudes
offrequencies
w andangles d,
~g (~g is the a2imuth
angle
measured from diffractionplane specified by
the vectors kBr andr)
of the emittedphoton
with the wave vector k are close to the values at which the real part of the coherentlength
ofradiation
lpn
- oc. This condition can beconveniently
rewritten as followsai = D
xi(fl II fin/D. (9)
Here
fl
=
~to/~ti,
D(wB, d)
= ~t~~ + ~t£~ + d~
2fl/wB.
Tosimplify
the treatment, we havedropped xi, rl'. Equation (9)
satisfies the condition Ilip»
= o either on the first diffraction branch if P = D +
fir[ ID
>o,
or on the second oneprovided
P < o. For Lauediffraction,
the number of a branch where DRO is emitted is determinedby
thesign
of thequantity
D(since fl >o).
Considering
theforegoing
andconfining
ourselves to the Laue diffraction case,provided
that the radiation maxima on different harmonics do notoverlap,
andassuming
thefrequency
wfound from I
lip»
= 0 to beapproximately equal
to wB, we obtain the DROangular
distribution(for
n =I) (see
Ref. [9])N]~
~~o =°
"~~°~
~~~~~~~ j~ ~~~~ ~~'~~£ L$( (@(D)d~i
+(I @(D))d~2) (lo)
'
~
167rc
~n B
~ ~i
where all the
frequency-dependent
terms in theright-hand
side ofequation (lo)
are taken forw = wB,
L$(
=L$(~ ii
exp(-Lo/L[(~)),
L$(~ is thephoton absorption length
~Ps C ~~ + fl~~
j~ ~j
~~~ L°B
Xi fl (D
+ ds)~ +r(-d~
ds =
r$/2Xi,
~~~~
~~~
~ ~~~) ~~
~~
~~~~/~)~
~~~~If the condition
Lo
< Labs" ~ isfulfilled,
thedependence
of(lo)
on d iscompletely
w
[x[[ fl
describedby
theangle
function(12).
Consider the behavior of equation
(lo)
at different values of theBragg frequency
wB. Weassume to have a beam of
charged particles
of a fixed energy, thenvarying
the value of @B,I-e-
rotating
thecrystal
with respect to the beam incidence direction, we shall obtain different patterns of DROangular
distributions(in
[10] we described DROangular
distribution as a function of oscillatorenergy).
4. DRO
angular
distribution as a function ofbragg angle
at a fixedparticle
energy.Note that the
equation
D= o defines the relation between the
photon
emissionangle
d and thephoton frequency
for thecomplex Doppler
effect. It can be rewritten asw =
~~~ (13)
'f~~
+'ftr + ~~We would like to recall the basic parameters of the
complex Doppler
effectfollowing
from(13).
Thefrequency
wD"
ml /(nfl)
and the Lorentz-factor ~tD=
wL/(nfl) (below
we shall consideronly
the first harmonic n=
ii
determine thepoint
of thecomplex Doppler
effectbirth,
at ~t = ~tD the radiationfrequency
w= wB, the radiation
angle
d= o. As ~t
increases,
the upper and lower branches of the
complex Doppler
effectdiverge
from the point wD. When~t » 'iD the minimum
frequency
of the lower branch wrnin=
wD/2,
the maximumfrequency
of the upper branch wrnax
= 2fl~t~. We assume that the
Bragg frequency
is wB > wrnin. If wB > wrnax, then Do ='f~~
+~tQ~+d~ 2fl/wB
> o and the latterinequality being
fulfilledonly
at p = I. The DRO
angular
distribution is asingle
maximumstrictly aligned
with the vectorkBr
As wBapproaches
wrnax,F(d)
is of the order of,
the
angular
width m 2).
In the2flr(
~region
wB < wrnax the form of the DROangular
distributiondensity
isconsiderably different,
I-e- a
single
narrow maximum at theangle
d= o transforms into two maxima
(the
a2imuthangle
~g is assumed to be a fixedone).
Theapproximate position
of the mentioned maxima in theangular
distributioncorresponds
to theangle dD
obtained from acomplex Doppler
effect equation D [w=w~ = o. One of themcorresponds
to the seconddispersion
branch and is atangles
d <dD(D
<o),
the other to the branch p= I and lies at
angles
d >dD(D)
>o),
j
j2+fit@
1,2 D S
fl/
L°B(i~)
The maximum value of the
angular
function is still of the order of2flr(
5. Effect of the beam parameters on
angular
distributiondensity.
The
foregoing
is validonly
under ideal conditions when aspread
ofcharged particles
overenergy ~h~t/~t and an efficient
angular spread
@~R =
l~
@( + 2in
e2(@o2d(15)
(n
=kBr / [kBr satisfy
theinequality
)
+ 2(@eR'f)~/3 ~~'~~@ (~6)
For experiments on the
majority
of accelerators~'~
> 2 (@~R~t)~
/3 (for
~t of the order of100),
'f
therefore,
to evaluateangular
distributiondensity
wheninequality (16)
is invalid, one should average(lo)
over the beam energyspread.
