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Submitted on 1 Jan 1976
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Enhancement of the superconducting transition
temperatures in ion-implanted aluminium alloys
A.M. Lamoise, J. Chaumont, F. Lalu, Frédéric Meunier, H. Bernas
To cite this version:
L-287
ENHANCEMENT
OF THE
SUPERCONDUCTING
TRANSITION TEMPERATURES
IN
ION-IMPLANTED ALUMINIUM ALLOYS
(*)
A. M.
LAMOISE,
J. CHAUMONT and F. LALULaboratoire René-Bernas du Centre de
Spectrométrie
Nucléaire et deSpectrométrie
deMasse,
91406
Orsay,
France F. MEUNIERLaboratoire de
Physique
des Solides(**),
UniversitéParis-Sud,
91405Orsay,
Franceand
H. BERNAS
Institut de
Physique
Nucléaire,
UniversitéParis-Sud,
91406Orsay,
France(Re~~u
le2 juillet
1976,le
15septembre 1976)
Résumé. 2014 La
température critique Tc d’alliages Al-C, d’Al-Ge et Al-Si, préparés par
implan-tation ionique à très basse température atteint 4,2 K (C), 7,35 K (Ge) et 8,35 K (Si). Cette dernière valeur de Tc est la plus forte valeur obtenue à partir de l’aluminium. Toutes ces valeurs de Tc
corres-pondent à des concentrations d’éléments covalents de l’ordre de 25 %. Le désordre ne peut, à lui seul,
expliquer ces augmentations de températures critiques. Abstract. 2014 Random
alloys of C, Si, and Ge with Al, prepared by ion implantation at liquid
helium temperatures, have maximum superconducting transition temperatures Tc of 4.2 K (C), 7.35 K (Ge) and 8.35 K (Si). The latter value is the highest yet obtained for an Al-based alloy. All
these values are obtained for covalent element concentrations of ~ 25 %. The effect of lattice disorder
is not found sufficient to account for the observed Tc enhancements.
LE JOURNAL DE PHYSIQUE - LETTRES
TOME 37, NOVEMBRE 1976,
Classification Physics Abstracts
7.188 - 8.362
One of the crucial
problems
insuperconductivity
relates to the mechanisms
by
which thesuperconduct-ing
transition temperature(Td
of a metal may bemodified. It is well known that
alloying
anddisordering
may
produce
drastic variations inTc.
The latter effecthas been often studied on thin films
produced by
evaporation techniques [1-3]
orby
sputtering [4].
In
superconductors
such asAl,
large
increases inTc
have been found for filmsproduced
by
quench-condensation
(80
K or 4.2K)
of the metal withnon-metals such as
O2, H2,
rare gases, Ge or Si on cold substrates[2, 3, 5].
For pure bulkAl,
7~
= 1.2K ;
typical
values found in this way range from 2.0 to 4.5K,
except for Al-Si and Al-Ge which reach 6.05 and 6.6 Krespectively
[3]
within the frame-work of Macmillan’stheory [6],
this effect has beenvariously
ascribed tochanges
in thephonon
spectrum(*) Work partially supported by DGRST under Contract Nb. 74.7.1083.
(**) Associe au C.N.R.S.
or in the electronic
density
of states at the Fermilevel,
or tochanges
in theamplitude
of thedcctron-phonon
interaction. Alternative
explanations
based onelec-tron-electron interactions via other
elementary
exci-tations have also been discussed[7-10].
Atpresent,
no
overwhelming
evidence favours any one of theseinterpretations.
The
microscopic
structure and the overallhomo-geneity
of the thin filmalloys
are basic features in theseexperiments.
The recent use of low temperatureimplantation
techniques
is animportant development
here,
sincethey
mayproduce inherently
randomphases
under well-controlled conditions[11, 1.2].
We havepreviously
reported
Tc
increases for Al filmsimplanted
withAl, 0,
He and H[12].
WhileTc-enhan-cements were related to lattice disorder in Al-0 and
Al-He,
the effect ofH-implantation
wasparticularly
striking
because of thehigh resulting Tc
value(6.75 K)
and the
possibility
that an orderedcompound
hadbeen
produced
by
ionimplantation.
Theresistivity
annealing properties
were alsoreported [13].
