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Submitted on 1 Jan 1964
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On the optical constants of metals at wavelengths shorter that their critical wavelengths
W.R. Hunter
To cite this version:
W.R. Hunter. On the optical constants of metals at wavelengths shorter that their critical wave-
lengths. Journal de Physique, 1964, 25 (1-2), pp.154-160. �10.1051/jphys:01964002501-2015400�. �jpa-
00205728�
ON THE OPTICAL CONSTANTS OF METALS
AT WAVELENGTHS SHORTER THAT THEIR CRITICAL WAVELENGTHS (1) By W. R. HUNTER,
E. O. Hulburt Center for Space Research, U. S. Naval Research Laboratory, Washington, D. C.
Résumé.
-On a étudié les propriétés optiques de Al, In, Mg et Si dans l’extrême ultra-violet pour des longueurs d’onde inférieures à la longueur d’onde critique. On a trouvé que Al, Mg et Si, qui ont des électrons de valence faiblement liés et des électrons internes fortement liés, peuvent
être décrits, avec une bonne approximation, par la théorie des électrons libres. Pour l’indium, dans ce domaine spectral, le terme dominant de la constante diélectrique complexe est le terme dû aux électrons libres ; cependant, d’autres mécanismes d’absorption ne sont pas négligeables,
aussi on ne peut pas utiliser une simple théorie à deux paramètres.
Abstract.
-The optical properties of Al, In, Mg, and Si have been investigated in the extreme ultraviolet at wavelengths shorter than their critical wavelengths. It was found that Al, Mg,
and Si, which have loosely bound valence electrons and tightly bound core electrons can be des- cribed, to a good approximation, by the free electron theory. For In, in this spectral range, the
dominant term in the complex dielectric constant is the free electron term, however, other absorp-
tion mechanisms are not negligible so a simple two-parameter thoery cannot be used.
Introduction.
-One of the consequences of Maxwell’s theory of the propagation of electro-
magnetic waves in a medium containing free charges is the existence of a critical wavelength Àc.
Wavelengths greater than are reflected while the shorter wavelengths penetrate into the medium.
A simple explanation of Xc is that the free charges
oscillate in phase with the electromagnetic waves
for À > Xc but are 7r radians out of phase for
À Àc. Thus the energy reradiated by the oscil- lating charges interferes constructively with the
transmitted wave and destructively with the
reflected wave for À Ào and vice versa.
In the case of a metal, the free charges are
electrons which, by virtue of their coulomb inter-
actions, are capable of collective oscillations. Con-
sequently it is to be expected that metals will have
a Xc given by ;
where c is the velocity of light, e is the electronic
charge and N the valence electron density.
This simple model was used by Zener [1] to explain the experimental results of Wood [2] who
showed that the alkali metals are transparent in
the ultraviolet. This theory was successful in that it gave fair approximations to the observed wave- length at which transmission set in. However, it requires total reflection at all angles of incidence for X > Àc which is not the case. Kronig [3] modi-
fied Zener’s theory by introducing damping of the
free electron motion, due to collisions with the (1) Supported, in part, by the National Aeronautics and
Space Administration.
lattice. This then becomes the free electron theory.
of Drude [4] and, for the purpose of describing optical phenomena, can be put into the following
form :
In the limit as 1:" approaches infinity, eq. (1)
becomes :
and eq. (2) becomes zero, i.e., Zener’s model. el
and e2 are the real and imaginary parts of the-e complex dielectric constant, respectively ; n is the
index of refraction, k is the extinction coefficient,
Me is the critical angular frequency and r is the
relaxation time of the electrons.
A Drude type model describes fairly well the optical properties of the alkali metals which have
a loosely bond valence electron and tightly bound
core electrons [5]. Hence, it is reasonable to expect
that the theory would be at least a good first approximation to other metals that have loosely
bound valence electrons and tightly bound cores.
Pines [6] discussed the classification of metals by
the binding energy of the valence and core electrons and found that the metals listed in Table I have this characteristic in common with the alkali metals. Thus the inference can be made that a
critical wavelength exists for these metals at which transmission should commence. In Table I is
listed, for several elements, the value for ae and the nearest absorption edge at which k should once
Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphys:01964002501-2015400
155
TABLE I
again become large enough to reduce or prevent
transmission.
Metals that cannot be described by. the free
electron theory may still have a X, accompanied by
transmission for À X,. This means that the free electron term in the complex dielectric constant is dominant in the region around Xc, however, other absorption processes will not be far enough remo-
ved from the region to be negligible. Some examples are indium, tin, antimony, and bismuth.
Other metals, such as gold [7], have no optical
transmission and, therefore, no trace of a xc, although it can be predicted on the basis of theory.
If the metal becomes transparent for X Xc, k must be rather small. Furthermore, from a
consideration of eq. (3), n will be real but less than
unity, so that radiation can center the medium
only at angles less than the critical angle, arc.
Hence, for X Àc metals that have transmission bands or regions will be expected to have a very small k and n less than unity.
Experimental methods.
-The metals to be
investigated were in the form of thin evaporated films, deposited under optimum conditions as des- cribed by Hass, Hunter, and Tousey [8]. In the
case of unbacked films, a suitable parting agent
was placed on the substrate prior to the evapora- tion of the metal, and another substrate, situated alongside, was exposed during the evaporation and
was subsequently coated with silver and used to
measure the film thickness by multiple beam inter- ferometry. Details of the process of making
unbacked films will be published [9].
