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The 'Fast' and 'Slow' Light Induced Defects in Diluted and Undiluted Hydrogenated Amorphous Silicon Solar Cells and Materials

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HAL Id: hal-02113506

https://hal.archives-ouvertes.fr/hal-02113506

Submitted on 28 Apr 2019

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and Undiluted Hydrogenated Amorphous Silicon Solar Cells and Materials

Joshua Pearce, R Koval, X. Niu, S May, R Collins, C Wronski

To cite this version:

Joshua Pearce, R Koval, X. Niu, S May, R Collins, et al.. The ’Fast’ and ’Slow’ Light Induced Defects

in Diluted and Undiluted Hydrogenated Amorphous Silicon Solar Cells and Materials. 17th European

Photovoltaic Solar Energy Conference Proceedings, 3, pp.2842 - 2845, 2002. �hal-02113506�

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THE ‘FAST’ AND ‘SLOW’ LIGHT INDUCED DEFECTS IN DILUTED AND UNDILUTED HYDROGENATED AMORPHOUS SILICON SOLAR CELLS AND MATERIALS

J. M. Pearce, R. J. Koval, X. Niu, S. J. May, R.W. Collins, and C. R. Wronski*

Center for Thin Film Devices, 121Electrical Engineering East The Pennsylvania State University, University Park, PA 16802

* tel: (814) 865-0930 fax:(814) 865-6581 email:[email protected]

ABSTRACT: Studies have been carried out on a-Si:H p-i-n solar cells and corresponding i-layer films fabricated with and without hydrogen dilution for kinetics with high intensity and 1 sun illuminations. The results show a striking similarity between the kinetics in the fill factors (FF) of the p-i-n solar cells and the mobility lifetime (µτ) products of the corresponding i layer films. New results are presented on thermal annealing after 10 sun degradation which further substantiate the presence of fast and slow defects in the light induced changes of a-Si:H materials, as do the degradation kinetics of both cells and films under 1 sun illumination to their degraded steady states (DSS). Initial (fast) and subsequent (slow) regimes approaching DSS are present at temperatures between 25°C and 100°C, with the two regimes having distinctly different dependences on temperature. The DSS in the films and cells improve monotonically with temperature whereas the initial regimes show a clear reversal in their temperature dependence between 40°C and 50°C. The inability to express these results of 1 sun kinetics with rate equations containing only single time constants for creation and annealing provides further evidence that more than one defect is responsible for light induced degradation in a-Si:H materials and solar cells.

Keywords: a-Si - 1: Defects - 2: Stability -3

1. INTRODUCTION

There is a large effort addressing the physical nature of light induced defects in hydrogenated amorphous silicon (a- Si:H) based solar cells in order to increase their stability.

Convincing evidence has been obtained with solar cells on multi-step light soaking and annealing studies for the presence of more than one type of light induced defect, which exhibit significantly different kinetics for creation and annealing [1,2,3]. It is found in these studies that the kinetics can only be fit with a multi-component model where each defect follows an individual rate equation so that not only the total defect density but also its distribution among components would change during the kinetic process. It was further found that the same changes in overall solar cell efficiencies that are obtained with different illumination intensities result in different distributions of the component defects. With high intensity illumination more of what is termed “fast” defects are formed relative to “slow” defects, where these fast defects are not only created more rapidly during illumination but also anneal out faster [4]. These results are counter to the prediction obtained for the single defect models, which are expressed in terms of a single rate equation. Such models, where it is assumed that only the total defect density determines the state of the material, have been extensively applied to results from studies on thin films. Because of the long times needed to obtain 1 sun degraded steady states (DSS) the majority of the studies on thin film materials were carried out with high light intensities, up to 50 suns, whereas for technological reasons most of the studies on cells are carried out with illuminations of 1 sun. Being that the ratio of fast to slow defects decrease with illumination, the subtle effects of the former become much more difficult to identify with 1 sun illumination. Nevertheless, such defects clearly manifest themselves in the large difference between the cells and materials fabricated with and without

hydrogen dilution of silane [2,3,5,6]. Materials and the cells fabricated with hydrogen dilution exhibit higher stability than those deposited without hydrogen dilution, as well as exhibiting a distinct difference in the kinetics of degradation. For solar cells the time to reach DSS under 1 sun operating conditions decreases from ~1000 hours to

