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Recent advances in molecular beam epitaxy of metallic multilayers and superlattices

F. Nguyen-Van-Dau, P. Etienne, J. Massies

To cite this version:

F. Nguyen-Van-Dau, P. Etienne, J. Massies. Recent advances in molecular beam epitaxy of metallic

multilayers and superlattices. Revue de Physique Appliquée, Société française de physique / EDP,

1990, 25 (10), pp.971-976. �10.1051/rphysap:019900025010097100�. �jpa-00246272�

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REVUE DE PHYSIQUE APPLIQUÉE

Revue Phys. Appl. 25 (1990) 971-976 OCTOBRE 1990, PAGE 971

Classification

Physics Abstracts

68.55201481.10B201473.40J

Recent advances in molecular beam epitaxy of metallic multilayers and superlattices

F. Nguyen-Van-Dau (1), P. Etienne (1) and J. Massies (2)

(1) Laboratoire Central de Recherches, Thomson C.S.F., Domaine de Corbeville, 91404 Orsay Cedex, France

(2) Laboratoire de Physique du Solide et Energie Solaire, CNRS Sophia Antipolis, Rue Bernard Gregory,

06560 Valbonne, France

(Received 10 May 1990, accepted 3 July 1990)

Résumé.

-

Dans cet article de revue, nous présentons quelques résultats récents obtenus en épitaxie par jets

moléculaires de multicouches et super-réseaux métalliques. Après une brève description de la physique de ces

structures multicouches, nous concentrons notre discussion sur les spécificités techniques de l’épitaxie par jets

moléculaires de métaux ; en particulier, nous discutons le problème de l’évaporation à haute température. En comparant les résultats de croissance obtenus sur les systèmes multicouches Ag/Fe et Fe/Cr, nous mettons en

évidence l’influence de la nature des métaux mis en jeux sur la qualité finale des super-réseaux.

Abstract.

-

We present a review of some recent results obtained in molecular beam epitaxial growth of

metallic multilayers and superlattices. After a brief description of the physics of these multilayer structures, we focused on specific developments of the metal M.B.E. technique including a discussion on high temperature evaporation. By comparing the growth characteristics of the Ag/Fe and Fe/Cr multilayer structures, we

emphasize on the influence of the nature of the metals involved in the superlattice structure on its overall

quality.

1. Introduction.

Metallic multilayers (M.M.) are thin films in which the composition is modulated by alternating depo-

sition of different metals. The term metallic is used to make a distinction with semiconductors mul-

tilayers. If the atomic planes of the M.M. structure are coherently stacked, one use to label the material

as a « superlattice » whereas if this additional order-

ing is absent, the term « multilayer » is used.

During the last few years, the study of M.M. have emerged as a very promising field from both funda- mental and technological point of view [1]. This is partly because owing to the development of sophisti-

cated thin film growth techniques such as Molecular

Beam Epitaxy (M.B.E.), it is now possible to produce high quality single-crystal metallic superlat-

tices of reasonably matched metallic materials.

Moreover, the specific development of metal

M.B.E. technique can be understood as a conse-

quence of the large area of potential applications

that offer the metallic multilayers, which leads this field to be an important industrial challenge.

In this brief review, we will describe some specific aspects concerning the M.B.E. growth of metallic multilayers. In section 2, we present the general background of the physics of these M.M. structures.

A large list of M.M. systems for several fields of

application can be found in reference [2]. In sec-

tion 3, we discuss some bulk properties of the

involved metals and their influence on the growth of

M.M. One consequence of this is the necessity, in

most cases, for high temperature evaporation. As far

as this is the origin of the main evolution of the metal M.B.E. technique as compared to standard M.B.E.,

we will describe in section 4 the various solutions that have been adopted. Finally, section 5 is devoted

to the growth of M.M., including nucleation prob- lems, growth modes and interface quality.

Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/rphysap:019900025010097100

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2. Physics of metallic multilayers. An overview.

