HP 16510A

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HP 16510A

LOGIC ANALYSIS MODULE

Service Manual

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^HEWLETT

~~ PACKARD

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^HEWLETT

~e..I PACKARD

SERVICE MANUAL

HP 16510A 25 MHz State/

1 00 MHz Timing Card

Manual Part No. 16510-90901 Microfiche Part No. 16510-90801

PRINTED: SEPTEMBER 1987

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CERTIFICATION

Hewlett-Packard Company certifies that this product met its published specifications at the time of shipment from the factory. Hewlett-Packard further certifies that its calibration measurements are traceable to the United States National Bureau of Standards, to the extent aI/owed by the Bureau's calibration facility, and to the calibration facilities of other International Standards Organization members.

WARRANTY

This Hewlett-Packard product is warranted against defects in material and workmanship for a period of one year from date of shipment. During the warranty period, Hewlett-Packard Company will, at its option, either repair or replace products which prove to be defective.

For warranty service or repair, this product must be returned to a service facility designated by HP.

Buyer shall prepay shipping charges to HP and HP shall pay shipping charges to return the product to Buyer. However, Buyer shall pay all shipping charges, duties, and taxes for products returned to H P from another country.

HP warrants that its software and firr:nware deSignated by HP for use with an instrument will execute its programming instructions when properly installed on that instrument. HP does not warrant that the operation of the instrument or software, or firmware will be uninterrupted or error free.

LIMITATION OF WARRANTY

The foregoing warranty shall not apply to defects resulting from improper or inadequate maintenance by Buyer, buyer··supplied software or interfacing, unauthorized modification or misuse, operation outside the environmental specifications for the product, or improper site preparation or maintenance.

NO OTHER WARRANTY IS EXPRESSED OR IMPLIED. HP SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE.

EXCLUSIVE REMEDIES

THE REMEDIES PROVIDED HEREIN ARE BUYER'S SOLE AND EXCLUSIVE REMEDIES. HP SHALL NOT BE LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL DAMAGES, WHETHER BASED ON CONTRACT, TORT, OR ANY OTHER LEGAL THEORY.

ASSISTANCE

Product maintenance agreements and other customer assistance agreements are available for Hewlett-Packard products.

For any assistance, contact your nearest Hewlett-Packard Sales and Service Office. Addresses are provided at the back of tllis manual.

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SAFETY CONSIDERATIONS

GENERAL • This Is a Safety Class I Instrument (provided with terminal for protective earthing).

OPERATION· BEFORE APPLYING POWER verify that the power transformer primary Is matched to the available line voltage, the correct fuse Is Installed, and Safety Precautions are taken (see the following warnings)., In addition, note the instrument's external markings which are described under

"Safety Symbols."

I

^WARNING

I

o Servicing Instructions are for use by service-trained personnel. To avoid dangerous electric shock, do not perform any servicing unless qualified to do so.

o BEFORE SWITCHING ON THE INSTRUMENT, the protective earth terminal of the Instrument must be connected to the protective conductor of the (mains) powercord. The mains plug shall only be Inserted In a socket outlet provided with a protective earth contact. The protective action must not be negated by the use of an extension cord (power cable) without a protective conductor (grounding). Grounding one conductor of a two- conductor outlet Is not sufficient protection.

o If this Instrument Is to be energized via an auto-transformer (for voltage reduction) make sure the common terminal Is connected to the earth terminal of the power source.

o Any Interruption of the protective (grounding) conductor (Inside or outside the Instrument) or disconnecting the protective earth terminal will cause a potential shock hazard that could result In personal InJury.

o Whenever It Is likely that the protection has been Impaired, the Instrument must be made inoperative and be secured against any unintended operation.

o Only fuses with the required rated current, voltage, and speCified type (normal blow, time delay, etc.) should be used. Do not use repaired fuses or short circuited fuseholders. To do so could cause a shock or fire hazard.

o Do not operate the Instrument In th~ presence of flammable gasses or fumes. Operation of any electrical Instrument in such an environment constitutes a definite safety hazard.

o Do not Install substitute parts or perform any unauthorized modification to the Instrument.

o Adjustments described In the manual are performed with power supplied ~o the Instrument while protective covers are removed. Energy available at many pOints may, If contacted, result In personal injury.

o Any adjustment, maintenance, and repair of the opened Instrument under voltage should be avoided as much as possible, and when inevitable, should be carried out only by a skilled person who Is aware of the hazard Involved.

o Capacitors Inside the Instrument may stili be charged even If the Instrument has been disconnected from Its source of supply.

SAFETY SYMBOLS

Instruction manual symbol. The product will be

&

marked with this symbol when It Is necessary for the user to refer to the Instruction manual In order to protect against damage to the product.

Indicates hazardous voltages.

-L Earth terminal (sometimes used In manual to Indicate circuit common connected to grounded chassis).

I

^WARNING

I

The WARNING sign denotes a hazard. It calls attention to a procedure, practice, or the like, which, If not correctly performed or adhered to, could result In personal Injury. Do not proceed beyond a WARNING sign until the Indicated conditions are fully understood and met.

'~

The CAUTION sign denotes a hazard. It calls attention to an operating procedure, practice, or the like, which, If not correctly performed or adhered to, could result In damage to or destruction of part or all of the product. Do not proceed beyond a CAUTION sign until the Indicated conditions are fully understood or met.

