• Aucun résultat trouvé

Editorial to the Special Issue of Rapid System Prototyping'10

N/A
N/A
Protected

Academic year: 2021

Partager "Editorial to the Special Issue of Rapid System Prototyping'10"

Copied!
2
0
0

Texte intégral

(1)

This is an author-deposited version published in:

http://oatao.univ-toulouse.fr/

Eprints ID: 6522

To cite this version: Kent, Kenneth and Hugues, Jérôme Editorial to the

Special Issue of Rapid System Prototyping'10. Software: Practice and

Experience, volume 42, n° 7, p. 779. (2012).

O

pen

A

rchive

T

oulouse

A

rchive

O

uverte (

OATAO

)

OATAO is an open access repository that collects the work of Toulouse researchers and

makes it freely available over the web where possible.

Any correspondence concerning this service should be sent to the repository

administrator: staff-oatao@inp-toulouse.fr

(2)

Editorial to the Special Issue of Rapid System Prototyping’10

The IEEE International Symposium on Rapid System Prototyping explores trends in rapid proto-typing of computer-based systems. Its scope ranges from embedded system design, formal methods for the verification of systems, engineering methods, process and tool chains to case studies of actual software and hardware systems. It aims to bring together researchers from the hardware and software communities to share their experiences and to foster collaboration of new and innovative science and technology.

Since its inception, the series of Workshop on Rapid System Prototyping evolved as a full-fledged symposium for its 19th occurrence. The symposium is an international forum for the cross-fertilization of ideas about the prototyping of complex systems, from both the hardware and software domains. Rapid system prototyping typically encompasses theoretical and practical methodologies, resolving technologies of specification, completeness, dynamics of change, technology insertion, complexity, integration, and time to market.

This special issue from selected papers of the 2010 venue of the symposium reflects this vision. The selected papers encompass the variety of challenges for the design and implementation of embedded systems: model-based design of systems by Forward et al. and of safe and secure systems by Delange et al. and Hillenbrand et al., model checking techniques by Drusinsky et al., challenges in multicore and many core systems by Lafi et al. and Bouchebaba et al., and virtualization techniques by Aguiar et al.

As guest editors, we would like to thank all the authors of this special issue for contributing the high quality papers. We would also like to thank the reviewers who have critically evaluated the papers. Finally, we hope the readers will enjoy the content and find this special issue very useful for their own work.

KENNETHB. KENT

University of New Brunswick, Canada

JÉRÔMEHUGUES

Références

Documents relatifs

This special issue contains improved and extended versions of selected papers from the 19th International Workshop on Formal Methods for Industrial

The topics covered in this special issue are the following: Domain Specific Languages, Component-based Systems and Architectures, Learning Finite State Machines, Construction

Abstract This special issue is dedicated to the presentation of novel results in the scope of formal methods for the verification and testing of software.. The papers included in

The original phrase: “The exascale definition limited to machines capable of a rate of 1018 flops is of interest to only few scienti fic domains.”. Must be corrected by:

3.1 The route model in the AAM process The PREESM rapid prototyping tool maps and schedules statically an algorithm onto an architecture.. The PREESM mapper/scheduler evaluates

In [NT12] we introduced the static software analysis tool MEMICS, which is able to detect race conditions as well as common runtime errors in C/C++ source code.. Common static

Guest Editorial: Special Issue of ACM TECS on the ACM-IEEE International Conference on Formal Methods and Models for System Design (MEM- OCODE 2017)... A Guest Editorial: Special

Next, we share our experience with the application of those techniques that seem to be mature enough to be used in an industrial context: Static analysis based on