diffraction X sous incidence
Multireflection grazing-incidence X-ray diffraction: A new approach to experimental data analysis
... The multireflection grazing-incidence X-ray diffraction method is used to test surface stresses at depths of several micrometres in the case of metal samples. This work presents new ways of analysing ...
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Step interactions on Pt(111) vicinal surfaces determined by grazing incidence x-ray diffraction: influence of the step orientation
... direction, such surfaces have been used as nucleation centers for the guided growth of metallic nanowires [1,2,3]. The specific properties of Pt steps have also been enlightened in numerous catalysis studies [4,5,6]. ...
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Multireflection grazing incidence diffraction used for stress measurementsin surface layers
... grazing incidence X-ray diffraction (named the MGIXD method) was applied to mea- sure the gradient of residual stresses in surface layers [1 –3] ...non-symmetrical diffraction, with small ...
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New reactor dedicated to in operando studies of model catalysts by means of surface x-ray diffraction and grazing incidence small angle x-ray scattering
... surface x-ray diffraction 共SXRD兲 and grazing incidence small angle x-ray ...The x-ray reactor chamber was designed for both ultrahigh-vacuum 共UHV兲 and reactive gas ...electron ...
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Diffraction électromagnétique par des surfaces rugueuses en incidence rasante : application à la surface de la mer
... Le pr´esent manuscrit en rend compte, et se compose de trois parties. Une m´ethode de calcul rigoureux de la diffraction d’ondes ´electromagn´etiques par des surfaces rugueuses comme la surface oc´eanique est tout ...
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Determination of residual stresses in coating by pseudo-grazing incidence X-Ray diffraction method
... Incident X-Ray Diffraction (Pseudo-GIXRD) method for experimental stress analysis, noticed sin 2 ψ*, was developed to analyze the residual stress (RS) gradient in ...(the incidence angle, the tilt ...
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X-ray reflectivity, diffraction and grazing incidence small angle X-ray scattering as complementary methods in the microstructural study of sol–gel zirconia thin films
... appropriated to accurately recover the parameters of prime importance we are interesting in which are the zirconia nanocrystals size and spatial arrangement. The comprehension of the thin film formation and its thermal ...
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MIROIRS ATOMIQUES : DIFFRACTION EN INCIDENCE RASANTE ET RUGOSITE D'UN MIROIR MAGNETIQUE
... Annexe E Article paru en 1998 diraction en incidence rasante "Atomic interference in grazing incidence diraction from an evanescent wave mirror", Phys.Rev.Lett... Article paru en 1998 di[r] ...
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Etude de la formation et de la surfusion de gouttelettes eutectiques AuSi sur substrats de Si par diffraction de rayons X synchrotron en incidence rasante.
... The complexity of the present work therefore lies in the study of a metal-SC eutectic liquid (mostly AuSi) in interaction with its respective SC solid substrate (Si), under the form of nanometric droplets. Therefore, it ...
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Morphological Component Analysis for the Inpainting of Grazing Incidence X-Ray Diffraction Images Used for the Structural Characterization of Thin Films
... rayons X en incidence rasante utilisés pour la caractérisation structurale des couches minces — La di ffraction des rayons X en incidence rasante (GIXD) est une technique de caractéri- sation ...
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Diffraction by a metal plate lens for arbitrary incidence and polarization
... L’accès à ce site Web et l’utilisation de son contenu sont assujettis aux conditions présentées dans le site LISEZ CES CONDITIONS ATTENTIVEMENT AVANT D’UTILISER CE SITE WEB. NRC Publicat[r] ...
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Grazing Incidence X-ray Diffraction investigation of strains in silicon nanowires obtained by gold catalytic growth
... (b)). For long wires (L), Figure 4 (c) shows similar behaviour with the increase of the (Sub) intensity versus the increase of i . As the nanowires are long, the intensity of (SiNW) increases with i . For i > ...
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Diffraction des ondes électromagnétiques par des surfaces rugueuses en incidence rasante.
... GOSSA sous-estime l’intensité diffractée par rapport aux données de Nathanson pour des angles d’incidence supérieurs à 60˚, cette différence étant beaucoup plus importante en bande X qu’en bande ...
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Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction
... Similarly to the ground sample, it was found that stacking faults taken into account in the stress analysis do not significantly change the stress values determined using the XSFs calcul[r] ...
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MOSFETs contraints sur SOI : analyse des déformations par diffraction des rayons X et étude des propriétés électriques
... CONCLUSION Dans cette thèse, nous avons pu vérifier que l’augmentation des performances des transistors MOSFETs pouvait être obtenue grâce à l’incorporation d’une contrainte mécanique dans le canal de transistors sur ...
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Characterization of polycrystalline materials by X-ray diffraction contrast tomography
... OF X-RAY DIFFRACTION CONTRAST TOMOGRAPHY X-ray diffraction contrast tomography (DCT) (Ludwig 2008, Johnson 2008, Ludwig 2009a) is a va- riant of the previously introduced 3DXRD technique ...
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Restauration en diffraction de rayon X en dispersion d'énergie
... avec un pic de diffraction. La partie continue des données a été correctement ajustée par le terme de “fond” g. 4 Conclusion Nous avons présenté dans ce papier une méthode maximum a posteriori permettant de ...
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Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging
... coherent X-ray diffraction is demonstrated on a twinned Au crystal, which was prepared by the solid-state dewetting of a 30 nm thin gold film on a sapphire ...incident X-ray beam and recording the ...
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Amélioration et automatisation des étapes de préparation des cristaux de protéines à la diffraction aux rayons X
... situ X-ray diffraction analysis has become a valid option for these operations and a growing number of users apply it for crystal screening and also to solve ...
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An analysis of a continuum X-ray Diffraction/Fluorescence instrument
... In addition, being able to identify larger d-spacings (smaller angle diffraction) and higher energy fluorescence would improve the instrument's ability to definitively iden[r] ...
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