SC10984

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HP 1651 OA - Table of Contents

I. GENERAL INFORMATION ... 1-1 1-1. Introduction ...•...•.... 1-1 1-2. Modules Covered By Manual ... 1-1 1-3. Safety Requirements •... 1-1 1-4. Product Description ...•.... 1-2 1-5. Accessories Supplied ... 1-2 1-6. Accessories Available ...•..•....•...•...• 1-2 1-7. Specifications ...•... 1-2 1-8. Operating Characteristics ... 1-2 1-9. Recommended Test Equipment ... 1-2

II. INSTALLATION ...•... 2-1 2-1. Introduction ... 2-1 2-2. Initial Inspection ...•. 2-1 2-3. Preparation For Use ... 2-1 2-4. Power Requirements ... 2-1 2-5. Safety Requirements ... 2-1 2-6. Probe Cable Installation ... 2-1 2-7. Installation ... 2-1 2-8. Module Installation ... 2-2 2-9. Operating Environment ... 2-4 2-10. Storage ...•... 2-4 2-11. Packaging ... 2-4 2-12. Tagging For Service ... 2-4

III. PERFORMANCE TESTS ... 3-1 3-1. Introduction ... 3-1 3-2. Recommended Test Equipment ... 3-1 3-3. Test Record ... 3-1 3-4. Performance Test Interval ... 3-1 3-5. Performance Test Procedures ... 3-1 3-6. Test Connector ... 3-1 3-7. Clock, Qualifier, and Data Input Tests ... 3-2 3-8. Clock, Qualifier, and Data Input Tests 1 ... 3-2 3-9. Clock, Qualifier, and Data Input Tests 2 ... 3-6 3-10. Clock, Qualifier, and Data Input Tests 3 ... 3-9 3-11. Clock, Qualifier, and Data Input Tests 4 ... 3-12 3-12. Clock, Qualifier, and Data Input Tests 5 ... 3-16 3-13. Clock, Qualifier, and Data Input Tests 6 ... 3-19 3-14. Clocl<, Qualifier, and Data Input Tests 7 ... 3-22 3-15. Glitch Test ... 3-25 3-16. Threshold Accuracy Test ... 3-30 3-17. Dynamic Range Test ... 3-37

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HP 16510A - Table of Contents

LIST OF TABLES

TABLE TITLE PAGE

1-1. H P 1651 OA Specifications ... 1-3 1-2. HP 1651 OA Operating Characteristics ... 1-4 1-3. Recommended Test Equipment ... 1-12 3-1. Performance Test Record ...•...•...•... 3-42 5-1. Reference Designators and Abbreviations ... 5-3 5-2. Replaceable Parts ... . . .. 5-4

LIST OF ILLUSTRATIONS

FIGURE TITLE PAGE

2-1 . Endplate Overlap ... 2-2 2-2. Cable Position ... 2-3 2-3. Endplate Overlap ... 2-3 3-1. Test Connector ... 3-1 3-2. Setup for Clock, Qualifier, and Data Inputs Test 1 ... 3-2 3-3. Waveform for Clock, Qualifier, and Data Inputs Test 1 ... 3-3 3-4. Configuration Screen ... 3-3 3-5. Format Screen ... 3-4 3-6. Trace Screen ... : ... 3-4 3-7. Listing Screen ... 3-5 3-8. Setup for Clock, Qualifier, and Data Inputs Test 2 ... 3-6 3-9. Waveform for Clock, Qualifier, and Data Inputs Test 2 ... 3-7 3-10. Trace Screen ... 3-7 3-11. Listing Screen ... 3-8 3-12. Setup for Clock, Qualifier, and Data Inputs Test 3 ... 3-9 3-13. Waveforms for Clock, Qualifier, and Data Inputs Test 3 ... 3-10 3-14. Listing Screen ... 3-10 3-15. Setup for Clock, Qualifier, and Data Inputs Test 4 ... 3-12 3-16. Waveforms for Clock, Qualifier, and Data Inputs Test 4 ... 3-13 3-17. Configuration Screen ... 3-13 3-18. Format Screen ... 3-14 3-19. Trace Screen ... -... 3-14 3-20. Listing Screen ... 3-15 3-21. Setup for Clock, Qualifier, and Data Inputs Test 5 ... 3-16 3-22. Waveforms for Clock, Qualifier, and Data Inputs Test 5 ... 3-17 3-23. Listing Screen ... 3-17 3-24. Setup for Clock, Qualifier, and Data Inputs Test 6 ... 3-19 3-25. Waveforms for Clock, Qualifier, and Data Inputs Test 6 ... 3-20 3-26. Format Screen ... 3-20 3-27. Listing Screen ... 3-21 3-28. Setup for Clock, Qualifier, and Data Inputs Test 7 ... 3-22 3-29. Waveforms for Clock, Qualifier, and Data Inputs Test 7 ... 2-23 3-30. Format Screen ... 3-23

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LIST OF ILLUSTRATIONS

FIGURE TITLE PAGE

3-31. Listing Screen ... 3-24 3-32. Setup for Glitch Test ... 3-25 3-33. Waveform for Glitch Test ... 3-26 3-34. Configuration Screen ... 3-26 3-35. Format Screen ... 3-27 3-36. Trace Screen ...•... 3-28 3-37. Timing Screen ... 3-29 3-38. Setup for Threshold Accuracy Test ... 3-30 3-39. Configuration Screen ... 3-31