In our further calculations we assumed the beam to have normal energy distribution withdispersion
ab =jh
and that it
averaged
~t In 4
~~~~ ~~ /~ab
~~~~~~b~
~~' ~~
~~~~
6. Oscillator kinetics.
As far as the DRO maximum
intensity
isconcerned,
one should conduct anexperiment
at beamenergies
of I loo MeV. At such beamenergies
and at X-radiationenergies
limited to at most several tens ofKeV,
the PXR is attenuated due to its threshold character. Below ~ttr the PXRintensity drops
withdecreasing
energy as (~t/~ttr)~Therefore,
DRO can be observedon the PXR
"background".
At suchenergies
aparticle
is a quantum oscillator. That iswhy
in further calculations we should allow for the coefficient of
population Qn
of the n th energy level with a transverse motion energy£ni determining
the chosenfrequency
of transition An =£ni £mi
between the levels n and m. The value of@(1/4
in(lo)
can be treated interms of the
quasiclassical theory
of the quantum oscillator as an estimate of the value of[Xnm[~
fl~/c~,
where[Xnm[~
is thedipole
momentum of the radiative transition n - m.In what follows we shall consider DRO emitted due to the radiative transition between the levels 1 ~ o, then the DRO
intensity
isproportional
tof/° Qi(z)dz, Qi being population
ofthe first level of the transverse motion energy.
The relation between the
population Qi
and thecrystal
thickness is describedby
the system ofequations:
~~ (
~"~"
~~
~~"~~'
where
Wnm
is theprobability
of a non-radiation transition from the level m to the leveln, rn
=
~jwnm;
m
Wmn =
27r/h~j
< O[<
po (Vnm[ p>[
N >< N[<
p [Vmn[ po>[
O >.N,p
(EN Eo
+£jj(p)
£jj(po
+£n £m)
Here < O[ and < N[ are
ground
and excited states of thecrystal,
Eo and EN are corre-sponding energies,
p, po are thestarting
and final momentum of theelectron, parallel
to thechanneling plane,
V is thepotential
of electroncrystal interaction,
the indices m and nimply
that the matrix element is taken over the wave
eigenfunction
of the electron transverse motion in the channel. Summation is made over thecrystal
excited states < N[ and the momenta p.In the
expression
for the function argument one canneglect
the differences ENEo
and£n
-£m, expand
the quantity £jj(pi -£jj (po
over parameter[p
po,
assuming
the momentum transfers to be small~((~P) £jj
(p~j
~ (P2 p~~)22m~
+ (P3 po31 cand
ignore
the term~~~j$°~~~
Eventually
we have forwmn
~t
~'~"
~j~~ / ~~l ~
fifmn(~l Tl/2)
'fifmn(Tl/2 ~l)
'~
(~l
Tl/2,
Tl/2
~l,
~
r
the function
fl
isexpressed
in terms of the electrondensity
form factorF(q)
and theamplitude
ofcrystal
atoms thermal oscillations ~, na is thecrystal
atomsdensity,
e is an electroncharge, fl(q, q')
=
/ dq jz2
zF(q)
zF(q') Fiq) F(q'i)
(e-(~-~')~U~/2 e-~~U~/2 e-~'~U~/2)
+(F(q
+q') 1/Z F(q) F(q'))e~(~+~')~~~/~
Here q is the vector with the coordinates
(qi,
q2,o),
andq'
is the one with(q[,
-q~,o),
Z is the nucleuscharge number, Mmn(k)
are the matrix elements:Mmn(k)
=
#n(x)
e~~~~ ~fim(x) dx.The wave
eigenfunctions
of theSchr6dinger equation
for thepotential U(x)
=Uo/ch~(ax)
aretaken as wave functions of transverse motion. The constants Uo and o are chosen so that the
potential
should be close to aninterplanar potential
obtained from the Moliere model.In
figure
I thepopulations Qn
areplotted against
thedepth
ofpenetration
into thecrystal.
The calculations were done for the 50 MeV electrons channeled in a Si
single crystal along
the(loo) planes.
Thestarting populations
were calculated for a beampenetrating
thecrystal
at anangle
of 2.3 x lo~~ rad andan
angular spread
of I x lo~~ rad.20 o,
oo
to
3
o,
O-.~...j...:....j...:..j
...j ..j
O 2 4 6 8 to
L.
(cm) Xlo'
Fig. I. Level population as a function of depth of electron penetration into the crystal, the beam
angular spread 10~~ rad, the angular at which the beam penetrates the crystal 2.3 x 10~~ rad.
Qi Population of the first level, Q2- Population of the second level et al.
7.
Experimental procedure.
Except
for DRO parametric X-radiation andbremsstrahlung
diffractedby
atomicplanes
arealso emitted into diffraction maximum. For wB 2 wrnax the DRO intensity will be
compared
to the
angular density
ofbremsstrahlung
at theangle
d= o, for wB < wrnax one should try to discover a
relatively
narrow DRO maximum on the PXR"background",
where the distributionmaximum is attained at an
angle dph
Ci'f~~ +~tQ~.
