X-Ray Diffraction Evaluation of DislocationDensity and Crystallite Size in the HAZ

Based on the X-ray diffraction analysis (XRD) using Material Analysis Using Diffraction (MAUD) software, the results show an outstanding evolution of

For theannealed samples at 500°C, only NiSi monosilicide is detectedWhen the annealing temperature increases to 750°C the NiSi2disilicide is the main formed phase. The obtained

In this work, X-ray diffraction was involved to study the formation of crystalline nickel silicide phases.. For this purpose, Ni nanometric thin films were deposited on

In this case, the pseudo-solid, coexisting with a low-density phase, can be strongly compressed; the molecules lay certainly flat on the graphite at first and

The diffraction-line broadening is mainly ascribed to the nitrogen concentration-depth profile within the layers causing depth-dependent strain-free lattice parameters, whereas

The refinement of the structure must be done by including reconstruction/relaxation in the underlying Si-substrate, but the main features contained in the x-ray

Cite this article as: Ashrafpoor et al.: Assessment of diastolic function from velocity-encoded cardiac magnetic resonance data in patients with hypertrophic cardiomyopathy. Journal

Understanding how gel structure impact on lipid oxidation could provide important information of how the gel systems could impact shelf-life and could provide a new perspective