3-40~ Format Screen ... 3-32 3-41. Trace Screen ... 3-33 3-42. Waveform Screen ...•... ⁰• • • • • • 0 • 0 • • • • • • • • • • • • • • • • • • • • • • 3-34 3-43. Waveform Screen .. ^{0 . 0}• • • • • • • • • • 0 • • • • • • • • • • • • • • • • • • • • • • • 0 • • 0 • • • 0 • • • • • • • • 0 • • • • • 0 • • • • • • • 0 • • • • • 3-34 3-44. Format Screen ... ⁰⁰• • • • • • • • 0 • 0 • • • • • • • • • • • • • • • • • • • • • • • • • • 0 0 • • • • • • • • • • • 0 0 • • • • • • • • • • • • • • • • : • • • 3-35 3-45. Format Screen ... ⁰• • • • 0 • • • • • • 0 • • • • • • • • • • • 0 • • • • • • • • • • • • • • • • • • • • 0 • • • • • • • 3-36 3-46. Setup for Dynamic Range Test ... 3-37 3-47. Configuration Screen ... ⁰• • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • 0 • • • • • 0 • • • • • 0 • • • • • • • • • • • • • • • • • 3-38 3-48. Format Screen ... ⁰• • • • • 0 • 0 • • 0 • • • 0 0 • 0 0 • • • • 0 0 • • • • • 0 • 0 . 0 0 • • • • 0 • 0 • • • • 0 • 0 • 0 . 0 . 0 • 0 • • 0 0 • • • 0 • • • 0 • • 3-38 3-49. Trace Screen ⁰• • • • • • • • • • • • • • • 0 • • • • • • • • • • 0 • • • • • • • • • • • • • • • • • • • • • • • • 0 " • • 0 • • • • • • • • • 0 • • • • • • • • 0 • • • 3-39 3-50. Waveform Screen ... ⁰• • • • • • • • • • • • • • • • • • • 0 • • • • • • • • • • 0 0 • • • • • • • • • • • • • • • • • 0 0 • • • • • • • • • • • 3-40 3-51. Waveform Screen ... ⁰^{• • • 0}• • • • • • • • • • • • 0 • • • • • • • • • • • 0 0 • • • • • • • • • • • • • • • • 0 0 • • • • • • • • • • • • • • • • • 3-40 4-1. Endplate Overlap ... ⁰• • • • • • • • • • • • • • • • • • 0 • • • • • • • • • • • • • • • • • • • • • 4-2 4-1. _ Extended Board and Module ... 4-3 4-3. Adjustment Pot Location ... 4-'4 4-4. Startup Screen ... ⁰^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^{• •}4''::5 4-5. Pod Threshold Field ... . . . .. 4':'5 6-1. HP 16510A State/Timing Analyzer Block Diagram ... 6-1 6-2. Startup Screen ... ⁰^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^{• •}6-3 6-3. Load Test System ... ⁰• • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • 6-4 6-4. Test System Screen ... 6-4 6-5. Main Test menu ... ⁰• • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • ~ ^•^•^•^•^•^•^•^•^•^•^•^•^•^•^•^{• •}6-5 6-6. Chip 1 Tests Run Screen ... '.' ... 6-5 6-7. stop Field ... ~ . . . .. 6-6 6-8. Exit Test System ... 6-6 6-9. Troubleshooting Flow Chart ... 6-8 6-10. Endplate Overhang ... ; ... 6-14 6-11. Cable Position ... 6-1 5 6-12. Endplate Overhang ... 6-16 6-13. Endplate Overhang ... 6-17 6-14. Card On Antistatic Mat ... 6-18 6-15. Retainer And Screws ... 6-18 6-16. Card Connectors ... o • • • • • • • • • • • • • • 6-19

vii

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TABLE OF CONTENTS

GENERAL INFORMATION

1.1. Introduction ... 1-1 1-2. Modules Covered By Manual ... a. • • • • • • • •• • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • •• 1-1 1-3. Safety Requirements ... 1-1 1-4. Product Description ... 1-2 1-5. Accessories Supplied ... 1-2 1-6. Accessories Available ... 1-2 1-7. Specifications ... 1-2 1-8. Operating Characteristics ... 1-2 1-9. Recommended Test Equipment ... 1-2

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1-1. INTRODUCTION

This service manual contains information for testing, adjusting, and servicing the HP 16510A State/Timing Module. Also included are installation procedures and a list of

recommended test equipment. This manual is divided into six sections as follows:

- General Information II - Installation

III - Performance Tests IV - Adjustments V - Replaceable Parts VI - Service

Information for operating, programming, and interfacing the HP 16510A State/Timing Module is contained in the HP 1651 OA State/Timing Operating and Programming Manual supplied with each module.

The General Information Section includes safety requirements, a product description, and a list of accessories supplied and of accessories available. Also included are tables listing specifications and operating characteristics, and a list of recommended test

equipment.

Listed on the title page of this manual is a Microfiche part number. This number can be used to order 4 X 6 inch microfilm transparen- cies of the manual. Each microfiche contains up to 96 photo-duplicates of the manual pages. The microfiche package also includes the latest Manual Changes supplement as well as pertinent Service Notes.

HP 16510A - General Information

SECTION I GENERAL INFORMATION

To complete the service documentation for your system, place this service manual in the 3-ring binder with your Logic Analysis System Service Manual.

1-2. MODULES COVERED BY THIS MANUAL

The information covered in this manual is for the HP 16510A State/Timing Module. If the card has changed, a new card number will be assigned and the manual will be accompanied by a Manual Changes Supplement. This supplement explains the changes and how to adapt the manual to the newer card.

In addition to the change information, the supplement may contain information for correct- ing errors in the manual. To keep this manual as current and accurate as possible,

Hewlett-Packard recommends that you

periodically request the latest Manual Changes Supplement.

1-3. SAFETY REQUIREMENTS

Specific warnings, cautions, and instructions are placed wherever applicable throughout the manual. These must be observed during all phases of operation, service, and repair of the module. Failure to comply with them violates safety standards of design, manufacture, and intended use of this module. Hewlett-Packard assumes no liability for the failure of the customer to comply with these safety

requirements.

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HP 1651 OA - General Information

1-4. PRODUCT DESCRIPTION

The HP 16510A State/Timing Module is an 80 channel, 25 MHz state, 100 MHz timing logic analyzer. It can be configured as two indepen- dent state analyzers or one state and one timing analyzer. Some of the main features are:

• Simultaneous state/state, or simultaneous state/timing analysis.

• Time interval; number of states; pattern search; minimum, maximum, and average time interval statistics.

• Uses transitional timing to store data only when there is a transition.

• 5 clock inputs, 4 clock qualifiers, storage qualification, time and number of state tagging, and prestore.

• Small lightweight probing.

1-5. ACCESSORIES SUPPLIED

The following accessories are supplied with the HP 16510A State/Timing module. Quantity one unless shown otherwise.

1-2

• Operating manual set

• Service manual

• 16 Channel Lead Sets, grey tip (HP 01650-61608) Qty 5

• 16 Channel Probe Cable (HP 16510-61602) Qty 2

• 16 Channel Probe Cable (HP 16510-61603) Qty 3

• Grabbers (Set of 20) (HP 5959-0288) Qty 5

1-6. ACCESSORIES AVAILABLE

• Termination adapter (HP 01650-63201)

• Service Data Supplement (16510-90903)

1-7. SPECIFICATIONS

. Module specifications are listed in Table 1-1.

