HAL Id: jpa-00246597
https://hal.archives-ouvertes.fr/jpa-00246597
Submitted on 1 Jan 1992
HAL is a multi-disciplinary open access archive for the deposit and dissemination of sci- entific research documents, whether they are pub- lished or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers.
L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d’enseignement et de recherche français ou étrangers, des laboratoires publics ou privés.
A triple axis double crystal multiple reflection camera for ultra small angle X-ray scattering
Jacques Lambard, Pierre Lesieur, Thomas Zemb
To cite this version:
Jacques Lambard, Pierre Lesieur, Thomas Zemb. A triple axis double crystal multiple reflection
camera for ultra small angle X-ray scattering. Journal de Physique I, EDP Sciences, 1992, 2 (6),
pp.1191-1213. �10.1051/jp1:1992204�. �jpa-00246597�
Classification
Physics
Abstracts61.10F 78.70V 82.70
A triple axis double crystal multiple reflection
camerafor ultra small angle X-ray scattering
Jacques Lambard,
Pierre Lesieur and Thomas ZembCEA, CEN
Saclay,
Service de Chimie Mol£culaire, BP 125, F91191 Gif-sur-Yvette Cedex, France(Received 18 November J99J,
accepted
J0January
J992)Rdsum4. L'extension du domaine de diffusion des
rayons-X
Vers lespetits angles
demandel'emploi
de cristaux h r£flexionsmultiples
pour collimater le faisceau. Nous d£crivons une cam£ra hrayons-X
h trois axes oh les r£flexionsmultiples
sont r£alis£es dans deux cristaux h gorge. Nous donnons ensuite les proc£dures de d£convolution pour obtenir la section efficace de diffusion en£chelle absolue, ainsi que les r£sultats des mesures effectu£es avec
plusieurs
dchantillonstypiques
: fibres decollagbne, sphbres
de silice de 0,3 ~m de diambtre,sphbres
de latex de 0,16 ~m de diambtre en interaction, charbonlignite
poreux, cristauxliquides
forrn6s dans unsystkme
eau-tensioactif, solution colloidale desphkres
de silice de 0,32 ~m de diambtre.Abstract. To extend the domain of small
angle X-ray scattering requires multiple
reflection crystals to collimate the beam. A double crystal,triple
axisX-ray
camera usingmultiple
reflection channel cut crystals is described. Procedures formeasuring
the desmearedscattering
cross-sectionon absolute scale are described as well as the measurement from several
typical samples
: fibrils ofcollagen,
0.3~m diameter silicaspheres,
0.16 ~m diameterinteracting
latexspheres,
porouslignite
coal,liquid crystals
in a surfactant-water system, colloidal crystal of 0.32 ~m diametersilica
spheres.
I. Introduction.
Small
angle X-ray scattering, pioneered by
Guinier[I]
inalloys fifty
years ago allows thestudy
of electrondensity inhomogeneities
of colloidalsize,
I-e- from 5 to 500h.
Muchlarger objects
can bedirectly
observed under anoptical microscope. However,
there remains an intermediate size range, between 500h
and 5 000h
whereoptical
as well as smallangle
X- rayscattering
areextremely
difficult. Efforts have been made to extend the range ofapplicability
ofsmall-angle X-ray scattering (SAXS)
to ultra smallangles (USAXS) by developing high
resolution cameras. We describe here the solution chosen in ourlaboratory
to build such a camera as well as some illustrative
examples.
To obtain useful USAXS data from a colloidal
sample,
two conditions have to be fulfilled12j
:get a minimum momentum q~~~ as small as
possible,
for which thescattering originated by
thesample
can bedistinguished
from the directbeam,
thus increase the resolutionby
decreasing
theangular divergence
of the beampassing through
thesample,
at least in one direction ;still
optimize
the fluxthrough
thesample
and reduce as much aspossible
anyparasitic scattering coming
from the tails of the reflection curve of the monochromator as well as fromsurface
scattering
on thecrystal
faces.The idea of
using angular
collimationperformed
withcrystals
isntead of slits seems to have beenproposed
for the first timeby Compton
in 1917[3].
Thetheory
was establishedby Compton
and Allison in 1935[4].
The firststriking experimental
result obtainedby
thismethod seems to be the measure of the
rocking
curve width of calcitecrystals
in 1921by
Davis andStempel [5].
In 1926, Slack used the doublecrystal technique
to measure therocking
curve
enlargement
due tographite mosaicity [6].
Fankuchen[7]
and Dumond[8]
used thistechnique independently
to obtainhigh
resolution.Beeman, Kaesberg
and Ritland used doublecrystal techniques
in order to measure smallangle X-ray scattering
of fibers[9-10].
Until
1950,
the doublecrystal techniques
could never compete with arrangementsusing
slits and curvedcrystals
introducedby
Guinier[I Ii.