The calculations are meant for an accelerator whose basicproperties
aregiven
in referenceill]
the electron energy 50MeV,
the beamangular spead lo~~ rad,
the energyspread
for 50 MeV~'~
= o.5il. We suggest the 'f
following experimental procedure:
the beam moves underplanar channeling conditions,
e-g- between the(loo) planes,
the radiationbeing
recorded at anangle equal
to the twoBragg angles
relative to thelongitudinal velocity
of e~ The X-radiation is diffractedby
the(llo) planes (see Fig. 2).
TheBragg angle
ischanged by
thecrystal
rotation in the diffractionplane.
One measurement will be made at wB "
2fl~t~,
two others at w <2fl~t~.
In theexperimental
geometry under consideration(earei)~
~ l,
(e«rei)~
~ d~sin~~gTg~@B> I-e- the emitted DRO will
actually
be a-polarized,
thebremsstrahlung
has a mixedpolarization.
The calculation isdone for
~g =
7r/2,
the PXRacquires
apolarization (see
Ref.[12]).
Thecrystal
thickness should be chosen sothat,
on the onehand,
the ratio between DRO andbremsstrahlung angular
densities as well as between DRO and PXR should be
maximum,
and on the otherhand,
thecrystal
thickness should be greater than the extinctionlength
to fulfill thedynamic
diffraction condition. The intensities ofbremsstrahlung,
PXR and DRO arerespectively proportional
toL(,
Lo andf/° Qi(z)dz.
The enhancement of the DROintensity
withincreasing
L is lesspronounced
than that of thebremsstrahlung
and PXR intensities sinceQi(x)
is adecreasing
function. The
crystal
thickness was chosen to be I x lo~~cm.fi
'
(220) '
'
I,
~
)
,~~ (loo)
_
kB~
Fig. 2. Geometry of an experiment to observe the diffraction radiation of oscillator.
The basic parameters for the
corresponding
measurements and maximum values of DRO, PXR andbremsstrahlung
are tabulated in table I. The calculations were done for a siliconsingle crystal.
Theaveraging
over the beamspread
wasperformed
for the case when theinequality (16)
does nothold,
therefore the table contains the column with the value2~t~/fl/3.
Theangular
distributionscorresponding
to the first and second rows of a table arepictured
infigures
3a, 3b. As a result of beam energyspread
for case wB < wrnax twopeaks
mergetogether.
Thebremsstrahlung
was calculated from the formula [12]Table I. Basic parameters and maximum values of
DRO, Bremsstrahlung
and PXRangular
distributions for three differentexperimental procedures.
fifa fifa
~B L°B~*~
(X~~
Labs @
'ftr ~D
~i~~~
X10~~i~~
(°)
~~~ X IQ ~~ X10~ ~~d d= dD d
= o d
=
dph
2,1 87.51 o.126 9.16 4.82 o 5.74 o.287 o.233
2 5 37.05 0.704 o.69 26.4 l192. I-ii 0.333 0.539
3 lo 18.60 2.80 o.09 lo8 598.6 o.248 o.438 0.988
(*)
Thefrequencies
were calculated for difractionplane (220).
~~d,Br
")~~~~~~~
~~~~
~ ~
+ 167rcsin @B
((d2
+ ~t~2xi
+flr()
~~~~°
~~~~~~
~ +
°~~~°
~~~~~
~
(17)
7rsin~@B
/k (d2
+ ~t~~xi /k)
7rsin~@B/k (d2
+ ~t~2xi
+/k)
where @j is a root-mean-square
angle
ofmultiple scattering
ofcharged particles
per unitlength,
@j =
(Es / (mc~~t))~
,
Es =
@mc~,
LR is the radiation unitlength,
2LR
~eR
"2Llis'
l~~lis/~0 II
~XP(~L0/~lis)))
The first term in
(ii)
isbremsstrahlung
emittedby charged particle moving
with avelocity exceeding
that of thegenerated radiation,
the second term isbremsstrahlung
associated withphotons
whose refractive index is under theunity
andefficiency
of X-radiation reflection from atomicplanes
is at its maximum.8. Conclusion.
As follows from table I and
figures
3a, 3b the DRO can be detected inexperiments
on themeasurement of the
angular
distribution. Inparticular,
we suggest thatkeeping
energy andangle
@Bunchanged,
one should vary thecharged particle
motion fromstraightforward
tooscillatory by rotating
thecrystal.
Then thecrystal
should be rotated in the diffractionplane, thereby changing
theangle
@B. This results in differentangular
distributions.One may also conduct an
experiment using
a narrow slitpositioned along
the a2imuthangle
~g =
O(7r)
as a radiation collimator. For @B £7r/4
the PXR becomeslinearly polarized (s
=a)
and is not emitted at the a2imuth
angles
~g =O(7r),
the DRO is alsolinearly polarized (s
=a)
but is emitted at all values of ~g.
1
~ 8"
'
il
o
i
~I z
2
a)
x
+*~
~ill
o t
j~
~
'~
o2i
§ o
Z to~~
[3] KUMAKHOV M-A-, Phys. Lett. 57
(1976)
17.[4] GRADOVBKY O-T-, Phys. Lett. 126A
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