In theL-288 JOURNAL DE PHYSIQUE - LETTRES
present work,
we have studied the criticaltempera-tures of Al based thin film
alloys
withvarying
concen-trations of the covalent elements
C,
Si and Ge. Wereport
(i)
results on thehighest 7~
values obtained forthese
systems;
(ii)
astudy
of the correlation betweenTc
and theannealing
temperature for the Al-Sisystem; and
(iii)
astudy
of the influence of latticedisorder on the
high Tc
samples.
Implantation,
resistivity
measurements, and filmpreparation techniques
are the same as in ourprevious
work
[12].
Thin films(8
x 0.6mm2,
thickness 500-1 000A)
wereprepared
by
evaporation
oncrys-talline quartz substrates from a tungsten crucible in a
bell-jar
vacuum.During
theimplantation
the targettemperature
was below 10 K.Implantation
energies
wereajusted
in order to obtainfairly
uniform
samples
(e.g.,
30 keV and 15 keV Si+implantations
wereperformed
in a 500A
thick aluminiumfilm).
Since
heavy
ionssputter
varying
amounts of thetargets, the film
composition
after ionimplantation
had to be determined. Thecomposition
of the Al-Geimplanted
alloys
was estimated from a Rutherfordbackscattering
study
of theappropriate sputtering
coefficients[14].
For the Si and Cimplanted samples,
thealloy
concentration was estimatedby assuming
that the
sputtering
ratio of Si on Al wasequal
to that of Al onAl,
and that thesputtering
of Alby
C wasnegligible.
Resistivity
measurements wereperformed
using
astandard
four-point
probe technique [13].
Implanted
samples
wererepeatedly
measured after a successionof
Ge,
Si and Cimplantations
atvarying
doses in order to correlate theresistivity
just
aboveTc
and thesuperconducting
transition temperature with theconcentration of
implanted
atoms[14].
FIG. 1. -
Superconducting transitions in Al-C, Al-Si and Al-Ge. The curve indexed Al(Ge) was obtained after Al implantation
(dose 7 x 1017 at . cm - 2) into a room-temperature co-evaporated
Alo.3oGeo.7o film. The curve indexed Ge was obtained after Ge implantation (dose 1017 at . cm - 2) into a pure Al film.
The
highest superCCL -’ ~~ .ing
transition tempera-ture curves obtained for differentalloys
aredisplayed
infigure
1.They
allcorrespond
to estimated averageGe,
Si or C concentrations of about 25%.
Note thatAl-implanted
pure Ge orAl-implanted
co-evaporated
AlGe films
produce higher
Tc
values thanGe-implant-ed Al. This could be due to
recoil-implanted
surfaceimpurities
(the
forward collision cross-section increasesfor
heavy
incoming ions) :
the increased concentra-tions of forexample,
0, N,
or Cin
theGe-implanted
sample
may reduce the maximumTc
value. It isquite
possible
that the observed value of 7.35 K is still below the maximum obtainable value for Al-Ge.Three results demonstrate the effect of lattice disorder on the
superconducting properties
of thesealloys :
(i)
a dose of1016
Siat.cm-2
wasimplanted
through
thehighest-Tc
Al-Sisample.
Thecorrespond-ing
change
in Si concentration wasnegligible,
but theimplantation produced -
10displacements
per atom in theimplanted
layer.
This had no effect onTc.
(ii)
The critical temperature of an Al-Sialloy
produced
at 6 K was studied after
annealing
atincreasing
temperatures
(Fig.
2).
No drastic variations werefound up to about 80
K,
butTc
fell to 3.3 K afterannealing
at room temperature.(iii)
The samesample
was thenSi-implanted
at 6 K :Tc
was found to increasesharply (Fig.
3)
until the average number ofdisplaced
atoms in theimplanted
layer
was about one.FIG. 2. - Effect of
annealing on the superconducting critical
temperature 7~ of an implanted Al-Si film. All transitions are less than 0.1 K wide.
FIG. 3. - Effect of low
temperature Si-implantation into Al-Si film. This film was produced by low-temperature implantation,
and then annealed at room-temperature. Note negligible composi-tion change : main effect is lattice disordering.