These specifications are the performance standards against which the module is tested.

1-8. OPERATING CHARACTERISTICS

Table 1-2 is a listing of the module operating characteristics. The operating characteristics are not specifications, but are typical operating characteristics included as additional information for the user.

1-9. RECOMMENDED TEST EQUIPMENT

Equipment required to test and maintain the HP 1651 OA State/Timing Module is listed in table 1-3. Other equipment may be substituted if it meets or exceeds the critical specifications listed in the table.

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HP 1651 OA - General Information

Table 1-1. HP 16510A Specifications

HP 16510A SPECIFICATIONS

PROBES

Minimum Swing: 600 mV pea~-to-peak.

Threshold Accuracy: Voltage Range -2.0V to +2.0V -9.9V to -2.1 V +2.1V to +9.9V

Accuracy

±150 mV

±300 mV

±300 mV Dynamic Range: ± 10 volts about the threshold.

STATE MODE

Clock Repetition Rate:

Single phase is 25 MHz maximum. With time or state counting, minimum time between states is 60 ns. 80th mixed and demul- tiplexed clocking use master-slave clocl< timing; master clock must follow slave clock by at least 10 ns and precede the next slave clock.

by >50 ns.

Clock Pulse Width: ~1 0 ns at threshold.

Setup Time: Data must be present prior to clock transition, ~ 10 ns.

Hold Time:

TIMING MODE

Data must be present after rising clock transition on all pods; 0 ns.

Data must be present after falling clock transition on pods 1,3 and 5; 0 ns.

Data must be present after falling clock transition on pods 2 and 4; 1 ns.

Minimum Detectable Glitch: 5 ns wide at the threshold.

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Table 1-2. HP 16510A Operating Characteristics

HP 16510A OPERATING CHARACTERISTICS

PROBES

Input RC: 100 Kn ±2% shunted by approximately 8 pF at the probe tip.

TTL Threshold Preset: +1.6 volts.

ECl Threshold Preset: -1.3 volts.

Threshold Range: -9.9 to +9.9 volts in 0.1 V increments.

Threshold Setting:

Threshold levels may be defined for pods 1, 2, and 3 on an in- dividual basis and one threshold may be defined for pods 4 and 5.

Minimum Input Overdrive: 250 mV or 30% of the input amplitude, whichever is greater.

Maximum Voltage: ±40 volts peak.

MEASURMENT CONFIGURATIONS

Analyzer Configurations:

Channel Assignment:

1-4

Analyzer 1 Timing

Off state

Off Timing state state Off

Analyzer 2 Off Timing

Off State

State Timing State

Off

Each group of 16 channels (a pod) can be assigned to Analyzer 1, Analyzer 2, or remain unassigned. The HP 16510A contains 5 pods.

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Table 1-2. HP 16510A Operating Characteristics (cont.)

STATE ANALYSIS

MEMORY

Data Acquisition:

TRACE SPECIFICATION Clocks:

Clock Qualifier:

Pattern Recognizers:

Range Recognizers:

Qualifier:

Sequence Levels:

Branching:

1024 samples/channel.

Five clocks are available and can be used by either one or two state analyzers at any time. Clock edges can be ORed together and operate in single phase, two phase demultiplexing, or two phase mixed mode. Clock edge is selectable as positive, negative, or both edges for each clock.

The high or low level of up to four clocks can be ANDed with the clock specification. setup time: 20 ns; hold time: 5 ns.

Each recognizer is the AND combination of bit (0, 1, or X) patterns in each label. Eight pattern recognizers are available when one state analyzer is on. Four are available to each analyzer when two state analyzers are on.

Recognizes data which is numerically between or on two specified patterns (ANDed combination of Os and/or 1 s). One range term is available and is assigned to the first state analyzer turned on. The maximum size is 32 bits.

A user-specified term that can be anystate, nostate, a single pattern recognizer, range recognizer, or logical combination of pattern and range recognizers.

There are eight levels available to determine the sequence of events required for trigger. The trigger term can occur anywhere in the first seven sequence levels.

Each sequence level has a branching qualifier. When satisfied, the analyzer will restart the sequence or branch to another sequence level.

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Table 1-2. HP 16510A Operating Characteristics (cont.)

Occurrence Counter:

Storage Qualification:

Enable/Disable:

Prestore:

TAGGING

State Tagging:

Time Tagging:

SYMBOLS

Pattern Symbols:

Range Symbols:

Sequence qualifier may be specified to occur up to 65535 times before advancing to the next level.

Each sequence level has a storage qualifier that specifies the states that are to be stored.

Defines a window of post-trigger storage. States stored in this window can be qualified.

Stores two qualified states that precede states that are stored.

Counts the number of qualified states between each stored state.

Measurement can be shown relative to the previous state or relative to trigger. Maximum count is 4.4 x 1012•

Measures the time between stored states, relative to either the previous state or the trigger. Maximum lime between states is 48 hours.

With tagging on, the acquisition memory is halved; minimum time between states is 60 ns.

User can define a mnemonic for the specific bit pattern of a label.

When data display is SYM BOL, mnemonic is displayed where the bit pattern occurs. Bit pattern can include Os, 1 s, and don't cares.

User can define a mnemonic covering a range of values. Bit pattern for lower and upper limits must be defined as a pattern of Os and 1 s.

When data display is SYMBOL, values within the specified range are displayed as mnemonic + offset from base of range.

Number of Pattern and Range Symbols: 100 per analyzer.

Symbols can be down-loaded over RS-232-C.

1-6

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TIMING ANALYSIS

TRANSITIONAL TIMING MODE

Sample Period: 10 ns.

Sample is stored in acquisition memory only when the data changes. A time tag stored with each sample allows reconstruction of waveform display. Time covered by a full memory acquisition varies with the number of pattern changes in the data.

Maximum Time Covered By Data: 5000 seconds.

Minimum Time Covered by Data: 10.24 Ils.

GLITCH CAPTURE MODE

Data sample and glitch information stored every sample period.

Sample Period:

20 ns to 50 ms in a 1-2-5 sequence dependent on s/div and delay settings.

