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Stability of a plate crystal growing in a channel

E. Brener, D. Temkin

To cite this version:

E. Brener, D. Temkin. Stability of a plate crystal growing in a channel. Journal de Physique I, EDP

Sciences, 1993, 3 (11), pp.2199-2205. �10.1051/jp1:1993111�. �jpa-00246863�

(2)

Classification

Physics

Abstracts

44.30 68.45 81.30F

Stability of

a

plate crystal growing in

a

channel

E.A.

Brener(I,*)

and D.E.

Temkin(~,**)

(~) Laboratoire de

Physique Statistique

de L'Ecole Normale

Sup6rieure(*** ),

24 rue

Lhomond,

75231 Paris Cedex 05, France

(°**)

(~) Laboratoire de

Physique,

Ecole Normale

Sup6rieure

de

Lyon,

46 Al16e

d'Italie,

69364

Lyon

Cedex 07, France

(Received

5

April

1993, revised 5

July1993, accepted

15

July1993)

Abstract. The

stability

of the diffusion

growth

of a

plate

in a channel with respect to the

long

wave fluctuations

along

the

edge

of the

plate

is considered. The

growth

is found to be

unstable for

wavelengths larger

than a critical value which is of the order of the channel width.

The

destabilizing

factor has the usual diffusive nature. The main

stabilizing

factor is connected to the

dependence

of the

growing plate

width on the curvature of its

edge.

1. Introduction.

Many experiments

on solidification are carried out in thin films whose width is fixed

by

the

cover

glasses (see

for

example

11,

2]).

In this case the

growth

of two-dimensional structures is

possible:

the solid

phase

fills the whole channel width and the scale of the structure is much

larger

than the channel width. Another

possible

case is when the

growing crystal

fills the channel width

only partly (see Fig. 1),

[3]. The occurrence of the two-dimensional structures in this case is also

possible

due to the

instability

of the

simple

forms like disks or

plates.

The

aim of this paper is the

investigation

of the

stability

of a

growing plate

which fills the channel width

only partly.

Let us consider the isothermal solidification of the

binary alloy

controlled

by

the diffusion in the

liquid phase.

The diffusion in the solid is

neglected.

The concentration field is

governed by

the diffusion

equation

)

=

Dv~u (I)

(*>Pennanent

address: 14432 Chemogolvka Institute for Solid State Physics of the Academy of Science, Russia.

(**)

Permanent address: I-P- Bardin Institute for Ferrous Metals, 2 Baumanskaya Str.

9/23,

107005 Moscow, Russia.

(***> assoc14 au C-N-R-S- et aux Universit4s Paris VI et Paris VII.

(3)

2200 JOURNAL DE

PHYSIQUE

I N°11

Fig-I-

Schematic representation of

plate growing

in a channel.

where

U #

(CLE C)/(CLE CSE)

Here C is the

concentration; CLE

and

CSE

are the

liquidus

and solidus concentration for a

given temperature;

D is the diffusion coefficient. The concentration in the

liquid

far away from the

crystal

is

C~

and

u(y

-

oJ)

=

A,

A

=

(CLE C~O)/(CLE CSE) (2)

At the channel walls there is no flux and

3u/3z(z=+w/~

= 0

(3)

where W is the channel width. At the

solid-liquid

interface the mass conservation law says

un =

D) (4)

where vz~ is the normal

velocity

of the interface and

3/3n

is the normal derivative to the interface.

(We

consider the one-sided model with

locally parallel liquidus

and solidus lines and with a constant

miscibility

gap

equal

to

(CLE CSE).

For details see

[4]).

At the interface the

concentration is written as

u =

-doK (5)

K is the curvature of the interface

(K

< 0 if the interface is convex towards the

liquid phase);

do

"

'fTm /

[L(

ml (CLE CSE))

is the

capillary length;

~iis the surface energy

(assumed isotropic)

T~z~ is the

melting temperature

of the pure

material;

L is the latent heat and m is the

slope

of the

liquidus.

The

problem

formulated above has a

stationary

solution

describing

a

plate

which is infinite in the x-direction and is

growing

in the

y-direction

with constant

velocity [5].

