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Study and development of silicon carbide stray light optical components for third generation gravitational wave detectors

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HAL Id: hal-02487074

https://hal.archives-ouvertes.fr/hal-02487074

Submitted on 21 Feb 2020

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Study and development of silicon carbide stray light optical components for third generation gravitational

wave detectors

Rudy Nahed, Olivier Dalverny, Antonino Chiummo, Marc Ferrato

To cite this version:

Rudy Nahed, Olivier Dalverny, Antonino Chiummo, Marc Ferrato. Study and development of silicon carbide stray light optical components for third generation gravitational wave detectors. GWADW2016 – Impact of recent discoveries on future detector design, May 2016, Isola d’Elba, Italy. pp.0, 2016.

�hal-02487074�

(2)

OATAO is an open access repository that collects the work of Toulouse researchers and makes it freely available over the web where possible

Any correspondence concerning this service should be sent

to the repository administrator: tech-oatao@listes-diff.inp-toulouse.fr This is an author’s version published in: http://oatao.univ-toulouse.fr/23403

To cite this version:

Nahed, Rudy and Dalverny, Olivier and Chiummo, Antonino and Ferrato, Marc Study and development of silicon carbide stray light optical components for third generation gravitational wave detectors. In: GWADW2016 – Impact of recent discoveries on future detector design, 22 May 2016 - 28 May 2016 (Isola d'Elba, Italy). (Unpublished)

Open Archive Toulouse Archive Ouverte

(3)

Study and Development of Silicon Carbide Stray Light Optical Components for Third Generation Gravitational

Wave Detectors

R. NAHED

1,2

; O. DALVERNY

1

; A. CHIUMMO

3

; M. FERRATO

2

BOOSTEC® SiC could be a good candidate for baffles for the third generation gravitational wave detectors regarding its thermal and mechanical properties.

MERSEN SiC-CVD is a very promising material for this purpose due to its agreement with the optical requirements desired.

Preliminary results of FE modeling interaction between the test mass and the baffle allowing us to study and analyze their temperature variation .

Problematic and research objectives

Conclusion & Next Steps

The chamber and the core optics with stray light

Methodology of simulation

Fig: BOOSTEC® SiC experimental data as a function of the temperature, (a) thermal conductivity, (b) thermal expansion.

[Credits: J.Marque, Lecture at VESF school 2012, EGO, Italy]

#1 Arm-duct baffles

#4 Wide angle baffles

#2 Cryo-duct baffles

#3 Narrow angle baffles

Laser BS

[Akutsu T. and al., Opt Society of America. 2016] [Credits: A. Moggi (INFN-PISA)]

Candidate

Requirements SS 304 Al-NiPW SiC-CVD SiC

Low Scattering •(RT) •• ••• •

High Laser Induced Damage Threshold LIDT ••(RT) ••• •••

High Thermal Conductivity • ••• ••• •••

Low Thermal Expansion •• • ••• •••

High Stifness •• • ••• •••

High Absorption Coefficient • ••• ••• ••

••• Most promising candidate

Physical characterization of BOOSTEC® SiC

(a) (b)

Material Requirement (SiC is a very promising candidate)

Optical Characterization

Measuring the scattering at room temperature (Advanced VIRGO) and at cryogenic temperature (Einstein Telescope ET)

Same conditions for measuring the reflectivity of SiC

Optical Simulation

Thermal Simulation

Mechanical Simulation Optical

properties

Mechanical properties

Scattering light field

Temperature field Thermal BC

Laser input

Mechanical BC Thermal

properties

Polished Sample Process

Surface Roughness

(nm) TIS**

(ppm) TIS*

(ppm)

Reflectivity at Brewster angle(%)

Reflectivity at 3 deg (%)

HIP BOOSTEC® SiC Hot Isostatic Pressing 5 3487 2120 0.2 21

BOOSTEC® SiC polished (no

HIP) Pressureless sintering 2 558 4360 0.2 19

MERSEN SiC-CVD Chemical Vaper Deposition < 1 <<< 50 0.1 19

[V. Bavigadda, and A. Magazzu, EGO, Cascina (Italy)]

[Bennett and Porteus]

Incident beam Radiative Exchange

with surrounding

Thermal flux from scattering light

1

Université de Toulouse; INP/ENIT; LGP ; Tarbes

LGP. 47, avenue

d’Azereix

- BP 1629, 65016 Tarbes Cedex, France

2

MERSEN BOOSTEC-zone industrielle-65460-Bazet; France

³ EGO; Advance VIRGO; Cascina (PI), Italy

* E-mail: rudy.nahed@enit.fr

Optical BC

Problematic

Research objectives

Methodology

Optical Work Simulation work

Optical characterization of the most promising materials (SiC, coated SiC…),

Analysis of the thermal and thermomechanical changes induced by scattering light flux,

Analysis of the influence of this changes on the scattering light process (if needed).