~100 hours, with similar results being obtained for corresponding thin films. The thin films and solar cells fabricated with hydrogen dilution allow detailed studies of kinetics to a DSS to be carried out in reasonable times under 1 sun illumination. However, the smaller relative densities of fast to slow defects make it more difficult to isolate their individual effects than in the case of high illumination intensities. In the work reported here, not only are the fast and slow states further identified in the annealing out of defects after high intensity illumination, but also from their contributions to the 1 sun light induced changes in p-i-n solar cells and their corresponding i layer films for both undiluted and diluted, protocrystalline [7]

Si:H materials. The results presented here also allow direct correlations to be made between solar cells and films of corresponding layers, a lack of which has been extensively reported [8,9].

2. EXPERIMENTAL

Studies were carried out on p-a-SiC:H/ i-a-Si:H/ n-µc- Si:H solar cells and the corresponding 1µm thick intrinsic films, deposited under previously reported conditions [10].

The intrinsic materials were deposited with hydrogen to silane dilution ratios of R=[H2/SiH4] =10 and R=0. The light I-V’s of the solar cells were measured at 25°C under 1 sun illumination with an Oriel Solar simulator. The measurements of the µτ products and subgap absorption α(E), determined using dual beam photoconductivity,

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transmission and reflection measurements, and following normalization procedures reported previously [11], were also measured at 25°C. A reproducible annealed state for the cells and films was obtained by annealing them at 170°C for 4 hours prior to degradation with 1 sun illumination from either a solar simulator or ELH lamps with IR filters or with high intensity illumination from a xenon lamp with an IR filter. The temperatures for the degradation and annealing were reproducibly obtained within +/-1°C using a TE Technologies Inc. 1600 temperature controller and confirmed with a surface thermocouple.

3. RESULTS AND DISCUSSION 3.1 High Intensity Illumination

Degradation and annealing under 60 sun illumination carried out at 50°C on R=10 and R=0 p-i-n solar cells exhibited characteristics very similar to those reported by Yang and Chen [3]. Under 1 sun illumination the fill factors (FF) recovered to their 1 sun degraded steady state values in the reported time frames with the recovery in the R=0 cell exhibiting the overshoot or “hump” found in the undiluted cells. Direct correlations between the R=10 cells and their corresponding i layers were obtained for the annealing at 50°C from the 10 sun degraded states not only under 1 sun illumination but also in the dark. The results obtained for a cell with an i-layer thickness of 700nm and the corresponding thin film are shown in Fig. 1. Fig. 1 is a plot of the recoveries in the FF (RHS) and µτ (LHS), measured for a carrier generation rate (G=1019 cm-3), obtained with and without 1 sun illumination. The results in Figure 1 not only illustrate the effects of “light annealing”

but also a striking similarity between the kinetics present in the solar cell and the corresponding i-layer thin film. It can be pointed out here that no such similarity exists when the DSS and annealing kinetics of the thin film materials are characterized, as is generally done, by subgap absorption at energies of 1.2eV or the densities of dangling bond defects.

The similarity between FF and µτ is present not only in the case with 1 sun illumination but also in the dark, where the kinetics undergo a transition after ~4000 minutes which is schematically represented by the dashed lines in Fig. 1.

These results on the thermal annealing in both cells and film materials provide striking new evidence for the presence of more than one type of light induced defect even in the materials prepared with hydrogen dilution. Since the kinetics with 1 sun illumination do not exhibit the distinctive transitions, such as found with undiluted materials, it is difficult to identify the relative contributions of the “fast” and “slow” defect states even though the results can not be fit with a single rate equation. However, the results for the thermal annealing presented here, not only further confirm the presence of these different states but also that the defects that are created faster also anneal out more rapidly.

