Structural and optical properties of Ni dopedZnO thin ?lms using sol–gel technique

SnO 2 thin films were electrodeposited on fluorine tin oxide substrate in nitric acid solution. The films were found uniform, adherent to the substrate and

XRD diagrams illustrate that undoped and erbium doped TiO 2 crystallize in anatase phase only and indicate that the crystallite size decreases from 24.06 to 21.19 nm as a function

The structural and optical properties of ZnO thin films have been investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM) and spectroscopy UV-visible..

Precursor solutions were prepared from zinc acetate dehydrate (Zn(CH 3 COO) 2 ·2H 2 O), ethanol as solvent and diethanolamine (HN(CH 2 CH 2 OH) 2 ) (DEA) as stabilizer

The measurement of the thickness (h) by the method of the interference fringes, [11] and from the Figure.1 transmittance curve, we derive the physical constants

X-ray diffraction (XRD) and scanning electron microscopy (SEM) analysis were used to investigate the effect of sol concentration on the crystallinity and surface morphology of

Development and characterization of ZnO thin films is of high interest because of its single electrical properties, optics which make it suitable for applications in different

They also show that increasing the concentration, the maximum transmission exceeds 90% for all layers and moves towards longer wavelengths.. We also find that