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START DIGIT CONDITIONS

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(1)

FAULT DETECTION OPTIONS

The operator selects the measurement by depressing the appropriate ke>' and then the OPTSEL key. The following will be displayed:

XXX OPTS

=

0 X X X B

START CRITERIA---' STOP CRITERIA---' CLOCK/DATA CRITERIA---' DISPLAY C R I T E R I A - - - . I SPECIAL C R I T E R I A - - - ' The operator specifies the criteria by digits which have preassigned meanings. The digits and their meanings are described in the following sections.

(2)

START DIGIT CONDITIONS

w>

a: CJ ...I

;:) in cc

~;:)

... >

zozffi

. START CJw:;:) ...

DIGIT CONDITION -a:OZ fl)ILCJ_

0 Using external start probe negative

going edge

XXXX

Using external start probe, positive

going edge

X X X X

2 Using external data probe, negative

going edge

XXXX

3 Using external data probe, positive

going edge

X X X X

4 Address Comparison

XXXX

5 Address Comparison and external

start probe, negative going edge

XXXX

6 Address Comparison and external

start probe, positive going edge

XXXX

7 Address Comparison and external

data probe negative going edge

XXXX

8 Address Comparison and external

data probe, positive going edge

XXXX

9 Start immediately

X X

(3)

STOP DIGIT CONDITIONS

W>

a: u ...

:)z

C I-wl->

c:)za:

ZO:)W

STOP £!~Ol-

DIGIT CONDITION (l)I&.U~

0 Using external stop probe negative

going edge

X X X

Using external stop probe positive

going edge

X XX

2 Using external data probe negative

going edge

X XX

3 Using external data probe, positive

going edge

X XX

4 Address Comparison

X XX

5 Address comparison and external

stop probe, negative going edge

X XX

6 Address comparison and external

stop probe, positive going edge

X XX

7 Address comparison and external

data probe negative going edge

X XX

8 Address comparison and external

data probe positive going edge

X XX

9 Count

XX

A Count and external stop probe,

negative going edge

X

B Count and external stop probe,

positive going edge

X

C Count and address comparison

X

0 Count and address comparison and

external stop probe, negative

going edge

X

E Count and address comparison and external stop probe, positive

going edge

X

(4)

CLOCK/DATA CONDITIONS

i~

Q. 0 I-

'" '"

a: ::3 a: ::3 > 0 Z

~ I-~ ~ "'I-

Ii:

0 ::3

z

~o

Z 0::3

~

d~

CLOCK SOURCE 1-> ctZ (/)(1) DATA SOURCE. ,,0 " "'0 (1)0

_ .... -

(I)

lEo

0 Clock Probe

+

Data Probe

+

X

Clock Probe

+

Data Probe X 2 Clock Probe Data Probe

+

X

3 Clock Probe Data Probe X

.4 OPREQ

+

Data Probe

+

X

5 OPREQ

+

Data Probe X

6 OPREQ Data Probe

+

X

7 OPREQ Data Probe X

8 Data Probe X P X

9 OPREQ P

A Data Probe T

(Transitions) P = Pulse Count

T = Transition Count

(5)

DISPLAY CONDITIONS

Display

·Dlgiis Meaning

o

Average of 10 samples No Average. No wait.

2 Wait 100 msec. between displays 3 Wait 200 msec. between displays 4 Wait 300 msec. between displays 5 Wait 400 msec. between displays 6 Wait 500 msec. between displays 7 Wait 700 msec. between displays 8 Wait 1 second between displays 9 Wait 2 seconds between displays A Wait 5 seconds between displays

SPECIAL CRITERIA

III>

a:C) ...I ::lZ C 1-1111->

c::lza:

Z°::llll S2~ol­

fl)u.(J~

XXX X X X X XXXX XXXX XXXX XX¥X XXXX XXfX XX*X XXXX XXXX

The special criteria digit indicates how memory is to be mapped. If it is zero, all memory except the test diagnostic memory is mapped to the SUT. If it is a one, all memory is mapped to the J.lSA; however, all control, address and data signals are passed to the SUT. While mapped to the J.lSA, any memory control and data signals from the SUT are disregarded. This allows fault analysis on the SUT memory and BUS structure.

(6)

BREAK POINT OPTIONS

BITS FUNCTION

o

0

=

Pause ",P, 1

=

Jump to Address 1

=

Pass Count Enable

2 1

=

Break On Read Access 3 1 = Break On Write Access

FILTER OPTIONS

FILTER DIGIT FUNCTION

o

No Filter 50 nsec

2 100 nsec

3 150 nsec

Références

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