3-Axis, ±1g/±2g/±4g/±8g Digital Accelerometer

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Digital Accelerometer

Data Sheet ADXL350

FEATURES

Excellent zero-g bias accuracy and stability with minimum/maximum specifications

Ultralow power: as low as 45 μA in measurement mode and 0.1 μA in standby mode at VS = 2.5 V (typical)

Power consumption scales automatically with bandwidth User-selectable resolution

Fixed 10-bit resolution

Full resolution, where resolution increases with g range, up to 13-bit resolution at ±8 g (maintains 2 mg/LSB scale factor in all g ranges)

Embedded, 32-level FIFO buffer minimizes host processor load

Tap/double tap detection and free-fall detection Activity/inactivity monitoring

Supply voltage range: 2.0 V to 3.6 V I/O voltage range: 1.7 V to VS

SPI (3- and 4-wire) and I²C digital interfaces

Flexible interrupt modes mappable to either interrupt pin Measurement ranges selectable via serial command Bandwidth selectable via serial command

Wide temperature range (−40°C to +85°C) 10,000 g shock survival

Pb-free/RoHS compliant

Small and thin: 4 mm × 3 mm × 1.2 mm cavity LGA package

APPLICATIONS

Portable consumer devices

High performance medical and industrial applications

GENERAL DESCRIPTION

The high performance ADXL350 is a small, thin, low power, 3-axis accelerometer with high resolution (13-bit) and selectable measurement ranges up to ±8 g. The ADXL350 offers industry- leading noise and temperature performance for application robustness with minimal calibration. Digital output data is formatted as 16-bit twos complement and is accessible through either a SPI (3- or 4-wire) or I²C digital interface.

The ADXL350 is well suited for high performance portable applications. It measures the static acceleration of gravity in tilt- sensing applications, as well as dynamic acceleration resulting from motion or shock. Its high resolution (2 mg/LSB) enables measurement of inclination changes of less than 1.0°.

Several special sensing functions are provided. Activity and inactivity sensing detect the presence or lack of motion and if the acceleration on any axis exceeds a user-set level. Tap sensing detects single and double taps. Free-fall sensing detects if the device is falling. These functions can be mapped to one of two interrupt output pins.

Low power modes enable intelligent motion-based power management with threshold sensing and active acceleration measurement at extremely low power dissipation.

The ADXL350 is supplied in a small, thin, 3 mm × 4 mm × 1.2 mm, 16-lead cavity laminate package.

FUNCTIONAL BLOCK DIAGRAM

3-AXIS SENSOR

SENSE

ELECTRONICS DIGITAL

FILTER

ADXL350 _POWER

MANAGEMENT

CONTROL AND INTERRUPT

LOGIC

SERIAL I/O

INT1 V_S V_{DD I/O}

INT2

SDA/SDI/SDIO SDO/ALT ADDRESS SCL/SCLK GND

ADC

32 LEVEL FIFO

CS 10271-001

Figure 1.

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COMPARABLE PARTS

View a parametric search of comparable parts.

EVALUATION KITS

• ADXL350Z Breakout Board

• Real Time Eval System for Digital Output Sensor

DOCUMENTATION

Data Sheet

• ADXL350: 3-Axis, ±1g/±2g/±4g/±8g Digital Accelerometer Data Sheet

REFERENCE MATERIALS

Press

• First MEMS Accelerometer with MIN/MAX Offset Sensitivity to Temperature Enables Predictable and Quantifiable Performance

DESIGN RESOURCES

• ADXL350 Material Declaration

• PCN-PDN Information

• Quality And Reliability

• Symbols and Footprints

DISCUSSIONS

View all ADXL350 EngineerZone Discussions.

SAMPLE AND BUY

Visit the product page to see pricing options.

TECHNICAL SUPPORT

Submit a technical question or find your regional support number.

DOCUMENT FEEDBACK

Submit feedback for this data sheet.

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SPECIFICATIONS

TA = 25°C, VS = 2.5 V, VDD I/O = 2.5 V, acceleration = 0 g, and CIO = 0.1 μF, unless otherwise noted. All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.

Table 1.