Far

from the

edge

the

plate

has the relative width

= A

(6)

By assumption,

the

profile

of the

plate

is

parametrised by

the

equation

y =

(I/s) lncos(7rz/A) (7)

with an unknown

shape parameter

s

just

as the

profile

of the

Saffman-Taylor finger

with

s =

7r/(1 A). (Here

and below the

lengths

are reduced

by

the channel width

W) Then,

the

shape parameter

s is found to be [5]

(4)

S = b~~ +

7r~/(1 A)~l~/~

-p

(8)

where p

=

uW/2D

is the Peclet

number,

and the

velocity

u is determined

by

the selection condition

a +

doD/(UW~)

=

Ii (7r/(AS))~i~/~/(~IS~) (9)

where /~ is a numerical factor of order one.

Equations (8)

and

(9) give

two branches of the

dependence

u on at fixed channel width [5]. These solutions exist

only

for >

1/2

and W

larger

than some critical value

Wc/do

~ (A

-1/2)~~/~,

for (A

-1/2)

< 1.

(10)

On the lower branch of the solution the

velocity

u decreases with

increasing

and on the upper branch u increases with A. Note that

parameter

a in

equation (9)

cannot be

large. Being

small

on the whole upper branch and also on the lower branch at close to

1/2

,

it increases up to the value of order one at close to 1.

2. Formulation of an effective

problem.

Pelce [6] has formulated the idea that for small Peclet

numbers,

when the diffusional

length

is much

larger

than the channel width W

,

the one-dimensional concentration field in front of the

plate

is

decoupled

from the

complicated

field in the

vicinity

of the

plate

which

changes

in the scale of W. Let us use this idea to formulate the effective

equations

which describe the

growth

of the

plate taking

into account a small distortion

along

the x-direction.

The concentration field in front of the

finger

has a scale much

larger

than W and does not

depend

on z. In the frame

moving

with a constant

velocity

u the concentration field is

governed by

the

equation

~i I

"

~

~

~)

~

~Pi' ~~~'~

"

°°~

" ~ ~~~~

For this field the effective

boundary

condition at the interface y

=

f(x, t), corresponding

to the

edge

of the

plate,

is

~

(u

+

W3f/3t)

= au

/3y(y-~ (12)

D

Here we assume that behind the

edge,

the

solidifying plate

has the relative width A.

Equation

(12)

is written for a small deformation of the

edge profile f(x, t).

We do not consider the details of the real

shape

of the interface which

changes

in the scale of W In the same

approximation

u(y=~

= 0.

(13)

To

complete

the formulation of the

problem

one has to use the selection conditions

(8)

and

(9) which,

as it is

shown,

can be

presented

in the form

=

A(u

+

W3f/3t) a3~f/3x~ (14)

where

A(u)

is

given by equations (8)

and

(9)

and a is a numerical factor In order to find the

parameter

a one should find the linear correction with

respect

to the curvature

3~f/3x~

to the

parameter

s in

equation (7).

The solution of this

problem

is

presented

in the next section and

gives

a

=

1/(167r)

for A close to

1/2.

The motivation for the

phenomenological equation

(14)

is due to the smallness

off

and due to the

long

wave

approximation

which allows us to

(5)

2202 JOURNAL DE

PHYSIQUE

I N°11

neglect

the

higher

derivatives with respect to x. We should note that

equation (14)

contains

an adiabatic ansatz in the same sense as in references

[6, 7].

Considering growth

of a

plate,

we can divide the whole space in the

y-direction

into three

regions:

the outer

region

in front of the

edge,

the

region

close to the

edge

with a characteristic

(dimensionless)

size

equal

to

I,

and the inner

region

behind the

edge.

The formulation of the

stability problem, given by equations (11-14), decouples

the first

region

from the other two.

This can be done when the Peclet number and the wave number of the

perturbation

are small:

p <

I,

k < I. In this case we can exclude the intermediate

edge region

from consideration and

replace

it

by

some effective

boundary

conditions at the

boundary

y =

f

between the outer and the inner

regions.

At this

boundary

the field u should be continuous and

equal

to some value connected with a mean curvature K of the interface in the

edge region: ~1(y=~-o

"

u(y=~+o

=

-doK.

At the same

time,

the diffusion fluxes should be discontinuous because solid

phase

with a relative thickness is formed at this

boundary: 3u/3y(y=~+o (I A)3u/3y(y=~-o

=

A

§ (u

+

W3f/3t).

For the

growth

of an

unperturbed plate,

the field u in the inner

region

and the flux au

/3y(~-o equal

zero. For the

perturbed plate

the concentration field in the inner

region

and the flux from this

region

are caused

by capillary

effect on a

corrugate

interface and

by

the relaxation of the

corrugations.

Both

cappilary effects,

in balance

equation (12)

and in

equation (13),

are considered to be small and are

neglected.

