Unravelling local environments in mixed TiO2–SiO2 thin films by XPS and ab initio calculations
Texte intégral
Figure
Documents relatifs
In order to investigate the refractive index as a function of the light sources used for the photolithography and the impact of the photo-initiator, we have used the M-line
Although the films remain X-ray amorphous at annealing temperatures as high as 950°C, FTIR and Raman spectroscopy indicate that TiO 2 crystallizes in anatase structure
Up to now, superconducting films have been prepared as-grown by an appropriate substrate temperature, or more classicaly, by annealing at high temperature after deposition on a
L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des
A similar effect of Te content on the localized states concentration has been observed by us during dielectric measurements of these samples reported elsewhere
Glancing incidence X-ray reflectivity of sample # 2 (dots), an improved simulation (dotted curve) based on the result of the Fourier transform shown in figure 5, a simulation
This paper is focused on the evolution of the chemical analysis and the environment around silicon atoms in two powders as a function of annealing treatments under nitrogen
Werner, The Effect of Solar Irradiance on the Power Quality Behaviour of Grid Connected Photovoltaic Systems, International Conference on Renewable Energy and Power