3.2 1 Sun Illumination

Previous studies on these solar cells having i-layers prepared with R=0 and R=10 and corresponding thin film materials have indicated that the kinetics of their light induced changes under 1 sun illumination [12] could not be

Annealing Time (Mintues)

0 2000 4000 6000 8000 10000

µτ (cm2/V)

1.6e-7 1.8e-7 2.0e-7 2.2e-7 2.4e-7 2.6e-7 2.8e-7 3.0e-7 3.2e-7 3.4e-7 3.6e-7

Fill Factor

0.51 0.52 0.53 0.54 0.55 0.56 0.57 0.58 0.59

Light High G µτ Dark High G µτ Light FF Dark FF

Figure 1: Annealing kinetics of R=10 film (µτ measured with G=1019 cm-3) and solar cell (FF) from 10 sun degraded steady state in both the light and dark at 50°C.

fit with a single rate equation. In these kinetics two regimes could be identified; the first corresponding to initial (fast) light induced changes and the other corresponding to the changes approaching the degraded steady state (slow). It was also found that for the high quality R=0 a-Si:H films and cells studied here significant changes in the kinetics are present at temperatures well below 100°C. This is unlike the undiluted a-Si:H materials that have been extensively studied above 100°C. In the studies here at temperatures between 25°C and 100°C, the contributions of the rapid thermal annealing that occurs at these “high” temperatures has been greatly reduced. In addition, the sensitivity allows direct, systematic comparisons to be made between the kinetics of R=0 and R=10 intrinsic materials and cells which require distinctly different times to reach DSS. The differences and similarities between a-Si:H p-i-n cells fabricated with and without hydrogen dilution are illustrated in Fig. 2 (a) and (b). Fig. 2(a) shows the light induced changes in the FF of a cell with an R=0 i-layer 400nm thick under 1 sun illumination at 25, 50, and 75°C.

Fig. 2(b) shows the corresponding results on a cell with an R=10 i-layer 700nm thick at 25, 50, and 75°C. In both these cells the fill factors are limited by the bulk i-layers [10] and the high quality of the R=0 a-Si:H is reflected by the FF of 0.72 in the annealed state. The kinetics and their temperature dependence of the R=10 p-i-n cell are similar to those reported for Schottky barrier cells with R=10 i- layers [6].

The two regimes previously identified can be seen in both Fig. 2 (a) and (b) as well as the significantly longer times required for the R=0 cell to reach the DSS, particularly at 25°C where the second regime sets in only after several hundred hours of 1 sun illumination. There are also large and monotonic improvements in the DSS with temperature in both cells, which are a clear indication of significant annealing effects, even at these relatively low temperatures. These systematic improvements in DSS can be explained by the commonly proposed models consisting of a single type of defect where the densities in the DSS decrease with temperature due to a balance between their rate of creation and thermal annealing [13]. However, this is quite inconsistent with results of subgap absorption, α(E), which is generally used to measure the densities of light induced states. This is illustrated in Table I where the

10 sun DSS

1 sun DSS

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1 Sun Illumination Time (Hours)

0.1 1 10 100 1000

Fill Factor

0.52 0.54 0.56 0.58 0.60 0.62 0.64 0.66 0.68 0.70 0.72

25oC 50oC 75oC

Figure 2a: Degradation kinetics of p-i-n solar cell with a 400nm thick R=0 i layer under 1 sun illumination at 25°C, 50°C, and 75°C.

1 Sun Illumination Time (Hours)

0.01 0.1 1 10 100

Fill Factor

0.56 0.58 0.60 0.62 0.64

25oC 50oC 75oC

Figure 2b: Degradation kinetics of p-i-n solar cell with a 700nm thick R=10 i layer under 1 sun illumination at 25°C, 50°C, and 75°C.

