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Characterization of interfacial layer of ultrathin Zr silicate on Si(100) using spectroscopic ellipsometry and HRTEM

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Academic year: 2021

Partager "Characterization of interfacial layer of ultrathin Zr silicate on Si(100) using spectroscopic ellipsometry and HRTEM"

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Fig. 2. XPS spectra showing the measured data in filled circles and fitted peaks in dotted lines for as-deposited Zr silicate film with 12 cycles at 550 8C
Fig. 3. (a) The measured SE data compared with the best fitting for sample 1. The solid lines are measured data at 60 and 758 of angle of incidence and the symbols are reconstructed data obtained by using the best fitting parameters

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