Parameter Test Conditions Min Typ Max Unit

SENSOR INPUT Each axis

Measurement Range User selectable ±1, ±2, ±4, ±8 g

Nonlinearity Percentage of full scale ±0.5 %

Inter-Axis Alignment Error ±0.1 Degrees

Cross-Axis Sensitivity¹ ±3 %

OUTPUT RESOLUTION Each axis

All g Ranges 10-bit resolution 10 Bits

±1 g Range Full resolution 10 Bits

SENSITIVITY Each axis

Sensitivity at X_OUT, Y_OUT, Z_OUT Any g-range, full resolution 473.6 512 550.4 LSB/g

Scale Factor at XOUT, YOUT, ZOUT Any g-range, full resolution 1.80 1.95 2.10 mg/LSB

Sensitivity at XOUT, YOUT, ZOUT ±1 g, 10-bit resolution 473.6 512 550.4 LSB/g

Scale Factor at XOUT, YOUT, ZOUT ±1 g, 10-bit resolution 1.80 1.95 2.10 mg/LSB

Sensitivity at X_OUT, Y_OUT, Z_OUT ±2 g, 10-bit resolution 236.8 256 275.2 LSB/g

Sensitivity at XOUT, YOUT, ZOUT ±4 g, 10-bit resolution 118.4 128 137.6 LSB/g

Scale Factor at X_OUT, Y_OUT, Z_OUT ±4 g, 10-bit resolution 7.22 7.81 8.40 mg/LSB

Sensitivity at X_OUT, Y_OUT, Z_OUT ±8 g, 10-bit resolution 59.2 64 68.8 LSB/g

Sensitivity Change Due to Temperature ±0.01 %/°C

0 g BIAS LEVEL Each axis

0 g Output for X_OUT, Y_OUT −150 ±50 +150 Mg

0 g Output for ZOUT −250 ±75 +250 Mg

0 g Offset vs. Temperature (X Axis and Y Axis)² −0.31 ±0.17 +0.31 mg/°C

0 g Offset vs. Temperature (Z Axis)² −0.49 ±0.24 +0.49 mg/°C

NOISE PERFORMANCE

Noise (X-Axis and Y-Axis) 100 Hz data rate, full resolution 1.1 LSB rms

Noise (Z-Axis) 100 Hz data rate, full resolution 1.7 LSB rms

OUTPUT DATA RATE AND BANDWIDTH User selectable

Measurement Rate³ 6.25 3200 Hz

SELF-TEST⁴ Data rate ≥ 100 Hz, 2.0 V ≤ VS ≤ 3.6 V

Output Change in X-Axis 0.2 2.1 g

Output Change in Y-Axis −2.1 −0.2 g

Output Change in Z-Axis 0.3 3.4 g

POWER SUPPLY

Operating Voltage Range (VS) 2.0 2.5 3.6 V

Interface Voltage Range (VDD I/O) 1.7 1.8 VS V

Supply Current Data rate > 100 Hz 166 µA

Data rate < 10 Hz 45 µA

Standby Mode Leakage Current 0.1 2 µA

Turn-On Time⁵ Data rate = 3200 Hz 1.4 ms

OPERATING TEMPERATURE RANGE −40 +85 ^oC

1 Cross-axis sensitivity is defined as coupling between any two axes.

2 Offset vs. temperature minimum/maximum specifications are guaranteed by characterization and represent a mean ±3σ distribution.

3 Bandwidth is half the output data rate.

4 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate).

5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms.

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ABSOLUTE MAXIMUM RATINGS

Table 2.

Parameter Rating

Acceleration

Any Axis, Unpowered 10,000 g

Any Axis, Powered 10,000 g

V_S −0.3 V to +3.6 V

V_{DD I/O} −0.3 V to +3.6 V

Digital Pins −0.3 V to VDD I/O + 0.3 V or 3.6 V, whichever is less

All Other Pins −0.3 V to +3.6 V

Output Short-Circuit Duration (Any Pin to Ground)

Indefinite Temperature Range

Powered −40°C to +105°C

Storage −40°C to +105°C

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

THERMAL RESISTANCE Table 3. Package Characteristics

Package Type θ_JA θ_JC Device Weight 16-Terminal LGA_CAV 150°C/W 85°C/W 20 mg

PACKAGE INFORMATION

The information in Figure 2 and Table 4 provide details about the package branding for the ADXL350. For a complete listing of product availability, see the Ordering Guide section.