The association of metals in thin multilayer struc-

tures is suitable for the study of physical properties

which depend on characteristic lengths. The basic parameters in superconductivity, such as the coher-

ence length or the transition temperature, can be strongly influenced by the variation of the thickness of the layers in a multilayer design [2-4]. However, it

should be noted that the total amount of people that

are currently working on metallic multilayers for superconducting applications have considerably de-

creased since the discovery, in 1987, of high-Tc superconductors.

Multilayers are also produced as X-ray [5] and

neutron mirrors [6]. Multilayers consisting of two

metals with a large difference in refractive index are

indeed of interest for tailoring specific optical properties. Such multilayers offer new opportunities

for fabricating X-ray optical elements. In this field of

optic applications, the quality of the interfaces is

obviously of crucial importance.

The interest of M.M. covers other fields such as

mechanical properties. In this context, one of the

most spectacular property is the so-called super- modulus effect which corresponds to a strong vari- ation of the Young’s modulus due to the multilayer arrangement. Such effect has been observed in

particular for Au/Ni, Cu/Pd, Ag/Pd and Cu/Au systems [7] where the Young’s modulus was found ton

be more than two times higher than in the corre-

sponding alloys [8].

The interest in the magnetic properties of mul- tilayers in which one of the material is magnetic in its

bulk form, concerns several effects. Here we choose to describe the two main ones, as far as they can lead

to important technological applications.

First of all there are interface effects depending on

the kind of material that is neighbouring the mag- netic layers. The main one is that the anisotropic

environment at the interface can strongly influence

the preferential direction of the magnetization in the magnetic layers. For example, in Ag/Fe superlat- tices, it has been found that, for thickness tFe of the individual Fe layer below 10 À, this interface ani- sotropy overcomes the dipolar effects, i.e. the so-

called demagnetizing field effect [9]. This strong uniaxial anisotropy induces, for tFe : 10 Á, a prefer-

ential direction for the magnetic moments perpen- dicular to the plane of the layers. This effect have

now been observed in several M.M. systems [10].

These multilayers with strong perpendicular ani- sotropy are of particular interest for application in high density magnetic recording.

Another source of interest is the long-range coup-

ling between neighbour magnetic layers across the non-magnetic ones. This can lead to various mag- netic superstructures in the material. For example,

an antiferromagnetic coupling have been found in

Gd/Y superlattices [ 11 while an helimagnetic coup-

ling was found in Dy/Y superlattices [12]. For these

Rare Earth systems, the coupling were ascribed to a R.K.K.Y.-type mechanism [13]. Interlayer couplings

have also be found in some transition metal mul-

tilayers [10], like for example an antiferromagnetic coupling in Fe/Cr multilayers [9, 14, 31].

3. Some general considérations about materials in- volved in metallic multilayer elaboration.

In table I, we present data concerning some typical

transition or Rare Earth metals that are used as

multilayers components. We first indicate the

evaporation temperature corresponding to a vapor pressure of 10-3 torr. Generally, this value allow to obtain a typical growth rate of 1 Â/s. It can be seen

from these data that, in most cases, one have to heat

at higher temperatures than the maximum required

with standard M.B.E. Knudsen cells (typically 1250 °C). In the next section, we will discuss the different technical solutions that have been adopted

to obtain sufficiently high fluxes of these refractory

materials.

Table I.

-

Data of interest in M.B.E. of some metals

involved in multilayers. Te is the evaporation tempera-

ture corresponding to a vapor pressure of 10- 3

torr [32].

In table I, we have also indicated the crystal

structure and lattice parameters of these metals, in

standard temperature and pressure conditions. These two informations, for both components of the mul- tilayer, will influence the choice of the substrate in terms of lattice matching. However, one have also to take into account the possible chemical reactivity

between the substrate and the overlayer metals,

which could lead to the necessity of growing a

suitable heteroepitaxial buffer layer between the substrate and the multilayer structure.

For example, Gd/Y and Dy/Y rare-earth superlat-

tices were grown by M.B.E. on (1120) A1203

substrates. It was found that Rare Earth oxides were

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incorporated during growth by chemical interactions of the Rare Earths with oxygen atoms supplied from sapphire. This difficulty was circumvented by insert- ing a (110) Nb chemical buffer layer which does not react with Rare Earths or with the sapphire sub-

strate [15].