The main reason is thestrong
« tail » ofparasitic scattering
which is stillcoming through
the camera withoutsample
when theangle
between the
analyser
and monochromatorcrystalline planes
are tilted of the order of minutes of arc : thisparasitic scattering
islarger
than with slits andfocusing crystal
arrangements, thushiding
weak smallangle scattering coming
from thesample.
In
1965,
the crucial step forward came from Bonse and Hartusing triple
and fivefold reflectionspossible
on channel-cutcrystal [12-13].
Thesecrystals
reduce theparasitic
tails of theoutgoing
beamby
several orders ofmagnitude,
hencebeing competitive
with arrange-ments
using
slits forscattering angles
of the same order ofmagnitude
as beamdivergence.
This beam
divergence
is setby
the monochromatormaterial,
such as defectless Ge or Sicrystals
which becameeasily
available in the last twenty years. We think now that forBragg spacings larger
than 600A,
the doublecrystal multiple
reflection spectrometer allows easiermeasurements than a
design involving
veryhigh
collimation with thin slits and a beamstop.
Several other
high
resolutionX-ray multiple crystal
cameras have been described in the literature : inJapan
for thestudy
ofimperfections
innearly perfect crystals by
Iida[14]
and for thestudy
of Kr bubbles inamorphous
andcrystalline Ni~~Y~Kr~ by Ratag [15]
in USSR for thestudy
of theperfection
of Sicrystals by
Koval'chuk[16]
in the USAby
Koffman formetallurgical
studies[17]
andby
Als-Nielsen et al. tostudy
smecticthermotropic
and dilutedlyotropic
lamellarphases [18]
; in Denmark tostudy
variousX-ray optical
elements for astronomyby
Christensen[19]
and in U-K,mainly
for thestudy
of muscle structureby
Nave[20]
and Bordas[21]
or for thestudy
ofcrystals
distortedby epitaxy by
Fewster[22].
Last but not
least,
thesingle pinhole
collimatedmultiple
reflectionspectrometer using
acrossed arangement of
crystals
has been describedby
Bonse and Hart[13],
and morerecently by
Bonse and Pahl[23-25].
2. The
multiple crystal multiple
reflection camera.2, I PRINCIPLE oF THE CAMERA. The most
commonly
usedexperimental setups
are limitedby
theangular
size of the beamcovering
theimage
of theX-ray
source in the detectorplane.
To obtain a minimum q value q~,~ =
4 «IA sin
(where
A is thewavelength
of radiation and 2 thescattering angle)
forheterogeneities
of size§
=
5 000
hi-e-
q=
«Ii
= 6 x
10~~ h~
~,one has to reach a minimum
angle
about 100wad
with copper Ku radiation. For areasonable
beam-stop
size of 5 mm this leads to increase thesample
to detector distance up to25 m. This can be done
only
with asynchrotron
source since such a sizeprohibits
theinstallation in a
laboratory setup using
anisotropic
source(rotating anode). Keeping
thesample-to-detector
distance to I m, the beam stop size would be reduced to 200 ~m. If we remember that near the beam stopedges
theintensity
is less than 10~~ that of the maximum of thebeam,
one is led to build a micro-focus camera, and to reduce any source of the tails of thebeam besides the beam stop.
Detailed
experimental aspects
of theperforrnances
of SAXS camerasusing
thefocusing
monochromators
pioneered by
Guinier are discussed in standard textbooks[I1, 26].
A clever
setup
has beenproposed using angular analysis
of theoutcoming
beam instead of aposition
sensitive detector and a beam stop[7-10, 12, 13].
This camera without beamstop
uses amultiple
reflection channel cutcrystal
as monochromator and a second identicalcrystal
toanalyse
the scatteredlight [13].
Thedivergence
of the incident beam is fixedby
themonochromator and the
angular
width used for detection isgiven by
the width of thereflection curve of the
analyser.
Since aBragg
reflection has a very smallacceptance angle,
avery
high
resolution is obtained.The reflection curve R
( 8)
of aplanar crystal
near aBragg
reflection hasroughly
theshape
of a Lorentzian function. The real curve isgiven by
thedynamic theory
ofscattering.
It is nonsymmetrical
and the tails followroughly
a(8 8~)~
~ law. Itsexpression depends
on a few parameters relative to the material and to the order of the reflection[12, 27-28].
With copper Kuradiation,
the full width at half maximum of the reflection curve is 35wad
forSi(220),
78wad
forGe(I II).
These areequivalent
to a momentum resolution at half maximum of1.4 x
10T~ h~
and 3.Ix
10T~ h~ respectively. High
resolution can thus be obtained with a doublecrystal
diffractometer.However,
the(8 8~)~~
tail of therocking
curve leads to animportant background spreading
over alarge
q range.The use of
grooved crystals
instead ofplanar crystals
does notgreatly modify
the width of the reflection curve butgreatly
reduces itswings.