XL350B ywVVVV

10271-202

Figure 2. Product Information on Package (Top View) Table 4. Package Branding Information

Branding Key Field Description

XL350B Part identifier for ADXL350

yw Date code

VVVV Factory lot code

ESD CAUTION

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PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

RESERVED

GND VS

SDO/ ALT ADDRESS

SDA/SDI/SDIO CS

NC = NO INTERNAL CONNECTION

NC V_{DD I/O}

NC SCL/SCLK NC

RESERVED GND

INT1 RESERVED INT2

TOP VIEW

ADXL350

(Not to Scale) 1

2 3 4 5

13 12 11 10

9

6 7 8

16 15 14

+Z +X

+Y

10271-002

Figure 3. Pin Configuration

Table 5. Pin Function Descriptions

Pin No. Mnemonic Description

1 VDD I/O Digital Interface Supply Voltage.

2 NC Not Internally Connected.

4 SCL/SCLK Serial Communications Clock.

6 SDA/SDI/SDIO Serial Data (I²C)/Serial Data Input (SPI 4-Wire)/Serial Data Input and Output (SPI 3-Wire).

7 SDO/ALT ADDRESS Serial Data Output/Alternate I²C Address Select.

8 CS Chip Select.

9 INT2 Interrupt 2 Output.

10 RESERVED Reserved. This pin must be connected to ground or left open.

11 INT1 Interrupt 1 Output.

12 RESERVED Reserved. This pin must be connected to ground.

13 GND This pin must be connected to ground.

14 VS Supply Voltage.

15 RESERVED Reserved. This pin must be connected to V_S or left open.

16 GND This pin must be connected to ground.

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TYPICAL PERFORMANCE CHARACTERISTICS

N = 460 for all typical performance characteristics plots, unless otherwise noted.

0

–100 –80 –60 –40 –20 0 ZERO g OFFSET (mg)

20 40 60 80 100 10

20 30 40

PERCENT OF POPULATION (%) 10271-103

Figure 4. X-Axis Zero g Offset at 25°C, VS = 2.5 V

0

–100 –80 –60 –40 –20 0 ZERO g OFFSET (mg)

20 40 60 80 100 10

20 30 40

Figure 5. Y-Axis Zero g Offset at 25°C, VS = 2.5 V

ZERO g OFFSET (mg) 0

20

10 30

–125 –105 –85 –65 –45 –25 –5 15 35 55 75 95 115

PERCENT OF POPULATION (%) 10271-105

Figure 6. Z-Axis Zero g Offset at 25°C, VS = 2.5 V

0

–100 –80 –60 –40 –20 0 ZERO g OFFSET (mg)

20 40 60 80 100 10

20 30

Figure 7. X-Axis Zero g Offset at 25°C, VS = 3.0 V

0

–100 –80 –60 –40 –20 0 ZERO g OFFSET (mg)

20 40 60 80 100 10

20 30

Figure 8. Y-Axis Zero g Offset at 25°C, VS = 3.0 V

0 10 20 30

–150 –130 –110 –90 –70 –50 –30 –10 10 30 50 70

–230 –210 –190 –170

PERCENT OF POPULATION (%)

ZERO g OFFSET (mg) _10271-

108

Figure 9. Z-Axis Zero g Offset at 25°C, VS = 3.0 V

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0 10 20 30

–0.5 –0.4 –0.3 –0.2 –0.1 0 0.1 0.2 0.3 0.4 0.5

ZERO g OFFSET TEMPERATURE COEFFICIENT (mg/°C) –40°C TO +25°C

+25°C TO +85°C

10271-109

Figure 10. X-Axis Zero g Offset Temperature Coefficient, VS = 2.5 V

0 10 20 30

–0.5 –0.4 –0.3 –0.2 –0.1 0 0.1 0.2 0.3 0.4 0.5

+25°C TO +85°C

10271-110

Figure 11. Y-Axis Zero g Offset Temperature Coefficient, VS = 2.5 V

0 10

5 15 20

–0.5 –0.4 –0.3 –0.2 –0.1 0 0.1 0.2 0.3 0.4 0.5

+25°C TO +85°C

10271-111

Figure 12. Z-Axis Zero g Offset Temperature Coefficient, VS = 2.5 V

–100 –50 –25

–75 0 50 75

25 100

–60 –40 –20 0 20 40 60 80 100

OUTPUT (mg)

