IEEE TRANSACTIONS ON
RELIABILITY
IEEE RELIABILITY SOCIETYpublished by theand Journal of the ASQ- ELECTRONICS & COMMUNICATIONS Division
MARCH 2009 VOLUME 58 NUMBER 1 IEROAD (ISSN 0018-9529)
PAPERS
Networks
A General Neural Network Model for Estimating Telecommunications Network Reliability ...
F.Altiparmak, B. Dengiz, andA. E. Smith Systems
Incorporating Common-Cause Failures Into the Modular Hierarchical Systems Analysis ...
L. Xing, A. Shrestha, L. Meshkat, and W Wang A Decomposition-Based Modeling Framework for Complex Systems ...
P. Lollini, A. Bondavalli, and F. di Giandomenico System Reliability Evaluation for a Multistate Supply Chain Network With Failure Nodes Using Minimal Paths ...
Y.-K. Lin Discrete Repairable Systems With External and InternaI Failures Under Phase-Type Distributions. ... .. ... .. . ... ... .... . ..
. ... .. .. ... .... .... .. .. .. .. ... .. .. .. . .... .. .. ... ... .. . .... ... ... J. E. Ruiz-Castro, G. Fernândez-Vzliodre,and R. Pérez-acon Variable Ordering to Improve BDD Analysis-of Phased-Mission Systems With Multimode Failures Y.Mo Redundancy vs. Protection vs. False Targets for Systems Under Attack G. Levitin and K. Hausken Evidential Networks for Reliability Analysis and Performance Evaluation of Systems With Imprecise Knowledge ...
C. SimonandP. Weber A Fast and Robust Reliability Evaluation Aigorithm for Generalized Multi-State k-out-of-n Systems...
, S. V.Amari, M. J. Zuo, and G. Dili
Optimization
Simultaneous Quality and Reliability Optimization for Microengines Subject to Degradation. ... .. ... ... .. ... ... .. ... ... ..
H. Peng, Q. Feng, and D. W Coït Degradation
Residual Life Predictions in the Absence of Prior Degradation Knowledge N. Gebraeel, A. Elwany, and J. Pan A Discrete Stress-Strength Interference Model With Stress Dependent Strength H.-Z Huang and z- W An Parameter Identification in Degradation Modeling by Reversible-lump Markov Chain Monte Carlo. . . .. . . .. . . ... . . . E. Zia andA. Zoia Order Restricted Inference for Exponential Step-Stress Models N. Balakrishnan, E. Beutner, and M. Kateri
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