The n reflections which occur between the walls of onecrystal changes
the reflection coefficient R into R~. This results in a very fast decrease of the tails as(8
MB)~~~
;(8
MB)~
~° for a 5-reflection channel cutcrystal
asused
by
Bonse and Hart[12-13].
The
principle
of the doublecrystal
spectrometer isgiven schematically
infigure
I. The firstcrystal,
themonochromator, gives
alarge
collimated beam whose very small horizontalMONOCHROMATOR ANALYSER
X~y~
SLIT
oc/
iffy
SLITS SAMPLE
29
2a~
SOURCE SCINTILLATOR
Fig.
I.Principle
of thetriple
axis doublecrystal multiple
reflection spectrometer. The 3 verticalmovements are around the monochromator
(a~),
around thesample
(0 and 2 0), and around theanalyser (a).
JOURNAL DE PHYSIQUE T 2, N'6, JUNE 1992 44
divergence
is setby
thecutting angle
of thecrystal [28-29].
A translational and the three rotationaldegrees
of freedom a~,#i~
and Xm areadjusted
so that a broad(I
or 2mm)
beam is centered on the second axisholding
thesample
in acapillary
forscattering
in thetransmission
geometry.
In the verticalplane,
thedivergence
is setby
theheight
of the source and apair
of vertical slits in front of thesample (I
to 5mm).
The collimation istypically
da = 80
~rad
FWHM(set by
Ge III)
in the horizontalplane
anddfl
= 3 mrad in the vertical
plane
setby
the slits. The beamoutgoing
thesample
isanalysed by
a secondmultiple
reflection
crystal,
theanalyser. There,
three other rotationaldegrees
of freedom a,#i and X allow a
precise setting
of theparallelism
between the reflectionplanes
of the monochromator andanalyser crystals.
The scatteredlight
and the direct beam are measured with a scintillator associated with aphotomultiplier.
The measurement of the
scattering
can be done eitherby rotating
the whole detectionsystem using
the movement 2 around thesample
axis orby rotating
theanalyser crystal
around is own axis. The
background,
obtained withoutsample
in the center of thegoniometer,
is the so-called «rocking-curve
». Thissignal
has a FWHM as well as tailsextending
toangles larger
than the reflection curves Ri and
R~
of the twocrystals according
to thefollowing
convolutionintegral
:R~(a )
=
Ri(« &). R~(&)
d&(1)
where a is the
angle
between thecrystals.
Therocking
curve is alsoslightly
nonsymmetrical.
Its tails fall down as a ~~ when n reflections occur on monochromator and
analyser crystals.
2.2 REALISATION oF THE MULTIPLE REFLECTION CAMERA. The mechanical
design
isshown in
figure
2, The doublecrystal
spectrometer is built on a marble tablemaintaining
a~
em
2
1
7
5
Fig.
2. The three axis doublecrystal
diffractometer built up in our laboratory. The first axis crossesthe monochromator (manual movement), the second crosses the
sample
holder (0 and 2 0 rotations) and the third goesthrough
theanalyser
(detector and a movement of theanalyser)
: I) monochromator axis, 2) monochromator, 3) moving marble, 4)manually rotating
marble, 5) monochromator holder, 6)stepping
motor with linear encoder, 7) support for air cushion, 8)sample
holder and 9) analyser holder.together
the three axes(monochromator, sample
andanalyser)
with anangular stability
within seconds of arc. The source
(rotating anode)
is notmechanically
bound to the camera.The first
goniometric
head(n° I)
supports the monochromator(n° 2)
and a thick metallic articulatedprotection
connected to a leaded vacuum tubecoming
from the source. Twopairs
of crossedguard
slits are locatedjust
before andjust
after themonochromator, rotating
around the
crystal
axis(a~).
The centralpart
of thegoniometer
is a marbleplateau (n° 3) rotating
around thesample
axis @. Theposition
of marmor(n° 3)
can beadjusted
in the center of the beamcoming
out of the monochromatorby adjusting
theunderlying plate (n° 4),
whichmoves on an air cushion.
The
plateau (n°3)
rotatesfreely
around the column(n°5), allowing
for a motion of 2 setby
thetangential
arm(n° 6)
with ahigh precision (I ~m) optical
linear encoder. Thedistance of the linear encoder to the rotation axis is 600 mm. There is no off axis mass balance
reducing
theprecision
of thepositioning
since off axis efforts are taken overby
ahigh precision (3 ~m)
air cushionsupporting
the mass of theanalysing
unit andusing
a very flat track(n° 7)
mounted on the basement(n° 4).
The
sample
is located on the axis of arotating plate (n°8). During
the installationprocedure,
the and 2 axes have been set to beparallel
within a few seconds of arc. A second conventionalgoniometric
head(n° 9),
with three rotation movements,supports
theanalyser crystal.
The vertical rotation axis a~ of the monochromator and a of theanalyser
are set to be
parallel
within seconds of arc. The detector can be moved with a linearmovement in order to follow the
X-ray
beamoutgoing
theanalyser
when a movement isused. Guard slits are
placed
in front of theanalyser crystal
and the detector in order to filter out as much aspossible parasitic scattering.