TEMPERATURE (°C) N = 16

V_S= V_{DD I/O}= 2.5V

10271-112

Figure 13. X-Axis Zero g Offset vs. Temperature—

16 Parts Soldered to PCB, VS = 2.5 V

–60 –40 –20 0 20 40 60 80 100

–100 –50 –25

–75 50 75

25

0 100

OUTPUT (mg)

V_S= V_{DD I/O}= 2.5V

10271-113

Figure 14. Y-Axis Zero g Offset vs. Temperature—

–60 –40 –20 0 20 40 60 80 100

–150 –100 –50 0 50 100 150

OUTPUT (mg)

V_S= V_{DD I/O}= 2.5V

10271-114

Figure 15. Z-Axis Zero g Offset vs. Temperature—

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0 10 20 30

+25°C TO +85°C

10271-115

–0.6 –0.5 –0.4 –0.3 –0.2 –0.1 0 0.1 0.2 0.3 0.4 0.5 0.6

Figure 16. X-Axis Zero g Offset Temperature Coefficient, VS = 3.0 V

0 10 20 30

+25°C TO +85°C

10271-116

–0.6 –0.5 –0.4 –0.3 –0.2 –0.1 0 0.1 0.2 0.3 0.4 0.5 0.6

Figure 17. Y-Axis Zero g Offset Temperature Coefficient, VS = 3.0 V

0 5 15

10 20

+25°C TO +85°C

10271-117

–0.6 –0.5 –0.4 –0.3 –0.2 –0.1 0 0.1 0.2 0.3 0.4 0.5 0.6

Figure 18. Z-Axis Zero g Offset Temperature Coefficient, VS = 3.0 V

–100 –50 –25

–75 50 75

25

0 100

–20 –40

–60 0 20 40 60 80 100

OUTPUT (mg)

V_S= V_{DD I/O}= 3.0V

10271-118

Figure 19. X-Axis Zero g Offset vs. Temperature—

–20 –40

–60 0 20 40 60 80 100

–100 –50 –25

–75 50 75

25 100

0

OUTPUT (mg)

TEMPERATURE (°C) _10271-

119

N = 16

V_S= V_{DD I/O}= 3.0V

Figure 20. Y-Axis Zero g Offset vs. Temperature—

–150 –100 –50 0 50 100 150

–20 –40

–60 0 20 40 60 80

120

OUTPUT (mg)

N = 16

V_S= V_{DD I/O}= 3.0V

Figure 21. Z-Axis Zero g Offset vs. Temperature—

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0 20 40 60

470 475 480 485 490 495 500 505 510 515 520 525 530 535 540 545 550

SENSITIVITY (LSB/g)