The first result is evidence that the Al-Si
alloy
produced
at 6 K is disordered. Since Al and Si(or Ge)
L-289 SUPERCONDUCTIVITY OF ALUMINIUM ALLOYS
samples
isexpected
to result insegregation and
crys-tallite
growth :
our second result suggests that such a process could takeplace
between 80 K and 300 K[15].
This is corroborated
by
the thirdresult,
since theonly
possible
effect of the low-dose Siimplantation
is to randomize the atomic distribution in the Al-Sialloy.
The effect of disorder was also witnessed in the
Al-Ge system. In several
experiments,
Al wasimplant-ed at 6 K into room-temperature
co-evaporated
Al-Ge films ofvarying composition.
Theimplanted
Al dose varied from 10 " to 1018 at . cm - 2 : in all cases,disordering
increased~
Lattice disorder is thus found to favour
high
7~-values
in Al-Si and Al-Ge.However,
asimple
interpretation
in terms of asoftening
of the Alphonon
spectrum is not
satisfying,
since thehighest
Tc-value
measured for theequally
disorderedAl-C,
Al-He andAl-0
implanted
systems[12]
isonly
4.2 K. Fromrecent
experiments
on
implanted
Ge-Cusuper-conducting alloys [18],
it wasconjectured that
super-conductivity
is due to aliquid-like
metallicphase
ofthe
semiconducting
component. Thissuggestion
was in line with the fact thatsuperconductivity
is obtainedon the Ge-rich side of the
Ge 1 _ x CuX
phase diagram
(the
highest
7~
was found around x ~0.3).
In ourexperiments,
however,
only
Al-richalloys (x > 0.75)
are
superconducting.
It is difficult toexplain
the difference between our results and those of[18]
ifsuperconductivity
isonly
due to Ge(or Si).
Alter-natively,
it isinteresting
to relate the appearance ofsuperconductivity
to the metal-insulator transition. This will be discussed for the Al-basedalloys
in aforthcoming
paper[14].
’
We wish to thank M. Salome for his
help
in theseexperiments.
The Rutherfordbackscattering
measure-ments were carried out at the
Groupe
dePhysique
desSolides de 1’Ecole Normale
Superieure
incollabora-tion with C. Cohen : it is a
pleasure
toacknowledge
hisenthusiastic support and
expertise.
We aregrateful
toB. Stritzker and H. Wiihl for a
preprint
of their paper.References [1] BUCKEL, W. and HILSCH, R., Z. Phys. 138 (1954) 109.
[2] ABELÈS, B. COHEN, R. W. and CULLEN, G. W., Phys. Rev. Lett. 17 (1966) 632.
[3] MEUNIER, F., HAUSER, J. J., BURGER, J. P., GUYON, E. and
HESSE, M., Phys. Lett. B 28 (1968) 37. [4] HAUSER, J. J., Phys. Rev. B 3 (1971) 1611.
[5] DEUTSCHER, G. and PASTERNAK, A., Phys. Rev. 10 (1974). [6]
MAC
MILLAN, W. L., Phys. Rev. 167 (1968) 331.[7]
GINSBURG, V. L., Usp. Fiz. Nauk 101 (1970) 185.[8]
ALLENDER,
D., BRAY, J. and BARDEEN, J., Phys. Rev. B 7 (1973) 1020.[9] ECONOMOU, E. N. and NGAI, K. L., Solid State Commun. 17
(1975) 1155.
[10] INKSON, J. C., ANDERSON, P. W., Phys. Rev. B 8 (1973) 4429.
[11] MEYER, O., Application of Ions Beams to Material, ed. G. Car-ter, J. S. Colligon and W. A. Grant, Institute of Physics Conference Series n° 28 (1975).
[12] LAMOISE, A. M., CHAUMONT, J., MEUNIER, F., BERNAS, H.,
J. Physique Lett. 36 (1975) L-271.
[13] LAMOISE, A. M., CHAUMONT, J., MEUNIER, F., BERNAS, H.,
J. Physique Lett. 36 (1975) L-305.
[14] MEUNIER, F., CHAUMONT, J., LAMOISE, A. M., COHEN, C. and
BERNAS, H., to be published.
[15] Although no information is available on the structure of the segregated phases, it is interesting to note that the Tc-values of the annealed samples are similar to those of quench-condensed films [16, 17].
[16] FONTAINE, A. and MEUNIER, F., Phys. Kond. Mat. 14 (1972)
119.