The extinction coefficient, k, was measured by
transmission through unbacked metal films. By measuring the transmittance of films of different
thicknesses, absorption at the surface by an oxide layer, and also reflection losses, can be eliminated,
assuming they are the same in both cases. The
formula for obtaining k by this method is :
where x is the film thickness and T the transmit- tance.
If k is very small, and n is less than unity, it is possible to use a technique similar to the critical
angle method for measuring the index of non- absorbing solids and liquids in the visible region.
Calculations of reflectance versus angle of inci-
dence for a medium with n
=0. 707, 0152c 450 and
FIG. 1.
-Calculated reflectance versus angle of incidence
for n
=0.707, ac £ 450, and different values of k.
different values of k, shown in figure 1, illustrate
that a definite «Q can be observed only if k
=0, however, for small values of k there is a sudden
drop in reflectance in the region of (Xc. The index,
n, was obtained from the position of maximum slope of the reflectance versus angle of incidence
curve. The position of the angle of maximum slope, CXm, of the reflectance curves is very close Lo ao, but moves further away as k increases.
Eventually k becomes large enough so that the
R vs oc curve is monotonic, as is the case of k > 0. 2.
Further calculations were made to find the
dependence of am on k. The results are shown in
figure 2, where the angle of incidence of am is
shown as a function of k for different values of the
FIG. 2.
-Calculated position of the angle of maximum
slope, am, as a function of k. The full lines are for unpo- larized radiation, the dotted lines for the p-component
and the dashed lines for the s-component.
index. The curves for n > 0.7 are terminated when the respective R vs oc curves become mono-
tonic. By means of these curves a correction for the value of n
=sin «m can be determined if k is known for the material. For example, if the mea-
sured value of «m
=49 . 5°, and k
=0.2 (fig. 2)
indicates that n
=0.6 ; neglect of the correction would yield n
=0. 76, an error of about 27 %.
Polarization would cause the measured n to vary between 0.68 for complete s-polarization and 0.81
for complete p-polarization, corresponding to errors
of 15 % and 33 %, respectively. This is, of
course an extreme case ; corrections for k # 0 are usually quite small.
The effect of reflections from the metal-substrate interface ahd the oxide layer are discussed else- where [10] and were shown to be, for the most part, negligible.
Results.
-The results for aluminum are shown in figure 3. In the upper part of the figure, the
dots through which a solid line has been drawn, represent measured values of sin «m. The large
shaded circles, at 584 A and 736 A, are the results of previous measurements [11] using an interfer-
FIG. 3.
-Optical constants of aluminum at wavelengths
shorter than the critical wavelength.
ence technique. At the same wavelengths, the triangles are data obtained by Madden, Canfield,
and Hass [12] from oxide-free surfaces using the general reflectance method. Data obtained by
LaVilla and Mendlowitz [13] from inelastic elec-
tron scattering experiments are shown as crosses.
Index measurements could only be carried out to 200 A because, at shorter wavelengths, am > 84o,
which was the largest angle at which measurements
could be made. The open circles represent n cal-
culated from the free electron theory using
Xo
=837 A and T = 1. 1 X 10-15 seconds [14],
and are in very good agreement with the measured values. From 700 A to longer wavelengths, the
broken curve represents the correction necessary because of the displacement of ocm by the ever- increasing k.
In the lower half of the figure are shown the
measured values of k. The scatter of points is quite large, especially at wavelengths shorter than the L2.3 x-ray edge at 170 A, where the dotted
line is to be regarded merely as an indication of the behavior of k. For X > 170 A, the results are
somewhat more consistent and the scatter of data decreases with increasing wavelength. Once again
the large shaded circles represent the results of previous measurements by transmission while the
crosses and triangles are data of La Villa and
Mendlowitz and Madden, Canfield, and Hass, res-
pectively. The. diamonds represent the data of
157
Tomboulian and Bedo [15], obtained photogra- phically using a synchroton as a light source.
Values of k, calculated using the free electron theory,
are so labelled. There is a definite departure from
the free electron model in that the measured k does not decrease with decreasing wavelength as rapidly
as the calculated values. This is due to the fact that interband transitions at approximately 8 OOOA
which are not included in the Drude theory are
still exerting a slight influence.
The data of Tomboulian and Bedo show a sharp dip in the value of k at the L2,3 edge. Astoin and
Vodar [16], who have measured the transmittance of aluminum films have reported a sharp peak in
transmittance at the L2,3 edge, corresponding to
the dip in k observed by Tomboulian and Bedo.
Both sets of investigators used aluminum films backed by thin films of zapon or collodion. In the earlier work of Tomboulian and Pell [17] on
unbacked aluminum films, 5 000 A thick, the sharp peak was. absent. No sharp peak was observed in the present work, although it would have been
detected in spite of the large scatter of the points
near the edge.
In Iigure 4 are shown the optical properties of
aluminum from 100 A to 6 000 A. Open circles represent values taken from the experimental
FIG. 4.
-Optical constants and normal incidence reflec- tance of aluminum.
curves of the preceeding figure, otherwise the data
symbols have the same meaning as in the previous figure with the exception of the additional data of Hass and Waylonis [18] for the near ultraviolet and visible, shown as plus signs.
.