In the field of transition and noble metal mul-

tilayers, GaAs have been the most extensively

studied substrate [16, 17]. The main reasons are the

relatively small lattice mismatches between GaAs and the overlayer metals (Fe, Cr, Ag, Au, ...), and

the fact that M.B.E. technique allows to prepare

highly perfect (001) GaAs surfaces. Moreover, an exciting challenge would be to combine magnetic multilayers and semiconductor structures in order to

integrate on the same semiconductor wafer elec- tronic and magnetic functions.

The choice of the substrate can be also influenced

by the purpose of stabilizing a metastable phase of

the metallic overlayer [18]. Indeed it is one of the most intriguing aspects of epitaxial growth. For example Maurer et al. have succeeded in the growth

of Fe/Ru superlattices in which the Fe crystallizes in

an h.c.p. structure, provided that the Fe layer

thicknesses does not exceed 12 Á [19]. These struc- tures are of great interest since the magnetic proper-

ties of iron are predicted to change dramatically

upon changing the crystal structure and interatomic distances.

4. Specificity of the métal M.B.E. technique.

In metal M.B.E., the importance of ultra-high

vacuum environment is not so crucial as in III-V M.B.E. technique, where one must control the

purity of the grown sample on a low dopant level

scale. However, when evaporating metals such as Fe

or Cr, an improvement of the pressure is found,

which is due to a strong gettering effect. For this

reason, the pressure during growth is often as low or

even lower than the base pressure of the system (typically 10-1° torr).

We now proceed with the problem of high tem- perature evaporation. Three different types of sol- utions have been adopted to solve it. First of all, it

should be noted that standard Knudsen cells with

pyrolytic boron nitride crucibles can reach a maxi-

mum temperature of - 1 250 °C. Above, it is well known that significant decomposition of the crucible

occurs. In spite of these considerations, several

groups have used such cells to evaporate iron [16],

thus being limited in the obtainable flux and growth

rate.

Up to now, in most cases, people have used

electron beam guns to evaporate the refractory

metals. Then it was necessary to build specially designed M.B.E. systems in order to incorporate the

e-beam evaporation technique [15]. Basically, the

electron beam guns consist of an open crucible, the

electron beam being directly focused on the source

material by a magnetic field. An advantage of the e-

beam technique is that it allows to evaporate almost

any kind of material. One disadvantage of this technique is that there is no way of controlling the temperature of the source material. Thus it is necessary to couple this technique with an accurate deposition control and shutter monitoring ; generally quartz monitors are used for this purpose but a more

sophisticated technique based on optical emission

have also been developed [15].

We have developed a third solution which is a

combination of the two other ones in the sense that it is a Knudsen cell where heating is achieved using

electronic bombardment of a metallic crucible [20, 21]. A scheme of this « high temperature » cell is represented in figure 1.

Fig. 1.

-

Scheme of a high temperature cell heated by

electron bombardment for metal M.B.E. growth.

5. Growth of metallic multilayers.

A number of recent experimental studies have shown that molecular beam epitaxy is able to produce high quality single-crystal metallic mul- tilayer structures [15, 16, 19, 22]. However, the structural perfection of the multilayered films is obviously critically dependent on the nature of the

materials involved in the structures. In particular,

the development of superlattices with sharp inter-

faces depends on the interplay of thermodynamics

and kinetic processes which govern both the inter- facial diffusion and the growth mode of the con-

sidered materials. One of the main difficulties of

growing highly perfect multilayers arises from the

fact that each material acts alternatively as the

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974

deposit and the substrate, situations which are not in

general energetically equivalent and depend on their

basic thermodynamical properties (in particular the

difference between their surface free energies [23]).