Memory Depth: 512 samples/channel.

Time Covered by Data: Sample period X 512.

WAVEFORM DISPLAY Sec/div:

10 ns to 100 s; 0.01 % resolution.

Delay:

-2500 s to 2500 s; presence of data dependent on the number of transitions in data between trigger and trigger plus delay (transitional timing).

Accumulate:

Overlay Mode:

Waveform display is not erased between successive acquisitions.

Multiple channels can be displayecl on one waveform display line.

Primary use is to view summary of bus activity.

Maximum Number Of Displayed Waveforms: 24

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TIME INTERVAL ACCURACY

Channel to Channel Skew: 4 ns typical.

Time Interval Accuracy:

± (sample period ... channel-to-channel sl<ew + 0.01 ^% of time interval reading).

TRIGGER SPECIFICATION Asynchronous Pattern:

Greater Than Duration:

Less Than Duration:

Glitch/Edge Triggering:

1-8

Trigger on an asynchronous pattern less than or greater than specified duration. Pattern is the logical AND of specified low, high, or don't care for each assigned channel. If pattern is valid but duration is invalid, there is a 20 ns reset time before looking for patterns again.

Minimum duration is 30 ns to 10 ms with 10 ns or 0.01 ^% resolution, whichever is greater. Accuracy is +0 ns to -20 ns. Trigger occurs at pattern + duration.

Maximum duration is 40 ns to 10 ms with 10 ns or 0.01 % resolution, whichever is greater. Pattern must be valid for at least 20 ns.

Accuracy is +20 ns to -0 ns. Trigger occurs at the end of the pattern.

Trigger on glitch or edge following valid duration of asynchronous pattern while the pattern is still present. Edge can be specified as rising, falling or either. Less than duration forces glitch and edge triggering off.

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MEASUREMENT AND DISPLAY FUNCTIONS

AUTOSCALE (TIMING ANALYZER ONLY)

Autoscale searches for and displays channels with activity on the pods assigned to the timing analyzer.

ACQUISITION SPECIFICATIONS Arming:

Trace Mode:

LABELS

Each analyzer can be armed by the run key, the other analyzer, or the Intermodule Bus.

Single mode acquires data once per trace specification; repetitive mode repeats single mode acquisitions until stop is pressed or until time interval between two specified patterns is less than or greater than a specified value, or within or not within a specified range.

There is only one trace mode when two analyzers are on.

Channels may be grouped together and given a six character name. Up to 20 labels in each analyzer may be assigned with up to 32 channels per label. Primary use is for naming groups of channels such as address, data, and control busses.

INDICATORS Activity Indicators:

Markers:

Trigger:

MARKER FUNCTIONS Time Interval:

Provided in the Configuration, State Format, and Timing Format menus for identifying high, low, or changing states on the inputs.

Two markers (X and 0) are shown as dashed lines on the display.

Displayed as a vertical dashed line in the timing waveform display and as line 0 in the state listing display.

The X and 0 markers measure the time interval between one point on a timing waveform and trigger, two points on the same timing waveform, two points on different waveforms, or two states (time tagging on).

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HP ·1651 OA -General Information

Table 1-2. HP 16510A Operating Character/sties (cont.)

. Delta States (State Analyzer Only):

Patterns:

Statistics:

RUN/STOP FUNCTIONS Run:

Stop:

DATA DISPLAY/ENTRY Display Modes:

Timing Waveform:

Bases:

1-10

The X and 0 markers measure the number of tagged states between one state and trigger, or between two states.

The X and 0 markers can be used to locate the nth occurrence of a specified pattern before or after trigger, or afler the beginning of data. The 0 marl<er can also find the nth occurrence of a pattern before or after the X marker.

X to 0 marl<er statistics are calculated for repetitive acquisitions.

Patterns must be specified for both markers and statistics are kept only when both patterns can be found in an acquisition. Statistics are minimum X to 0 time, maximum X to 0 time, average X to 0 time, and ratio of valid runs to total runs.

Starts acquisition of data in specified trace mode.

In single trace mode or the first run of a repetitive acquisition, STOP halts acquisition and displays the current acquisition data. For sub- sequent runs in repetitive mode, STOP halts acquisition of data and does not change current display.

State listing; timing waveforms; interleaved, time-correlated listing of two state analyzers (time tagging on); time-correlated state listing and timing waveform display (state listing in upper half, timing waveform in lower half, and time tagging on).

Pattern readout of timing waveforms at X or 0 marker.

Binary, Octal, Decimal, Hexadecimal, ASCII (display only), and User-defined symbols.

(21)

HP '16510A - General Information

Table "1-2. /-IP 16510A Operating Characteristics (cont.)

AUXILIARY POWER

Power Through Cables:

2/3 amp @ 5V per cable.

2 amp @ 5V per HP 16510A Current Draw Per Card:

3 amp @ 5V per HP 16510A

OPERATING ENVIRONMENT Temperature:

Humidity:

Instrument, 0

°

to 55

°

C (+32

°

to 13'1

°

F). Probe lead sets and cables, 0

°

to 65

°

C (+32

°

to 149

°

F).

Instrument, up to 95% relative humidity at +40

°

C (+104

°

F).

Altitude: To 4600 m ("15,000 tt).

Vibration:

Operation: Random vibration 5-500 Hz, 10 minutes per axis, -0.3 9 (rms).

Non-operating:

Random vibration 5-500 Hz, 10 minutes per axis, - 2.41 9 (rms); and swept sine resonant search, 5-500 Hz, 0.75 9 (O-peak), 5 minute resonant dwell @ 4 resonances per axis.

