THIN FILMS PREPARATION AND CHARACTERIZATION OF THE Y2O3-Er2O3-Al2O3 SYSTEM FOR INTEGRATED OPTICAL AMPLIFIERS

Surface characterization of sol-gel derived scintillating rare- earth doped Lu 2 SiO 5 thin films..

In the first case, it was observed that the piece of the not annealed sample 499, which was treated with the disordering procedure, showed the highest band gap of all samples,

Uv–vis transmission spectra show that the absorption edge shifts to longer wavelength as the thickness increases, which is correlated with the change in the optical band gap value..

The structural and optical properties of ZnO thin films have been investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM) and spectroscopy UV-visible..

Precursor solutions were prepared from zinc acetate dehydrate (Zn(CH 3 COO) 2 ·2H 2 O), ethanol as solvent and diethanolamine (HN(CH 2 CH 2 OH) 2 ) (DEA) as stabilizer

They also show that increasing the concentration, the maximum transmission exceeds 90% for all layers and moves towards longer wavelengths.. We also find that

In the present work, we studied the growth of ZnO thin films on glass substrate by Sol-gel method using zinc acetate dehydrate precursor and undergo optical

As-deposited films were amorphous, and the XRD studies showed that the formation of anatase phasewas initiated at annealing temperature close to 400 °C.. The grain size of the