Table I: The values of fill factors (FF) in the DSS for p-i-n solar cells with 700nm R=10 and 400nm R=0 bulk i-layers respectively; and the subgap absorption at 1.2eV (α(1.2)) of the corresponding 1µm R=10 and R=0 films after 100 hours of 1 sun illumination at 25°C, 50°C and 75°C.

values of the fill factors and α(1.2), measured with DBP, are listed for the degraded steady states obtained at different temperatures. It can be seen that, unlike the striking similarity between the FF and µτ characteristics previously reported, there is no correlation between the values of FF (and µτ) with those of α(1.2). Such results are inconsistent with creation and annealing of a single type of defect [14,15]. They are however, entirely consistent with the presence of multiple light induced defects where the degraded steady state is determined not only by the total density of these states but also by their relative distributions [1].

That the creation of distinctly different light induced defects occurs under 1 sun illumination is clearly identified by the temperature dependence of the kinetics in Fig. 2, as well as those of the corresponding µτ’s of the thin film i layers. The results for the R=10 i layer film are shown in Fig. 3 at 25, 50, and 100°C. It can be seen in both figures that the initial rates of degradation are not only faster at 50, 75, and 100°C than 25°C but also their changes with temperature are not monotonic as indicated by the arrows in Figs. 2 and 3. (In Fig. 3 the results at 75°C have been excluded for clarity but their initial kinetics fall between those at 50 and 100°C.) As the temperature is increased from 25 to 50°C the µτ and FF degrade at a faster rate, which can be explained by an increase in the ratio of fast defects to slow defects and a probable faster rate of creation in the total number of defects [1]. However, it should be noted, that it is not possible to directly relate defect densities to changes in FF and µτ since the carrier capture cross sections associated with the fast and slow states have as yet not been reliably established. When the temperature is increased from 50 to 75°C the ratio of fast to the slow states now decreases as both the µτ and FF degrade less rapidly. Since the carrier capture cross sections are not expected to change with temperature this leads to the conclusion that as the temperature increases from 50 to

1 Sun Illumination Time (Hours)

0.1 1 10 100

µτ [cm2/V]

2.0e-7 4.0e-7 6.0e-7 8.0e-7 1.0e-6 1.2e-6 1.4e-6

25oC 50oC 100oC

Figure 3: Degradation kinetics of the mobility lifetime products, µτ (measured with G=1019 cm-3), for a 1µm thick R=10 intrinsic film under 1 sun illumination at 25°C, 50°C, and 100°C.

Degradation Temperature

R=10 R=0

FF α(1.2) FF α(1.2)

25°C 0.56 0.88 0.55 1.01

50°C 0.59 0.85 0.58 0.90

75°C 0.60 0.76 0.62 0.77

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75°C the net accumulation (i.e. creation minus annealing) of one of the defects begins to dominate the kinetics of both µτ and FF. It can also be pointed out here that such turnaround in the kinetics has been observed in the degradation kinetics under high intensity illumination at temperatures between 100°C and 190°C [16]. That the kinetics in Fig. 3 are inconsistent with the creation and annealing of just one type of defect is also reflected in the inability to be fit by rate equations containing only a single term for creation and a single term for the annealing of defects. The fit to such rate equations are the poorest at 25°C but improve as the temperature increases and the creation of one type of defect begins to dominate. At 100°C a reasonable fit can be obtained for the changes in µτ with a rate equation containing a single time constant for creation and one for annealing. It should be noted, that at the temperatures studied here the µτ kinetics can be fit with a rate equation containing creation and annealing terms associated with distinctly different defects.

The above results not only provide strong additional evidence for the fast and slow defects created under 1 sun illumination but also for their different rates of annealing.

They are in agreement with the results obtained in solar cell studies with high intensities of illumination which show that for temperatures of 50°C and higher the defects that were created faster also anneal out faster [1].

4. CONCLUSION

The studies on annealing out of defects after degradation with high intensity illumination have been extended to include both cells and films and for both 1 sun illumination as well as in the dark. The results presented on thermal annealing further substantiate the presence of fast and slow defects in the light induced changes of undiluted a-Si:H materials. In addition, the results show a striking similarity between the kinetics in the FFs of the p-i-n solar cells and the µτ products at G = 19 cm-3s-1 of the corresponding i- layer films. Clear evidence for these multiple defects is also found in the degradation kinetics of both cells and films under 1 sun illumination carried out to their degraded steady states. Again, in both cells and thin films fabricated with diluted and undiluted materials strong similarities are found between the µτ values of the films and the FFs of the cells. These are present in both the initial (fast) and subsequent (slow) regimes approaching DSS for all temperatures even though the two regimes have distinctly different dependence on temperature. The DSS in the films and cells improves monotonically with temperature whereas the initial regimes show a clear reversal in their temperature dependence between 40°C and 50°C.

