• Aucun résultat trouvé

Test Structure for Ic(Vbe) Parameter Determination of Low Voltage Applications

N/A
N/A
Info
Télécharger
Protected

Academic year: 2021

Partager "Test Structure for Ic(Vbe) Parameter Determination of Low Voltage Applications"

Copied!
7
0
0

Chargement.... (Voir le texte intégral maintenant)

Texte intégral

Figure

Fig. 1. Illustration of the different modelling of the temperature variation of the Si energy band gap.
Fig. 3. Schematic of the programmable configuration test cell implemented in a bandgap circuit core.
Fig. 5. Complete set of I C (V BE ) characteristic for a BJT in the temperature range of –50°C to 125°C, measured by a
Table 1. Comparison of uncertainties in the temperature values obtained from the sensor and that computed from
+2

Références

Télécharger maintenant ( PDF - 7 Page - 311.84 KB )

Documents relatifs