Thegoniometer (n° 9)
and the detector can be moved towards thesample
in order toadjust
thesample
to detector distance. Theanalyser crystal, guard
slits as well as the detector are located in a vacuum chamber.Figure
2 shows themultiple
reflection doublecrystal
diffractometer which wasrecently
built in ourlaboratory
for colloid and microemulsion studies. The source is a 18 kWrotating
anode
(RU300, Rigaku)
with a coppertarget
and an effective source size of lx I mm. The three axisgoniometer
has beendesigned
and builtby
Microcontrble(Evry, France) [2].
The detector and the
analyser
can rotateindependently
around theanalyser
axis(motion
a for the
analyser). They
can rotate as a whole around an axisgoing through
thesample (movement
2 @). Thesample
itself can rotate around its axis(movement
@). A fourthglobal
movement
(rotation
ofsample
+analyser
+detector)
around the monochromator allows us tochange easily
the monochromator(odd
to even number ofreflections,
Ge toSi)
or thewavelength.
All movements,except
theglobal
one, are motorised with areproducibility
better than 5
~rad.
For the 2angle,
and due to theweight
of theapparatus, displacements
are achieved
by using
atangential
arm and a linear encoder instead of alarge
conventionalgoniometer.
The beam from source to monochromator and fromsample
to detector is maintained under vacuum toprevent
bothparasitic scattering
and beam attenuation. Thebackground
istypically
0.3 count persecond, mainly
due to the dark current in the detector.The source-to-monochromator distance is about 1.2 m,
sample
is 15 cm further and detector 60 cm away fromsample.
A verticalcollimating
slit is locatedjust
before the monochromator and a verticalanalyser
slit is 52 cm away fromsample,
in order to allow for the deconvolution of thesignal. Ka~
line isusually
filtered outby
a horizontal slitplaced just
before themonochromator. A
pair
of antiscatter slits is located in front of thesample.
All the datapresented
in the present paper have been obtained with twotriple
reflectionGe(I
II) crystals
and Cu Ku radiation and a 2 scan,
except
otherwisespecified.
The vertical
divergence
can be modifiedby changing
the slitheight.
Whatever the slitconditions,
the verticaldivergence dfl
remains muchlarger
than the horizontal resolution da. The two extreme verticaldivergences dfl
which we have usedcorrespond
toscattering
vectors
dq~
of 0,009l~
and 0.Ih~ dq~
can either be of the order of or much
larger
than the range of measured q vectors. The collimation is thus either semi-linear or linear. Theangular
width at half maximum of therocking
curve isequivalent
to a momentumdq~
= 3.2 xlo~~ A~
2.3 PERFORMANCES oF THE CAMERA. The
high angular resolution,
obtainedusing
apair
of Ge channel cut
crystals,
does notprevent
the beam at thesample
fromhaving
a noticeableintensity: using
a18kW, lmm~ X-ray
source, we obtained a total fluxexceeding
7 x
l~f
detected Cu Kuphotons
per second
through
thesample
and theanalyser,
as measured with calibrated attenuators. If a very smallangular
fraction of the rays emittedby
the sourcecan be
reflected,
nospatial
selection is made and the beam can be several mmhigh (see
Tab.I).
Due to theangular detection, spreading
of thespatial
extension of the beam at thesample
does not decrease the resolution. Thishigh
resolution couldonly
be achievedby etching
thecrystal
at ambianttemperature
withHNOjHF/CH~COOH
inproportions 5/3/3.
Table I.
Specifications of
our doublecrystal multiple reflection
camerafor
Ge(I II)
3reflection crystals
and CuKa radiation. Flux and verticaldivergences depend
on slitsettings.
Aq (HWHM)
1.6 x 10~4A-I
q~i~
(at
10~3 of maximumintensity)
4 x 10-4A~l
q~;~
(at
10~5 of maximumintensity)
2 x 10-3A~l
4l
(maximum
flux ofRocking Curve)
I x106
c/s to 7x
106
c/sH x V
(beam
size atsample position)
I x 1mm2 2x 4 mm2
H x V
(entrance
solidangle)
80wad
x 800~rad
80~rad
x 3 mradH x V
(analysis
solidangle)
80wad
x 2 mrad 80wad
x 16 mradThe
rocking
curve of the empty camera(without sample)
obtained in ourlaboratory
isplotted
infigure
3. The usual twoexperimental
methods have been used. When a rotation ofangle
a isperformed
around theanalyser
the direct beamalways
irradiates theanalyser crystal. Scanning angle
2 around thesample displaces
theanalyser slits,
theanalyser
and the detector alltogether.