This allows us to

decouple

the

outer

region

from the inner one. Both of these effects turn out to be small because of the

long

wavelength approximation

and because of the smallness of the parameter a. We will return to this

point

later.

3. Calculation of

parameter

a.

We introduced the

phenomenological parameter

a into

equation (14).

Let us calculate it. Ac-

cording

to

equations (7-9)

the relative width of the

plate

is connected to the

shape parameter

s. In the non

perturbed problem

this

parameter

was found [5] from the

analysis

of the asymp- totic behaviour for z close to

A/2 (see Eq.(8))

Let us

present

the

perturbed shape

of the

interface in the form

z(x, v,t)

=

A/2 exP(8v)

+

Bf(x,t) exPl(8

+

b8)vl, (15)

where

f(x,t)

=

to exp(uJt) cos(kx).

We look for the

perturbation

of the concentration field in the form

~~ ~ ~~~~~°~ ~ ~~ ~ ~~~~~

~"~~~~

~"

(~ )~'

~~~~

which satisfies the conditions

3bu/3z(z=1/2

= 0 and bu

= 0 at z

=

A/2.

The relation between A and

Bfo

can be found from the conservation law

(4),

but it is not

important

for the

following

From the

stationary

diffusion

equation

in the

moving

frame

i7~bu

+

2p3bu/3y

= 0 we find

(s

+

bs)~

k~ ~r~

/(I

A)~ +

2p(s

+

bs)

= 0.

(17

For the non

perturbed system (k

=

0,

bs =

0)

this

equation gives

the result

(8).

For k «

we

get

~2

~~

2(s

+

p)

~~~

In order to find the correction to the

solvability

condition

(9)

we have to know the

shape

the interface not

only asymptotically

but

everywhere

in the same sence as ansatz

(7).

Let

(6)

solve

equation (15)

for y as function of z in the linear with respect to

f approximation

y =

ljlu(A/2 z)

+

Btexpjbs lu(A/2 z)/sjj. (19)

The basic idea [5] of ansatz

(7)

for the

steady-state

solution is to

replace In(A/2 z) by lncos(7rz/A).

It

gives

an exact

Saffman-Taylor

solution for p

= 0. We use the same model

for

equation (19). Moreover,

not very close to the

asymptotic regime

we can

expand

the

exponential

term in

equation (19)

for small bs

Is.

This is correct for

k2

« 1.

Finally

we

get

y =

f(x,t)

+ ~

~~~ )ln cos(7rz/A) (20)

s

which for

f

= 0

gives

the initial

shape (7)

and for z

= 0

gives

y =

f (the

latter

gives

B

=

s).

Equation (20)

differs from

equation (7) by

a factor s

/( I+fbs)

instead of s and

by

the translation of

f

in the

y-direction (the

latter is not

important

for the selection condition

(9)). Taking

into

account the mentioned

reparametrization

s, one finds from

equation (8)

and

equation (9)

for

p « I and close to

1/2

> =

>(u)

+

tbs/4 (21)

where

A(u)

is a non

perturbed

selection condition.

Collecting equations (8, 14,

18 and

21)

we

find for p « I and (A

-1/2)

« 1

a =

1/(167r) (22)

We note

again

that the calculation of the

parameter

a contains the model

step,

but the

impor-

taut

point

is that the parameter a is

just

a

positive

number.

4.

Stability analysis.

For the

steady-state growth

of the infinite

unperturbed plate (f

=

0)

we find from

equations (11-13)

u(y)

= A A

exp(-2py),

and

= A.

(23)

Equation (14) gives

the

velocity

u. Pelce [6] examined the

stability

of this solution

(for

the lower

Saffman-Taylor branch)

with

respect

to the

homogeneous perturbation

in the

x-direction, f

=

to

exp

(cot).

Because of the translation invariance one of the solutions is uJ

= 0. Another one which is

proportional

to the derivative

(-al /3u)

leads to the

instability

on the lower branch where

3A/3u

< 0. The upper branch is stable because

3A/3u

> 0. It is easy to understand these results

qualitatively

from

equation (12).

Parameter

plays

the role of the effective source of the material. If the

velocity

increases and the

strength

of the source decreases

(al /3u

<

0)

it leads to further increase of the

speed

and therefore to

instability.

Let us consider the

perturbation

in the form

t(x,t)

=

to exp(uJt) cos(kx) (24)

The solution of

(II

and

13)

is

u = A A

exp(-2py) 2pAfo exp(uJt

QY)

cos(kx) (25)

where

q = p +

(p~

+ k~ +

2pfl)~/~,

fl

=

UJW/u. (26)

From

equation (12), taking

into account

equation (14)

in the form

~ = A +

u(3A/3u)Qf ab~f/3x~, (27)

(7)

2204 JOURNAL DE

PHYSIQUE

I N°11

n

,

Q

l~~~

Q

~

0

Fig.2.

Schematic spectrum

~1(k).

The hatched

region corresponds

to the stable continuous spec- trum.

we find

fl(A

+ u3A

/3u)

=

QA ak~ 2pA. (28)

Equations (25), (26)

and

(28)

are correct at

k2

+

2pn

> o.

(29)

Under the

opposite

condition there is a continuous stable

spectrum (hatched region

on

Fig.

2).

Let us look at the limit of small k

,

k « p « I. For al

/3u

> 0

fl =

k~A/(2pu3A/3u) (30)

For

3A/3u

< 0

~