10721-121

Figure 22. X-Axis Sensitivity at 25°C, VS = 2.5 V, Full Resolution

0 20 40 60

470 475 480 485 490 495 500 505 510 515 520 525 530 535 540 545 550

10721-122

Figure 23. Y-Axis Sensitivity at 25°C, VS = 2.5 V, Full Resolution

0 20 40 60

470 475 480 485 490 495 500 505 510 515 520 525 530 535 540 545 550

10721-123

Figure 24. Z-Axis Sensitivity at 25°C, VS = 2.5 V, Full Resolution

SENSITIVITY TEMPERATURE COEFFICIENT (%/°C) –40°C TO +25°C

+25°C TO +85°C

10271-124

0 20 40 60 80

–0.010 –0.008 –0.006 –0.004 –0.002 0 0.002 0.004 0.006 0.008 0.010

Figure 25. X-Axis Sensitivity Temperature Coefficient, VS = 2.5 V

+25°C TO +85°C

10271-125

0 20 40 60 80

–0.010 –0.008 –0.006 –0.004 –0.002 0 0.002 0.004 0.006 0.008 0.010

Figure 26. Y-Axis Sensitivity Temperature Coefficient, VS = 2.5 V

+25°C TO +85°C

10271-126

0 10 20 30 40

–0.010 –0.008 –0.006 –0.004 –0.002 0 0.002 0.004 0.006 0.008 0.010

Figure 27. Z-Axis Sensitivity Temperature Coefficient, VS = 2.5 V

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0 20 40

10 30

555 560 565 570 575

495 500 505 510 515 520 525 530 535 540 545 550

10721-127

Figure 28. X-Axis Sensitivity, VS = 3.0 V, Full Resolution

555 560 565 570 575

495 500 505 510 515 520 525 530 535 540 545 550

0 60

20 40

SENSITIVITY (LSB/g) _10721-

128

Figure 29. Y-Axis Sensitivity, VS = 3.0 V, Full Resolution

0 60

20 40

470 475 480 485 490 495 500 505 510 515 520 525 530 535 540 545 550

10721-129

Figure 30. Z-Axis Sensitivity, VS = 3.0 V, Full Resolution

+25°C TO +85°C

10271-130

0 20 40 60 80

–0.010 –0.008 –0.006 –0.004 –0.002 0 0.002 0.004 0.006 0.008 0.010

Figure 31. X-Axis Sensitivity Temperature Coefficient, VS = 3.0 V

+25°C TO +85°C

10271-131

0 20 40 60

10 30 50 70

–0.010 –0.008 –0.006 –0.004 –0.002 0 0.002 0.004 0.006 0.008 0.010

Figure 32. Y-Axis Sensitivity Temperature Coefficient, VS = 3.0 V

+25°C TO +85°C

10271-132

0 20 40

10 30 50

–0.010 –0.008 –0.006 –0.004 –0.002 0 0.002 0.004 0.006 0.008 0.010

Figure 33. Z-Axis Sensitivity Temperature Coefficient, VS = 3.0 V

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490 495 500 505 510 515 520 525 530 535 540

–60 –40 –20 0 20 40 60 80 100

SENSITIVITY (LSB/g)

V_S= V_{DD I/O} = 2.5V

10271-133

Figure 34. X-Axis Sensitivity vs. Temperature—

16 Parts Soldered to PCB, VS = 2.5 V, Full Resolution

–60 –40 –20 0 20 40 60 80 100

490 495 500 505 510 515 520 525 530 535 540

134

N = 16

V_S= V_{DD I/O} = 2.5V

Figure 35. Y-Axis Sensitivity vs. Temperature—

–60 –40 –20 0 20 40 60 80 100

490 495 500 505 510 515 520 525 530 535 540

135

N = 16

V_S= V_{DD I/O} = 2.5V

Figure 36. Z-Axis Sensitivity vs. Temperature—

500 505 510 515 520 525 530 535 540 545 550

–60 –40 –20 0 20 40 60 80 100

136

N = 16

V_S= V_{DD I/O} = 3.0V

Figure 37. X-Axis Sensitivity vs. Temperature—

–60 –40 –20 0 20 40 60 80 100

500 505 510 515 520 525 530 535 540 545 550

137

N = 16

V_S= V_{DD I/O} = 3.0V

Figure 38. Y-Axis Sensitivity vs. Temperature—

–60 –40 –20 0 20 40 60 80 100

138

490 495 500 505 510 515 520 525 530 540 550

535 545

N = 16

V_S= V_{DD I/O} = 3.0V

Figure 39. Z-Axis Sensitivity vs. Temperature—

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0 20 40 60 80

0.60 0.65 0.70 0.75 0.80 0.85 0.90 0.95 1.00

OUTPUT (g) _10271-

139

Figure 40. X-Axis Self-Test Response at 25°C, VS = 2.5 V

0 20 40 60

PERCENTAGE OF POPULATION (%)

OUTPUT (g)

–1.00 –0.95 –0.90 –0.85 –0.80 –0.75 –0.70 –0.65 –0.60

10271-140

Figure 41. Y-Axis Self-Test Response at 25°C, VS = 2.5 V

1.20 1.25 1.30 1.35 1.40 1.45 1.50 1.55 1.60

OUTPUT (g) _10271-

141

0 20 40 60

Figure 42. Z-Axis Self-Test Response at 25°C, VS = 2.5 V

0 20 40 60 80

0.80 0.85 0.90 0.95 1.00 1.05 1.10 1.15 1.20

OUTPUT (g) _10271-

142

Figure 43. X-Axis Self-Test Response at 25°C, VS = 3.0 V

0 20 40 80

60 100

–1.20 –1.15 –1.10 –1.05 –1.00 –0.95 –0.90 –0.85 –0.80

OUTPUT (g) _10271-

143

Figure 44. Y-Axis Self-Test Response at 25°C, VS = 3.0 V

0 10 20 40

30 50

1.70 1.75 1.80 1.85 1.90 1.95 2.00 2.05 2.10 2.15 2.20

OUTPUT (g) _10271-

144

Figure 45. Z-Axis Self-Test Response at 25°C, VS = 3.0 V

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0 20 40 60

CURRENT CONSUMPTION (µA)