With thetriple
reflection Gecrystals
we use, the two rotation methodsgive nearly
identical results.Only
a small difference is observed near a=
2
=
mrad, certainly
due to thescattering by
theanalyser
slit, However the slits cannot be removed sincethey
prevent the direct beam fromfalling
out of theanalyser crystal
channel for non zero 2 @.Rotating
the secondcrystal
around the a axis is safer because the same
point
of thecrystal
surface is used,avoiding
errorsdue to surface
inhomogeneities (Deutsch, personal communication).
Therocking
curvesobtained
by
these methods arecompared
to the theoreticaltriple
reflectionprofile.
The difference in width can beexplained by
amosaicity
of 10wad (2"
ofarc)
of the Ge materialover the
effectively
usedscattering
volume of the monochromator material. Therocking
curves show a decrease of the tails
by
several orders ofmagnitude
and aq~~
decrease isobserved near a
scattering angle
of 100~rad.
A
quality
criterion of the camera for agiven scattering
momentum q is therejection
rate R(q),
that is the ratio of theremaining background
for this q value relative to the maximumintensity
of therocking
curve.Rejection
ratios R=10~~
and R=10~~
are obtained for deviation
angles
2 8 of I mrad and 0, I mradrespectively.
Forangles larger
than 10 mrad or distances D*= 2
ar/q
smaller than3001,
therocking
curve is limited
by
the detectorbackground
and leads to arejection
ratio R =5x10~~
Thesecan be
compared
to theperformance
of our GDPA 30 camera : aGuinier-Mering
type camera manufacturedby
the10
~rad 100 ~rad
I mrad 10 mradW~
~
0O
$
I *O
t~ i
i
i O
W~ .2 $
I *
E $ O
t~ ~
MW ~
t$
hO
°
$ ~ ~
.4 j 4
., O
~, *°+_ (
b.s.$~
'~+.
~
i~
o O ~ + +
°, o . + +
$ ° ~
o ~
~
$ o
$ ° ,
o +
~ + .
~
$
.2 -1 tl I
log(20.20~) (20 mrad)
Fig.
3.Rocking
curves obtainedby rotating
either a (o) or 2 0 (+) and theoreticalrocking
curve (...) for 2perfect
3 reflections Ge II Igrooved crystals.
The maximum value is normalized tounity.
On thesame scale is also indicated the
background scattering
measured at thebeamstop
(BS)edge
of our CGRcamera (A). In the latter, the beam
focusing
occurs with a bent andasymmetrically
cut (6°) Gecrystal.
Compagnie
Gdn6raleRadiologique
atIssy-les-Moulineaux (France)
in 1970. Here the minimum usefulangle
is limitedby
thebeam-stop
size in front of the detectorplane.
This size isgiven by
the tail of the direct beam, I.e. thebeamstop
extends to anangle
2 8 where the
parasitic scattering
is of the order ofmagnitude
of thescattering coming
from thesample. Triple
reflection Gecrystals yield good rejection
factors up toparticle
sizesD* a few hundred nanometers. A
comparison
of our camera with thepinhole
collimationSANS Dl I camera at ILL and the double
crystal
S21 camera at ILL has beenperformed by
Lesieur et al.
[30].
3. Data
analysis
method.The
goal
ofscattering experiments
is to measure the differential cross sectiondensity
dI/dtl of asample
or of a series ofsamples.
Let us consider asample
of thickness t, made of n uncorrelatedparticles, having
individual cross sections «. Withoutmultiple
scattering
one hasexperimentally
access to thequantity
:~~'
= t
~~
=
tI~(t1)
= tn
~"
(2)
where d3' is the
probability
for agiven photon
to be scattered in dD whencrossing
thesample
and has nounit,
d3'/dtl can beexpressed
inrad~~
and d«/dD incm~ rad~~
Thequantity
d3/dD is also called the absoluteintensity I~(D ),
isexpressed
in cm~ rad~ ~ Oneuses more often as a short cut cm~ for
I~(D)
instead of cm~rad~~
3.I THE SMEARING PROBLEM. In a real
experiment,
the incident beam is notparallel
and the scatteredlight
is not measured within an infinitesimal solidangle.
One does not measuredirectly
the differential cross sectiondensity
d3/dD but an average of d3/dD over theangular divergences
of both the incident and scattered beams. With amultiple
reflection camera theangular divergence
of the incident beam is defined in the horizontalplane by
theacceptance angle
of the monochromator. Since the radiation emittedby
a conventional source is verybroad,
theangular
distribution of theinensity
for agiven wavelength
isproportional
to the reflection coefficientR~~~~ (a )
of thecrystal,
where a is the outputangle
of theX-rays.
In the verticalplane,
thedivergence
of the beam is definedby
theheight
of the source and that of thecollimating
slit located near the monochromator. After Lesieur theangular
distribution of the direct beamintensity
after the monochromator can thus be factorized as follows[3 II
:$ (n0)
~
$ ("0' fl0)
~lo. fmono("0)
g(fl0) (3)
f~~~~(a)
isproportional
to the reflection coefficient of thecrystal.