Furthermore, there is an absence in similarity of FF and µτ with densities of defect states measured with subgap absorption or D° densities measured with ESR. The inability to express the results with rate equations representing only a single defect, even in the case of diluted materials, was illustrated with results for 1 sun degradation kinetics. This strong evidence that more than one defect is responsible for SWE in a-Si:H materials, observed here at temperatures below 100°C, offers an explanation for the apparent inconsistencies in the results of earlier studies on films at low temperatures [17,18]. The results underscore

not only the inadequacy of the single defect models based on just the dangling bond defects but also suggest different mechanisms exist for the creation of light induced defects associated with SWE.

5. ACKNOWLEDGEMENTS

The authors would like to acknowledge helpful discussion with Drs. G. Ganguly, D. Carlson, L. Yang, and B. von Roedern. We would also like to acknowledge the support by the National Renewable Energy Laboratory (NREL) under subcontracts HXAF-8-17619-22 and the New Energy Development Organization (NEDO) International Joint Research Grant for this work.

6. REFERENCES

[1] L.Yang and L. Chen, Appl. Phys. Lett. 63 (1993) 400.

[2] X. Xu, J. Yang, and S. Guha, Mat. Res. Soc. Proc., 297 (1993) 649.

[3] L. Yang and L. Chen, Mater. Res. Soc. Symp. Proc. 336 (1994) 669.

[4] L. Yang, L. Chen, and A. Catalano, Appl. Phys. Lett.

59, (1991) 840.

[5]Y. Lee, L. Jiao, H. Liu, Z. Lu, R.W. Collins, and C. R.

Wronski, Conf. Record of 25th IEEE PVSEC (IEEE, 1996), 1165.

[6] R. Koval, X. Niu, L. Jiao, J. Pearce, G. Ganguly, J.

Yang, S. Guha, R.W. Collins, C.R. Wronski, Mat. Res.

Soc. Proc., 609, (2000) A15.5.

[7] J. Koh, Y. Lee, H. Fujiwara, C.R. Wronski, and R.W.

Collins, Appl. Phys. Lett. 73 (1998) 1526.

[8] B. von Rodern, Appl. Phys. Lett. 62 (1993) 1368.

[9] X. Xu, J. Yang, and S. Guha, Appl. Phys. Lett. 62 (1993) 1399.

[10] R. J. Koval, J. Koh, Z. Lu, L. Jiao, R. W. Collins, and C.R Wronski, Appl. Phys. Lett. 75 (1999) 1553.

[11] L. Jiao, S. Semoushikiana, Y. Lee, and C.R. Wronski, Mater. Res. Soc. Symp. Proc. 467 (1997) 97.

[12] J. Pearce, X. Niu, R. Koval, L., G. Ganguly, D.

Carlson, R.W. Collins, C.R. Wronski, Mat. Res. Soc. Proc., 664, (2001) A12.3.

[13] L. Yang, L. Chen, and A. Catalono, Appl. Phys. Lett.

59 (1991) 84.

[14] M. Stutzmann, W.B. Jackson, and C.C. Tsai, Phys.

Rev. B 32 (1985) 23.

[15] M. Isomura and S. Wagner, Mat. Res. Soc. Symp.

Proc., 258 (1992) 473.

[16] L. Chen and L. Yang, J. of Non-Crystalline Sol., 137&138 (1991) 1185.

[17] D. Han, and H. Fritzche, J. Non-Cryst. Solid. 59-60, 397 (1983).

[18] P. Stradins and H. Fritzsche, Phil. Mag. B 69 (1994).

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