In order to impose a favorable growth situation (i.e.

not too far from the ideal layer by layer growth mode) while preserving the single-crystal nature of

the multilayer, the experimenter action will be then to select growth parameters giving rise to a suitable

balance of kinetic and thermodynamic effects. It is still more difficult to overcome problems due to

strain effects arising from the lattice parameter difference between the materials involved in the

superlattice. This point severely limits the number of metal pairs which can be sucessfully used to build a high quality superlattice structure on a given sub-

strate. It remains from these basic considerations that it is in general not easy to grow highly perfect single-crystal metallic superlattices even by using a powerful technique such as M.B.E.

The aim of this section is to briefly illustrate the influence of the nature of the metals involved in the

superlattice structure on its overall quality, by com- paring the M.B.E. growth of two typical systems : Ag/Fe and Fe/Cr on (001) GaAs substrate.

5.1 Ag/Fe SUPERLATTICES.

-

The Ag/Fe system is

a typical example of systems for which superlattices

with high interfacial quality can be grown on (001)

GaAs providing that the critical steps controlling the growth process are correctly taken into account. The first important step before growing any metal struc-

ture on top of a (001) GaAs substrate is to grow an

homoepitaxial GaAs buffer layer in order to improve

the smoothness of the substrate surface. This is because the details of the nucleation of the very first metal atoms impinging the surface are critically dependent of the defects present on the surface. The

development of a smooth and well ordered surface is therefore necessary to correctly initiate the first

metal layer growth. Moreover, beyond the first few

deposited monolayers, the quality of the starting

surface influences the overall structural quality of

the multilayer. The GaAs homoepitaxial buffer layer is grown in standard M.B.E. growth con-

ditions [24]. When obtaining a smooth reconstructed

(001) GaAs surface, a subsequent step which has been proven effective in growing high quality super- lattices [16] is the growth of a metal buffer layer. In

the case of Ag/Fe superlattices, this step is mainly performed in order to relax the strain associated with the lattice mismatch between (001) Ag or (001)

Fe and (001) GaAs (2.2 % and 1.4 % respectively).

However, with the aim of studying the magnetic properties of the final superlattice structure, a thick buffer layer of Fe is clearly undesirable. On the other hand, the growth of a Ag single-crystal buffer layer on (001) GaAs is somewhat difficult because

Fig. 2.

-

RHEED oscillations recorded during the growth of (001) Ag at various growth temperatures (see text).

two different epitaxial relationships exist leading to (001) or (001) Ag orientations [25, 26]. This problem

is a consequence of the strong anisotropy of the (001) GaAs surface [22] and can be overcome by

first depositing a thin layer of Fe, which only presents the (001) orientation, before growing the Ag layer [27]. On top of this Fe nucleation layer, the growth of (001) Ag in the 200-400 K range occurs

following a two dimensional (2D) layer by layer growth mode as indicated by the observation of reflection high energy electron diffraction (RHEED) intensity oscillations when the growth is reinitiated after roughly 20-50 Á have been deposited (Fig. 2) [22]. However, in the same temperature

range, no RHEED intensity oscillation is observed neither for the growth of (001) Fe on (001) GaAs nor

on (001) Ag. This is presumably due to the difference in surface diffusion coefficients of the two metals.

According to Flynn [28], the lower limit of the

growth temperature below which the roughening of

the growth front occurs is related to the melting temperature of the metal, as the surface diffusion coefficient is. Considering that the melting tempera-

ture of Fe is more than 500 K above the Ag one, it

can be inferred that in the 200-400 K range the surface diffusion of Fe atoms is insufficient to give a

smooth growth front. However, the growth tempera-

ture cannot be significantly increased without pro-

voking strong interfacial diffusion which severely degrades the superlattice structure. Nevertheless,

even for the low temperature range imposed by

interdiffusion effects, the RHEED pattern obser-

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Fig. 3.

-

X-ray diffraction pattern around the (002) Ag peak of a [Ag(34 Â)/Fe(14 Á)h7 supperlattice grown on

(001) GaAs (from Ref. [30]).

vation during the growth of a Ag/Fe superlattice

indicates that the growth is not too far from the ideal

layer by layer mode. This is confirmed by X-rays

diffraction analysis performed on those superlatices.

