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Transient Voltage Overshoots of High Voltage ESD Protections Based on Bipolar Transistors in Smart Power Technology

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Figure

Fig.  1.  Simplified  cross-section  of  the  20  V  ESD  clamp  under test.
Fig. 2. TLP characteristic of 20 V ESD clamp.
Fig. 4. Simplified version of a TLP tester equivalent circuit  B. TCAD simulations results
Fig. 8. Current density distribution at t(V=V Max ) showing  the lateral and vertical current paths

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