(22)

Table 1-3. Recommended Test Equipment

INSTRUMENT CRITICAL SPECIFICATIONS RECOMMENDED 'USE*

MODEL

OSCILLOSCOPE dual channel HP 54201A P, T

dc to 300 MHz

PULSE 5 ns pulse width HP 8161A/020 P GENERATOR 20 ns period

1.3 ns risetime double pulse

POWER + or - 10.2 V output HP 6216B P SUPPLY current: 0 - 0.4 amperes

POWER 50 ohms HP 11549A P

SPLITTER dc to 300 MHz

ADAPTER Type N male to

-

HP 1250-0780 P

BNC female (qty 2)

ADAPTER Type N male to HP 1250-0082 P

BNC male

DMM 3.5 digit resolution HP 3478A P, A

EXTENDER No Substitute HP 16500-69004 A, T BOARD

50 Ohm Qty 2 HP 10100C P

Feedthru

* P=Performance Tests A=Adjustments T=Troubleshooting

1-12

(23)

2-1. Introduction. . . .. 2-1 2-2. Initial Inspection ... 2-1 2-3. Preparation For Use ... 2-1 2-4. Power Requirements .... . . .. 2-1 2-5. Safety Requirements ... 2-1 2-6. Probe Cable Installation ... 2-1 2-7. Installation ... 2-1 2-8. Module Installation ... 2-2 2-9. Operating Environment ... 2-4 2-10. Storage ... 2-4 2-11. Packaging ... 2-4 2-12. Tagging For Service ... 2-4

(24)

2-1. INTRODUCTION

This section explains, how to initially inspect the HP 1651 OA State/Timing Module, how to prepare it for use, storage and shipment. Also included are procedures for module

installation.

2-2. INITIAL INSPECTION

Inspect the shipping container for damage. If the shipping container or cushioning material is damaged, it should be kept until the contents of the shipment have been checked for completeness and the module has been checked mechanically and electrically. The contents of the shipment should be as listed in the "ACCESSORIES SUPPLIES" paragraph lo- cated in Section I.

Procedures for checking electrical performance are in Section III. If the contents of the container are incomplete, there is mechanical damage or defect, or the instrument does not pass the performance tests, notify the nearest Hewlett-Packard office.

If the shipping container is damaged, or the cushioning material shows signs of stress, notify the carrier as well as the

Hewlett-Packard office. Keep the shipping material so the carrier can inspection it. The Hewlett-Packard office will arrange for repair or replacement at Hewlett-Packard's option without waiting for claim settlement.

2-3. PREPARATION FOR USE

I

^WARNING

I

Read the Safety Considerations in the front of this manual and in Section I before installing or operating this module.

HP 16510A - Installation

SECTION II INSTALLATION

2-4. POWER REQUIREMENTS

All power supplies required for operating the HP 16510A State/Timing Module are supplied to the module through the backplane

connector.

2-5. SAFETY REQUIREMENTS

Specific warnings, cautions, and instructions are placed wherever applicable throughout the manual. These must be observed during all phases of operation, service, and repair of the module. Failure to comply with them violates safety standards of design, manufacture, and intended use of this module. Hewlett-Packard assumes no liability for the failure of the customer to comply with these safety

requirements.

2-6. PROBE CABLE INSTALLATION

The HP 16510A State/Timing Module comes with probe cables installed by the factory. If a cable is to be switched or replaced, refer to

"PROBE CABLE REPLACEMENT" in Section VI of this manual.

2-7. INSTALLATION

Do not install, remove or replace the module in the instrument unless the in- strument power is turned off.

The HP 16510A State/Timing Module will take up one slot in the card cage. For every additional HP 16510A State/Timing Module you install, you will need an additional slot. They may be installed in any slot and in any order.

The installation procedure for the module is shown step-by-step in paragraph 2-8.

2-1

(25)

2-8. MODULE INSTALLATION

The effects of ELECTROSTATIC DISCHARGE can damage electronic components. Use grounded wriststraps and mats when you are per- forming any kind of service to this module.

INSTALLATION CONSIDERATIONS:

• The HP 16510A State/Timing Module(s) can be installed in any available card slot and in any order.

• Cards or filler panels below the empty slots intended for module installation do not have to be removed.

• The probe cables do not have to be removed to install the module.

PROCEDURE:

a. Turn instrument power switch off, unplug power cord and disconnect any input connections.

b. Starting from the top, loosen thumb screws on filler panel(s) and card(s).

c. Starting from the top, begin pulling card(s) and filler panel(s) out half way. See figure 2-1.

TOP CARD

¢:Jl

NEXT LOWEST

< ¹²

1 IIIIOI!Xl I

Figure 2-1. End plate Overlap

(26)

HP 1651 OA - Installation

d. Lay the cable(s) flat and pointing out to the rear of the card. See figure 2-2.

e. Slide the analyzer card approximately half way into the card cage.

f. If you have more analyzer cards to install repeat step d and e.

Figure 2-2. Cable Position

g. Firmly seat bottom card into backplane connector. Keep applying pressure to the center of card endplate while tightening thumb screws finger tight.

h. Repeat for all cards and filler panels in a bottom to top order. See figure 2-3.

NEXT HIGHEST

BOTTOM

CARD

Figure 2-3. Endplate Overlap

leaclltX1S

i. Any filler panels that are not used should be kept for future use. Filler panels must be installed in all unused card slots for correct air circulation.

2-3

(27)

2-9. OPERATING ENVIRONMENT

The operating environment is listed in table 1-2 of Section I of this manual. Note should be made of the non-condensing humidity limitation. Condensation within the instrument can cause poor operation or malfunction.

Protection should be provided against internal condensation.

The HP 16510A State/Timing Card will operate at all specifications within the temperature and humidity range given in table 1-2. However, reliability is enhanced when operating the module within the following ranges.

Temperature: +20 to +35° C (+68 to +95° F) Humidity: 20% to 80% non-condensing

2-10. STORAGE

The module may be stored or shipped in en-

viro~ments within the following limits:

Temperature: _40° C to +75⁰C Humidity: Up to 90% at 65⁰C

Altitude: Up to 15,300 meters (50,000 feet) The module should also be protected from temperature extremes which cause condensation on the module.

2-11. PACKAGING

The following general instructions should be used for repacking the module with commer- cially available materials.

• Wrap module in anti-static plastic.

• Use a strong shipping container. A double-wall carton made of 350 lb. test material is adequate.

• Use a layer of shock-absorbing material 70 to 100 mm (3 to 4 inch) thick around all sides of the module to provide firm cushioning and prevent movement inside the container.

