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A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment

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Academic year: 2021

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Figure

Fig. 1 LDMOS area occupation for a typical automotive application
Fig. 4 Working principle of the solution implementing BI-GST
Figure 5 shows the detailed schematics of the circuitry, where the voltages have been annotated for the critical nets both during normal and built-in GST operation.
Fig. 8 Circuit description of the solution implementing BI-GST and BI-DLT
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