100 110 120 130 140 150 160 170 180 190 200

10271-145

Figure 46. Current Consumption at 25°C, 100 Hz Output Data Rate, VS = 2.5 V, 31 Parts

0 20 40 60 80 100 120 140 160 180

1 10 100 1k 10k

CURRENT (µA)

OUTPUT DATA RATE (Hz) _10271-

146

Figure 47. Current Consumption vs. Output Data Rate at 25°C VS = 2.5 V, 10 Parts

100 120 140 160 180 200 220

2 3 4

CURRENT (µA)

SUPPLY VOLTAGE (V) _10271-

147

Figure 48. Supply Current vs. Supply Voltage, VS at 25°C, 10 Parts

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THEORY OF OPERATION

The ADXL350 is a complete 3-axis acceleration measurement system with a selectable measurement range of ±1 g, ±2 g, ±4 g, or ±8 g. It measures both dynamic acceleration resulting from motion or shock and static acceleration, such as gravity, which allows the device to be used as a tilt sensor.

The sensor is a polysilicon surface-micromachined structure built on top of a silicon wafer. Polysilicon springs suspend the structure over the surface of the wafer and provide a resistance against acceleration forces.

Deflection of the structure is measured using differential capacitors that consist of independent fixed plates and plates attached to the moving mass. Acceleration deflects the beam and unbalances the differential capacitor, resulting in a sensor output whose amplitude is proportional to acceleration. Phase-sensitive demodulation is used to determine the magnitude and polarity of the acceleration.

POWER SEQUENCING

Power can be applied to VS or VDD I/O in any sequence without damaging the ADXL350. All possible power-on modes are summarized in Table 6.

The interface voltage level is set with the interface supply voltage, V_{DD I/O}, which must be present to ensure that the ADXL350 does not create a conflict on the communication bus. For single-supply operation, VDD I/O can be the same as the main supply, V_S. In a dual-supply application, however, V_{DD I/O} can differ from V_S to accommodate the desired interface voltage, as long as V_S is greater than V_{DD I/O}.

After VS is applied, the device enters standby mode, where power consumption is minimized and the device waits for VDD I/O to be applied and for the command to enter measurement mode to be received. (This command can be initiated by setting the measure bit in the POWER_CTL register (Address 0x2D).) In addition, any register can be written to or read from to configure the part while the device is in standby mode. It is recommended to configure the device in standby mode and then to enable measurement mode.

Clearing the measure bit returns the device to the standby mode.

Table 6. Power Sequencing

Condition V_S V_{DD I/O} Description

Power Off Off Off The device is completely off, but there is the potential for a communication bus conflict.

Bus Disabled On Off The device is on in standby mode, but communication is unavailable and creates a conflict on the communication bus. The duration of this state should be minimized during power-up to prevent a conflict.

Bus Enabled Off On No functions are available, but the device does not create a conflict on the communication bus.

Standby or Measurement On On At power-up, the device is in standby mode, awaiting a command to enter measurement mode, and all sensor functions are off. After the device is instructed to enter measurement mode, all sensor functions are available.

3-Axis, ±1g/±2g/±4g/±8g Digital Accelerometer

Digital Accelerometer

Data Sheet ADXL350

COMPARABLE PARTS

EVALUATION KITS

DOCUMENTATION

REFERENCE MATERIALS

DESIGN RESOURCES

DISCUSSIONS

SAMPLE AND BUY

TECHNICAL SUPPORT

DOCUMENT FEEDBACK

TABLE OF CONTENTS

SPECIFICATIONS

ABSOLUTE MAXIMUM RATINGS

XL350B ywVVVV

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

TYPICAL PERFORMANCE CHARACTERISTICS

THEORY OF OPERATION