Figure 3 shows a spectrum obtained in the 0-2 0 geometry on a Ag (34 Â)/Fe (14 À) superlattice [30]. Several satellites are observed around and between the (002) reflection of Ag and Fe, which is,

in first approximation, a signature of the interface

quality. Indeed, interfaces act on the satellite peaks

intensities as an effective Debye-Waller factor ; so

we can only observe a large number of satellite

peaks if the interfaces are sufficiently sharp. It seems

therefore that the two types of interfaces in the

Ag/Fe superlattices are abrupt. In all the spectra, the intensity of the (004) GaAs peak is small because there is no coincidence between thé (001) axes of Ag, Fe and GaAs. This point has been studied in details by Farrow et al. [27] and has been ascribed to a coherency strain and tilted epitaxy of the superlat-

tice.

5.2 Fe/Cr MULTILAYERS. - Recently, it has been shown that Fe/Cr multilayers can also be grown on

(001) GaAs [17]. Furthermore, these multilayers exhibit, for sufficiently thin Cr layers (typically

below 30 Á) very exciting giant magnetoresistance properties [20, 21, 28]. This new effect, which suggests interesting potential applications in the field of sensors, have been ascribed to spin-dependent

transmission of the conduction electrons between Fe

layers through Cr layers [28]. However, the structur- al quality of Fe/Cr multilayers is far from being as good as the one usually achieved in the Ag/Fe system. Actually, the problem is that, even if the

first growth periods of the superlattice exhibit

RHEED patterns characteristic of sharp interfaces

and a fairly good single crystal growth, a slight but

continuous degradation occurs when the growth proceeds, and become clearly observable above

roughly 300 Â of deposition. It is in fact almost

impossible to grow superlattices beyond 1 500 À

while keeping the single-crystal nature of the struc-

ture. These superlattices were obtained by growing

first a thin Fe layer on (001) GaAs, as it is usually

done in order to impose a (001) orientation for the entire structure [17]. If Cr is first grown on (001) GaAs, it takes a (112) orientation. Cr/Fe multilayers

have been grown following this orientation with the aim of comparing their structural properties to those

of (001) oriented structures. No clear improvement

was observed.

.

As a first attempt to improve the cristallinity, a

thick (relaxed) Ino.2sGao.72As buffer layer has

been used in order to reduce the strain between GaAs and the superlattice, the lattice parameter of this alloy being identical to that of two unit cells of bcc Fe [29]. No significant improvement has been

found. Similar results are also obtained when a 500 Â thick (001) Ag buffer layer is used. Up to

now, the only parameter which has been proven effective in controlling the structural quality of the Fe/Cr multilayers is the growth temperature. After a superlattice growth of 1 200 Â (20 periods), the Fe

RHEED pattern, as well as the Cr one, markedly depends on the growth temperature : below roughly

300 K rings are formed indicating a rather polycrys-

talline growth, while around 350 K the single crystal growth is still prevalent [30]. However, above 400 K

facetting effects occur indicating that the growth is becoming largely three dimensional.

Conclusion.

In conclusion, this brief review of recent results in the M.B.E. growth of metallic multilayers shows

that the development of specially designed systems

opens now the possibility of fabricating high quality single-crystal metallic superlattices. In most cases,

this is only possible while controlling a high tempera-

ture evaporation technique for refractory materials.

Concerning the growth of these multilayers, one

have to keep in mind the two following features that

are quite specific to metals, as compared with

semiconductor compound technology. First, the growth temperature is generally much lower, typi- cally between room temperature and 200 °C. Conse- quently, the growth rates should also be lower, typically around 0.1 t-tm/h. The structural properties

of the final structure mainly depend on the nature of

the metals involved, and not only on their lattice parameters. In each case, one have to optimize the growth parameters in order to develop sufficiently

well defined multilayer structures for the analysis of

their physical properties as well as for device appli-

cations.

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976

Acknowledgements.

The authors would like to thank Dr. G. Creuzet and Dr. J. P. Hirtz for helpful discussions and critical

reading of the manuscript. Dr. A. Friederich and Prof. A. Fert are also gratefully acknowledged for

constant support and interest.

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