• Seal shipping container securely.

• Mark shipping container FRAGILE to ensure careful handling.

• In any correspondence, refer to module by model number and board number.

2-12. TAGGING FOR SERVICE

If the module is to be shipped to a

Hewlett-Packard office for service or repair, at- tach a tag showing owner (with address), complete board number, and a description of the service required.

(28)

3-1. Introduction. . . .. 3-1 3-2. Recommended Test Equipment ... 3-1 3-3. Test Record ... 3-1 3-4. Performance Test Interval ... 3-1 3-5. Performance Test. Proceclures ... 3-1 3-6. Test Connector ... 3-1 3-7. Clock, Qualifier, ancl Data Input Tests ... 3-2 3-8. Clock, Qualifier, and Data Input Tests 1 ... 3-2 3-9. Clock, Qualifier, and Data Input Tests 2 ... 3-6 3-10. Clock, Qualifier, and Data Input Tests 3 ... 3-9 3-11. Clock, Qualifier, and Data Input Tests 4 ... 3-12 3-12. Clock, Qualifier, and Data Input Tests 5 ... 3-16 3-13. Clock, Qualifier, and Data Input Tests 6 ... 3-19 3-14. Clock, Qualifier, and Data Input Tests 7 ... : ... 3-22 3-15. Glitch Test ... 3-25 3-16. Threshold Accuracy Test ... 3-30 3-17. Dynamic Range Test ... 3-37

(29)

3-1. INTRODUCTION

The procedures in this section test the HP 16510A State/Timing Analyser's electrical performance using the specifications listed in Section I as the performance standards. All tests can be performed without access to the interior of the instrument. At the end of this section is a form that can be used as a record of performance test results.

3-2. RECOMMENDED TEST EQUIPMENT

Equipment recommended for performance tests is listed in table 1-3. Any equipment that satisfies the critical specifications given in the table may be substituted for the recommended models.

3-3. TEST RECORD

Results of performance tests may be tabulated on the Performance Test Record (table 3-1) at the end of the procedures. The test record lists all of the tested specifications and their ac- ceptable limits. The results recorded on the test record may be used for comparison in periodic maintenance and troubleshooting or after repairs and adjustments have been made.

3-4. PERFORMANCE TEST INTERVAL

Periodic performanc(~ verificalion of tile HP 16510A State/Timing Module is required at two year intervals. The instrument's performance should be verified after it has been serviced, or if improper operation is sLlspected. Further checks requiring access to the interior of the instrument are included in the adjustment section, but are not required for the performance verification.

HP 16510A - Performance Tests

SECTION III PERFORMANCE TESTS

3-5. PERFORMANCE TEST PROCEDURES

All performance tests should be performed at the instruments environmental operating. temperature and after a 15-minute warm up period.

3-6. TEST CONNECTOR

The performance tests and adjustments require connecting pulse generator outputs to probe pod inputs. Figure 3-1 is a test connector that may be built to allow testing of multiple channels (up to eight at one time). The test connector consists of a BNC connector and a length of wire. Connecting more than eight channels to the test connector at a time will induce loading of the circuit and true sig- nal representation will degrade. Test results may not be accurate if more than eight channels are connected to the test connector.

The Hewlett-Packard part number for the BNC connector in figure 3-1 is 1250-1032. An equivalent part may be used in place of the Hewlett-Packard part.

18519/EX9711e-a7

Figure 3-1. Test Connector

(30)

3-7. CLOCK, QUALIFIER, AND DATA INPUTS TESTS

3-8. Clock, Qualifier, and Data Inputs Test 1

Description:

This test verifies maximum clock rate with counting mode and the setup and hold times for the falling edge of all clocks to pods 1,3 and 5.

Specification:

Clock repetition rate: With time or state counting mode on, minimum time between states is 60 ns.

Hold time: Data must be present after falling edge of all clocks; 0 ns.

Setup time: Data must be present prior to clock transition; ~1 Ons.

Equipment:

Pulse Generator ... H P 8161 A/020 Oscilloscope ... H P 54201 A Power Splitter :... H P 11549A 50 Ohm Feedthru (2) ... HP 101 OOC Test Connectors (2) see figure 3-1

Procedure:

1. Connect the HP 16510A and test equipment as in figure 3-2.

HP 16S99A

OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER

3-2

A 0 B

Figure 3-2. Setup for Cloc/(, Qualifier, and Data Inputs Test 1 Note

In this setup, eigtlt channels are connected to test eight channels at

a

time.

Ground lead must be grounded to ensure accurate test results.

p P

R 0

o 0 B E S

188111TUII11J17

(31)

2. Adjust pulse generator for the output in figure 3-3.

1 0 0 I I 1 . . - - - - -69n. ---II"'~I

~19n.

DATA AND elK - - - - . . . -

n ----

- - - - 1.8V ^~1.9V ' - - - - S1.3V

Figure 3-3. Waveform for C/oc/(, Qualifier, and Data Inputs Test 1

3. Assign the pod under test to Analyzer 1 in the Configuration screen as in figure 3-4. Refer to steps a and b if unfamiliar with menus.

a. Touch Type field I)f Analyzer 1 and set to State.

b. Assign the pod to be tested to Analyzer 1.

( S ta te/Tim1 ng C) (conn gura t1 on)

Analyzer I Analyzer 2

Name I ( MACHINE 1 )

Type^l

(

^State ) ^Type^l

(

^Off

)

I ^Pod ¹ I POd 5

l ... uuuu ---

~ ( Run

Unassigned Pods Pod 2

---_{Pod 3} ---

Pod 4

---

Figure 3-4. Configuration Screen

(32)

HP 1651 OA - Performance Tests

4. Assign appropriate clock, falling edge, and 8 channels of the pod under test to a label in the Format screen as shown in figure 3-5. Refer to steps a and b if unfamiliar with the menus.

a. Touch Clock field and set appropriate clock for a falling edge.

b. Touch Labels and turn labels on.

S til te/Timi ng c) ( F'ormll t 1 ) ~ ( Run

Clock

)

^{( Symbo}^IS)

Pod Cl TTL Clock

....