All the methodology could be applied to advanced virgo and/or third generation interferometer.

Key points : cryogenic temperature, high laser power density

Optical characterization of 3 samples of MERSEN SiC

!"#

$

= %

&'(

%

)*

Steady state thermal analysis

Open cavity radiation

View factor interaction

Radiative interaction with surrounding

Radiative Interaction between the optical components

Thermal flux distribution on the baffle obtained from optical simulations

Results

Fig: Temperature field over the baffle and the mirror with room temperature as surrounding one (K) baffle

Mirror

Fig: Baffle temperature distribution at room and cryogenic temperatures (K) Baffle back face facing

the mirror

Mirror front face

Fig: Radiation flux per unit area on baffle and mirror (W/mm²)

u, ε, + [1] Canuel B., and al., Opt Express. 2013 May 6; 21(9):10546-62

Thermal analysis

, = -./0

1

2 0

31

4

Studying and analysing the thermal and mechanical behavior of SiC under interferomrter conditions

Studying the possibility of stray light reduction or elimination by using SiC as baffles

Advanced VIRGO core optic

chamber system

Stray light is the light that does not follow the intended path reaching the detector [1]. Subsequently, stray light was considered as

an issue because scattered light from surfaces other than the mirrors surface, such as the walls of the cavity, will carry information about the displacement of the wall that will recouple back with the main beam adding a stray light field to the unperturbed field inside the interferometer:

5

(&(67

= 5

)*

8 5

3

= 5

)*

8 9

3:

5

&'(

-

);<(

5

(&(67

= 5

)*

exp[ 9

3:

%

&'(

%

)*

/cos ;

3

> 8 ?@?A ;

3

> 4]

This final profile of the equation contains a real part and an imaginary part. In this sense, the real part represents the amplitude modulation induced

BC (

C

and the imaginary part represents the phase modulation A

;

/>4 [1]:

D% >

% = 9

3:

%

&'(

%

)*

cos ;

3

> A

;

/>4 = 9

3:

%

&'(

%

)*

@?A ;

3

>

Where 5

3

is the stray light field, 5

&'(

is the output field and ;

3

is the phase angle thet carries information about the scattered light.

Stray light in the current detectors is being reduced using light shades called « baffles ». In fact, the third generation detector will be using a very high power laser and the test masses will be subjected to a different temperature condition « cryogenic temperature ».

Hence, we had to find a new material that can be a replacement for the current baffles and thet can bear these conditions.

Mechanical field

• TIS is calculated as the ratio between scattered output light and input light source

Studying the characterization process of BOOSTEC® SiC under cryogenic temperature to explore whether the optical requirements are achieved.

FE Studies of the thermal analysis of the conduction process.

Mechanical analysis under room and cryogenic temperature of SiC setup must be explored to evaluate displacement, stress; strain and analyze mechanical behavior.

Evaluating the possibility of using different types of coatings with the same substrate SiC.

Conclusion Next Steps

Maximum temperature attained by SiC at room temperature is T = 297.8 K

Maximum temperature attained by SiC at cryogenic temperature is T = 141.2 K

Temperature variation at room temperature and cryogenic temperature is E! = F G

Multiple actions combining

Optical work

Baffle solutions in KAGRA interferometer

Baffle solutions in Advanced VIRGO

Scattering light flux distribution

[Credits: A. Chiummo and E. Genin, EGO, Cascina, Advanced VIRGO, Italy]

• TIS measured as a function of the root mean square roughness

!"#

$$

= H 2 exp[2/ IJKL@0

)

. M 4

N

]

[Stefan-Boltzman law for radiation]

This activity is supported by the European Commission, through Marie Curie Actions, GraWIToN Project

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