~~~~~~~~~2

~

pu~~~3u(

~~~~

The result

(31)

agrees with the result of [7] for k

= 0. For p « k « I for both cases one

finds from

equations (26

and

28)

fl

=

(Ajkj ak~) /(A

+ u3A

/3u) (32)

Note that the denominator in the

equation (32)

is

always positive

even at the lower branch

[6].

For

3A/3u

> 0 both

limiting

cases

(30

and

32)

can be described

by

the formula

fl

=

A

p2

+

k2

1/2

~ ~

~~~

~~~~~ ~~~~~~l~~ ~/3u

~~~~

The

spectrum fl(k)

is

schematically presented

on

figure

2.

Let us look

formally

at the

system

where is

independent

of the

velocity

and curvature

(I.e.

al

/3u

=

0,a

=

0).

From

equation (32)

we

get

the usual diffusional

instability

fl

r~

(k(.

In this

system

the

stabilizing

factor is the surface

tension,

which should

give

the well known correction to the

spectrum

of the order of

a(k(k2.

In our system for small a and k the main

stabilizing

factor is

provided by

the influence of the curvature of the

plate

on the width of the

plate.

It

gives

the correction to the

spectrum ak2 (Eq.(32) ).

This effect of stabilization is caused

by

the fact that on the convex

part

of the front the

plate

width is

bigger (a

>

0),

(8)

which

corresponds

to a

bigger

effective source of the material in

equation (12).

It leads to the decrease of the

velocity

of this

part,

I-e- to the stabilization.

Finally,

we can make an estimate of the

marginal

wave number

(see Eq. (32))

jkoi

"

Ala (34)

which

corresponds

to a dimensional

wavelength

I

=

W(27r/ko)

"

W/(8A)

which is of the order

of the channel width W. Note that all the

analysis

has been carried out for small k.

Therefore,

the result

(34)

is

only

an estimate of the order of

magnitude.

In

conclusion,

the

steady-state growth

of the

plate

is

possible only

for channel widths

larger

than the critical value

Wc (see Eq. (lo)).

In this case the

instability

leads to the

development

of the three-dimensional structure with a characteristic scale of order W. For the channel width W <

Wc

the solid

phase

fills the whole width of the channel. The characteristic scale of the

two-dimensional structure in this case is of the order of

Wc [8].

Acknowledgments.

We are

grateful

to P-Oswald and J.C.Geminard for fruitful discussions which stimulated this work. This work was

partly supported by

a

grant

of the D.R.E.T.

(France)

and

by

the American

Physical Society.

One of us

(D.T.) acknowledges

financial

support

from the C-N-R-S-

References

ill

Flesselles J-M., Simon A., Libchaber A-J-, Adv.

Phys.

40

(1991)

1- [2] Oswald P., Malthete J., Pelce P-, J-

Phys-

IFance 50

(1989)

2121.

[3] Janiaud B., Bouissou Ph., Perrin B.,

Tabeling

P., Phys. Rev. A 41

(1990)

7059.

[4]

Langer J-S-,

Rev- Mod.

Phys.

52

(1980)1.

[5] Brener E-A-, Geilikman M-B-, Temkin D-E-, JETP 67

(1988)

1002.

[6] Pelce P.,

Europhys.

Lett. 7

(1988)

453.

[7] Karma

A.,

Pelce

P.,

Phys- Rev- A 39

(1989)

4162, ibid. 41

(1990)

6741- [8] Brener

E.,

Mfiller-Krumbhaar

H.,

Temkin D.,

Europhys-

Lett- 17

(1992)

535.

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