...

.

...

BIT ~

I··· .•••••••• I

Off Ofr Off Ofr Off Off Ofr

Figure 3-5. Format Screen

5. Set the Trace screen without sequencing levels and set Count to States as shown in figure 3-6. Refer to a and b if unfamiliar with the menus.

a. Touch Count and set to Anystate.

b. Touch Prestore and set to Off.

Stete/Ttming C) Trece 1 ~ ⁽ ^Run

Sequence Levels

cp

Hhile storing -no stele H TRIGGER on He" 1 times

(

^BrenchesOff

)

0

Store -enyslllte-

(

Stetes ^Count ⁾ ( Prestore

Off

)

Lebel> @C)

Bllse> ~

e ~

b ~

c ~

d ~

Fiuure 3-6. Trace Screen

3-4

(33)

6. Touch Run. The Listing screen will be displayed and will show F's for the channe"ls under"

test. See figure 3-7.

( Stote/Tlming c) ^(LiSting ^{1 )} ^Run

( MOrak,er S )

I

^BIT

II

^{5 to tes}

'---_--' I

^Hel<

II

^Reletive

o FF

1 FF

2 FF

3 FF

4 FF

5 FF

~,",*7----, FF

B FF

9 FF

10 FF

11 FF

12 FF

13 FF

14 FF

15 FF

Figure 3-7. Usting Screen

Note

To ensure consistent pattern of Ps in listing, use Roll field and knob to scroll through State Usting.

7. Disconnect the channels under test from the test connector and connect the remaining channels on this pod.

8. ASSign the remaining eight channels to the label, then repeat step 6.

9. Disconnect the pod of channels under test from the probe tip assembly and connect the next pod (pods 1,3 or 5) of data channels to be tested.

10. Return to the Configuration screen and repeat steps 3 through 9 until all the pods have been tested.

11 . After pods 1,3 and 5 have been tested, repeat steps 3 through 10 assigning the next clock (clocks J ,K,L.M or N).

(34)

3-9. Clock, Qualifier, and Oa ta Inputs Test 2

Description:

This performance test verifies the setup and hold time specification for the rising edge transition of all clocks.

Specification:

Setup Time: Data must be present prior to clock transition; ~1 0 ns.

Hold Time: Data must be present after rising clock transition; 0 ns.

Equipment:

Pulse Generator ... HP 8161 Aj020

Osc~lIoscope ...•...•. H P 54201 A Power Splitter... . .... ... ... ... ... HP 11549A 50 Ohm Feedthru (2) ... HP 10100C Test Connectors (2) see figure 3-1

Procedure:

1. Connect the HP 16510A and test equipment as in figure 3-8.

HP 16500A

3-6

A 0 B

Figure 3-8. Setup for Clock, Qualifier, and Data Inputs Test 2 Note

In ttliS S(~tup, eigllt channels are connected to test half of the pod at

a

^time.

Ground lead must flO grounded to ensure accurate test results.

P P R 0

o 0 B E S

1 151 e/TUall 1117

(35)

H P 16510A - Performance Tests

2. Adjust pulse generator for Olltput in figure 3-9.

DATA AND eLK ~

10ns

u,...---.... ^l:::----

- - - - 1.6V ^~1.^9V - S1.3V 1111.",..,...,

Figure 3-9. Waveform for Clock, Qualifier, and Data Inputs Test 2

3. Assign the pod under test to Analyzer 1 in the Configuration screen as in previous test figure 3-4.

4. Assign appropriate clock, rising clock transition, and eight channels of the pod under test to the label in the Format screen as shown in previous test figure 3-5.

5. Set up the Trace screen without sequencing levels and set Count to Off as in figure 3-10.

S til te/T1ml ng C ) Trece 1 ~ { Run

Sequence Levels

~

Hhlle storing -no stete- TRIGGER on -e- I t lmes

( Brenches

)

Store Henystete" ^Off

(

^CountOf f

)

( Prestore

Off

)

Lebel> ~

Bese> ~

. . . - -

e

QQ

b

QQ

c

QQ

d

QQ

Figure 3-10. Trace Screen

(36)

HP16510A - Performance Tests

6. Touch Run. The Listing screen will be displayed and will list 0 for the channels under test as in figure 3-11 .

Stete/Timing c) (LiSting 1 ) Run

Merkers ) Off .

I

BIT

I

" - - - Q§CJ

1 00

2 00

3 00

.:I 00

5 00

6 00

7 00

e ⁰⁰

9 00

10 00

11 00

12 00

13 00

14 00

15 00

16 00

Figure .3-11. Usting Screen

7. Disconnect the channels under test from the test connector and connect the remaining eight channels of the pod.

8. Assign the remaining eight channels to the label, then repeat step 6.

9. Disconnect the pod of channels under test from the probe tip assembly and connect the next pod of data channels to be tested.

10. Return to Configuration screen and repeat steps 3 through 9 until all pods have been tested.

11. After all pods have been tested, repeat steps 3 through 10 for each clock.

3-8

(37)

3-10. Clock, Qualifier, and Data Inputs Test 3

Description:

This performance test verifies the hold time specifications for the falling clock transitions of all clocks to pods 2 and 4.

Specification:

Hold Time: Data must be present after falling clock transitions; 1 ns.

Equipment:

Pulse Generator ... H P 8161 Aj020 Oscilloscope ... H P 54201 A Power Splitter.. .. ... ... ... ... .. . ... ... ... . ... . ... ... HP 11549A 50 Ohm Feedthru (2) ... H P 101

ooe

Test Connectors (2) see figure 3-1 Procedure:

1. Connect the HP 16510A and test eQuipment as in fiqure 3-12.

HP 16599A

A A

ClK 590

DATA BITS DATA a

FIGURE

590 3-1

a Figure 3·12. Setup for Clock, Qualifier, and Data Inputs Test 3

Note

In this setup, eight channels are connected to test half of the pod at

a

time.

Ground lead must be grounded to ensure accurate test results.

P R

0 B E S

p 0 R B E S

P 0 0

p 0 0

1151UTUIl/l..."