The functiong(fl )
is definedby
the vertical dimensions of the source and of thecollimating
slit.They
willbe normalized
later,
thusdefining
the coefficientlo.
Usually
the functiong(y)
has theshape
of atrapezium. Figure
4 shows anexperimental
verticalprofile
of the direct beam. It has been measured in theplane
of theanalyser
slit. Oneclearly
sees the centralplateau
and thesymmetric
shadowed zones on both sides with a linear decrease of flux with verticalposition.
Position has been converted toangle
seen from thesample.
In order to obtain reliable desmearedspectra,
suchprofiles
aresystematically
measured with an
Image
Plate detectorsystem
described in[32].
y Y
Source 51 t1 Sample
52
~
Fig.
4. Verticalplane
cut of a Bonse-Hart cameradesigned
for a conventional source. Sl is thecollimating
slit and 52 theanalyser
slit, M represents the monochromator. Thetypical intensity profile
of the beam g
(y)
in theplane
of theanalyser
slit and the transmission step function h(y)
of theanalyser
slit are shown on the right.
3.2 ROCKING CURVE wiTHouT SAMPLE. The detection
system
iscomposed
of a slit which limits both the beam and the scattered rays in the verticaldirection,
ananalyser crystal
and adetector. The response function
E(nj)
of the whole can be factorized as follows :E(nl) ~E(£kl'PI) ~fana("I).h(pl) (4)
f~~(ai)
isproportional
to the reflection curve of theanalyser crystal
andh( pi )
is the step function deftnedby
theanalyser
slitheight.
Theintensity
measured withoutsample
or the«
rocking
curve » is theintensity
of the direct beam(dI/dn )(n) falling
on the detectionsystem multiplied by
itsefficiency
E(n
andaveraged
over the solidangle
n. If theanalyser crystal
is rotatedby
anangle
a one obtains :I~eam
(a )
=duo S (no)
E(no
a
) (5)
or in a more
explicit
way :ib~~
(£k)
=
IO d£T0fmono("0) fana("0
") dp0 g(fl0) h(p0) (6)
Theintegral
overangle
a represents theangular profile R~(a)
of therocking
curve :Rc(" )
~dtY0fmono("0) fana("0
") (7)
The second
integral
inequation (6)
is a constant.Anticipating
to later results, we shall call it V(0)
where V(fl )
isgiven by
:v
(fl )
=dflo
g(flo)
h(flo
+fl ) (8)
We shall norrnalize the functions
R~(a ), g(fl
eth(fl )
so that :+cc
V
(0)
= andR~(a )
da = 1.(9)
-cc
This leads to the
simple
relation :Ibeam(£Y
) =10 R~(£Y ). (10)
We now see that the constant
lo
isequal
to theangular integral
of theexperimental rocking
curve. If the
analyser
slit truncates the direct bewn, the conditionV(0)
=1 means thatlo
is theangular integral
of this fraction of the direct beam which goesthrough
theanalyser
slit. The measured
intensity I~e~~(a)
isexpressed
incounts.s~~, R~(a)
is inrad~~
andlo
is in rad. counts, s ~. With a maximumintensity
of 3 x 10~ counts. s~ and anangular
widthnear 100
~rad, lo
is about 300 rad. counts. slo
=Ib~~(a )
da(ll)
8 -4 0 4 8
pin mrad
Fig.
5.Experimental
verticalprofiles
of the direct beam in theplane
of the analyser slit measured withphosphorescent
screens and scanner. Suchprofiles
are determinedby
the vertical sizes of thesource (I mm) and of the
collimating
slit (4 mm).3.3 INTENSITY SCATTERED BY THE SAMPLE. One ray with incident direction
no
=
(ao, flo),
andintensity (dI/dD ). dDo
after transmissionthrough
thesample, gives
riseto a scattered
intensity (dI/dD )n
n~
dtlo (d3/dD )n
n n~ per unit solid
angle
dn
j in direction n
j. Transmitted later
by
theanalyser
tiltedby
anangle
a and countedby
the detector withglobal efficiency
E(nj
a),
the scattered and measuredintensity
is obtainedby integration
over the solidangles no
andnj.
I~(a
=ldno
dn j ~~'(nj no)
~(no)
E(n~
a(12)
dJl dJl
If we use the
previous expressions
of dI/dn and E(n )
it comes :im(" )
~IO
dnI
$ (all' dn0fmono("0) fana(£T0
+ "1 "g(fl0) h(p0
+Pi ) (13)
or after some rearrangement
using equations (7)
and(8)
:Im(" )
~IO dnl $ (all' dn0fmono("0) fana("0
+ "1 ") g(fl0) h(fl0
+PI) (14)
For an
isotropic sample
d3'/dD isonly
a function of thescattering angle
2=
(a)
+fl
))~~~If,
as isusually
the case, the width of the scatteredintensity
d3'/dn(2 &)
is muchlarger
than the width of therocking
curveR~(
a),
the convolution in the horizontal direction(along angle
a, where the resolution is
high)
can besuppressed.
One thus obtains theexpression
characteristic for
smearing
due to linear orquasi-linear
collimation :im(a
=lo j~
~°dfl
i$ (fi)
v(pi) (15)
Here the
rocking
curveR~(a)
is normalizedaccording
toprevious
condition(12).
(a~
+fl))~~~ represents
the effectivescattering angle.
Due to theadditivity
ofa~
andfl)
it is muchsimpler
to writeI~
and d3/dnas functions of
a~.
Thefollowing equivalent expression, presented
as a true convolutionproduct yields
an inversion forrnulagiving
d3'/dn
(a)
whenI~(a )
is known, If wereplace
d3'/dn(a by I~(a ),
weget
:Im(«~)
=
tlo II
dUIa(« ~+ U)
G(U) G(U)
=
~
~/~i)~ /~ (16)
3.4 SoLuTioNs FOR THE DESMEARING PROCEDURE.
Many
papers haveproposed
solutionsto the linear collimation
smearing problem.
Theproblem
wasalready
known in the 50's as well as the solution for the case of an infinite slit[I Ii.
When the vertical
divergence
is solarge
that thequasi-linear
collimation becomes an infinite slitcollimation,
then the functionV(fl)
can be setequal
to I and theapparatus
function is
equal
toG(u)
= II
/.
Invertion ofsmearing equation
can be
perforrned analytically. Following
Guinier and Foumet[[[J
we have :i~~«~~
~
i
jj~
~~y2~ ='~
d
~1°'
~ui~~a
2 +u) ). (17)
«t~~-«
~ u
Apart
from theleading
constantI/(artlo)
thisequation
tells usthat,
in order to desmear theexperimental
spectrum, one has to resmear with the samesmearing
function II/
and thentake the derivative
(relative
to coordinatea~.
Note that both smeared and unsmearedintensities are
expressed
as functions ofsquared angles a~.
In the finite slit case, the main
problem
is to find the inverse of thesmearing
function G(u).
Anearly
solution has beenproposed by Kratky [33]
when theweighing
function has aGaussian
shape.
Numerical tests of the deconvolution have beenperformed by
Schmidt[34]
for Gaussian
weighing
functions.An iterative method has been
proposed by
Lake[35]
to desmearexperimental
spectra. Infact it smears a
hypothetical
desmeared curve, compares theresulting
curve with theexperimental
one andadjusts
the desmeared curve to get agood
fit between the calculated smeared curve and theexperimental spectrum.
Tests of Lake's method have beenperformed by
Schmidt[34].
Anadvantage
of this method lies in the fact that differentsmearings (due
toslit
height,
slit width or radiationbandwith)
can be corrected at once.However,
convergence has not beenproved
and is notalways good [36].
Deutsch and Luban
[36-39],
Schmidt and Ferodov[40],
havedeveloped
methods to solve theproblem
asposed by Kratky.
The case of a Gaussianweighing
function is often considered but more realistic cases ofrectangular
ortrapezoidal
distributions ofintensity
of the directbeam in the detector
plane
aredeveloped by
Luban[38]
and Schmidt[40], respectively.
A least squares method has been
proposed by
Glatter[41-42].
The unsmearedintensity
orits Fourier transform
(the
Pattersonfunction)
isexpanded
on a basis ofappropriate
functions : I
(q)
=3C~. I~(q).
It is thensmeared, compared
to theexperimental
spectrum and the coefficientsC~
are determinedby
a least squareprocedure.
This method needs amaximum
particule
size and is not well suited tointeracting particules.
Efforts arecurrently being
made to remove this condition[43].
3.5 AN ALGEBRAIC soLuTIoN. A formulation has been
given by
Strobl[44]
in order todevelop
an efficient method fordesmearing spectra
from aKratky
camera. It hasrecently
beenadapted
and usedby
Lesieur and Zemb formultiple crystal
cameras[30-31].
Stroblintroduced a function G* defined
by
:l~ ~~~(V).G*(u-v)= y(u)= (0ifu~0j
~"
l ifu~o
(18)
where Y
(u )
is theHeavyside
function. Theanalytical
solution G *(u )
=
I/(ar /)
is valid forsmall u. For
larger
u, G*(u)
can be deterrninedrecursively
from small tolarge
values ofu. The
smearing
ofI~(a)
with function G* leads to theprimitive (versus a~
of the absoluteintensity I~(a ). Taking
then the derivative one gets thefollowing simple
formula[31]
:ia(a2) =1 iii'i (a2)
=
i~~ «~~ II dUlm~a~+
U~ G"~~~
~~~~If one determines the constant
lo,
I.e. if one measures the direct beamintensity (usually through
a calibrated attenuator toprevent
saturation of thedetector)
and the scattered beamwith
exactly
the same slitheights,
then desmeared spectra on the absolute scale in cm~ ~.rad~~
can be obtained. Since
lo
is the area of the direct beam transmittedthrough
thesample,
the correction due the transmission factor of thesample
isperformed
in the same step.Let us sum up the
procedure
andgive
asimple recipe
to desmear on an absolute scale.Starting
with anexperimental
spectrum1(8)
in counts.s~~, integrate
the centralregion corresponding
to the direct beam transmittedby
thesample. lo
in rad. counts. s is obtained.Then
divide1( 8) by
this arealo
and alsoby
the thickness t of thesample.
Thisgives
a newsmeared
intensity
in cm~ rad~ ~. Now desmear it with aG*(fl~)
function in rad~ and getthe desmeared
intensity
on the absolute scale in cm~ ~. rad~ ~ Wefinally
insist upon the use ofangles
in radians(never
use another unit nor q inh~
~) so that as few constants as
possible
areintroduced.
3.6 DESMEARED APPARATUS FUNCTION ON AN ABSOLUTE SCALE.
Smearing
and desmea-ring equations
are linear transformations. Thus it ismeaningful
to desmear therocking
curverecorded with the
empty
camera. Severalrocking
curvescorresponding
to different vertical apertures have beenplotted
infigures
6a and 6b. On a linear scale we can see that the width of therocking
curve does not vary with the verticaldivergence (Fig. 6a). Figure
6b shows thatrocking
curves recorded with different beam powers and different vertical beamdivergences
lead to
nearly
the sameapparatus
function afterdesmearing
andscaling.
For the latteroperation,
a standardsample
thickness of 0.I cm was used. A small deviation is observed atlarge
momentum :rocking
curves measured with alarge divergence,
and thus ahigh
beamintensity
are less sensitive to the detectorbackground,
Theregion
below the curves shows infigure
6b is accessibleonly
after subtraction of ahigh background.
These curves can be considered as a lower limit to the measurement of a real I(q)
spectrum.They
can becompared
to a theoretical calculation off(q)
beforestudying
a newsample.
For
comparison
toscattering by spheres,
theenvelope
ofPR(q)
curves forspheres
of radiusto
~s
T
E
»
~
~
is
b0
4 2
o
-5
Fig. 6. - g plot
reflection
Gelll
observed at q ith
a
larger vertical divergence.The
straight line, whose slope is - 3, theenvelope of P~(q) curves for
spheres
of radius Rwhen
R isvaried.
It isPR(q) for
q.R=
.46. The
of
spheresrelative
tosolvent
is AB=l0~~lJl~I-e-
Ap
=0.3
e/l~ orthe
lectron density of water for AXS. The olume action is0.I
ifi.R,
when R isvaried,
has been drawn. It is astraight
line whoseslope
is -3. ThePR (q )
curves are tangent to this line for q R=
2,46. The volume fraction is set to 0.I fb and the contrast of
spheres
relative to solvent is All=10~~h/h~
or
Ap
= 0.3
e/h~
I.e. theeffective electron
density
of water for SAXS.4.
Experimental examples.
4.I RESOLUTION LIMIT
: SCATTERING FROM THE RAT TAIL COLLAGEN FIBERS. In order to
compare the
possibilities
of afocusing
camera and amultiple crystal
camera on atypical
colloidal
sample,
we decided to measure the samesample
made of a bundle of strainedaligned
wet rat tailcollagen
fibers[45]
with afocusing
camera and ourtriple
axislaboratory setup.
The bestfocusing
camera available in ourneighbourhood
is the double monochromator setup D22 in perrnanent use at L.U.R.E.(Orsay, France) developed by
C. Williams. Thecharacteristic flux at the time of the measurement was 5
x10? photons.s~~
for a l0keV energy. This value was estimatedby using
thescattering given by
a 1.5 mm thick watersample
in a
given
solidangle.
The 2 mm widebeam-stop
is located near the detector 1.5 m after thesample.
Its size isimposed by
thedivergence
of thebeam,
in order to obtain a total flux of the order of 100-300photons.s~
in the detector, but outside thebeam-stop.
Thebeam-stop
sizelimitation is
given by
the defects of the two Gecrystals
used as monochromators.Figure
7 compares the results obtained with a 5 h scan of the firstBragg peak
obtained in thelaboratory using
themultiple crystal
method. With a linear detector on a storagering, twenty
orders of reflection areeasily
seen with a gas detectorhowever,
the first few ordersare
superimposed
to abig
« tail » ofparasitic scattering.
The width of eachpeak
is the sameon all orders
(2
x 10 ~h~
~) and isslightly larger
than the size of the beam in the detectorplane,
due to the resolution of the electronics(300~m FWHM).
Threepeaks
can beaccurately
scannedduring
a 24 hexperiment
in thelaboratory
: thesepeaks
have the samewidth as the
empty
camerarocking
curve(3
x 10~~A~ FIVHM,
or 2 ~m
Bragg periodicity
in real space!).
Theq-independent
resolution of themultiple
reflection camera is therefore ofo.o12